Matches 1 - 50 out of 99 1 2 >


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US20060282228 METHOD AND SYSTEM FOR USE OF ENVIRONMENTAL CLASSIFICATION IN PRECISION FARMING  
Methods and software for selecting seed products or other agricultural inputs for planting within an associated land base include dividing the field into regions, providing an environmental...
US20050119843 Semiconductor production system  
A semiconductor production system has a semiconductor manufacturing apparatus having an exposure unit, a control unit for controlling the exposure unit and a storage device; a semiconductor...
US20070083338 Fundamental mistuning model for determining system properties and predicting vibratory response of bladed disks  
A reduced order model called the Fundamental Mistuning Model (FMM) accurately predicts vibratory response of a bladed disk system. The FMM software may describe the normal modes and natural...
US20130035888 METHOD AND SYSTEM FOR PROVIDING A QUALITY METRIC FOR IMPROVED PROCESS CONTROL  
The present invention may include acquiring a plurality of overlay metrology measurement signals from a plurality of metrology targets distributed across one or more fields of a wafer of a lot of...
US20120158336 MANAGEMENT OF A NUMBER OF SWIMMING POOLS  
Method for managing a group of swimming pools, characterized in that it includes the following steps: measurement or estimation of at least one datum representing the water quality of each...
US20160033251 SYSTEM AND METHOD FOR AUTOMATED OBJECT MEASUREMENT  
A method for automated part probing using a physical machine defining a physical working volume, the method including: generating a virtual model based on a virtual part design received from a...
US20080281541 System and method for estimating reliability of components for testing and quality optimization  
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal...
US20130006564 DISCRETE COMPONENT BACKWARD TRACEABILITY AND SEMICONDUCTOR DEVICE FORWARD TRACEABILITY  
A system is disclosed for providing backward and forward traceability by a methodology which identifies discrete components (die, substrate and/or passives) that are included in a semiconductor...
US20100006785 METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL  
Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms...
US20140324373 QUALITY CONTROL SENSOR METHOD, SYSTEM AND DEVICE FOR USE WITH BIOLOGICAL/ENVIRONMENTAL RAPID DIAGNOSTIC TEST DEVICES  
Quality control (QC) sensor methods, systems and devices are for use with biological/environmental rapid diagnostic test (RDT) devices and provide for automatic timers, reminders and RDT cassette...
US20060212141 Radio frequency identification-detect ranking system and method of operating the same  
A radio frequency identification (RFID)-detect ranking system and method of operating the same. In one embodiment, the RFID-detect ranking system includes a matrix subsystem configured to...
US20110153248 OPHTHALMIC QUALITY METRIC SYSTEM  
A method for automatically measuring and quantitatively evaluating the optical quality of an ophthalmic lens, such as, for example, a contact lens. The method measures an ophthalmic lens with an...
US20080183407 SYSTEM AND METHOD FOR TESTING POWER INTENSIFY OF RFID TAGS  
The invention provides a system and method for testing the power intensity of RFID tags. The method is applicable to the system for testing power intensity, which comprises a RFID reading device,...
US20080114558 Augmenting semiconductor's devices quality and reliability  
A method for augmenting quality or reliability of semiconductor units, including providing few populations of semiconductor units that are subject to quality or reliability testing. The...
US20140358465 YIELD ANALYSIS SYSTEM AND METHOD USING SENSOR DATA OF FABRICATION EQUIPMENT  
A system and method for analyzing a product fabrication process are disclosed. A product yield analysis system according to an exemplary embodiment of the present disclosure includes a data...
US20110164653 THERMAL INSPECTION SYSTEM AND METHOD INCORPORATING EXTERNAL FLOW  
A thermal inspection method is disclosed. The inspection method includes disposing a component in a wind tunnel configured to create a predetermined Mach number distribution for an external...
US20070088516 Low bandwidth reduced reference video quality measurement method and apparatus  
A new reduced reference (RR) video calibration and quality monitoring system utilizes less than 10 kilobits/second of reference information from the source video stream. This new video calibration...
