Matches 1 - 28 out of 28


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US20120063569 Two-Axis Sagittal Focusing Monochromator  
An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders...
US20120140891 Method for extracting a primary diffusion spectrum  
A method and device for spectrometry analysis and for extracting a primary diffuse spectrum from a diffusion spectrum of diffuse radiation, according to a diffusion angle, coming from a material...
US20110013744 Optical Positioner Design in X-Ray Analyzer for Coaxial Micro-Viewing and Analysis  
An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body...
US20120057677 TILTED GRATINGS AND METHOD FOR PRODUCTION OF TILTED GRATINGS  
The present invention relates to phase-contrast imaging which visualizes the phase information of coherent radiation passing a scanned object. Focused gratings are used which reduce the creation...
US20090225948 HIGHLY ALIGNED X-RAY OPTIC AND SOURCE ASSEMBLY FOR PRECISION X-RAY ANALYSIS APPLICATIONS  
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot...
US20100002838 HIGH PRECISION POSTURE CONTROL METHOD OF X-RAY MIRROR  
A high precision posture control method for sustaining the posture of an X-ray optical element constantly at 1 μrad or less. A longitudinal condensation mirror (5) and a lateral condensation...
US20100246769 X-RAY OPTICAL GRATING AND METHOD FOR THE PRODUCTION THEREOF, AND X-RAY DETECTOR EMBODYING SAME  
In a method for the production of x-ray-optical gratings composed of a first material forming of periodically arranged grating webs and grating openings, a second material is applied by...
US20100111254 METHOD FOR X-RAY WAVELENGTH MEASUREMENT AND X-RAY WAVELENGTH MEASUREMENT APPARATUS  
A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high...
US20130108022 METHOD FOR CHARACTERIZATION OF A SPHERICALLY BENT CRYSTAL FOR K-alpha X-RAY IMAGING OF LASER PLASMAS USING A FOCUSING MONOCHROMATOR GEOMETRY  
A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the Kα emission line reflected narrowly off angle of...
US20110135059 X-ray optical configuration with two focusing elements  
An X-ray optical configuration (1), comprising a position for an X-ray source (2), a position for a sample (3), a first focusing element (4) for directing X-ray radiation from the position of the...
US20110299658 X-RAY RADIATOR TO GENERATE QUASI-MONOCHROMATIC X-RAY RADIATION, AND RADIOGRAPHY X-RAY ACQUISITION SYSTEM EMPLOYING SAME  
For a quasi-monochromatic x-ray radiation with high radiation intensity, an x-ray radiator generates quasi-monochromatic x-ray radiation to expose a subject from a point-shaped radiation source...
US20110129065 X-RAY MONOCHROMATOR, METHOD OF MANUFACTURING THE SAME AND X-RAY SPECTROMETER  
An X-ray monochromator including: a substrate having a concave surface; and an inorganic oxide film formed on the concave surface and having a plurality of pores, in which the plurality of pores...
US20090161829 MONOCHROMATIC X-RAY MICRO BEAM FOR TRACE ELEMENT MAPPING  
An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area....
US20100054415 PHASE CONTRAST IMAGING  
Phase contrast imaging is achieved using a sample mask 8 and a detector mask (6). X-rays emitted from x-ray source (2) are formed into individual beams (16) by sample mask which pass through...
US20090290681 METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS  
Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in...
US20130272501 X-RAY IMAGING APPARATUS  
The present invention relates to an X-ray imaging apparatus including an X-ray source, a grating that divides diverging X-rays irradiated from the X-ray source, and a detector that detects X-rays...
US20120114101 METHODS AND SYSTEMS FOR THE DIRECTING AND ENERGY FILTERING OF X-RAYS FOR NON-INTRUSIVE INSPECTION  
Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams
US20050041779 X-ray zoom lens  
An optical array focussing X-rays comprises a plate e.g. made of silicon, on which are etched a series of concentric gaps to form channels through the plate, when X-rays are incident on the plate...
US20100183122 X-RAY CONDENSING METHOD AND ITS DEVICE USING PHASE RESTORATION METHOD  
An X-ray condensing method and its device are provided with an X-ray mirror that has a wavefront adjustable function to finely adjust a wavefront of a reflecting X-ray, measure an X-ray intensity...
US20120294426 COMPACT X-RAY ANALYSIS SYSTEM  
The invention relates to a device for the delivery of a beam of X-rays for analysis of a sample (50), comprising: a source block (100) comprising X-ray emission means;an optical block (200) placed...
US20110170666 XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE  
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic...
US20100195795 X-Ray multichannel spectrometer  
An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength...
US20160327499 Hard X-Ray Photoelectron Spectroscopy Apparatus  
[Problem] The present invention aims to solve the problems that size of X-ray monochromater crystal assembly is restricted and the vacuum of the X-ray source and the vacuum of the analysis chamber...
US20160260514 XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNED PACKAGE  
An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic...
US20160178541 APPARATUS FOR ANALYZING THIN FILM  
An apparatus analyzes a thin film having multiple layers. The apparatus includes an X-ray generator, a detector, and a signal processor. The X-ray generator radiates multi-wavelength X-rays...
US20160086681 Zone Plate and Method for Fabricating Same Using Conformal Coating  
A system and method for improving efficiency of zone plates fabricated by conformal layer coatings is disclosed. In embodiments, the inventive conformal layer coating zone plates provide increased...
US20150357069 HIGH BRIGHTNESS X-RAY ABSORPTION SPECTROSCOPY SYSTEM  
This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems....
US20150276628 X-RAY DIFFRACTION IMAGING SYSTEM WITH INTEGRATED SUPERMIRROR  
An x-ray diffraction imaging (XDI) system includes a plurality of x-ray sources configured to generate x-rays directed toward an object. The XDI system also includes a primary collimator...

Matches 1 - 28 out of 28