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US20130319090 TESTING OF SURFACE CRYSTALLINE CONTENT IN BULK AMORPHOUS ALLOY  
Provided in one embodiment is a method, comprising: forming a part comprising a bulk amorphous alloy, wherein the part comprises a sampling portion; determining a parameter related to the part by...
US20130081159 ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE  
Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a...
US20120079635 METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY  
In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain...
US20120278957 Scanning probe microscope with compact scanner  
A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head...
US20110036169 Scanning Near-Field Ultrasound Holography  
A high spatial resolution phase-sensitive technique employs a scanning near field ultrasound holography (SNFUH) methodology for imaging elastic as well as viscoelastic variations across a sample...
US20120137394 Atomic Force Microscope Manipulation of Living Cells  
Techniques for atomic force microscope manipulation of living cells include functionalizing a nanoscale tip of a microscale cantilever with a first ligand for a first receptor associated with a...
US20110283428 High frequency deflection measurement of IR absorption  
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would...
US20120137396 Characterizing Dimensions of Structures Via Scanning Probe Microscopy  
A method comprising characterizing the dimensions of structures on a semiconductor device having dimensions less than approximately 100 nanometers (nm) using one of scanning probe microscopy (SPM)...
US20090313729 SCAN TYPE PROBE MICROSCOPE AND CANTILEVER DRIVE DEVICE  
A driving laser unit (11) irradiates a laser beam on a cantilever (5) to cause thermal expansion deformation. A driving-laser control unit (13) performs feedback control for the cantilever (5) by...
US20090178165 CANTILEVER WITH PIVOTING ACTUATION  
Improved actuation device useful in direct-write nanolithography and imaging including use of a pivot point for downward deflection of a cantilever with long travel path. A device comprising at...
US20090313730 METHOD FOR COST-EFFICIENT MANUFACTURING DIAMOND TIPS FOR ULTRA-HIGH RESOLUTION ELECTRICAL MEASUREMENTS AND DEVICES OBTAINED THEREOF  
An atomic force microscopy probe configuration and a method for manufacturing the same are disclosed. In one aspect, the probe configuration includes a cantilever, and a planar tip attached to the...
US20100180356 Nanoindenter  
A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional...
US20150106979 OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PROBE SPECTROSCOPY MEASUREMENTS APPLIED IN A WIDE SPATIAL REGION WITH AN EXTENDED RANGE OF FORCE SENSITIVITY  
An optical and atomic force microscopy measurement integrated system is described. The system has an atomic force microscope having a first probe configured to interact with a sample to be...
US20140352005 TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQUID INTERFACE WITH AN ATOMIC FORCE MICROSCOPE  
A mechanism is provided for sequencing a biopolymer. The biopolymer is traversed from a first medium to a second medium. The biopolymer includes bases. As the biopolymer traverses from the first...
US20120260374 SCANNING THERMAL TWISTING ATOMIC FORCE MICROSCOPY  
Provided are atomic force microscope probes, methods for making probes for use in atomic force microscopes and systems using such probes. The probes include at least a body portion and a...
US20130111636 NON-LINEAR INTERACTION IMAGING AND SPECTROSCOPY  
This system includes non-linear interaction imaging and spectroscopy (“NIIS”) for scanning probe microscopy. Scanning probe microscopy operates with an oscillating tip and cantilever to monitor...
US20120131703 QUANTITATIVE ANALYSIS OF MRNA AND PROTEIN EXPRESSION  
Provided is a highly selective and non-destructive method and apparatus for the measurement of one or more target molecules within a target environment. The apparatus comprises of a modified AFM...
US20150067932 AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE IMAGING AND SPECTROSCOPY  
A method of using a AFM/NMR probe, the method comprising the steps of injecting a sample to be analyzed with magnetic particles, introducing a probe into proximity with the sample, the probe...
US20090071506 Debris removal in high aspect structures  
A method of debris removal is provided. The method includes positioning a nanometer-scaled tip adjacent to a piece of debris on a substrate. The method also includes adhering the piece of debris...
US20120278958 Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid  
Provided are methods and systems for high resolution imaging of a material immersed in liquid by scanning probe microscopy. The methods further relate to imaging a material submersed in liquid by...
US20120304343 AUTOMATIC GAIN TUNING IN ATOMIC FORCE MICROSCOPY  
A method for optimizing loop gain of an atomic force microscope (AFM) apparatus includes determining a change in gain of the physical system and adjusting a controller frequency response of the...
US20120182412 Inspection Instrument  
The present disclosure relates an inspection instrument adapted to increase testing throughput in a manufacturing process. In one embodiment, the inspection instrument includes a base plate and a...
US20140304863 Marking Paper Products  
Methods of marking paper products and marked paper products are provided. Some methods include irradiating the paper product to alter the functionalization of the paper.
US20120079634 TANDEM PIEZOELECTRIC ACTUATOR AND SINGLE DRIVE CIRCUIT FOR ATOMIC FORCE MICROSCOPY  
An apparatus for atomic force microscopy (AFM) comprises a first actuator configured to move a cantilever along an axis; a second actuator configured to move the cantilever along the axis; an...