US20120185221 SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE AND METHOD FOR SPECIFYING OPTIMUM VALUE THEREOF, INSPECTION SYSTEM FOR SUBSTRATE ON WHICH COMPONENTS ARE MOUNTED, SIMULATION METHOD AT PRODUCTION SITE, AND SIMULATION SYSTEM  
Suitability of determination standard value for intermediate inspection is determined. A correlation between measured values X for intermediate inspection and measured values Y for final...
US20110161030 Method And Device For Monitoring Measurement Data In Semiconductor Process  
An embodiment of the present invention discloses a method for monitoring measurement data in a semiconductor process, which includes: updating measurement data of wafer performance parameters...
US20070213951 METHOD AND SYSTEM FOR AUTOMATICALLY MONITORING THE READ QUALITY OF AN RFID SYSTEM  
A radio frequency identification system comprises a reader associated, in use, with a transmitted beam of radio frequency energy and a plurality of transponders to be energized by the energy and...
US20060208897 Capacitive RFID tag encoder  
In one embodiment, a capacitive encoding system is provided that includes a first conductive element; a second conductive element; and a capacitive encoder adapted to drive the first conductive...
US20090281753 METHOD AND SYSTEM FOR PHOTOVOLTAIC CELL PRODUCTION YIELD ENHANCEMENT  
A system and a method for photovoltaic thin film quality control. The system illuminates an area of photovoltaic film, acquires the illuminated area and compares it with a predetermined i A system...
US20090182520 ASSESSMENT OF DIAMOND COLOR  
Disclosed are methods and devices for assessing the colors of diamonds. In embodiments, the color of finished diamonds cut from a given rough diamond is assessed by analyzing the effect on light...
US20140067302 PRODUCT RELIABILITY ESTIMATION  
Methods and systems for systems and methods for product reliability estimation are provided. A method implemented in a computer infrastructure includes separating products into different process...
US20100220316 METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL  
Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source....
US20100131221 METHOD FOR DETERMINING QUALITY PARAMETER AND THE ELECTRONIC APPARATUS USING THE SAME  
The invention provides a method for determining quality parameter and the electronic apparatus using the same. The electronic apparatus includes a central processing unit (CPU) and a memory...
US20100088054 METHODS AND APPARATUS FOR DATA ANALYSIS  
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by...
US20060085152 Ecological value transfer  
In respect to emissions trading, although the emission of carbon dioxide may be reduced, there arises a need for reduction of energy so used in conjunction therewith with the possibility of global...
US20090192731 System and Method for Monitoring a Health State of Hydrocarbon Production Equipment  
A device for monitoring the health state of hydrocarbon production equipment is disclosed. The device has a plurality of targets, which are associated with the hydrocarbon production equipment. A...
US20130204563 PRINTING INSPECTION APPARATUS, PRINTING INSPECTION SYSTEM, STATISTICAL METHOD FOR INSPECTION DATA, PROGRAM, AND SUBSTRATE MANUFACTURING METHOD  
A printing inspection apparatus includes a measurement unit and a controller. The measurement unit is configured to measure solder that is printed on a substrate with a squeegee of a screen...
US20120239317 CONTROLLING DEVICE AND METHOD FOR ABNORMALITY PREDICTION OF SEMICONDUCTOR PROCESSING EQUIPMENT  
Disclosed in this invention is a controlling device for abnormality prediction of semiconductor processing equipment. The controlling device includes a multiplexer connecting a plurality of...
US20110022524 PRINTED CIRCUIT BOARD WITH PASSIVE RFID TRANSPONDER  
A process is provided for testing or operating an integrated circuit that includes providing a passive radio frequency identification transponder in electrical communication with the integrated...
US20090138223 On-Line Quality Prediction System for Stainless Steel Slab and the Predicting Method Using It  
Disclosed is an on-line quality prediction system for stainless steel slab and the predicting method using it, which can allow produced slab quality to predict in high precision on the on-line...
