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US20110141824 |
LEAKAGE COMPENSATED REFERENCE VOLTAGE GENERATION SYSTEM
An e-fuse sense circuit employs a single ended sense scheme in which the reference voltage is compensated for leakage. A reference voltage generator includes a pull-up resistor of similar value to... |
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US20140126318 |
INTEGRATED CIRCUIT INCLUDING E-FUSE ARRAY CIRCUIT
An integrated circuit includes a high voltage generator generating a high voltage, a negative voltage generator generating a negative voltage, a divided voltage generator generating a divided... |
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US20100328987 |
E-FUSE APPARATUS FOR CONTROLLING REFERENCE VOLTAGE REQUIRED FOR PROGRAMMING/READING E-FUSE MACRO IN AN INTEGRATED CIRCUIT VIA SWITCH DEVICE IN THE SAME INTEGRATED CIRCUIT
An electrically programmable fuse (e-fuse) apparatus includes an e-fuse macro and a switch device. The e-fuse macro is disposed in an integrated circuit, and has a plurality of e-fuse units. The... |
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US20090003093 |
FUSE READING CIRCUIT
Correction data is written in fuse circuits of q bits. A reading circuit sequentially reads information of the fuse circuits through a selector and writes the information in a storage circuit.... |
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US20100329061 |
ELECTRICAL FUSE CIRCUIT FOR SECURITY APPLICATIONS
A fuse circuit is disclosed, which comprises at least one electrical fuse element having a resistance that changes after being stressed in an electromigration mode, a switching device serially... |
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US20070002658 |
Semiconductor device including a unique identifier and error correction code
A semiconductor device includes a plurality of laser fuses and each laser fuse represents a bit of data. A first set of the plurality of laser fuses represents a unique identifier that corresponds... |
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US20100329055 |
MEASURING ELECTRICAL RESISTANCE
A circuit having a first circuit configured to receive an input voltage and generate a first voltage that generates a first current flowing through a resistive device and a second voltage that... |
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US20110158026 |
FUSE CIRCUIT AND CONTROL METHOD THEREOF
A fuse circuit includes a plurality of fuse sets configured to perform fuse programming and generate fuse signals in response to fuse programming signals and a fuse control unit configured to... |
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US20140177373 |
SYSTEM INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES
An electrically reprogrammable fuse comprising an interconnect disposed in a dielectric material, a sensing wire disposed at a first end of the interconnect, a first programming wire disposed at a... |
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US20080266994 |
LEVEL DETECT CIRCUIT
A detect circuit may be used to detect one or more characteristics corresponding to the fuse being programmed. When the one or more characteristics of the fuse being programmed reach the desired... |
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US20110273949 |
ELECTRICAL FUSE PROGRAMMING TIME CONTROL SCHEME
A circuit includes a fuse and a sensing and control circuit. The fuse is coupled between a MOS transistor and a current source node. The sensing and control circuit is configured to receive a... |
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US20090180340 |
SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING COLUMN REDUNDANCY FUSE BLOCK
A semiconductor integrated circuit includes a semiconductor chip having an edge area and a bank area located an inner portion of the edge area, and a column redundancy fuse block disposed in the... |
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US20130176805 |
METHODS AND SYSTEMS INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES
An electrically reprogrammable fuse comprising an interconnect disposed in a dielectric material, a sensing wire disposed at a first end of the interconnect, a first programming wire disposed at a... |
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US20090141578 |
FUSE BOX AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME
A fuse box of a semiconductor memory device which comprises a plurality of fuse units commonly connected to a power line, each of the fuse units comprising a first fuse connected with the power... |
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US20090257300 |
FUSE INFORMATION CONTROL DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT USING THE SAME, AND CONTROL METHOD THEREOF
A fuse information control device having a delay circuit to delay an active signal, includes a fuse circuit that outputs fuse information in response to a fuse information control signal, and a... |
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US20060028895 |
Silver island anti-fuse
An silver island anti-fuse including a first electrical conductor, an electrically resistive material in contact with the first conductor and at least one silver island disposed opposite the first... |
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US20110002186 |
SECURE ELECTRICALLY PROGRAMMABLE FUSE AND METHOD OF OPERATING THE SAME
