|
Match
|
Document |
Document Title |
|
|
US20130046498 |
MULTI-TESTING PROCEDURE MANAGEMENT METHOD AND SYSTEM
A multi-testing procedure management method tests on a testing platform a plurality of function units of a plurality of devices under testing (DUTs) by a test schedule management list enumerating... |
|
|
US20130304408 |
Measurement Recipe Optimization Based On Spectral Sensitivity And Process Variation
An optimized measurement recipe is determined by reducing the set of measurement technologies and ranges of machine parameters required to achieve a satisfactory measurement result. The reduction... |
|
|
US20150112625 |
TESTING APPARATUS AND METHOD FOR TESTING PRODUCT
A testing apparatus and a method for testing products are provided. The method includes the following steps. First, a first testing procedure is performed to at least one product to be tested in... |
|
|
US20120208301 |
Methods and Systems for Creating or Performing a Dynamic Sampling Scheme for a Process During Which Measurements Are Performed on Wafers
Various methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers are provided. One method for creating a dynamic... |
|
|
US20110231131 |
FORGED SEAL IMPRINT INSPECTION METHOD AND RECORDING MEDIUM
Disclosed herein is a forged seal imprint checking method which includes a step ST-101 of generating a reference seal imprint from a genuine seal (ST-110) and a step ST-121 of comparing a compared... |
|
|
US20110320149 |
Selecting One or More Parameters for Inspection of a Wafer
Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided. |
|
|
US20140324374 |
EXTRACTING ATTRIBUTE FAIL RATES FROM CONVOLUTED SYSTEMS
A method, system or computer usable program product for extracting attribute fail rates for manufactured devices including testing manufactured devices having a set of attributes to provide a set... |
|
|
US20150081240 |
SYSTEM AND METHOD FOR GENERATING A TEST FILE
A test system for generating a test file includes an information obtaining module, a file header generation module, an identification module, and a measuring module. The information obtaining... |
|
|
US20110202298 |
METHOD AND SYSTEM FOR PROVIDING PROCESS TOOL CORRECTABLES USING AN OPTIMIZED SAMPLING SCHEME WITH SMART INTERPOLATION
The present invention may include performing a first measurement on a wafer of a first lot of wafers via an omniscient sampling process, calculating a first set of process tool correctables... |
|
|
US20090192743 |
SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATUS, AND COMPUTER READABLE MEDIUM STORING SAMPLING INSPECTION ESTIMATING PROGRAM
A sampling inspection estimating method comprises determining an acceptable range of a measured value and an acceptable range of a acceptance probability, determining a first sampling plan to be... |
|
|
US20080231853 |
Qualitative Analysis System and Method for Agricultural Products in Harvesting Equipment
A system for the qualitative analysis of an agricultural product comprises a scanning cell (1) for the transmittance of a sample of an agricultural product, means for the emission of a quantity of... |
|
|
US20070174012 |
Method Of Determining Photomask Inspection Capabilities
A method of and article for determining photomask inspection capabilities. The article comprises a photomask having a first array of a plurality of test pattern shapes that include ordered... |
|
|
US20120253723 |
SYSTEM AND METHOD FOR PRODUCING STATISTICALLY VALID ASSAY MEANS AND RANGES FOR QUALITY CONTROL MATERIALS
A method of establishing statistically valid assay means and ranges for quality control materials, used to qualify medical testing machines, utilizes tests on a new lot of quality control material... |
|
|
US20080133162 |
Process Control System to Manage Materials Used in Construction
Systems and methods are disclosed for designing and tracking construction material usage by estimating volumetric properties for one or more mix designs; determining an optimum mix based on... |
|
|
US20110071783 |
Verification and modification method of rules of do-not-inspect regions, computer program, and apparatus for such verification and modification
The verification method of do-not-inspect region rules includes: an information storage process which includes storing information of a plurality of do-not-inspect regions which specifies each of... |
|
|
US20070203660 |
Systems and related methods for managing data corresponding to environmental inspections, and for dynamically generating an inspection report
A system is provided for easily and efficiently managing a compliance monitoring process and for dynamically generating an inspection report. The system includes a database that contains data that... |
|
|
US20120185194 |
SUBSTRATE INSPECTION SYSTEM
An inspection item recognition unit references a component type table and recognizes inspection items necessary for specified components, an inspection means selection unit references an... |
|
|
US20090228228 |
Photomask Image Inspection
A method optimizes photomask inspection. After masks are manufactured, the method predicts the likelihood that the masks will be defect free based on defect criteria, etch area, etch mode, and... |
|
|
US20100211202 |
METHOD AND MACHINE FOR EXAMINING WAFERS
Method and machine utilizes the real-time recipe to examine a series of wafers during the fabrication of integrated circuits. Each real-time recipe essentially corresponds to a practical... |
|
|
US20050246214 |
Method/process for monitoring the progress of six sigma projects during implementation
Six Sigma is practiced as a methodology of process improvement to achieve business excellence by Companies all over the world today. The inventor Mr. Mahesh Chinnagiri addresses the present... |
|
|
US20130018618 |
METHOD AND SYSTEM FOR AUTOMATED QUALITY CONTROL PLATFORM
A method and system for performing automated quality control analysis of a plurality of radiopharmaceuticals are provided. The method includes uniquely identifying each of the plurality of... |
|
|
US20080147344 |
Physimetric property identification of physical object for process control
The present invention relates to a method of automated process control operation wherein a physical object is directed into a read zone, information stored on an ID Container attached to the... |
