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US20110314576 NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL  
Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning...
US20120079630 SUB-MICROSECOND-RESOLUTION PROBE MICROSCOPY  
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided...
US20120331592 Interatomic force measurements using passively drift compensated non-contact in situ calibrated atomic force microscopy - quantifying chemical bond forces between electronic orbitals by direct force measurements at subatomic lateral resolution  
Interatomic forces are measured with subatomic lateral resolution by in situ calibrated non-contact and passively thermal drift compensated atomic force microscopy in aqueous or generally...
US20150150163 Modular atomic force microscope with environmental controls  
A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and...
US20110173728 PROBE ALIGNMENT TOOL FOR THE SCANNING PROBE MICROSCOPE  
A probe alignment tool (10) for scanning probe microscopes utilizes an attached relay optics to view the scanning probe microscope probe tip (40) and align its image in the center of the field of...
US20150160259 Force Measurement with Real-Time Baseline Determination  
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time...
US20140283228 Dual-Probe Scanning Probe Microscope  
An apparatus and method of positioning a probe of an atomic force microscope (AFM) includes using a dual probe configuration in which two probes are fabricated with a single base, yet operate...
US20110107471 SCANNING PROBE MICROSCOPE HAVING SUPPORT STAGE INCORPORATING A KINEMATIC FLEXURE ARRANGEMENT  
A scanning probe microscope (SPM) has a piezoelectric actuator-based tube scanner to which a probe is attached and which is moveable in three planes by the application of a voltage to the...
US20110093987 MEMS ACTUATOR DEVICE WITH INTEGRATED TEMPERATURE SENSORS  
An electro-thermal actuator which includes a unit cell comprising at least one thermal bimorph, the thermal bimorph comprising at least two materials of different thermal expansion coefficient...
US20110055982 A SCANNING PROBE MICROSCOPE AND A MEASURING METHOD USING THE SAME  
It is difficult for a scanning probe microscope according to the conventional technology to operate a probe for scanning and positioning in a wide range and for high-precision scanning in a narrow...
US20110239336 Low Drift Scanning Probe Microscope  
A scanning probe microscope, such as an atomic force microscope, include a z-stage and a bridge structure comprised substantially free of Invar. A scanner containing a probe is mounted to the...
US20140298548 SCANNING PROBE MICROSCOPE  
A scanning probe microscope is provided for scanning a sample surface with a probe formed on a cantilever and detecting an interaction acting between the probe and the sample surface to measure a...
US20150059025 SCANNING PROBE MICROSCOPE  
A scanning probe microscope includes a stage on which a sample is mounted, a probe configured to measure a characteristic of the sample, and a controller configured to move the probe and the stage...
US20130283486 Atomic Force Microscope Manipulation of Living Cells  
Techniques for atomic force microscope manipulation of living cells include functionalizing a nanoscale tip of a microscale cantilever with a first ligand for a first receptor associated with a...
US20120137394 Atomic Force Microscope Manipulation of Living Cells  
Techniques for atomic force microscope manipulation of living cells include functionalizing a nanoscale tip of a microscale cantilever with a first ligand for a first receptor associated with a...
US20140137300 ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING  
An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then...
US20150219685 MULTIPLE PROBE ACTUATION  
A method of actuating a plurality of probes. Each probe may be made of two or more materials with different thermal expansion coefficients which are arranged such that when the probe is...
US20120079632 METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY  
Scanning hall probe microscopy is used to measure 3 components of the magnetic field vector at nanometer resolution by connecting of Hall probe to the end of the piezo scanner, then gluing of the...
US20110061139 METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY  
Scanning hall probe microscopy is used to measure 3 components of the magnetic field vector at nanometer resolution by connecting of Hall probe to the end of the piezo scanner, then gluing of the...
US20110203020 Atomic force microscopes and methods of measuring specimens using the same  
Atomic force microscopes and methods of measuring specimens using the same. An atomic force microscope may precisely measure a 3D shape of a specimen using both a short-stroke scanner and a...
US20120124706 SCANNING PROBE MICROSCOPE AND METHOD FOR DETECTING PROXIMITY OF PROBES THEREOF  
A scanning probe microscope includes: a first and second probes for scanning a sample while maintaining the distance to the sample surface; crystal oscillators holding each of the first and second...
US20120260374 SCANNING THERMAL TWISTING ATOMIC FORCE MICROSCOPY  
Provided are atomic force microscope probes, methods for making probes for use in atomic force microscopes and systems using such probes. The probes include at least a body portion and a...
US20110093988 STUD SCANNER  
A scanning device (36) is useful for scanning a body, especially a stud (10), from a bore (13) which extends through the body or stud (10) and is accessible from the outside. The scanning device...
US20150013035 PROBE ACTUATION  
A method of driving a probe of a scanning probe microscope. The intensities of first and second radiation beams are modulated; and the beams are directed simultaneously onto the probe whereby each...
