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US20130024153 MICROPROCESSOR TESTING CIRCUIT  
A microprocessor testing circuit includes a sensor selection circuit to select a sensor measuring a characteristic of a microprocessor. An offset circuit artificially drives a signal from the...
US20120136610 Method and Apparatus for Providing Leak Detection in Data Monitoring and Management Systems  
Method and apparatus for providing a leak detection circuit for a data monitoring and management system using the guard trace of a glucose sensor by applying a leak detection test signal to...
US20050278133 Integrated test circuit  
A test cell (12) provides boundary scan testing in an integrated circuit (10). The test cell (12) comprises two memories, a flip-flop (24) and a latch (26), for storing test data. A first...
US20140336974 Reconfigurable Automatic Test Circuit Techniques  
A re-configurable test circuit for use in an automated test equipment includes a test circuit, a test processor and a programmable logic device. The pin electronics circuit is configured to...
US20060064268 Dynamic creation and modification of wafer test maps during wafer testing  
Methods, systems, and apparatuses provide dynamic creation and modification of wafer test maps. Test plans are defined for a testing session of a wafer lot. The test plan is associated with a...
US20160003892 SYSTEM AND METHOD FOR PERFORMING PROCESSING IN A TESTING SYSTEM  
System and methods can execute processes in a test system. A flexible platform may be provided for developing test programs for performing automated testing. For example, the tester and its...
US20120179412 Circuits and Methods for Characterizing Random Variations in Device Characteristics in Semiconductor Integrated Circuits  
Circuits for measuring and characterizing random variations in device characteristics of integrated circuit devices.
US20120150475 APPARATUS FOR OBTAINING PLANARITY MEASUREMENTS WITH RESPECT TO A PROBE CARD ANALYSIS SYSTEM  
A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection...
US20120065920 EVALUATION METHOD, EVALUATION APPARATUS, AND SIMULATION METHOD OF SEMICONDUCTOR DEVICE  
An evaluation method of a semiconductor device according to an aspect of the present invention includes MISFETs including a gate insulating film, the evaluation method including measuring an RTN...
US20080133165 TEST APPARATUS AND DEVICE INTERFACE  
The test apparatus includes: a plurality of test modules that transmit/receive signals to/from the plurality of DUTs; a test head on which the plurality of test modules are placed; a plurality of...
US20140372068 FAULT DETECTION APPARATUS  
A fault detection apparatus according to an embodiment is provided with a measurement unit, a memory unit, a control unit, and a display unit. The measurement unit measures a first time period...
US20100332177 TEST ACCESS CONTROL APPARATUS AND METHOD THEREOF  
A test access control apparatus includes test access mechanism (TAM) buses and an extended IEEE 1149.1 Test Access Port (TAP) Controller. The TAM buses support memory built-in-self-test (BIST)...
US20050182587 Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereon  
A circuit quality evaluation method obtains an indicator linked to the quality of a circuit by applying information representing a minimum delay margin of a path passing through an assumed fault...
US20140214354 SYSTEM AND METHOD OF DETECTION AND ANALYSIS FOR SEMICONDUCTOR CONDITION PREDICTION  
The invention described here enables in-operation, low-cost, non-invasive measurement of component performance and condition for assessing device longevity prediction, resilience and reliability....
US20090309624 Method and Device of Measuring Interface Trap Density in Semiconductor Device  
A method is provided for measuring interface trap density in a semiconductor device. In the method, measurement parameters are input to a host computer. A pulse condition is set at a pulse...
US20050080581 Built-in self test for memory interconnect testing  
In some embodiments, built-in self-test logic is provided for an integrated circuit (IC) device having memory controller logic to generate address and command information for accessing a memory...
US20090192753 APPARATUS AND METHOD FOR TESTING ELECTRONIC SYSTEMS  
The technology and economics of system testing have evolved to the point where a radical change in methodology is needed for effective functional testing of systems at clock rates of 1 GHz and...
US20140172343 Emulation System and Method  
In accordance with a preferred embodiment of the present invention, a method of testing a device includes a circuit includes a device-under-test and an emulated apparatus. The emulated apparatus...
US20070250284 Semiconductor integrated circuit and testing method for the same  
A semiconductor integrated circuit of the present invention is provided with a clock control portion having a clock generation portion for generating a clock signal and an output command signal...
US20070185679 INDICATING STATUS OF A DIAGNOSTIC TEST SYSTEM  
Systems and methods of indicating status of a diagnostic test system are described. In one aspect, a diagnostic test system includes a housing, an indicator system, and a test unit in the housing....
US20110218755 INTEGRATED CIRCUIT AND TEST METHOD THEREFOR  
Disclosed is a method of testing an integrated circuit (100) comprising a radio-frequency (RF) transceiver, said transceiver comprising a receiver chain (120) having an input for coupling the...
US20060208754 Method and apparatus for a reliability testing  
A method for a reliability testing of a device under test which comprises: a first step for applying a second voltage after applying for a predetermined time a first voltage to a device under test...
US20120150474 DEBUG STATE MACHINE CROSS TRIGGERING  
In an electronic system that includes a plurality of electronic modules and a plurality of debug circuits, each of which is integrated with one of the plurality of electronic modules, a method for...
US20080234966 Acquiring Test Data From An Electronic Circuit  
Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board,...
US20050182585 Structure and method for package burn-in testing  
The present invention discloses a contact structure and method for burn-in testing. The structure comprises a print circuit board, metal solder join fixed to the print circuit board, and contact...
US20130290594 CORE-DRIVEN TRANSLATION AND LOOPBACK TEST  
A translation and loopback test for input/output ports is described. In one example, a method includes receiving a test packet on an output of a high speed processor link, looping the test packet...