An electrically programmable fuse, a method of operating the same and an integrated circuit (IC) incorporating the fuse or the method. In one embodiment, the fuse includes: (1) at least one fuse... |
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US20060152991 |
Non-volatile memory storage of fuse information
A fuse-free circuit may include a NAND flash memory cell, and a switch to turn on or off in response to data stored in the NAND flash memory cell. The fuse-free circuit may be embodied in a... |
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US20090245005 |
RECOVERY OF EXISTING SRAM CAPACITY FROM FUSED-OUT BLOCKS
A system, device, and method are disclosed. In one embodiment the system includes an interconnect within an integrated circuit. The system also includes a first fuse-disabled design block within... |
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US20070058472 |
Fuse structure for semiconductor device and controlling method thereof
A fuse structure for a semiconductor device including a plurality of fuses, n first control lines, m second control lines, n first switches, and m second switches is described. In the above fuse... |
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US20090196113 |
Fuse circuit and semiconductor memory device including the same
The fuse circuit includes a first program unit, a second program unit and a sensing circuit. The first and second program units are programmed simultaneously. The first program unit is programmed... |
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US20090268530 |
Trigger Circuit of a Column Redundant Circuit and Related Column Redundant Device
A trigger circuit for triggering corresponding memory cells of a column redundant circuit includes a determining circuit for generating a determining signal according to an accessed row address,... |
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US20140098623 |
APPARATUSES AND METHODS FOR SENSING FUSE STATES
Apparatuses and methods for sensing fuse states are disclosed herein. An apparatus may include an array having a plurality of sense lines. A plurality of cells may be coupled to a sense line of... |
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US20080186788 |
ELECTRICAL FUSE AND ASSOCIATED METHODS
A fuse link of undoped material is connected between first and second doped material contact regions and a layer of conductive material is located above the first and second contact regions and... |
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US20110002188 |
Apparatus for Nonvolatile Multi-Programmable Electronic Fuse System
Electronic fuse (e-fuse) systems with multiple reprogrammability are provided. In one aspect, a reprogrammable e-fuse system is provided that includes a first e-fuse string; a second e-fuse... |
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US20090168580 |
FUSE MONITORING CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE
A fuse monitoring circuit for a semiconductor device includes a repair fuse unit including a number of fuses to which a repair address is programmed, and configured to output fuse state signals... |
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US20080089151 |
Methods of determining laser alignment and related structures, devices, and circuits
Methods may be provided to determine an alignment of a laser with respect to an integrated circuit device including a fuse pattern and a monitoring pattern adjacent the fuse pattern. More... |
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US20070217276 |
FUSE LATCH CIRCUIT, SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MEMORY SYSTEM
A data storing fuse element unit includes a plurality of fuse elements, stores data in the respective fuse elements in a bit unit in accordance with presence and absence of cutting of fuse... |
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US20140071779 |
E-FUSE ARRAY CIRCUIT
An e-fuse array circuit includes a program gate line and a word line gate line that are stretched in parallel to each other, and a metal line formed over the program gate line and the word line... |
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US20090231901 |
SEMICONDUCTOR INTEGRATED CIRCUIT FOR SUPPORTING A TEST MODE
A semiconductor integrated circuit for supporting a test mode includes a program region including at least one One Time Programmable Cell Array, and a program region control unit configured to... |
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US20090285036 |
Fuse data read circuit having control circuit between fuse and current mirror circuit
A fuse data read circuit includes a fuse data holding unit which holds fuse data, a fuse data read unit which detects fuse data, and a bias voltage generating circuit which generates a bias... |
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US20110103170 |
NOVEL FUSE PROGRAMMING SCHEMES FOR ROBUST YIELD
An embodiment of the present invention is a technique to program a fuse. A program circuit generates first and second currents to program the fuse. The second current is higher than the first... |
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US20090238022 |
SEMICONDUCTOR DEVICE AND CONTROLLING METHOD OF SEMICONDUCTOR DEVICE
A semiconductor device includes: a setting circuit which sets a first setting value; a control circuit which receives a predetermined control signal and the first setting value so as to output a... |
