Matches 1 - 50 out of 246 1 2 3 4 5 >


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US20140058698 System and Method for Hybrid Board-Level Diagnostics  
A method for diagnosing a faulty board includes generating a table of debug knowledge in accordance with predefined debug rules, and configuring a diagnostic engine in accordance with the table of...
US20130080107 TESTER HAVING SYSTEM MAINTENANCE COMPLIANCE TOOL  
A tester module for automatic test equipment (ATE) includes test instruments for testing an integrated circuit device under test (DUI). A plurality of sensors include sensors coupled to or...
US20130166244 SUPERVISOR MONITORING SYSTEM  
A supervisor monitoring system for autonomous test supervision is presented. A system can comprise a first supervisor monitor (SM) and a second SM, each configured to simultaneously monitor one or...
US20140125365 Testing Electronic Components on Electronic Assemblies with Large Thermal Mass  
An approach is provided in which a system under test is subjected to thermal cycling that include transferring the system under test between two different environments that generate two different...
US20120078565 Methods, Systems, and Products for Reflective Maintenance  
Methods, systems, and products maintain reflective maintenance records for a network. Test results are mirrored from different testing applications to a centralized testing database. The test...
US20070156364 Light activated hold switch  
An automatic hold switch is disclosed. The automatic hold switch provides a means for automatically switching a hold feature on and off. When the hold feature is on, one or more input devices of a...
US20140278196 EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS  
Efficient production testing of integrated circuits. A first production test is implemented on a group of integrated circuits and failures among the test group are assessed. Specifically, the...
US20130218507 TESTING AN INTEGRATED CIRCUIT DEVICE WITH MULTIPLE TESTING PROTOCOLS  
Various exemplary embodiments relate to an integrated circuit device that includes a plurality of input/output pins, device circuitry, a first testing protocol interface connected to the device...
US20110010126 HIGH VOLTAGE INTERLOCK STRATEGY  
A High Voltage Interlock Strategy (HVIS) uses feedback current to detect cable connectivity status for a high-voltage cable configured to connect a power conversion circuit with a remote permanent...
US20080027701 Printed Circuit Board Design Instruction Support Method and Device  
There are provided a printed circuit board design instruction support method between a circuit design and a printed circuit board design, a printed circuit board design instruction support device...
US20120053924 SYSTEM AND METHOD FOR EXECUTING FUNCTIONAL SCANNING IN AN INTEGRATED CIRCUIT ENVIRONMENT  
An example method is provided and includes executing a functional test for an integrated circuit and observing a failure associated with the integrated circuit. The method also includes executing...
US20120182154 ELECTRONIC DEVICE AND METHOD FOR OPTIMIZING ORDER OF TESTING POINTS OF CIRCUIT BOARDS  
In a method for optimizing an order in which certain points on a circuit board can be tested and evaluated, a coordinate system is established in a circuit diagram of a circuit board, and at least...
US20130024153 MICROPROCESSOR TESTING CIRCUIT  
A microprocessor testing circuit includes a sensor selection circuit to select a sensor measuring a characteristic of a microprocessor. An offset circuit artificially drives a signal from the...
US20120130669 VARIATION AWARE TESTING OF SMALL RANDOM DELAY DEFECTS  
In one embodiment, the invention is a method and apparatus for variation aware testing of small random delay defects. One embodiment of a method for selecting a set of paths with which to test an...
US20110106481 SYSTEM AND METHOD FOR CHECKING GROUND VIAS OF A CONTROLLER CHIP OF A PRINTED CIRCUIT BOARD  
A system and method for checking a ground via of control chips of a printed circuit board (PCB) provides a graphical user interface (GUI) displaying a layout of the PCB. The control chip has a...
US20110246120 EQUIVALENT CIRCUIT OF INDUCTANCE ELEMENT, METHOD OF ANALYZING CIRCUIT CONSTANT, CIRCUIT CONSTANT ANALYSIS PROGRAM, DEVICE FOR ANALYZING CIRCUIT CONSTANT, CIRCUIT SIMULATOR  
The present invention provides an equivalent circuit, circuit constant analysis method, circuit constant analysis program, circuit constant analysis device, and circuit simulator for an inductance...
