Matches 1 - 44 out of 44


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US20130046498 MULTI-TESTING PROCEDURE MANAGEMENT METHOD AND SYSTEM  
A multi-testing procedure management method tests on a testing platform a plurality of function units of a plurality of devices under testing (DUTs) by a test schedule management list enumerating...
US20130304408 Measurement Recipe Optimization Based On Spectral Sensitivity And Process Variation  
An optimized measurement recipe is determined by reducing the set of measurement technologies and ranges of machine parameters required to achieve a satisfactory measurement result. The reduction...
US20150112625 TESTING APPARATUS AND METHOD FOR TESTING PRODUCT  
A testing apparatus and a method for testing products are provided. The method includes the following steps. First, a first testing procedure is performed to at least one product to be tested in...
US20120208301 Methods and Systems for Creating or Performing a Dynamic Sampling Scheme for a Process During Which Measurements Are Performed on Wafers  
Various methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers are provided. One method for creating a dynamic...
US20110231131 FORGED SEAL IMPRINT INSPECTION METHOD AND RECORDING MEDIUM  
Disclosed herein is a forged seal imprint checking method which includes a step ST-101 of generating a reference seal imprint from a genuine seal (ST-110) and a step ST-121 of comparing a compared...
US20110320149 Selecting One or More Parameters for Inspection of a Wafer  
Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided.
US20140324374 EXTRACTING ATTRIBUTE FAIL RATES FROM CONVOLUTED SYSTEMS  
A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set...
US20150081240 SYSTEM AND METHOD FOR GENERATING A TEST FILE  
A test system for generating a test file includes an information obtaining module, a file header generation module, an identification module, and a measuring module. The information obtaining...
US20110202298 METHOD AND SYSTEM FOR PROVIDING PROCESS TOOL CORRECTABLES USING AN OPTIMIZED SAMPLING SCHEME WITH SMART INTERPOLATION  
The present invention may include performing a first measurement on a wafer of a first lot of wafers via an omniscient sampling process, calculating a first set of process tool correctables...
US20090192743 SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATUS, AND COMPUTER READABLE MEDIUM STORING SAMPLING INSPECTION ESTIMATING PROGRAM  
A sampling inspection estimating method comprises determining an acceptable range of a measured value and an acceptable range of a acceptance probability, determining a first sampling plan to be...
US20080231853 Qualitative Analysis System and Method for Agricultural Products in Harvesting Equipment  
A system for the qualitative analysis of an agricultural product comprises a scanning cell (1) for the transmittance of a sample of an agricultural product, means for the emission of a quantity of...
US20070174012 Method Of Determining Photomask Inspection Capabilities  
A method of and article for determining photomask inspection capabilities. The article comprises a photomask having a first array of a plurality of test pattern shapes that include ordered...
US20120253723 SYSTEM AND METHOD FOR PRODUCING STATISTICALLY VALID ASSAY MEANS AND RANGES FOR QUALITY CONTROL MATERIALS  
A method of establishing statistically valid assay means and ranges for quality control materials, used to qualify medical testing machines, utilizes tests on a new lot of quality control material...
US20080133162 Process Control System to Manage Materials Used in Construction  
Systems and methods are disclosed for designing and tracking construction material usage by estimating volumetric properties for one or more mix designs; determining an optimum mix based on...
US20110071783 Verification and modification method of rules of do-not-inspect regions, computer program, and apparatus for such verification and modification  
The verification method of do-not-inspect region rules includes: an information storage process which includes storing information of a plurality of do-not-inspect regions which specifies each of...
US20070203660 Systems and related methods for managing data corresponding to environmental inspections, and for dynamically generating an inspection report  
A system is provided for easily and efficiently managing a compliance monitoring process and for dynamically generating an inspection report. The system includes a database that contains data that...
US20120185194 SUBSTRATE INSPECTION SYSTEM  
An inspection item recognition unit references a component type table and recognizes inspection items necessary for specified components, an inspection means selection unit references an...
US20090228228 Photomask Image Inspection  
A method optimizes photomask inspection. After masks are manufactured, the method predicts the likelihood that the masks will be defect free based on defect criteria, etch area, etch mode, and...
US20100211202 METHOD AND MACHINE FOR EXAMINING WAFERS  
Method and machine utilizes the real-time recipe to examine a series of wafers during the fabrication of integrated circuits. Each real-time recipe essentially corresponds to a practical...
US20050246214 Method/process for monitoring the progress of six sigma projects during implementation  
Six Sigma is practiced as a methodology of process improvement to achieve business excellence by Companies all over the world today. The inventor Mr. Mahesh Chinnagiri addresses the present...
US20130018618 METHOD AND SYSTEM FOR AUTOMATED QUALITY CONTROL PLATFORM  
A method and system for performing automated quality control analysis of a plurality of radiopharmaceuticals are provided. The method includes uniquely identifying each of the plurality of...
US20080147344 Physimetric property identification of physical object for process control  
The present invention relates to a method of automated process control operation wherein a physical object is directed into a read zone, information stored on an ID Container attached to the...