US20100064395 Monolithic Comb Drive System and method for Large-Deflection Multi-Dof Microtransduction  
A scanning probe microscope includes a plate moveable in an x-axis direction, a y-axis direction, and a z-axis direction, and a probe tip coupled to the plate. A plurality of actuators cooperate...
US20110265227 PIEZOELECTRIC MICROCANTILEVERS AND USES IN ATOMIC FORCE MICROSCOPY  
The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric...
US20120036602 Video rate-enabling probes for atomic force microscopy  
Method for producing a probe for atomic force microscopy with a silicon nitride cantilever and an integrated single crystal silicon tetrahedral tip with high resonant frequencies and low spring...
US20130340126 Multiple Frequency Atomic Force Microscopy  
An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related...
US20140020141 MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING  
A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a...
US20110067150 Cantilever with paddle for operation in dual-frequency mode  
A microcantilever system comprising a paddle, its use and a method of simultaneously acquiring the topography and measuring the tip-sample interactions of a sample with it.
US20090241232 Prototyping station for atomic force microscope-assisted deposition of nanostructures  
A localized nanostructure growth apparatus that has a partitioned chamber is provided, where a first partition includes a scanning probe microscope (SPM) and a second partition includes an atomic...
US20140041084 Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
US20090205091 Array and cantilever array leveling  
Faster and better methods for leveling arrays including software and user interface for instruments. A method comprising: (i) providing at least one array of cantilevers supported by at least one...
US20130145506 Systems And Methods For Performing Microscopy At Hyperbaric Pressures  
In some embodiments, a system for performing microscopy at hyperbaric pressures includes a hyperbaric chamber that defines a sealed interior space, and an imaging system contained within the...
US20100325761 Scanning Probe Microscope and Method of Observing Sample Using the Same  
Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by...
US20100071477 Flow Velocity and Pressure Measurement Using a Vibrating Cantilever Device  
Measurement apparatus having a cantilever and a fluid flow channel, the cantilever being positioned in the channel so that it projects in a direction parallel to the direction of fluid flow. In an...
US20110126328 Methods and Apparatus for Nanolapping  
A lapping system for lapping portions of a workpiece. The lapping system includes, a lap that is defined by a surface. Portions of the surface are a lapping surface. The lapping surface has a...
US20110055986 Athermal Atomic Force Microscope Probes  
An atomic force microscopy system includes an imaging probe having a first thermal displacement constant and a sample placement surface. At least a portion of the sample placement surface has a...
US20110307980 HIGH-SPEED AND HIGH-RESOLUTION ATOMIC FORCE MICROSCOPE  
According to example embodiments, an atomic force microscope includes a probe tip, a cantilever including the probe tip, a displacement measurement device, and a movement device. A vibrating...
US20090260113 Probe Microscope Setup Method  
A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously...
US20090320167 MECHANICAL VIBRATOR AND PRODUCTION METHOD THEREFOR  
A mechanical oscillator which defines a starting point of a cantilever at a front edge of a base and can determine the length of the cantilever without depending on an alignment accuracy and an...
US20110093990 METHOD AND STRUCTURE FOR CHARACTERISING AN ATOMIC FORCE MICROSCOPY TIP  
A method for characterising an atomic force microscopy tip using a characterisation structure having two inclined sidewalls opposite one another and of which at least one actual lateral distance...
US20050030995 GaN laser element  
In a GaN-based laser device (100) having a GaN-based semiconductor stacked-layered structure including a light emitting layer (106), the semiconductor stacked-layered structure includes a ridge...
US20090293161 CANTILEVER DEVICE AND CANTILEVER CONTROLLING METHOD  
The amplitude control of a cantilever based on the van der Pol model is performed through a feedback using the measurement data on a deflection of the cantilever. A self-oscillating circuit...
US20100290992 NANOPARTICLE NUCLEIC ACID BINDING COMPOUND CONJUGATES FORMING I-MOTIFS  
The present invention concerns the field of nanoparticle bioconjugates which form an i-motif or an i-motif related structure (compositions) without or with at least one further nucleic acid...
US20080073522 Method of correcting opaque defect of chrome mask, in which atomic force microscope fine working apparatus has been used  
By mechanically removing a boundary portion between an opaque defect and a normal pattern in an atomic force microscope fine working apparatus having a probe harder than a worked material, or...
US20090070979 Vertical indent production repair  
A method of nanomachining is provided. The method includes plunging a nanometer-scaled tip into a surface of a substrate at a first location in a first direction that is substantially...
US20050277696 Novel use of cytotoxic drugs for treatment and prophylasxis of aging diseases by reversing the loss of elasticity of epithelial cells due to aging  
A method for treatment of age-related symptoms of epithelial tissues that includes the administration of an agent that disrupts F-actin polymerization in an amount effective to reduce rigidity in...
US20100175155 Measurement and Mapping of Molecular Stretching and Rupture Forces  
Detection and localization of stretching and rupture of targets (e.g., macromolecules) is achieved using time-varying tip-sample force measurements in a dynamic-mode atomic force microscope. The...
US20090133168 SCANNING PROBE MICROSCOPE  
A scanning probe microscope is provided, which can be stably used for a long time even if excitation efficiency varies during scan. A cantilever (5) is excited, and the cantilever (5) and a sample...

Matches 1 - 50 out of 112 1 2 3 >