Matches 1 - 50 out of 105 1 2 3 >


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US20110270567 TOOLS FOR DESIGN AND ANALYSIS OF OVER-THE-AIR TEST SYSTEMS WITH CHANNEL MODEL EMULATION CAPABILITIES  
A wireless electronic device may serve as a device under test in a test system. The test system may include an array of over-the-air antennas that can be used in performing over-the-air wireless...
US20120253733 TRANSACTION BASED WORKLOAD MODELING FOR EFFECTIVE PERFORMANCE TEST STRATEGIES  
A method for creating workload model to test performance of a critical application in a data processing network (112) is disclosed. The method includes receiving (202), at one of the plurality of...
US20120239338 EMPIRICAL PREDICTION OF SIMULTANEOUS SWITCHING NOISE  
In an example embodiment, the system obtains the mutual inductance (e.g., Mij) between a quiet I/O buffer and each switching I/O buffer on a PLD from an automatic SSN measurement system. The...
US20110307209 Diagnosis of Integrated Driver Circuits  
A circuit arrangement includes a controller and an integrated driver arrangement coupled to the controller. The integrated driver circuit includes a driver unit having at least one operation...
US20130173204 SYSTEM AND METHOD FOR MEASURING TRACE WIDTH OF PCB  
A measuring system executable by a computer for measuring a PCB is provided. A layout information obtaining module obtains layout information of the PCB. A parameter setting interface display...
US20130218507 TESTING AN INTEGRATED CIRCUIT DEVICE WITH MULTIPLE TESTING PROTOCOLS  
Various exemplary embodiments relate to an integrated circuit device that includes a plurality of input/output pins, device circuitry, a first testing protocol interface connected to the device...
US20120166131 INTEGRATED DEVICE TEST CIRCUITS AND METHODS  
Test circuits and methods for detecting faults in integrated devices are disclosed. In an embodiment, a circuit may include an input node configured to receive a test signal, and a transition...
US20130066581 INTEGRATED CIRCUIT TESTING MODULE INCLUDING SIGNAL SHAPING INTERFACE  
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be...
US20150066416 SYSTEM AND METHOD FOR TESTING VEHICLE TRACTION BATTERY COMPONENTS  
A traction battery connection simulator is disclosed comprising a plurality of power supplies connected to simulate a traction battery and a plurality of switching devices that selectively connect...
US20120259575 INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FOR ON-CHIP STRESS TESTING IN ORDER TO MODEL OR MONITOR DEVICE PERFORMANCE DEGRADATION  
Disclosed is an integrated circuit chip incorporating a test circuit having multiple logic blocks. Each logic block is a matrix of individually selectable, physically different, test devices in a...
US20110060546 Intergrated circuit (IC) with primary and secondary networks and device containing such IC  
Some embodiments provide an integrated circuit (“IC”) with a primary circuit structure. The primary circuit structure is for performing multiple operations that implement a user design. The...
US20120221285 GENERAL PURPOSE PROTOCOL ENGINE  
In one embodiment, a protocol aware circuit for automatic test equipment, which includes a protocol generation circuit constructed to retrieve protocol unique data and format the protocol unique...
US20090210188 1149.1 TAP LINKING MODULES  
IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry...
US20130116961 DIGITAL INTEGRATED CIRCUIT TESTING AND CHARACTERIZATION SYSTEM AND METHOD  
The digital integrated circuit testing and characterization system and method provides high-speed testing for digital IC prototypes. A stand-alone circuit, such as an application specific...
US20100049464 SYSTEM FOR TESTING INTEGRATED CIRCUITS  
The invention provides for a system for testing integrated circuitry. The system includes a local computational device, a communications link connected to the computational device, and testing...
US20050071109 Media platform testing  
Methods, systems, and devices are provided for media platform testing. A method includes multiplexing media channels of a tester having a first type media card to media channels of a media...
US20110224938 SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING  
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to...
