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8913244 Methods, systems, and apparatus for end of line testing  
A testing box for testing light sources, the testing box comprising: an enclosure comprising an opening for receiving a light source; a sensor of a light property for light emitted inside the...
8629977 Traffic scanning LIDAR  
A system for determining the speed and position of objects comprises a beam source, a transmit reflection device, a beam receiver, a receive reflection device, and a controller. The beam source...
8466966 Video calibration device  
A video calibration device comprising an elongated image tube having a length, a first opening at one end of the image tube and a second opening at the opposite end of the image tube. The device...
8363101 Method and device for optically measuring external threads  
The invention relates to a method and device for optically measuring external thread profiles, particularly at the ends of pipes, wherein the thread is previously synchronously produced in a...
8310738 Scanning optical device, image forming device and jitter correction method  
A scanning optical device includes a rotating polygonal mirror having a plurality of reflecting faces. A first light source emits a first light beam from one section obtained by sectioning the...
8279454 Method of measuring a length of sections of extrados or intrados curves of an elongated workpiece, and relevant length measuring instrument  
A method of measuring a length of sections of extrados or intrados curves of an elongated workpiece travelling in a bending machine along a forwarding direction, the elongated workpiece having...
8178837 Logical CAD navigation for device characteristics evaluation system  
A navigation system for easily determining defective positions is provided. In the case of CAD navigation to defective positions, logical information for indicating defective positions is created...
7920277 Method and apparatus for irradiating laser  
A laser irradiation process includes: scanning a substrate with laser having a predetermined lasing frequency at different irradiation intensities to form a plurality of first irradiation areas...
7813537 Motion-guided segmentation for cine DENSE images  
Myocardial tissue tracking techniques are used to project or guide a single manually-defined set of myocardial contours through time. Displacement encoding with stimulated echoes (DENSE), harmonic...
7724382 Method and apparatus for irradiating laser  
A laser irradiation process includes: scanning a substrate with laser having a predetermined lasing frequency at different irradiation intensities to form a plurality of first irradiation areas...
7700916 Logical CAD navigation for device characteristics evaluation system  
A navigation system for easily determining defective positions is provided. In the case of CAD navigation to defective positions, logical information for indicating defective positions is created...
7599075 Automatic optical inspection using multiple objectives  
Apparatus and techniques for automated optical inspection (AOI) utilizing image scanning modules with multiple objectives for each camera are provided. A scanning mechanism includes optical...
7573586 Method and system for measuring a coating thickness  
A method of measuring a coating thickness involves projecting a pattern of light on a surface. A first reflection of the pattern of light is received by a first image capturing device. A second...
7499583 Optical inspection method for substrate defect detection  
A method and apparatus for inspecting the surface of articles, such as chips and wafers, for defects, includes a first phase of optically examining the complete surface of the article inspected at...
7433032 Method and apparatus for inspecting defects in multiple regions with different parameters  
In a method of inspecting defects, a first actual region of an actual object is inspected based on a first characteristic parameter as an inspection condition. A point where an inspection region...
7403872 Method and system for inspecting manufactured parts and sorting the inspected parts  
A method and system are provided for inspecting manufactured parts such as cartridges and cartridge cases and sorting the inspected parts. The system includes an illumination assembly for evenly...
7394531 Apparatus and method for automatic optical inspection  
An automated optical inspection system, comprising at least one camera having a field of view; and at least one image scanning module comprising a plurality of objective modules arranged to have...
7345271 Optoelectric sensing device with common deflection device  
The invention relates to an optoelectronic detection device, especially a laser scanner, comprising a transmitting device for transmitting preferably pulsed electromagnetic radiation, also...
7225051 Closed-loop feedback for maximizing Cpk in progressive forming operations  
A method and system for maximizing process capability in a progressive forming operation. The method compensates for deviations introduced by unformed components, and uses closed loop feedback to...
7110036 Systems and methods for identifying a lens used in a vision system  
Systems and methods for identifying an interchangeable lens in a vision system having a controllable light source, a camera, and the lens to be identified. Light provided by the light source is...
6602716 Method and device for referencing fluorescence intensity signals  
A method and device for fluorimetric determination of a biological, chemical or physical parameter of a sample utilize at least two different luminescent materials, the first of which is sensitive...
6597445 Apparatus for deciding position of seam of golf ball  
A seam position deciding apparatus (1) comprises a light source (3), a camera (5) and a computer (7). The computer (7) has operating means (for example, a CPU) and storage means (for example, an...
6480272 System and method for in-situ particle contamination measurement using shadowgrams  
A system (100) for determining particle contamination on optical surfaces (112, 114, 116) includes a detector array (118) and a non-coherent light source (110) that illuminates the detector array...
6403950 Method of producing a carrier frequency modulated signal  
A method for generating a carrier frequency-modulated signal for the evaluation of n>2 photoelectric measurement signals which are generated by imaging a structured surface onto a spatial...
6396949 Machine vision methods for image segmentation using multiple images  
Machine vision methods for segmenting an image include the steps of generating a first image of the background of an object, generating a second image of the object and background, and subtracting...
