Title:
Rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder
United States Patent D717190


Inventors:
Jochumsen, Hans Henrik (Allerod, DK)
Jensen, Anders (Allerod, DK)
Sadolin, Jannik (Bronshoj, DK)
Madsen, Niels Torp (Valby, DK)
Norregaard, Lars (Virum, DK)
Khalfaoui, Chaker (Bronshoj, DK)
Baekbo, Henrik (Bronshoj, DK)
Gammelgaard, Lauge (Copenhagen K, DK)
Nielsen, Peter Folmer (Farum, DK)
Jankjaer, Hans Henrik (Gentofte, DK)
Application Number:
29/456062
Publication Date:
11/11/2014
Filing Date:
05/28/2013
Assignee:
Capres A/S (Lyngby, DK)
Primary Class:
Other Classes:
D10/103
International Classes:
(IPC1-7): 1004
Field of Search:
D8/354, D10/80, D10/94, D10/103, D13/173, D14/217, 324/72.5, 324/149, 324/545, 324/713-719, 324/754.03, 324/754.04, 324/754.5, 324/754.11, 324/754.09, 324/754.2, 324/755.01, 324/755.07, 324/756.01, 324/756.02, 324/757.01, 324/73.1
View Patent Images:
US Patent References:
7898275Known good die using existing process infrastructureMarch, 2011Arnold et al.324/756.01
7253649Automatic mercury probe for use with a semiconductor waferAugust, 2007Chen324/754.04
7151368Insert block with pusher to push semiconductor device under testDecember, 2006Joung et al.324/757.01
D400865Holder for electronics and instrumentation enclosureNovember, 1998KorhonenD10/103



Primary Examiner:
DAVIS, ANTOINE D
Attorney, Agent or Firm:
KLEIN, O'NEILL & SINGH, LLP (IRVINE, CA, US)
Claims:
CLAIM

1. The ornamental design for a rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder, as shown.

Description:

FIG. 1 is a perspective view, taken from the top, front, and left side, of a rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder in accordance with our new design;

FIG. 2 is a perspective view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1, taken from the bottom, front, and left side;

FIG. 3 is a bottom plan view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1;

FIG. 4 is a left side elevation view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1;

FIG. 5 is a right side elevation view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1;

FIG. 6 is a top plan view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1;

FIG. 7 is a rear elevation view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1; and,

FIG. 8 is a front elevation view of the rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder shown in FIG. 1.