US20130218508 SYSTEM FOR TESTING ELECTRONIC CIRCUITS  
A system for testing electronic circuits includes first, second, and third standard interfaces. A test port master and a test port slave are connected to an external testing apparatus. The first,...
US20100088059 ABNORMAL SIMULATION SIGNAL ANALYSIS METHODS AND ABNORMAL SIGNAL SIMULATION ANALYSIS MODULE FOR 4˜20mA INSTRUMENTAL SYSTEM  
The present invention relates to a negative pulse transient signal analysis methods and negative pulse transient signal analysis module for a PC base simulation equivalent circuit capable of...
US20080319700 TEST APPARATUS, PATTERN GENERATOR, TEST METHOD AND PATTERN GENERATING METHOD  
Provided is a test apparatus for testing a specimen by using a test pattern and an expected value pattern. The test apparatus includes: a control unit for outputting a test pattern to the...
US20140088947 ON-GOING RELIABILITY MONITORING OF INTEGRATED CIRCUIT CHIPS IN THE FIELD  
Disclosed is an integrated circuit (IC) chip with a built-in self-test (BIST) architecture that allows for in the field accelerated stress testing. The IC chip can comprise an embedded processor,...
US20110251818 KEYBOARD TEST PROGRAM GENERATING METHOD  
A keyboard test program generating method includes the following steps. Firstly, a first key number is received. By pressing a first key, a first key identification code corresponding to the first...
US20140095101 AUGMENTED POWER-AWARE DECOMPRESSOR  
Decompressor circuitry includes a first segment and a second segment each comprising memory elements (MEs) and (i) said first segment receives the plurality of static variables originating from...
US20080208508 Test Prepared Rf Integrated Circuit  
An integrated circuit (10) comprises a mixer circuit (14, 54a) and a local oscillator circuit (18, 58). During testing a frequency divider circuit (32, 60) in the integrated circuit (10) divides a...
US20050261859 Systems and methods for evaluating a test case  
In one embodiment, a system and a method for evaluating a test case pertain to assigning weights to at least one of system components and system events, processing the test case to determine the...
US20090228231 LOW PIN INTERFACE TESTING MODULE  
A low pin interface module is provided for testing an integrated circuit. The interface module includes an input-output module, a controlling module, a processing module and a storage module...
US20130124133 PRODUCT PERFORMANCE TEST BINNING  
A method, test system and computer program product and system for voltage binning integrated circuit chips. The method includes selecting or changing a voltage bin of an integrated circuit chip...
US20110004434 LOW POWER TESTING OF VERY LARGE CIRCUITS  
Plural scan test paths (401) are provided to reduce power consumed during testing such as combinational logic (101). A state machine (408) operates according to plural shift states (500) to...
US20080195346 Low power scan testing techniques and apparatus  
Disclosed below are representative embodiments of methods, apparatus, and systems used to reduce power consumption during integrated circuit testing. Embodiments of the disclosed technology can be...
US20120022821 INTEGRATED CIRCUIT THAT TRANSFERS MISSION MODE SIGNAL IN DEBUG MODE  
A system including an integrated circuit configured to transfer a mission mode signal between a mission mode circuit on the integrated circuit and a first input/output pin on the integrated...
US20090182523 APPARATUS AND METHOD FOR CONNECTION TEST ON PRINTED CIRCUIT BOARD  
A connection test apparatus includes a controlling section, controlling each connection test device to switch the operation mode between the first and the second modes such that a first connection...
US20050027470 Interactive stub apparatus for testing a program and stub program storage medium  
For the purpose of eliminating the need for creating a stub program dedicated to a program to be tested and for setting a test environment, and of increasing the efficiency of test operations, an...
US20100188097 FAULT TESTING FOR INTERCONNECTIONS  
Embodiments of the invention are generally directed to fault testing for interconnections. An embodiment of a fault analysis apparatus includes a test pattern source to provide a test pattern for...