US20070112538 Concurrent control of semiconductor parametric testing  
An automated semiconductor parametric test system has a control module that is operable to concurrently control both operation of semiconductor test equipment and operation of parametric test...
US20050015213 Method and apparatus for testing an electronic device  
A method of testing an electronic device. A test pattern is transferred between a first data controller coupled to a first data interface and a second data controller coupled to a second data...
US20140088911 VLSI Circuit Verification  
A method of connecting to an integrated circuit. A target integrated circuit (102) is provided with an embedded agent (104) for exporting signals. While the target integrated circuit (102) is...
US20110288807 FAILURE DETECTING METHOD, SEMICONDUCTOR DEVICE, AND MICROCOMPUTER APPLICATION SYSTEM  
The present invention is directed to improve the precision of failure detection by performing the failure detection by changing an analog amount of a circuit to be subjected to the failure...
US20100030508 PIN ELECTRONICS CIRCUIT, SEMICONDUCTOR DEVICE TEST EQUIPMENT AND SYSTEM  
A main driver and a sub-driver control circuit are provided respectively to receive a test pattern signal for testing a device. The main driver drives the test pattern signal to output a first...
US20100228507 TRACE DEVICE AND TRACE METHOD FOR FAILURE ANALYSIS  
A trace device for tracing data in an LSI includes a trace data storing unit that stores trace data, a trace target determination unit that determines whether to store trace data of one of a...
US20080071489 INTEGRATED CIRCUIT FOR MEASURING SET-UP AND HOLD TIMES FOR A LATCH ELEMENT  
An integrated circuit (IC) includes circuitry for measuring accurately at least one of set-up and hold times of a flip-flop included in the IC design. The circuitry uses data determined at the...
US20060025955 Gas density transducer  
A gas density transducer including: a piezoresistive bridge sensor operative to provide an output indicative of an applied pressure, a computing processor having multiple inputs and at least one...
US20100106447 DEFECT ANALYZING APPARATUS AND DEFECT ANALYZING METHOD  
A defect analyzing apparatus capable of acquiring standard data easily and a defect analyzing method are provided. The defect analyzing apparatus includes: a storage section storing data including...
US20110196641 Semiconductor device and diagnostic method thereof  
A semiconductor device includes a test target circuit subjected to self-diagnosis, a PLL circuit that outputs a clock for the self-diagnosis to the test target circuit, a diagnostic register that...
US20130197851 TEST CONTROLLER FOR 3D STACKED INTEGRATED CIRCUITS  
Stacked IC devices (or 3D semiconductor devices) have two or more semiconductor devices stacked so they occupy less space than two or more conventionally arranged semiconductor devices. Access to...
US20150331038 ANALYSIS SYSTEM  
An analysis system for analyzing circuits and other appropriate devices as well as its method of use are disclosed. In one embodiment, a system may include one or more electromagnetic field...
US20150185268 Monitoring Device for Monitoring a Circuit  
A monitoring device for monitoring a circuit is provided. The circuit has a main functional unit to perform a main calculation. The monitoring device includes a calculation unit to perform a test...
US20110077893 Delay Test Apparatus, Delay Test Method and Delay Test Program  
A delay test apparatus for a semiconductor integrated circuit includes (1) a selecting unit that selects at least one pair of a beginning latch and an ending latch based on layout information of...
US20090063085 PMU TESTING VIA A PE STAGE  
An apparatus for use in testing a device includes a parametric measurement unit to measure a first signal from the device, and pin electronics to provide a second signal to the device. The pin...
US20120259574 DESIGNED-BASED YIELD MANAGEMENT SYSTEM  
An integrated-circuit yield improvement system includes a global signature analysis/grouping module configured to receive an integrated circuit (IC) design and identify areas in the IC design that...
US20060020412 Analog waveform information from binary sampled measurements  
Circuits that count zeros or ones in a binary sampling of a signal can measure analog characteristics of the signal. By this technique, relatively simple circuits can perform parameter...
US20140172344 METHOD, SYSTEM AND APPARATUS FOR TESTING MULTIPLE IDENTICAL COMPONENTS OF MULTI-COMPONENT INTEGRATED CIRCUITS  
A method, system and apparatus for testing of multi-component integrated circuits are provided. A multi-component integrated circuit has multiple identical components to be tested. A testing...
US20080021668 Apparatus and method for inspection of electronic devices  
Disclosed is an apparatus and method for inspection of an electronic device, which can increase the efficiency of inspection by performing a self inspection. According to an aspect of an exemplary...
US20070038404 Testable digital delay line  
A testable digital delay line that uses XOR gates as delay elements is provided. The use of XOR gates enables independent control of each input to the multiplexer. With test inputs that enable...
US20130282323 Visual dynamic monitoring system for operating states of protective relay system  
A visual dynamic monitoring system for operating states of a protective relay system, which is applied to a computer based relay includes: collecting information of a voltage input circuit & a...
US20110087452 TEST DEVICE  
A test device for testing a system, which has first interface circuit, second interface circuit, and a power switch, comprises a power supply, status detector, and a controller. The power supply...
US20070250283 Maintenance and Calibration Operations for Memories  
Embodiments of the present invention provide methods, systems and apparatus for performing memory maintenance and calibration operations. To perform calibration operations, calibration data may...
US20110264396 ELECTRICAL CIRCUIT WITH PHYSICAL LAYER DIAGNOSTICS SYSTEM  
An electrical circuit has a power supply, one or more devices and a diagnostics system. The diagnostics system includes a monitoring means adapted to monitor physical layer characteristics of the...

Matches 1 - 50 out of 97 1 2 >