US20110137602 INSERTION OF FAULTS IN LOGIC MODEL USED IN SIMULATION  
A method of selecting fault candidates based on the physical layout of an Integrated Circuit (IC) layout, that includes, identifying failing observation points in an IC layout, determining the...
US20120259574 DESIGNED-BASED YIELD MANAGEMENT SYSTEM  
An integrated-circuit yield improvement system includes a global signature analysis/grouping module configured to receive an integrated circuit (IC) design and identify areas in the IC design that...
US20150066414 AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC TEST EQUIPMENT USING SAME  
An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and...
US20110087453 RELIABILITY TEST WITH MONITORING OF THE RESULTS  
An embodiment for executing a reliability test is proposed. A corresponding electronic device includes functional means for implementing a functionality of the electronic device, and testing means...
US20130325389 METHOD FOR INSPECTING SHORT-CIRCUIT OF CIRCUIT LAYOUT AND DEVICE USING THE SAME  
A method for inspecting short-circuit of circuit layout and a device using the same are provided, the method including: obtaining a circuit layout, wherein the circuit layout including a plurality...
US20130191065 CLOCK FAULT DETECTOR  
A method and apparatus for providing clock fault detection is presented. A first clock of a plurality of clocks on a printed circuit board (PCB) is designated as a reference clock. A reference...
US20130338959 SWITCHING-TYPE CATEGORIZING AND TESTING STRUCTURE OF RFIC  
A switching-type categorizing and testing apparatus of a Radio Frequency integrated Circuit (RFIC) is used to test and categorize at least one RFIC module. The apparatus comprises at least one...
US20110137604 REAL-TIME ADAPTIVE HYBRID BiST SOLUTION FOR LOW-COST AND LOW-RESOURCE ATE PRODUCTION TESTING OF ANALOG-TO-DIGITAL CONVERTERS  
An integrated circuit configured to perform hybrid built in self test (BiST) of analog-to-digital converters (ADCs) is described. The integrated circuit includes an ADC. The integrated circuit...
US20150204941 OVERHEAT PROTECTION CIRCUIT AND METHOD IN AN ACCELERATED AGING TEST OF AN INTEGRATED CIRCUIT  
To include in a device a controller to control operation of the device in a normal-operation mode and in a test mode for performing one or more tests including an accelerated aging test, a...
US20100030508 PIN ELECTRONICS CIRCUIT, SEMICONDUCTOR DEVICE TEST EQUIPMENT AND SYSTEM  
A main driver and a sub-driver control circuit are provided respectively to receive a test pattern signal for testing a device. The main driver drives the test pattern signal to output a first...
US20060020412 Analog waveform information from binary sampled measurements  
Circuits that count zeros or ones in a binary sampling of a signal can measure analog characteristics of the signal. By this technique, relatively simple circuits can perform parameter...
US20120123724 Detecting an Unstable Input to an IC  
Additional circuitry is included in an input cell design structure for an integrated circuit to detect and report transitions on an input that was expected to be stable, and to store that event...
US20100318313 MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS AND TEST OF RELIABILTY STRUCTURES  
System and method for obtaining statistics in a fast and simplified manner at the wafer level while using wafer-level test equipment. The system and method performs a parallel stress of all of the...
US20120065919 BUILT-IN SELF-TEST CIRCUIT-BASED RADIATION SENSOR, RADIATION SENSING METHOD AND INTEGRATED CIRCUIT INCORPORATING THE SAME  
A radiation sensor for an integrated circuit (IC), a radiation sensing method and an IC incorporating the sensor or the method. In one embodiment, the radiation sensor includes: (1) a built-in...
US20110257923 WiFi Positioning Bench Test Method and Instrument  
The present invention relates to simulation on a lab workbench of conditions that would be encountered by a mobile device during a so-called drive test, which involves transporting the mobile...
US20070185679 INDICATING STATUS OF A DIAGNOSTIC TEST SYSTEM  
Systems and methods of indicating status of a diagnostic test system are described. In one aspect, a diagnostic test system includes a housing, an indicator system, and a test unit in the housing....
US20150226790 ELECTRONIC DEVICE, PERFORMANCE BINNING SYSTEM AND METHOD, VOLTAGE AUTOMATIC CALIBRATION SYSTEM  
A method for determining performance of an integrated circuit (IC) is disclosed herein. The method includes following operations: disposing hardware performance monitors (HPMs) in each of ICs, in...