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US20090067252 |
FUSE DATA ACQUISITION
One or more embodiments of the present disclosure provide methods, devices, and systems for operating memory devices having fuse circuits. One method embodiment includes detecting a signal... |
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US20080170457 |
METHOD FOR SENSING A SIGNAL IN AN INTEGRATED CIRCUIT COMPLEMENTARY FUSE ARRANGEMENT
A method for sensing an electrical signal includes the steps of: providing an arrangement having a fuse connected in series to an antifuse, the arrangement further having an output tap connected... |
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US20140126317 |
E-FUSE ARRAY CIRCUIT
An e-fuse array circuit includes a high voltage pumping unit configured to generate a high voltage by pumping a power source voltage, a negative voltage pumping unit configured to generate a... |
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US20100232248 |
Implementing eFuse Resistance Determination Before Initiating eFuse Blow
A method and an eFuse programming circuit for implementing resistance determination of an eFuse before initiating eFuse blow, and a design structure on which the subject circuit resides are... |
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US20110235453 |
FUSE CIRCUIT AND REPAIR CONTROL CIRCUIT USING THE SAME
A fuse circuit includes a fuse driving unit, a separation/connection unit, a voltage equalization unit, and a latching unit. The fuse driving unit is configured to drive an output terminal in... |
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US20100061168 |
FUSES FOR MEMORY REPAIR
Structures for fuses to control repair of multiple memories embedded on an integrated circuit are provided along with methods of use. A set of fuses is shared to control repair of a plurality of... |
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US20140313842 |
E-FUSE ARRAY CIRCUIT
An e-fuse array circuit includes: an e-fuse transistor of a vertical gate type configured to have a gate for receiving a voltage of a program gate line and have one between a drain terminal and a... |
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US20140071780 |
E-FUSE ARRAY CIRCUIT
An e-fuse array circuit includes: an e-fuse transistor of a vertical gate type configured to have a gate for receiving a voltage of a program gate line and have one between a drain terminal and a... |
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US20060067117 |
Fuse memory cell comprising a diode, the diode serving as the fuse element
A memory cell is formed of a semiconductor junction diode interposed between conductors. The cell is programmed by rendering the memory cell very high-resistance, such that current no longer flows... |
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US20080159042 |
LATCH CIRCUITS AND OPERATION CIRCUITS HAVING SCALABLE NONVOLATILE NANOTUBE SWITCHES AS ELECTRONIC FUSE REPLACEMENT ELEMENTS
A non-volatile latch circuit is provided. The non-volatile latch circuit includes a nanotube switching element capable of switching between resistance states and non-volatilely retaining the... |
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US20100014374 |
FUSE ELEMENT READING CIRCUIT
A fuse element reading circuit including a first fuse element having a resistance which differs in accordance with whether the first fuse element is in a blown state or an unblown state, a... |
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US20090010085 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND REDUNDANCY METHOD THEREOF
A semiconductor integrated circuit device includes a first fuse circuit, a second fuse circuit, and a control signal generating circuit which sends a first control signal and executes program such... |
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US20100118636 |
Methods and Systems Involving Electrically Reprogrammable Fuses
An electrically reprogrammable fuse comprising an interconnect disposed in a dielectric material, a sensing wire disposed at a first end of the interconnect, a first programming wire disposed at a... |
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US20090168581 |
FUSE MONITORING CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE
A fuse monitoring circuit for a semiconductor memory device includes a fuse repair unit including a plurality of fuses each programmed with at least one repair address, configured to receive a... |
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US20100290298 |
FUSE CIRCUIT AND REDUNDANCY CIRCUIT
A fuse circuit or a redundancy circuit is capable of detecting a fuse with a crack. The fuse circuit includes a fuse block configured to drive an output node through a current path including a... |
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US20100014373 |
REGULATING ELECTRICAL FUSE PROGRAMMING CURRENT
An apparatus for regulating eFUSE programming current includes a current control generator receiving an input reference current through a first current path of reference fuses, the input reference... |
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US20080186789 |
ELECTRIC FUSE CIRCUIT AVAILABLE AS ONE TIME PROGRAMABLE MEMORY
A first transistor is connected in series with one end of a fuse element. A second transistor is connected in series with the other end of the fuse element. A current flows through the fuse... |