Matches 1 - 50 out of 142 1 2 3 >


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US20120059614 APPARATUS, METHOD AND PROGRAM FOR DESIGN VALIDITY VERIFICATION OF ELECTRONIC CIRCUIT BOARD WITH REGARD TO POWER SUPPLY NOISE SUPPRESSION  
Disclosed is a method for design validity verification of an electronic circuit board with regard to power supply noise, wherein with regard to an i-th LSI (i=1 to n) on the electronic circuit...
US20090265127 PREFERENTIAL DEFECT MARKING ON A WEB  
A system for preferentially marking defects on a web is described. The system includes a web of material to be converted into individual sheets of a plurality of different grade levels, a database...
US20110231130 TESTING APPARATUS AND METHOD FOR TESTING LIGHT EMITTING DIODE LAMP  
Disclosed is an apparatus for testing an LED lamp which includes: a secured seat on which the LED lamp is seated; an up and down shifter which, when the LED lamp is seated on the secured seat,...
US20130158925 COMPUTING DEVICE AND METHOD FOR CHECKING DIFFERENTIAL PAIR  
A computer-based method and a computing device for checking differential pairs of a printed circuit board layout are provided. The computing device determines the via pitch between switching vias...
US20130197842 STREAMLINED PARTS APPROVAL PROCESS  
A method for streamlining a production parts approval process is disclosed. The method includes receiving a master file. The master file includes nominals and tolerances of a production part for a...
US20120158319 UTILIZING RESONANCE INSPECTION OF IN-SERVICE PARTS  
Various embodiments relating to resonance inspections and in-service parts are disclosed. One protocol (150) includes conducting a resonance inspection of an in-service part (152). The frequency...
US20110093226 FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST PARAMETERS  
A fault detection and classification (FDC) method for wafer acceptance test (WAT) parameters includes the following steps. A plurality of fault detection and classification parameters is...
US20140309957 Multi-Phone Programming Application  
Automated provisioning of radiotelephone handsets 20 at a fulfillment center and automated quality assurance uses a computer database of specifications 16 for authentication and activation from...
US20140303921 DYNAMIC DESIGN ATTRIBUTES FOR WAFER INSPECTION  
Methods and systems for dynamic design attributes for wafer inspection are provided. One method includes, at run time of a wafer inspection recipe, prompting a user of a wafer inspection tool on...
US20120265467 SYSTEM FOR TESTING ILLUMINATING ELEMENTS AND METHOD FOR TESTING ILLUMINATING ELEMENTS  
The present invention discloses a system for testing illuminating elements and a method for testing illuminating elements, wherein the method includes the following steps. Firstly, an illuminating...
US20140122005 SYSTEM AND METHOD FOR GENERATING A YIELD FORECAST BASED ON WAFER ACCEPTANCE TESTS  
A wafer acceptance test (WAT) system and method that, in one embodiment, includes: (1) a saturation current WAT subsystem operable to generate a weighted standard deviation based on target NMOS...
US20100204940 METHOD AND SYSTEM OF COMMONALITY ANALYSIS FOR LOTS WITH SCRAPPED WAFER  
According to an embodiment of the present invention is to provide methods to evaluate the impact of scrapped wafers on the remaining wafers in a lot by using scrap codes and statistical models. An...
US20090248324 FIRE HOSE TESTING APPARATUS AND METHOD  
A method for testing a plurality of fire hoses having respective service test pressures and the test apparatus therefor wherein each hose is required to maintain a test pressure for a specified...
US20110184682 TERMINAL INSERTION DEFECT DETERMINING METHOD  
A terminal insertion defect determining method includes a step of determining the defect state by judging whether the preset condition is satisfied or not in an insulation-displacement period...
US20080228420 Web Marking Systems and Methods  
Apparatus for and a method of marking a web 10 advancing along a path includes a monitoring station 11 at which the web 10 is observed and including a signal generator arranged to produce an...
US20100028567 GLASS SHEET DEFECT DETECTION DEVICE, GLASS SHEET MANUFACTURING METHOD, GLASS SHEET, GLASS SHEET QUALITY JUDGING DEVICE, AND GLASS SHEET INSPECTION METHOD  
A glass sheet defect detection device includes a light source and a light reception device which are placed at opposed positions so as to sandwich a glass sheet. The glass sheet has...
