Matches 1 - 50 out of 127 1 2 3 >


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US20130120760 AMBIENT LIGHT REJECTION FOR NON-IMAGING CONTACT SENSORS  
A sensor for capturing images of skin topology is provided having a platen, and a one or two-dimensional array of light sensing pixel elements for receiving light representative of skin topology...
US20120182542 Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology  
An optical metrology apparatus for measuring nanoimprint structures using Vacuum Ultra-Violet (VUV) light is described.
US20130050699 METHOD AND APPARATUS FOR DETERMINING FLATNESS CHARACTERISTIC FOR REFLECTIVE FACET OF POLYGON ASSEMBLY  
A method for determining a flatness characteristic for a facet of a polygon assembly includes a) rotating a polygon assembly with facets at a desired speed, b) directing a light beam from a light...
US20140043621 SURFACE FEATURES CHARACTERIZATION  
Provided herein is an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article; and a characterization means for characterizing...
US20150146216 METHOD AND DEVICE FOR OPTICALLY MEASURING THE INTERIOR OF A PIPE  
The invention relates to a method and a device for optically measuring the interior of a seamless pipe which is manufactured by rolling or of a pipe which is welded with a longitudinal seam and is...
US20150226544 OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS  
An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence...
US20130205660 SEED SORTER  
Systems and methods are provided for evaluating and sorting seeds based on characteristics of the seeds. One method generally includes collecting image data from different parts of the seeds, and...
US20080304081 Acquisition of Surface Normal Maps from Spherical Gradient Illumination  
An apparatus for generating a surface normal map of an object may include a plurality of light sources having intensities that are controllable so as to generate one or more gradient illumination...
US20080088855 Shape Evaluation Method, Shape Evaluation Device, And Device Having The Shape Evaluation Device  
A shape evaluation device performs simulation by using an annular light source or concentric light source instead of a rectilinear light source and calculates a characteristic line for performing...
US20130141577 APPARATUS AND METHOD FOR DETECTING ROAD SURFACE PROPERTIES  
Disclosed is a technique for detecting a road surface property. More specifically, the technique includes a reflectivity table that stores a degree of reflectivity of a rainy road relative to a...
US20120086952 Providing Thermal Compensation for Topographic Measurement at an Elevated Temperature Using a Non-Contact Vibration Transducer  
A mechanism for providing thermal compensation when measuring surface topography at an elevated temperature using a non-contact vibration transducer, such as a laser Doppler vibrometer (LDV)....
US20110199619 MEASURING STATION FOR HIGH-GLOSS SURFACES  
The invention relates to a method of measuring a profile of a reflecting face of a work piece, in particular a reflecting face of an end (2) of a pipe section, in that an electrical field is...
US20100157315 HYBRID DIFFRACTION MODELING OF DIFFRACTING STRUCTURES  
Diffraction modeling of a diffracting structure employing at least two distinct differential equation solution methods. In an embodiment, a rigorous coupled wave (RCW) method and a coordinate...
US20150226543 OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS  
An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence...
US20070139658 Luminous projecting device for the topography of spherical and non-spherical reflective surfaces  
A luminous projecting device for the topography of spherical and non-spherical reflecting surfaces, adapted to a slit lamp, and/or any other focused and projected light source illumination system,...
US20080024794 Semiconductor Surface Inspection Apparatus and Method of Illumination  
In a semiconductor surface inspection apparatus for inspecting the surface of a semiconductor device as a test object based on an optical image thereof, the present invention achieves illumination...
US20150073654 METHOD FOR DETERMINING A ROADWAY IRREGULARITY IN A ROADWAY SECTION ILLUMINATED BY AT LEAST ONE HEADLIGHT OF A VEHICLE AND METHOD FOR CONTROLLING A LIGHT EMISSION OF AT LEAST ONE HEADLIGHT OF A VEHICLE  
A method is provided for determining a roadway irregularity in a roadway section illuminated by at least one headlight of a vehicle. The method has a step of recognizing an instantaneous light...
