Title:
Microchip probe
United States Patent D614151


Inventors:
Petersen, Christian L. (Burnaby, BC, CA)
Application Number:
29/325790
Publication Date:
04/20/2010
Filing Date:
10/06/2008
Primary Class:
International Classes:
(IPC1-7): 1303
Field of Search:
361/760, 361/720, 324/754, 174/255, D14/436, D14/437, 174/253, D13/182, 324/716, 174/250, 174/752, 439/68, 29/829, 174/748
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Primary Examiner:
SIKDER, SELINA
Attorney, Agent or Firm:
KLEIN, O'NEILL & SINGH, LLP (IRVINE, CA, US)
Claims:
CLAIM

1. The ornamental design for a microchip probe, as shown.

Description:

FIG. 1 is a front elevational view of a microchip probe, in accordance with my new design;

FIG. 2 is a rear elevational view of the microchip probe of FIG. 1;

FIG. 3 is a left side elevational view of the microchip probe of FIG. 1;

FIG. 4 is a right side elevational view of the microchip probe of FIG. 1;

FIG. 5 is a top plan view of the microchip probe of FIG. 1;

FIG. 6 is a bottom plan view of the microchip probe of FIG. 1; and,

FIG. 7 is an enlarged, detailed, front elevational view of the microchip probe of FIG. 1, showing a portion of the front surface of the microchip probe.