US20120123727 SELF-SERVICE CIRCUIT TESTING SYSTEMS AND METHODS  
In one of many possible embodiments, an exemplary system includes a test management subsystem configured to provide a user portal to a user of a circuit provided by a service provider, the user...
US20120053883 ELECTRONIC DEVICE TESTER AND TESTING METHOD  
An electronic device tester is connected to an electronic device needed to be tested. A test program is stored in a data storage of the tester. The test program comprises a number of test...
US20110082661 Card Interface Direction Detection System  
A card interface direction detection system includes a card. A power pin is mounted to the card and connected to a power source. A ground pin is mounted to the card and connected to a ground. A...
US20080140334 Semiconductor package capable of performing various tests and method of testing the same  
A semiconductor package includes an input pin that receives a first signal from the outside of the semiconductor package, a pad that is coupled to the input pin, and a test mode driving circuit...
US20140046616 CIRCUIT TEST SYSTEM AND CIRCUIT TEST METHOD THEREOF  
A circuit test system including a circuit test apparatus and a circuit to be tested is provided. The circuit test apparatus provides a first clock signal. The circuit to be tested includes a...
US20080082286 Circuit for testing a USB device using a packet to be measured controlled by test signals  
A USB test circuit for use in a USB device such as a system LSI with a USB function for testing the USB function generates and outputs a packet to be measured for a signal quality test. In the...
US20060247885 Scalable integrated tool for compliance testing  
Methods, tools, systems and computer readable media for compliance testing instrumentation and/or software. Data from one or more analytical instruments and/or software is inputted, and...
US20100274518 Diagnostic Test Pattern Generation For Small Delay Defect  
Methods of diagnostic test pattern generation for small delay defects are based on identification and activation of long paths passing through diagnosis suspects. The long paths are determined...
US20080126002 SYSTEM AND METHOD FOR AUTOMATICALLY ADJUSTING LENGTH OF TEST LINE, AND TEST SYSTEM  
A test system for testing a network device is provided. The test system includes a control device and a cable group. The control device receives a user instruction, generates a test instruction...
US20080133167 Testable Electronic Circuit  
An electronic circuit contains groups of flip-flops (12a-c), coupled to data terminals (11a-c) of the circuit and to a functional circuit (10). Each group (12a-c) has a clock input for clocking...
US20060047463 Bit synchronization for high-speed serial device testing  
An apparatus for testing electronic devices that output high-speed serial data bit streams employs a programmable device to adjust the timing of the strobe so that the data bit stream being...
US20140052404 METHODS AND STRUCTURE FOR ANALYZING DIFFERENT SIGNALING PATHWAYS THROUGH A TEST SIGNAL SELECTION HIERARCHY  
Methods and structure are disclosed for analyzing different signaling pathways through a test signal selection hierarchy utilizing test patterns. One embodiment comprises an integrated circuit...
US20090070061 SEMICONDUCTOR MEMORY DEVICE INCLUDING TEST MODE CIRCUIT  
A semiconductor memory device having a test mode circuit is presented which includes: a mode setting unit, in response to an external command and a first address signal for a mode set, providing a...
US20100082284 TEST APPARATUS  
Provided is a test apparatus 10, which includes: a plurality of test modules 150, each of which is connected to any of the plurality of devices under test 100 to supply a test signal to the...
US20080312857 Input/output multiplexer bus  
An input/output (“I/O”) system includes a plurality of input/output (“I/O”) ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more...
US20110144939 COMPUTERISED STORAGE SYSTEM COMPRISING ONE OR MORE REPLACEABLE UNITS FOR MANAGING TESTING OF ONE OR MORE REPLACEMENT UNITS  
A method, apparatus and software is disclosed, for use in a computerised storage system comprising one or more replaceable units, for managing testing of one or more replacement units, where the...
US20110119016 Deterministic Reconfiguration of Measurement Modules Using Double Buffered DMA  
Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF...

Matches 1 - 50 out of 105 1 2 3 >