Matches 1 - 50 out of 168 1 2 3 4 >


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US20120052234 ADHESIVE STRUCTURE WITH STIFF PROTRUSIONS ON ADHESIVE SURFACE  
An adhesive structure is provided comprising a surface from which extend substantially cylindrical protrusions comprising a stiff resin having a Young's modulus of greater than 17 MPa. The...
US20110314576 NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL  
Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning...
US20080121029 Cantilever with carbon nano-tube for AFM  
A cantilever having a support portion, a lever portion extended from the support portion, and a probe portion formed in the vicinity of a free end of the lever portion, in which a carbon nano-tube...
US20060156798 Carbon nanotube excitation system  
A carbon nanotube excitation system is disclosed. The excitation system is suitable to vibrate the nanotube and to excite at least one nanotube resonant frequency. Types of excitation systems...
US20090320624 Method for Preparing Specimens for Atom Probe Analysis and Specimen Assemblies Made Thereby  
A method for making a specimen assembly for atom probe analysis in an energetic-beam instrument includes milling a post near a region of interest in a sample in the energetic-beam instrument, so...
US20100064784 PROBE TIP  
To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the...
US20070089551 Cantilever probe structure for a probe card assembly  
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted...
US20090095058 WORK HANDLING MECHANISM AND WORK INSPECTION SYSTEM  
In the present invention, through a provision of a relay stand including a first relaying point, a second relaying point and a plurality of work mounting bases, a discharge/feed process of works...
US20110197665 SURFACE TEXTURE MEASURING DEVICE  
A surface texture measuring device includes a threshold value storage module configured to store a threshold input through an operation key, a stylus move distance detector configured to detect a...
US20130000394 SUBSTRATE MIMICKING INTERCELLULAR LIPIDS IN STRATUM CORNEUM AND METHOD OF EVALUATING SKIN ROUGHENING USING THE SAME  
A substrate mimicking intercellular lipids in stratum corneum consisting of a substrate and a lipid membrane formed on the substrate, wherein the lipid membrane is formed from ceramide, palmitic...
US20070214875 Cantilever and cantilever manufacturing method  
A cantilever includes: a lever portion; a holder portion supporting the proximal end of the lever portion; a probe portion arranged at the distal end of the lever portion and having a spherical...
US20080262751 Curvature-based edge bump quantification  
Evaluating irregularities in surfaces of objects such as semiconductor wafers using a thickness profile of a surface section and analyzing the profile to obtain information of an irregularity...
US20110041593 MATERIAL MEASURES FOR USE IN EVALUATING PERFORMANCE OF MEASURING INSTRUMENT FOR MEASURING SURFACE TEXTURE  
A material measure for use in evaluating the performance of a measuring instrument for measuring surface texture includes: a measurement area having a plurality of grooves in a predetermined...
US20080078239 SEMICONDUCTOR PROBE HAVING WEDGE SHAPE RESISTIVE TIP AND METHOD OF FABRICATING THE SAME  
A semiconductor probe having a wedge shape resistive tip and a method of fabricating the semiconductor probe is provided. The semiconductor probe includes a resistive tip that is doped with a...
US20130239668 SURFACE TEXTURE MEASURING MACHINE AND A SURFACE TEXTURE MEASURING METHOD  
A surface texture measuring method includes: moving a stylus toward an origin point; and, when the stylus reaches the origin point, braking the stylus to be stopped after overrunning the origin...
US20090000362 Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer  
A nanotweezer (1) according to the present invention includes: a supporting member (25); an observation probe (10) that projects out from the supporting member (25), and is used when observing a...
US20050033499 Method and a computer readable storage device for estimating tire-to-road friction  
The invention relates to a method for estimating road-to-tire friction between tires of a wheeled vehicle and a road surface, which vehicle is provided with a collision avoidance system. The...
US20090000365 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope  
AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises...
US20070039380 Device for measuring hydralic roughness of the internal surface of a pipeline  
The device 1 for determining the hydraulic roughness of the internal surface of a pipe 2 has a trolley 4 with wheels 3. Drum 5 is mounted to be rotationally movable on trolley 4. The roughness is...
US20060042364 Angled tip for a scanning force microscope  
A microscope probe includes a cantilever having a carbon nanostructure attached thereto at a distally oriented angle. A method of making the microscope probe can include the steps of: providing a...
US20080011065 THERMAL MECHANICAL DRIVE ACTUATOR, THERMAL PROBE AND METHOD OF THERMALLY DRIVING A PROBE  
A drive actuator for a measurement instrument having a probe, the drive actuator including a heating element in a thermally conductive relationship with the probe such that application of electric...
US20120227476 SURFACE TEXTURE MEASURING APPARATUS  
A surface texture measuring apparatus includes a stylus displacement detector having a measurement arm which is able to swing, a pair of styli provided at a tip of the measurement arm, and a...