|
|
US20120123717 |
ELECTRONIC DEVICE AND METHOD OF OPTIMIZING MEASUREMENT PATHS
A method of optimizing measurement paths computes a minimum bounding box for the measurement elements on a product, and computes a capturing range of a lens of a measurement machine. The method... |
|
|
US20120004879 |
CHARGED PARTICLE APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE INSPECTION METHOD
An object of the invention is to be able to select easily and quickly inspection recipes which are appropriate to samples from any number of inspection recipes. A calculating device displays a... |
|
|
US20100076584 |
SAMPLING INSPECTION METHOD
A sampling inspection method is provided. The sampling inspection method is adapted for a multi-product production line including a plurality of tools. The sampling inspection method includes the... |
|
|
US20070208523 |
Device and Method for Determining the Quality of Illustrations of Printing Plates
A device and a method for determining the quality of imaging of printing plates by means of, in particular, an optoelectronic sensor for detecting a reference mark that is disposed inside or... |
|
|
US20100169036 |
METHODS AND SYSTEMS TO ALIGN WAFER SIGNATURES
One embodiment relates to a computer method for aligning wafers processed in a semiconductor fabrication facility. In the method, a first arrangement of dies having a common functionality level is... |
|
|
US20140011306 |
INSPECTING METHOD AND INSPECTING EQUIPMENT
An inspecting method and an inspecting equipment including a dividing unit, a determining unit, a transferring unit and an inspecting unit for inspecting a disk are provided. The inspecting method... |
|
|
US20100288323 |
Thermoelectric evaluation and manufacturing methods
A means for determining the electrical resistance and resistivity of thermoelectric material allows quality control at all steps in the construction of a bismuth telluride and antimony telluride... |
|
|
US20090315151 |
Method for testing group III-nitride wafers and group III-nitride wafers with test data
The present invention discloses a new testing method of group III-nitride wafers. By utilizing the ammonothermal method, GaN or other Group III-nitride wafers can be obtained by slicing the bulk... |
|
|
US20110172941 |
SCREENING APPARATUS, SCREENING METHOD, AND PROGRAM
A screening apparatus includes: a measurement unit measuring characteristics of a semiconductor device and reading an identification code allocated to the semiconductor device; a database storing... |
|
|
US20100250172 |
SYSTEM AND METHOD FOR IMPLEMENTING WAFER ACCEPTANCE TEST ("WAT") ADVANCED PROCESS CONTROL ("APC") WITH ROUTING MODEL
System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) are described. In one embodiment, the method comprises performing an inter-metal (“IM”) WAT on a... |
|
|
US20100250174 |
SAMPLE INSPECTION SYSTEM AND OPERATING METHOD FOR MANAGEMENT SERVER THEREOF
A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a... |
|
|
US20090082983 |
Method and Apparatus for Creating a Spacer-Optimization (S-O) Library
The invention can provide a method of processing a substrate using S-O processing sequences and evaluation libraries that can include one or more optimized spacer creation and evaluation procedures. |
|
|
US20080286885 |
METHODS AND SYSTEMS FOR CREATING OR PERFORMING A DYNAMIC SAMPLING SCHEME FOR A PROCESS DURING WHICH MEASUREMENTS ARE PERFORMED ON WAFERS
Various methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers are provided. One method for creating a dynamic... |
|
|
US20090306922 |
Method and System for Classifying Defect Distribution, Method and System for Specifying Causative Equipment, Computer Program and Recording Medium
A production line includes an inspection step for acquiring inspection information representing positions of defects on each of substrates after an end of specified steps. With respect to m... |
|
|
US20120310576 |
MANUFACTURE OF ENGINEERING COMPONENTS WITH DESIGNED DEFECTS FOR ANALYSIS OF PRODUCTION COMPONENTS
An engineering component with a designed defect and use of an engineering component with a designed defect to evaluate a production component are disclosed. A test component having a known defect... |
|
|
US20140180618 |
TEST DEVICE FOR TESTING STARTUP FUNCTION OF ELECTRONIC DEVICE
A test device for testing an electronic device, includes an alternating current (AC) input port used to connect to an AC power source. An AC output port used to connect to a power port of the... |
|
|
US20130245806 |
AUTOMATED HYBRID METROLOGY FOR SEMICONDUCTOR DEVICE FABRICATION
Methods and systems are provided for fabricating and measuring features of a semiconductor device structure. An exemplary method of fabricating a semiconductor device structure involves... |
|
|
US20100106447 |
DEFECT ANALYZING APPARATUS AND DEFECT ANALYZING METHOD
A defect analyzing apparatus capable of acquiring standard data easily and a defect analyzing method are provided. The defect analyzing apparatus includes: a storage section storing data including... |
|
|
US20050114058 |
Method for analyzing inspected data, apparatus and its program
An inspected data analysis method, apparatus, and program for analyzing inspected data using an information processing unit. The program embodies the method, and, when it is run, causes the... |
|
|
US20160334778 |
METHOD AND SYSTEM FOR INTEGRATED MANUFACTURING PRODUCTION QUALITY INSPECTIONS
A system and computer-implemented method comprising receiving at a memory device a manufacturing process plan having a plurality of operating steps including data from a bill of specification... |
|
|
US20160147220 |
RELIABILITY MONITOR TEST STRATEGY DEFINITION
In an approach to determining reliability test strategy, one or more computer processors receive a volume forecast for manufacturing one or more products. The one or more computer processors... |
|
|
US20160018818 |
IN-SITU MONITORING OF FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS
Techniques include receiving a design of an integrated computational element (ICE), the ICE design including specification of a substrate and a plurality of layers, their respective target... |