6396942 Method and apparatus for locating ball grid array packages from two-dimensional image data  
A ball grid array inspection and location method and apparatus includes a raw feature finding processor which uses a feature finding algorithm to find ball features (irrespective of number) and...
6304321 Vehicle classification and axle counting sensor system and method  
A vehicle detection and classification sensor provides accurate 3D profiling and classification of highway vehicles for speeds up to 100 mph. A scanning time-of-flight laser rangefinder is used to...
6198529 Automated inspection system for metallic surfaces  
An automated inspection system particularly adapted for detection and discrimination of surface irregularities of specularly reflecting and other materials, such as are employed in laminate chip...
6195019 Vehicle classifying apparatus and a toll system  
A class of a vehicle (VHC) is judged from distance data obtained by scanning on a lane with at least a laser beam in the longitudinal direction LD of the lane, wherein the scanning line may be...
6064483 Device for checking the position the coplanarity and the separation of terminals of components  
A device for detecting the position, coplanarity and separation of terminals of printed circuit board components wherein the terminals are consecutively imaged on a topically resolving detector...
5870187 Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing  
An automated method for aligning wafer surface scan maps and locating defects such as particle contaminant distributions on a wafer surface. More specifically, the invention is an automated method...
5864394 Surface inspection system  
A high throughput surface inspection system with enhanced detection sensitivity is described. The acquired data is processed in real time at a rate of below 50 MHz thereby reducing the cost for...
5812268 Grid array inspection system and method  
A high speed, high accuracy, three-dimensional inspection system for ball and pin grid assemblies. The system uses a three-dimensional scanner to gather data which is analyzed to yield height...
5793491 Intelligent vehicle highway system multi-lane sensor and method  
An Intelligent Vehicle Highway System (IVHS) sensor provides accurate information on real-time traffic conditions that can be used for incident detection, motorist advisories, and traffic...
5787887 Apparatus for tissue examination using bidirectional transirradiation with light  
An apparatus for examining tissue with light, for identifying inhomogeneities, such as tumors, in the tissue, bidirectionally transirradiates the tissue with light, and detects the light emerging...
5686995 Scale pattern arrangement  
A scale pattern is placed in close proximity of a measuring point whose position is to be determined in at least one dimension with the aid of a narrow measuring beam which moves in one place and...
5663799 Optical diffraction method and apparatus for integrated circuit lead inspection  
A technique for detecting damage of leads arranged in a generally parallel periodic pattern, includes the following steps: directing a coherent light beam at a plurality of adjacent leads;...
5661671 Bending angle detecting position setting device  
In bending angle detection, a linear projected light image formed on the surface of a workpiece is photographed by a photographing device; the actual inclination angle of a specimen is stored as...
5646724 Threaded parts inspection device  
An opto-electronic, threaded parts inspection device. The device includes a source for generating a thin, planar beam of collimated light which is disposed on one side of a parts carrier. The...
5641960 Circuit pattern inspecting device and method and circuit pattern arrangement suitable for the method  
A circuit pattern inspection device includes a stage on which circuit patterns to be inspected are arranged so as to be symmetrical about a center of the stage about which the stage can rotate, a...
5615013 Galvanometer and camera system  
A system combines a galvanometer system with a camera to provide information from a workpiece to the camera. The galvanometer rotates mirrors to change the image that is directed from the...
5574233 Non-contact railway wheel test apparatus and method  
The present invention provides a non-contact test apparatus and method for evaluating an as-manufactured railway wheel, which apparatus has a plurality of non-contact sensors positionable in...
5568264 Exterior view inspecting apparatus for circuit board  
The exterior view inspecting apparatus for circuit board of the invention including a sensor unit for emitting a laser beam to an object to be inspected, and detecting the displacement of the...
5565979 Surface scanning apparatus and method using crossed-cylinder optical elements  
An apparatus and method for inspecting a substrate, such as a semiconductor wafer, includes crossed cylindrical optical elements that form an elliptical beam that is caused to scan in parallel...
5489985 Apparatus for inspection of packaged printed circuit boards  
There is provided an apparatus of inspecting a packaged state by scanning a packaged printed circuit board with a fine light beam and detecting reflection beams of the fine light beam in a...
5400135 Automatic defect inspection apparatus for color filter  
An automatic defect inspection apparatus for a color filter includes a light source for radiating light onto a color filter having a spatially periodical repetitive structure of red, green, and...
5384000 Semiconductor chip mounting method and apparatus  
The three-dimensional shape of the surface of a board (12) is measured, and the parallel degree between the board (12) and a semiconductor chip (10) is adjusted on the basis of the measurement...
5329359 Parts mounting inspection method  
An inspection method for inspecting the posture of parts mounted on a circuit board. This method consists of providing a moving unit for moving a stage holding the circuit board, a light source...
5301012 Optical technique for rapid inspection of via underetch and contamination  
Sensitivity and resolution of an automated inspection system are improved and data processing loads for defect detection are reduced, increasing inspection speed, by fully illuminating an area...
5287290 Method and apparatus for checking a mask pattern  
A method and an apparatus for checking a mask pattern including a plurality of mask pattern regions formed based on different design pattern rules. The method includes the steps of: defining each...

Matches 1 - 50 out of 278 1 2 3 4 5 6 >