US20100186132 PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE  
A probe assembly is for use in a scanning probe microscope. The probe assembly includes a carrier having a plurality of at least three substantially identical probes, each probe having a tip that...
US20100017920 SCANNING PROBE MICROSCOPE WITH TILTED SAMPLE STAGE  
A scanning probe microscope has a tilting stage on which a sample is mounted. The sample is scanned back and forth with the stage being tilted clockwise during a forward scan and counterclockwise...
US20100031402 PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPERATED BY THE SAME  
Provided is an aligning method capable of setting a sample observation unit such as an optical microscope to a probe microscope observation position at high precision. A sample having a known...
US20110154546 Thermal measurements using multiple frequency atomic force microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
US20150067929 ILLUMINATION FOR OPTICAL SCAN AND MEASUREMENT  
Optical scanning with an optical probe composed of an elongated cylinder of transparent material mounted upon an optical scanner body; one or more sources of scan illumination mounted in the probe...
US20120079631 Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
US20150219684 PHOTOTHERMAL ACTUATION OF A PROBE FOR SCANNING PROBE MICROSCOPY  
Various methods of driving a probe of a scanning probe microscope are disclosed. One set of methods distribute the energy of a radiation beam over a wide area of the probe by either scanning the...
US20120227138 DISPLACEMENT DETECTION MECHANISM AND SCANNING PROBE MIRCOSCOPE USING THE SAME  
Provided are a displacement detection mechanism for a cantilever which does not use an optical cantilever method or self-detection type displacement detection, and a scanning probe microscope...
US20140007306 APPARATUS AND METHOD FOR ANALYZING AND MODIFYING A SPECIMEN SURFACE  
The invention refers to a probe assembly for a scanning probe microscope which comprises at least one first probe-adapted for analyzing a specimen, at least one second probe adapted for modifying...
US20100180354 Three-Dimensional Nanoscale Metrology using FIRAT Probe  
In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure...
US20150026846 Variable Density Scanning  
Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning...
US20110219479 Variable Density Scanning  
Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning...
US20150047078 SCANNING PROBE MICROSCOPE COMPRISING AN ISOTHERMAL ACTUATOR  
A single-chip scanning probe microscope is disclosed, wherein the microscope includes an isothermal two-dimensional scanner and a cantilever that includes an integrated strain sensor and a probe...
US20140223612 Modular Atomic Force Microscope  
A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices...
US20110191917 Harmonic Correcting Controller for a Scanning Probe Microscope  
A scanning probe microscope and method for operating the same to correct for errors introduced by a repetitive scanning motion are disclosed. The microscope includes an actuator that moves the...
US20100175156 Three-Dimensional Imaging and Manipulation  
A three-dimensional imaging and manipulation tool is provided. Techniques for creating a three-dimensional imaging and manipulation tool include combining high-resolution capability of a probe...
US20130014295 METHOD FOR POSITIONING AN ATOMIC FORCE MICROSCOPY TIP IN A CELL  
A method for positioning a tip of an atomic force microscope relative to a intracellular target site in a cell is provided. In general terms, the method comprises: a) positioning a fluorescent tip...
US20110055981 Device for Positioning a Moveable Object of Submicron Scale  
The instant disclosure describes a device for positioning a moveable object which can be moved over a distance of the order of 1 nanometer in a time of 1 microsecond or less, comprising: a...
US20130117895 Quantitative measurements using multiple frequency atomic force microscopy  
The imaging mode presented here combines the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In...
US20150247881 Method and Apparatus to Compensate for Deflection Artifacts in an Atomic Force Microscope  
A method of compensating for an artifact in data collected using a standard atomic force microscope (AFM) operating in an oscillating mode. The artifact is caused by deflection of the probe not...
US20110093989 SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE  
A scanner device is provided which enables high-frequency scanning and can increase the speed of a scanning probe microscope. A scanner device (1) used for a scanning probe microscope includes a Z...
US20150020243 SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE  
A scanning mechanism includes a cantilever, an XY movable portion movable in X and Y directions parallel to an X-Y plane, an XY actuator to scan the XY movable portion in the X and Y directions, a...
US20120042422 VARIABLE PIXEL DENSITY IMAGING  
A method and associated apparatus for topographically characterizing a workpiece. The workpiece is scanned with a scanning probe along a first directional grid, thereby scanning a reference...
US20100218284 METHOD FOR EXAMINING A TEST SAMPLE USING A SCANNING PROBE MICRSCOPE, MEASUREMENT SYSTEM AND A MEASURING PROBE SYSTEM  
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe...
US20110302676 Method and Device for Examining a Sample with a Probe Microscope  
The invention relates to a method for examining a sample by using probe microscopy, in particular scanning probe microscopy in which a sample is examined by way of a probe microscope with a...
US20120030845 SCANNING PROBE MICROSCOPE  
An atomic force microscope (AFM) (1) is one type of SPM, and detects a resonance frequency shift as an amount of interaction between a probe and a sample. The AFM (1) performs distance modulation...

Matches 1 - 50 out of 127 1 2 3 >