US20160216215 SUBSTRATE INSPECTING APPARATUS  
The present invention relates to a substrate inspecting apparatus which is capable of reducing an inspection time of a substrate having a plurality of inspection regions and improving convenience...
US20070244657 Methods and systems for testing radio frequency identification (RFID) tags having multiple antennas  
Methods, systems, and apparatuses for testing antenna(s) of a radio frequency identification (RFID) tag are described. A reader transmits a test command signal to a RFID tag having a plurality of...
US20050100136 Image displaying apparatus and program  
An image displaying apparatus including: a display section for displaying medical image and calibration image within a predetermined image displaying area; a storage section for storing...
US20090171606 SEMICONDUCTOR MANUFACTURE PERFORMANCE ANALYSIS  
A software architecture, design and implementation that enables efficient transistor performance analysis across multiple levels of parameter granularity with interactive drill-down, drill-across...
US20150346106 METHOD AND DEVICE FOR INSPECTING AND TAILORING A MOVING PRODUCT WEB  
In a method for inspecting and tailoring a predefined point of a moving product web (2), the moving product web (2) is located at least partly on a winder (3). Both a relative running length L of...
US20130132014 EVALUATION FOR ETCH MASK FILM  
In conjunction with a photomask blank comprising a transparent substrate, a pattern-forming film, and an etch mask film, the etch mask film is evaluated by measuring a first etching clear time...
US20140095096 NON-DESTRUCTIVE THERMOGRAPHIC WELD INSPECTION  
A non-destructive system for characterizing welds that includes at least one weldment that further includes at least two components joined together a weld; at least one source of heat energy...
US20120221272 QUALITY ESTIMATION APPARATUS, QUALITY ESTIMATION METHOD AND NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING PROGRAM  
According to one embodiment, a quality estimation apparatus includes: a storage module which stores designation information for designating inspection targets to be subjected to sampling...
US20080294361 Intelligent execution system for the monitoring and execution of vaccine manufacturing  
Intelligent execution systems and methods thereof used to monitor and execute a vaccine manufacturing process are disclosed herein. Consequently, the methods and systems provide a means to perform...
US20110135473 SYSTEM, DEVICE, AND METHOD FOR MONITORING A WIND TURBINE USING DATA QUALITY INDICATORS  
A method for monitoring a wind turbine is provided. An operating parameter, including a parameter value and a data quality value, is created by a controller. The parameter value is based on a...
US20100175965 PALLET MONITORING SYSTEM AND MONITORING METHOD  
According to one embodiment, a pallet monitoring system for monitoring pallets sequentially conveyed to stations provided along a conveyor path, the system includes: a monitor, connected to the...
US20080059095 Electronic Device Handling Apparatus and Defective Terminal Determination Method  
Standard positional information of respective terminals of an electronic device to be a standard is stored in advance, an image of terminals of an electronic device to be tested held by a conveyor...
US20130006563 Continuous monitoring methods in vaccine production  
Methods of monitoring an acceptance criteria of vaccine manufacturing processes are disclosed herein. Consequently, the methods and systems provide a means to perform high-quality manufacturing on...
US20090088997 DATA PROCESSING SYSTEM  
A data processing system manages data of inspection conditions of a plurality of inspection devices. The system includes a storage device, a computing device, and an input/output device. The...
US20070229227 METHOD AND APPARATUS FOR PROVIDING REJUVENATED TRANSPONDERS  
The present invention provides a transponder communication system that is capable of reading and/or encoding transponders such that a user may increase the output of operable smart media units. In...
US20130262006 White LED Quality Inspection Method and Device  
A white LED quality inspection method includes steps as follows. A steady current is supplied to a LED by a rated voltage supply unit for generation of a stable light spot from the LED; a stable...
US20110224933 METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS TO ASSIST IN FACILITATING REGULATORY APPROVAL OF A PRODUCT  
A method for providing a service to assist in obtaining regulatory approval of a product includes using a computing device programmed to search at least one database of literature and programmed...

Matches 1 - 50 out of 99 1 2 >