US20120136609 BINARY DEFINITION FILES  
A computer implemented system for testing electronic equipment where files are provided to aid in the conversion of device generic messages into device specific messages and conversion of device...
US20070271057 Inspection method of semiconductor integrated circuit and semiconductor  
It is detected with a detecting circuit whether or not a signal outputted from an output terminal and a signal inputted to an output buffer are coincident with each other, and a retaining circuit...
US20110246119 PROCESS FOR TESTING THE RESISTANCE OF AN INTEGRATED CIRCUIT TO A SIDE CHANNEL ANALYSIS  
A process for testing an integrated circuit includes collecting a set of points of a physical property while the integrated circuit is executing a multiplication, dividing the set of points into a...
US20100213962 BALLAST AND WIRING LAMP FIXTURE TESTER  
Apparatus and methods for testing a light fixture power circuit are therefore provided. The light fixture power circuit may energize a fluorescent lamp by providing power at first and second power...
US20090076747 Test board and test system  
A test board includes a socket, a mounting test circuit, and a relay. An analog core embedded application processor is installed into the socket. The mounting test circuit has a same configuration...
US20100204948 SYSTEM LEVEL TESTING FOR SUBSTATION AUTOMATION SYSTEMS  
Protection, measurement and control IEDs in a substation compute if switches they control may be operated safely, according to interlocking rules or physical principles as well as the dynamic...
US20130262018 APPARATUS AND METHOD FOR IDDQ TESTS  
A method for conducting IDDQ tests for a device having a plurality of test sites is disclosed. The method includes identifying voltage ranges for each of the plurality of test sites, closing a...
US20150185268 Monitoring Device for Monitoring a Circuit  
A monitoring device for monitoring a circuit is provided. The circuit has a main functional unit to perform a main calculation. The monitoring device includes a calculation unit to perform a test...
US20100274517 Chip Handler with a Buffer Traveling between Roaming Areas for Two Non-Colliding Robotic Arms  
Two robotic arms roam in separate, non-overlapping areas of a test station, avoiding collisions. A traveling buffer moves along x-tracks between a front position and a back position. In the front...
US20100299096 DELAY FAULT TESTING COMPUTER PRODUCT, APPARATUS, AND METHOD  
A computer-readable medium stores therein a program that causes a computer to execute acquiring for each chip, first delay values of paths in chips manufactured using circuit information...
US20090224792 METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CURRENTS  
A method is provided for predicting leakage current in a semiconductor die with a plurality of devices. A limited leakage macro is incorporated on the semiconductor die. The limited leakage macro...
US20080154530 Method for normalized test line limits with measurement uncertainty  
A method is provided for performing a diagnostic test on a piece of equipment, the equipment including a plurality of components and defining various pathways through respective subsets of the...
US20090319218 APPARATUS, METHOD AND COMPUTER-READABLE MEDIUM FOR TESTING A PANEL OF INTERFEROMETRIC MODULATORS  
In some embodiments, each interferometric modulator has a stiction threshold voltage. If a voltage above the stiction threshold voltage is applied to the interferometric modulator, the...
US20120123725 PERFORMING RELIABILITY ANALYSIS OF SIGNAL WIRES  
A computer-implemented system, method, and storage device simulate a periodic voltage waveform in a network model of the integrated circuit design. The method then determines resultant current...
US20060041397 Method for checking a integrated circuit for electrostatic discharge bobustness  
The invention is a method and a computer program product for checking an integrated circuit for electrostatic discharge (ESD) robustness at the design level and comprises essentially the check of...
US20130218493 DIAGNOSTICS FOR A PROGRAMMABLE LOGIC CONTROLLER  
To reduce the cost and/or space occupied by diagnostic circuitry in a module of a programmable logic controller with multiple outputs, a multiplexer connects the same diagnostic circuitry to the...
US20150177316 METHOD AND APPARATUS FOR AN EFFICIENT FRAMEWORK FOR TESTCELL DEVELOPMENT  
A method of performing a test using automated test equipment (ATE) is disclosed. The method comprises configuring a proxy application programming interface (API) services module, wherein the proxy...

Matches 1 - 50 out of 246 1 2 3 4 5 >