US20090306921 SPECIFICATION, OPTIMIZATION AND MATCHING OF OPTICAL SYSTEMS BY USE OF ORIENTATIONAL ZERNIKE POLYNOMIALS  
The present disclosure relates to specification, optimization and matching of optical systems by use of orientation Zernike polynomials. In some embodiments, a method for assessing the suitability...
US20080195342 OPTICAL METROLOGY MODEL OPTIMIZATION FOR REPETITIVE STRUCTURES  
An optical metrology model for a repetitive structure is optimized by selecting one or more profile parameters using one or more selection criteria. One or more termination criteria are set, the...
US20090055116 Method For Inspecting Appearance Of Pellet Type Medicines And System Employing Thereof  
A method for inspecting appearance of pellet type medicines and a system employing thereof are provided, in which after the pellet type medicines are arranged into a row, they are sequentially...
US20070276618 Method for Supporting Dietary Habits, a System and a Computer Program Therefor  
The object of the invention is a method for supporting dietary habits and a system and a computer program therefore. The invention enables to develop the healthy and reasonable nutrition habits...
US20110202297 PRODUCT SORTING METHOD BASED ON QUANTITATIVE EVALUATION OF POTENTIAL FAILURE  
Provided is a product sorting method based on the quantitative evaluation of a potential failure. The product sorting method manufactures a plurality of independent products with a manufacture...
US20120310575 Inspection Method for Pixel Array and Inspection Apparatus Thereof  
The present invention provides an inspection method for a pixel array and an inspection apparatus thereof. The inspection method firstly charges a sample pixel area containing a flawed pixel unit...
US20060271393 Computer system for efficient design and manufacture of multiple component devices  
Embodiments of the disclosed computer systems provide rapid design of multiple component products, especially medical products, as well as determination of manufacturing costs, pricing, physical...
US20080243411 Method for monitoring the optical transmissibility through an observation window and device for cleaning an observation window  
The invention relates to a method and a device for monitoring the optical transmissibility of an observation window (2) for the spectroscopic analysis of the homogeneity of a mixture material in a...
US20130054170 TEST SYSTEMS WITH NETWORK-BASED TEST STATION CONFIGURATION  
A test system for testing a device under test (DUT) is provided. The test system may include multiple test stations that are coupled to a network server. A master test station configuration file...
US20120271581 PROCESS MONITORING FOR HIGH-SPEED JOINING  
A process monitoring method for a joining operation of a joining element at a speed of at least 5 m/s, in particular placing a bolt at least 10 m/s into at least one component with the aid of a...
US20140249767 REJECT BIN INTERLOCK SYSTEM AND METHOD OF SECURING OBJECTS REJECTED BY AN INSPECTION DEVICE  
A combination of a hardware-secured reject bin and a programmed controller that together function to create an interlock that limits access to a reject bin to only those users with specific access...
US20090319214 OPTICAL METROLOGY SYSTEM OPTIMIZED WITH DESIGN GOALS  
Provided is a method of designing an optical metrology system for measuring structures on a workpiece where the optical metrology system is configured to meet two or more design goals. The design...
US20090248339 DESIGNING AN OPTICAL METROLOGY SYSTEM OPTIMIZED WITH SIGNAL CRITERIA  
Provided is a method of designing an optical metrology system for measuring structures on a workpiece wherein the optical metrology system is configured to meet one or more signal criteria. The...
US20090129990 RACK FOR SAMPLE CONTAINERS FOR CLINICAL ANALYZER  
A device for enabling the user of a clinical analyzer, such as, for example, an automated clinical analyzer, e.g., an automated hematology analyzer, to identify samples that require additional...
US20110119010 METHOD OF DETERMINING CHARACTERISTICS OF DEVICE UNDER TEST, PROGRAM, AND STORAGE MEDIUM STORING PROGRAM  
A method of determining characteristics of a DUT, in which test results indicating at least a pass/fail state of the DUT are used on a matrix in which plots defined by a combination of a first...
US20080262771 Statistic Analysis of Fault Detection and Classification in Semiconductor Manufacturing  
A method of fault detection and classification in semiconductor manufacturing is provided. In the method, delicate variations of actual data of parameters for which normal values of a...
US20110191049 SYSTEM AND METHOD FOR VERIFYING MANUFACTURING ACCURACY  
In a method for verifying manufacturing accuracy, a point cloud of a workpiece is read. A first determined point is determined according to the first point of the point cloud and a second...