US20060192979 Optical measuring process and precision measuring machine for determining the deviations from ideal shape of technically polished surfaces  
In a known measuring process, the stability for the generation of two measuring beams, by means of two measuring systems operating in the same measurement strategy is given. The reflection angle...
US20100328679 Method and System for Device Identification  
Disclosed is a medical device susceptible of identification using interference patterns. A source signal may be directed from an energy source towards the surface of a device for reflection...
US20110013176 METHOD AND DEVICE FOR DETERMINING PROPERTIES OF TEXTURED SURFACES  
A method of determining properties of textured surfaces with the steps: irradiation of radiation onto the surface (10) to be investigated;detection of at least part of the radiation irradiated...
US20130222815 CHROMATIC RANGE SENSOR INCLUDING MEASUREMENT RELIABILITY CHARACTERIZATION  
A method of categorizing the reliability of measurement data in a chromatic range sensor (e.g., an optical pen) which uses chromatically dispersed light to measure the distance to a surface. In...
US20090262367 Device for Acquiring a Three-Dimensional Video Constituted by 3-D Frames Which Contain the Shape and Color of the Acquired Body  
A device for acquiring the three-dimensional shape of the surface of an object comprises a lens; deflection means; at least two masks; at least two projection assemblies adapted to emit light...
US20120069354 Vision recognition system for produce labeling  
A vision recognition system is provided for use with a high speed, automatic produce labeling machine. The system uses laser profiling to direct a sheet of light transversely to the longitudinal...
US20120188559 DEVICE FOR OPTICALLY SCANNING AND MEASURING AN ENVIRONMENT  
In a laser scanner for optically scanning and measuring an environment, the scanner having a center which defines for a scan the stationary reference system of the scanner and the center of the...
US20130188199 NORMAL VECTOR TRACING ULTRA-PRECISION SHAPE MEASUREMENT METHOD  
[Object] To provide a drive axis control method used by a normal vector tracing ultra-precision shape measurement device that derives a surface shape of an object to be measured from coordinates...
US20150131108 SYSTEM AND METHOD FOR INSPECTING RAILROAD TIES  
A system for inspecting railroad ties in a railroad track includes a light generator, an optical receiver and a processor. The light generator is oriented to project a beam of light across the...
US20110080593 SURFACE SHAPE MEASUREMENT APPARATUS  
An apparatus for measuring a shape of a surface, comprises a measurement head which measures at least one of a distance between a reference point and the surface and a direction of a normal from...
US20120315056 DIFFUSE REFLECTION OUTPUT CONVERSION METHOD, ATTACHED POWDER AMOUNT CONVERSION METHOD, AND IMAGE FORMING APPARATUS  
In an embodiment, a diffuse reflection output conversion method is executed in an apparatus detecting a plurality of gradation patterns. The apparatus includes a light emitter and light receiver,...
US20150015894 DETERMINING GEOMETRIC CHARACTERISTICS OF REFLECTIVE SURFACES  
Illustrative embodiments of determining geometric characteristics of reflective surfaces are disclosed. In at least one illustrative embodiment, a method of determining geometric characteristics...
US20090040533 Tire shape measuring system  
A tire shape measuring system measures a surface shape on the basis of an image of a line of light (a light section line) emitted to a surface of a relatively rotating tire using a light-section...
US20070146728 Method and device for detecting, determining and documenting damage, especially deformations in lacquered surfaces caused by sudden events  
A method and a device for detecting, determining and documenting damage to painted surfaces, especially parts of the bodywork of vehicles, utilizes light from at least one heavily focusing light...
US20100060905 METHOD AND SYSTEM FOR MEASURING THE SHAPE OF A REFLECTIVE SURFACE  
The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14)...
US20100328649 MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD  
This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a...
US20150015870 Overlay Abnormality Gating by Z Data  
The present disclosure relates to a method of monitoring wafer topography. A position and orientation of a plurality first alignment shapes disposed on a surface of a wafer are measured. Wafer...