US20120123717 ELECTRONIC DEVICE AND METHOD OF OPTIMIZING MEASUREMENT PATHS  
A method of optimizing measurement paths computes a minimum bounding box for the measurement elements on a product, and computes a capturing range of a lens of a measurement machine. The method...
US20120004879 CHARGED PARTICLE APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE INSPECTION METHOD  
An object of the invention is to be able to select easily and quickly inspection recipes which are appropriate to samples from any number of inspection recipes. A calculating device displays a...
US20100076584 SAMPLING INSPECTION METHOD  
A sampling inspection method is provided. The sampling inspection method is adapted for a multi-product production line including a plurality of tools. The sampling inspection method includes the...
US20070208523 Device and Method for Determining the Quality of Illustrations of Printing Plates  
A device and a method for determining the quality of imaging of printing plates by means of, in particular, an optoelectronic sensor for detecting a reference mark that is disposed inside or...
US20100169036 METHODS AND SYSTEMS TO ALIGN WAFER SIGNATURES  
One embodiment relates to a computer method for aligning wafers processed in a semiconductor fabrication facility. In the method, a first arrangement of dies having a common functionality level is...
US20140011306 INSPECTING METHOD AND INSPECTING EQUIPMENT  
An inspecting method and an inspecting equipment including a dividing unit, a determining unit, a transferring unit and an inspecting unit for inspecting a disk are provided. The inspecting method...
US20100288323 Thermoelectric evaluation and manufacturing methods  
A means for determining the electrical resistance and resistivity of thermoelectric material allows quality control at all steps in the construction of a bismuth telluride and antimony telluride...
US20090315151 Method for testing group III-nitride wafers and group III-nitride wafers with test data  
The present invention discloses a new testing method of group III-nitride wafers. By utilizing the ammonothermal method, GaN or other Group III-nitride wafers can be obtained by slicing the bulk...
US20110172941 SCREENING APPARATUS, SCREENING METHOD, AND PROGRAM  
A screening apparatus includes: a measurement unit measuring characteristics of a semiconductor device and reading an identification code allocated to the semiconductor device; a database storing...
US20100250172 SYSTEM AND METHOD FOR IMPLEMENTING WAFER ACCEPTANCE TEST ("WAT") ADVANCED PROCESS CONTROL ("APC") WITH ROUTING MODEL  
System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing an inter-metal (“IM”) WAT on a...
US20100250174 SAMPLE INSPECTION SYSTEM AND OPERATING METHOD FOR MANAGEMENT SERVER THEREOF  
A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a...
US20090082983 Method and Apparatus for Creating a Spacer-Optimization (S-O) Library  
The invention can provide a method of processing a substrate using S-O processing sequences and evaluation libraries that can include one or more optimized spacer creation and evaluation procedures.
US20080286885 METHODS AND SYSTEMS FOR CREATING OR PERFORMING A DYNAMIC SAMPLING SCHEME FOR A PROCESS DURING WHICH MEASUREMENTS ARE PERFORMED ON WAFERS  
Various methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers are provided. One method for creating a dynamic...
US20090306922 Method and System for Classifying Defect Distribution, Method and System for Specifying Causative Equipment, Computer Program and Recording Medium  
A production line includes an inspection step for acquiring inspection information representing positions of defects on each of substrates after an end of specified steps. With respect to m...
US20120310576 MANUFACTURE OF ENGINEERING COMPONENTS WITH DESIGNED DEFECTS FOR ANALYSIS OF PRODUCTION COMPONENTS  
An engineering component with a designed defect and use of an engineering component with a designed defect to evaluate a production component are disclosed. A test component having a known defect...
US20140180618 TEST DEVICE FOR TESTING STARTUP FUNCTION OF ELECTRONIC DEVICE  
A test device for testing an electronic device, includes an alternating current (AC) input port used to connect to an AC power source. An AC output port used to connect to a power port of the...
US20130245806 AUTOMATED HYBRID METROLOGY FOR SEMICONDUCTOR DEVICE FABRICATION  
Methods and systems are provided for fabricating and measuring features of a semiconductor device structure. An exemplary method of fabricating a semiconductor device structure involves...
US20100106447 DEFECT ANALYZING APPARATUS AND DEFECT ANALYZING METHOD  
A defect analyzing apparatus capable of acquiring standard data easily and a defect analyzing method are provided. The defect analyzing apparatus includes: a storage section storing data including...
US20050114058 Method for analyzing inspected data, apparatus and its program  
An inspected data analysis method, apparatus, and program for analyzing inspected data using an information processing unit. The program embodies the method, and, when it is run, causes the...
US20160334778 METHOD AND SYSTEM FOR INTEGRATED MANUFACTURING PRODUCTION QUALITY INSPECTIONS  
A system and computer-implemented method comprising receiving at a memory device a manufacturing process plan having a plurality of operating steps including data from a bill of specification...
US20160147220 RELIABILITY MONITOR TEST STRATEGY DEFINITION  
In an approach to determining reliability test strategy, one or more computer processors receive a volume forecast for manufacturing one or more products. The one or more computer processors...
US20160018818 IN-SITU MONITORING OF FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS  
Techniques include receiving a design of an integrated computational element (ICE), the ICE design including specification of a substrate and a plurality of layers, their respective target...

Matches 1 - 44 out of 44