US20080047660 PEEL PLATE ASSEMBLY FOR REMOVING PROGRAMMABLE TRANSPONDERS FROM A WEB  
A peel plate assembly for selectively removing RFID tags from a web for applying the RFID tags to a succession of articles includes an extendible or retractable peel blade and an RFID sensor...
US20150134286 METHOD FOR QUANTIFICATION OF PROCESS NON-UNIFORMITY USING MODEL-BASED METROLOGY  
Embodiments of the present invention provide an improved method and system for assessing non-uniformity of features in the measurement area (within the beam spot) on a semiconductor structure,...
US20090063076 Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology  
Provided is a method for determining one or more profile parameters of a structure using an optical metrology model, the optical metrology model comprising a profile model, an approximation...
US20050288881 Aid device for inspection system and display method therefor  
An aid device is set to an inspection system for obtaining waveform data from an inspection object, calculating a value of a characteristic quantity that characterizes the inspection object and...
US20080172197 SINGLE LASER MULTI-COLOR PROJECTION DISPLAY WITH QUANTUM DOT SCREEN  
A display (1100) comprises a passive screen (106, 502, 700, 1114) printed with a pattern (404) of different color quantum dots (602, 604, 606) that is excited by scanning a laser (130, 1108) over...
US20080071490 Industrial process evaluation system, industrial process evaluation method and recording medium storing industrial process evaluation program  
An alarm detection part 103 monitors each element of a manufacturing device 1, and detects an abnormality generated in the execution of a manufacturing process. In a process evaluation part 105,...
US20140316731 CONTINUOUS VOLTAGE PRODUCT BINNING  
A binning process uses curve fitting to create and assign one or more bins based on testing data of operating voltage versus leakage current for test integrated circuits. Each bin is created by...
US20080262769 USING MULTIVARIATE HEALTH METRICS TO DETERMINE MARKET SEGMENT AND TESTING REQUIREMENTS  
A method includes receiving a first set of parameters associated with a particular die. A health metric for a particular die is determined using a multivariate analysis of the first set of...
US20130262007 METHOD AND SYSTEM TO COMPUTE EFFICIENCY OF AN AUTOMATION INFRASTRUCTURE OF A PLANT  
The method and systems of the embodiments proposes to calculate Effectiveness of the Automation infrastructure of the plant by monitoring the control loop information using 3 primary data...
US20090248340 APPARATUS FOR DESIGNING AN OPTICAL METROLOGY SYSTEM OPTIMIZED WITH SIGNAL CRITERIA  
Provided is an apparatus for designing an optical metrology system for measuring structures on a workpiece wherein the optical metrology system is configured to meet one or more signal criteria....
US20130013240 SEMICONDUCTOR MANUFACTURING SYSTEM  
A semiconductor manufacturing system includes a program for inspecting a device of the system executing: displaying a screen for selecting an inspection set including inspection items having a...
US20060106555 Method for using an alternate performance test to reduce test time and improve manufacturing yield  
A method for using an alternate performance test to reduce test time and improve manufacturing yield. The method comprises establishing a specification test limit within which a product would be...
US20140095097 SYSTEM AND METHOD FOR DETERMINING LINE EDGE ROUGHNESS  
A method and system for determining line edge roughness is disclosed. The method involves computing a first length for a plurality of points based on a first line size, computing a second length...
US20080239498 RANDOM PHASE MASK FOR LIGHT PIPE HOMOGENIZER  
An apparatus for illuminating a light valve (34) comprises at least one laser array (10) capable of emitting a plurality of radiation beams (40a, 40b, 40c), each radiation beam propagating along a...
US20150241364 Inspecting Radiology Shields Using Passive RFID  
A method for locating/identifying and inspecting radiology shields to facilitate the safe use thereof is carried out by providing a set of radiology shields, each of the radiology shields having a...
US20100153046 Devices and Methods for Improving LCD Device Testing  
Devices and methods are disclosed which relate to an LCD device responding to an AT command which solely activates the backlight of the LCD device. An LCD device is programmed to respond to two...
US20140100807 CHIP AUTHENTICATION USING MULTI-DOMAIN INTRINSIC IDENTIFIERS  
Embodiments of the present invention provide a chip authentication system using multi-domain intrinsic identifiers. Multiple intrinsic identifiers taken from multiple domains (areas or sections of...

Matches 1 - 50 out of 142 1 2 3 >