US20100231894 OPTICAL DEVICE FOR OBSERVING MILLIMETRIC OR SUBMILLIMETRIC STRUCTURAL DETAILS OF AN OBJECT WITH SPECULAR BEHAVIOUR  
A device for observation, by reflection, of the structural details of an object (2) that exhibits a behaviour that is at least partially specular, located in an exposure area, which includes: at...
US20120120393 TIME AND SPACE RESOLVED STANDOFF HYPERSPECTRAL IED EXPLOSIVES LIDAR DETECTOR  
A system and method for standoff detection of explosives and explosive residue. A laser light source illuminates a target area having an unknown sample producing luminescence emitted photons,...
US20080291468 Apparatus and method for measuring height of protuberances  
The height of protuberances present on the surface of a product, typically a bump wafer, can be measured with a high accuracy irrespective of the state of the upper surfaces of the protuberances....
US20080180695 Unevenness elimination end-point detecting apparatus and unevenness elimination end-point detecting method for CMP apparatus  
An unevenness elimination end-point detection apparatus for a CMP apparatus which polishes a film to be polished formed on a wafer surface includes: light irradiation means for irradiating a light...
US20090242527 Method and Apparatus for Processing Coated Spectacle Lenses  
By means of the method and the apparatus in accordance with the invention, coated spectacle lenses are processed to form at the latter joining surfaces which permit a reliable adhesive bonding of...
US20130039460 METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN  
Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The...
US20090042481 METHOD OF CALIBRATING OR COMPENSATING SENSOR FOR MEASURING PROPERTY OF A TARGET SURFACE  
A method of calibrating or compensating a sensor for measuring property of target surface is provided. In one embodiment, a liquid reference surface is formed on a platen. A sensor is used to...
US20130021610 Method and apparatus for real-time determination of spherical and non-spherical curvature of a surface  
The present invention provides for an apparatus for measuring a curvature of a surface of a wafer in a multi-wafer epitaxial reactor.
US20090195790 IMAGING SYSTEM AND METHOD  
An apparatus for measuring the coordinates of a point on the surface of an object comprises a projection system for projecting a beam of energy onto the surface of the object, a receiving system...
US20120126141 SURFACE COATING FOR INSPECTION  
A method of inspecting an article, comprising applying an organic liquid substance over at least a portion of the article to be inspected so as to form a surface layer thereon, wherein said...
US20090310126 Method and apparatus for raised material detection  
A method is provided of detecting a region of raised material on a document surface. A surface of the document is illuminated with at least one angled radiation beam such that any raised material...
US20090157210 METHOD FOR ANALYZING REFLECTION PROPERTIES  
A method allows analyzing and describing the reflective properties of a three-dimensionally structured original surface. The topology of the original surface is determined and the topological data...
US20130033710 NON-ENERGY DISSIPATING, CURVATURE SENSING DEVICE AND METHOD  
A non-energy dissipating, curvature sensing device senses curvature variation of a sample and comprises an outer layer, an inner layer and at least one spacer. The outer layer is flexible,...
US20130235472 ASPHERIC SURFACE MEASURING METHOD, ASPHERIC SURFACE MEASURING APPARATUS, OPTICAL ELEMENT PRODUCING APPARATUS AND OPTICAL ELEMENT  
The method includes: calculating positional and angular magnification distributions of rays reflected by a reference aspheric surface on a light-receiving sensor and on a sensor conjugate surface;...
US20120221142 Sequential Scanning Of Multiple Wavelengths  
A system is provided for identifying at least one physical characteristic of items in a stream of items moving along a path through an inspection zone, and for separating items from the stream of...
US20120026512 APPARATUS AND METHOD FOR DETERMINING SURFACE CHARACTERISTICS USING MULTIPLE MEASUREMENTS  
An apparatus (1) for determining surface characteristics of measuring surfaces, comprising at least one first radiation device (2) that emits radiation onto a measuring surface (10), at least one...

Matches 1 - 50 out of 127 1 2 3 >