US20090249867 Displacement Detector  
A displacement detector capable of making a measurement in two directions of measurement 180 degrees different from each other without the need of a switching operation has been disclosed. This...
US20080121030 Roughness scanner  
In a roughness scanner comprising a scanning arm with a scanning needle mounted at one end thereof, a skid carrier having an end supporting a skid with the scanning arm extending along the skid...
US20110283784 METHOD FOR DETERMINING A TWIST STRUCTURE  
Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part includes that multiple sampling segments which extend in the axial direction...
US20050236566 Scanning probe microscope probe with integrated capillary channel  
A scanning probe microscope probe is disclosed. The scanning probe microscope probe includes a handle and a cantilever shank connected with the handle. The cantilever shank has at one end a base...
US20060136111 Rough road detection  
A rough road detection system for a vehicle comprises a first acceleration sensor that measures vertical acceleration of a component of the vehicle. An adaptive acceleration limits module...
US20130312502 METHOD FOR ESTIMATING A ROUGHNESS OF A SURFACE  
A method for estimating a roughness R of a surface, including the following steps: relative movement of a force sensor against the surface and in a direction of movement roughly parallel to the...
US20110061452 Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer  
Described herein are devices and methods for sensing pulsed forces. Some of the described devices and methods are also useful for measuring infrared absorbances and compiling spectral and chemical...
US20100058846 Signal Coupling System For Scanning Microwave Microscope  
A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal...
US20080216565 PROBE TIPS  
Probe tips comprising tips and coatings are described. The tips and coatings may be selected to provide various probe-tip features, including, but not limited to, high reproducibility, high...
US20070180889 Probe replacement method for scanning probe microscope  
A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe (20), and a measurement unit for measuring a physical...
US20060260388 PROBE AND METHOD FOR A SCANNING PROBE MICROSCOPE  
A measurement instrument probe has an outwardly extending sensing lever having at least two sections, one section that, at least during operation, has a different effective spring constant than an...
US20080282819 PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE  
A probe assembly for an instrument and a method of manufacture includes a substrate and a cantilever having a length that is independent of typical alignment error during fabrication. In one...
US20110016956 Surface texture measuring instrument  
A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that...
US20110005307 Surface texture measuring instrument  
A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that...
US20080209988 CANTILEVERS WITH INTEGRATED ACTUATORS FOR PROBE MICROSCOPY  
An atomic force microscopy sensor includes a substrate, a cantilever beam and an electrostatic actuator. The cantilever beam has a proximal end and an opposite distal end. The proximal end is in a...
US20050038589 Method for estimating a friction coefficient  
A method and a system for estimating a friction coefficient between a driven wheel and a surface. The method uses a Fourier series to calculate the friction coefficient. More specifically, a...
US20070271996 Cantilever Assembly  
A cantilever assembly (1) comprises a cantilever (10) having a cantilever tip (11). The cantilever is mounted to a rigid support (12,120,121) and is provided on its back side with an area (110) of...
US20090038382 PROBE AND CANTILEVER  
[Object of the Invention] To provide a probe 1 for use in a cantilever 2 of an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full use...
US20080266575 Hybrid Contact Mode Scanning Cantilever System  
This invention addresses a contact mode hybrid scanning system (HSS), which can be used for measuring topography. The system consists of a cantilever or a cantilever array, a scanning stage, a...
US20090107222 Scanning Probe Microscope with Improved Scanning Speed  
A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electro-mechanical actuator, and a controller. The probe has a tip that...
US20080190182 AFM PROBE WITH VARIABLE STIFFNESS  
Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having...
US20080000293 Spm Cantilever and Manufacturing Method Thereof  
An SPM cantilever of the present invention including: a support portion (1) fabricated by processing a single crystal silicon wafer; a lever portion (2) formed in a manner extended from the...
US20080295585 Tweezer-Equipped Scanning Probe Microscope and Transfer Method  
A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an...
US20060243035 Surface roughness/contour profile measuring instrument  
A surface roughness/contour profile measuring instrument capable of automatic movement of a pickup to a measurement position has been disclosed. The surface roughness/contour profile measuring...
US20080223120 Higher Harmonics Atomic Force Microscope  
The invention concerns a microscopic system with atomic force, comprising a probe tip placed on one end of a lever arm (2), oscillating means (1) a to oscillate said probe tip substantially based...
US20080295571 ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM MEASURING MECHANISM  
A form measuring mechanism 100 which measures a form of an object 102 to be measured by bringing a probe 124 into direct contact with the object 102, includes a plurality of reference spheres 130a...
US20120279287 Transferable Probe Tips  
Transferable probe tips including a metallic probe, a delamination layer covering a portion of the metallic probe, and a bonding alloy, wherein the bonding alloy contacts the metallic probe at a...
US20090242764 SPIN-TORQUE PROBE MICROSCOPE  
A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the...

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