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Match Document Document Title
US20110149299 CONTACTLESS OPTICAL GLIDE HEAD  
A device for detecting disk asperities. The device includes an optical glide head. The glide head is not required to physically contact a disk for detection of the disk asperities. The optical...
US20150153167 TEXTURE AUTOMATIC MONITORING SYSTEM  
A texture automatic monitoring system for measuring surface texture of a road surface compacted by a road roller is measured by texture measurement equipment mounted on the road roller. The road...
US20130258351 SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD  
A surface inspection tool 110 measures scattering light intensity of scattering light generated by irradiated irradiation light in association with a measurement coordinate on a wafer 200 with...
US20120262723 SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD  
A surface inspection tool 110 measures scattering light intensity of scattering light generated by irradiated irradiation light in association with a measurement coordinate on a wafer 200 with...
US20110037988 LINE EDGE ROUGHNESS MEASURING TECHNIQUE AND TEST STRUCTURE  
A test structure is presented test structure on a substrate for monitoring a LER and/or LWR effect, said test structure comprising an array of features manufactured with amplified LER and/or LWR...
US20110090512 SURFACE INSPECTION TOOL AND SURFACE INSPECTION METHOD  
An object of the present invention is to provide a surface inspection tool in which a flat inspection range capable of measuring surface roughness of a wafer with patterns with high accuracy and...
US20080088830 OPTICAL SYSTEM OF DETECTING PERIPHERAL SURFACE DEFECT OF GLASS DISK AND DEVICE OF DETECTING PERIPHERAL SURFACE DEFECT THEREOF  
In the present invention, since light beams are irradiated from a back face of a glass disk through the glass disk on to an outer peripheral chamfered portion at a front face side of the glass...
US20150056891 MEASURING METHOD OF SURFACE ROUGHNESS OF POLISHING PAD  
There is disclosed a measuring method of a surface roughness of a polishing pad which can measure a surface roughness index of the polishing pad showing a strong relationship with polishing...
US20080266575 Hybrid Contact Mode Scanning Cantilever System  
This invention addresses a contact mode hybrid scanning system (HSS), which can be used for measuring topography. The system consists of a cantilever or a cantilever array, a scanning stage, a...
US20050275850 Shape roughness measurement in optical metrology  
A simulated diffraction signal to be used in measuring shape roughness of a structure formed on a wafer using optical metrology is generated by defining an initial model of the structure. A...
US20090177428 Method of Measuring Peripheral Tilt Angle, Method and Device for Inspecting Inspection Object Having Surface Mounds, Method of Determining Position of Illumination Means, Irregularity Inspection Device, and Light Source Position Determining Device  
The method of measuring a peripheral tilt angle in accordance with the present invention, to address the problems, is a method of measuring a peripheral tilt angle on an inspection object having...
US20140355003 LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION  
In order to make it possible for a difference between a defect and a normal part, such as contrast, to appear, a lighting device for inspection is provided with: a surface light source that emits...
US20120257217 SYSTEMS AND METHODS FOR CALIBRATING AN OPTICAL NON-CONTACT SURFACE ROUGHNESS MEASUREMENT DEVICE  
A calibration apparatus for an optical non-contact surface roughness measurement device allowing for quick, accurate, and repeatable device calibration is described. In certain embodiments, the...
US20130129929 Sensor for Registering a Measurement Variable of a Medium  
A sensor for registering a measurement variable of a medium, comprising a sensing body with a section of surface area, which is exposed to the medium to register the measurement variable, whereby...
US20100182613 DOPPLER SENSOR FOR THE DERIVATION OF TORSIONAL SLIP, FRICTION AND RELATED PARAMETERS  
An optical method and apparatus are described for the measurement of properties of a travel vehicle or a travel surface upon which the travel vehicle travels, which includes providing an incident...
US20050280687 Sheet-type detection device  
A reading sensor has first and second detection regions. The first detection region has high directivity and detects a thickness of a recording sheet. The second detection region has low...
US20090147270 System and method for investigating and/or determining the condition or state of a ship's hull  
A system and a method for investigating and/or determining the condition or the state of a ship's hull, in particular its outer skin, for making it possible to select, in particular to lengthen,...
US20080165367 ROUGHNESS EVALUATION METHOD AND SYSTEM  
A roughness evaluation method for evaluating a roughness of lines formed on a substrate includes a measuring step of irradiating light onto a plurality of locations of the substrate and measuring...
US20090046299 NANOSCALE IMAGING VIA ABSORPTION MODULATION  
An imaging system is provided. The imaging system includes a sample to be scanned by the imaging system. An absorbance modulation layer (AML) is positioned in close proximity to the sample and is...
US20140293292 Device For Measuring The Surface State Of A Surface  
Devices for measuring the surface state of a surface, at least one portion of which has a surface curvature. The devices may includes a probe for being in contact with the curved surface portion....
US20110310398 FRICTION-COEFFICIENT ESTIMATING DEVICE AND FRICTION-COEFFICIENT ESTIMATING METHOD  
A friction-coefficient estimating device is configured to estimate friction coefficient of the surface of a medium in a form of a sheet by irradiating a light on the surface and by detecting...
US20140081573 DETECTING ROAD WEATHER CONDITIONS  
Aspects of the disclosure relate generally to detecting road weather conditions. Vehicle sensors including a laser, precipitation sensors, and/or camera may be used to detect information such as...
US20080123106 Surface Roughness Measurement Methods and Apparatus  
Surface roughness measurements are made by illuminating a surface with coherent light to generate a speckle pattern and studying characteristics of the speckle pattern. The disclosed techniques...
US20120243003 ASPERITY DETECTION DEVICE FOR CAN  
Provided is an asperity detection device for a can which does not need an additional conveyance device for inspection, reduces increased inspection costs, and allows for quick detection of...
US20090122299 Optical Sub Wavelength Super Resolution Imaging System and Method  
An imaging method and system are presented for use in sub-wavelength super resolution imaging of a subject. The imaging system comprises a spatial coding unit configured for collecting light...
US20080259351 Device and Method for Recognizing Particles in Milk  
A device for recognizing particles in milk comprising a measuring surface and a housing. The measuring surface is structured so as to cause the milk to spread on the measuring surface in that the...
US20080079951 DETECTION APPARATUS, DETECTION METHOD, AND OPTICALLY TRANSPARENT MEMBER  
Provided are a detection apparatus, a detection method and an optically transparent member, which can detect a decrease in a precision. A convolution is performed by a convolution portion 80...
US20120170051 METHOD AND DEVICE FOR INSPECTING THE QUALITY OF A FORMED THERMOPLASTIC FIBER-REINFORCED PLASTIC COMPONENT  
A method and a device for inspecting the quality of a formed thermoplastic fiber-reinforced plastic component wherein the component is tested by means of a sensor unit with a downstream electronic...
US20100265518 Back Quartersphere Scattered Light Analysis  
A surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem....
US20070242583 METHOD AND APPARATUS FOR MEASURING SURFACE STRUCTURE OF A NEAR-FIELD OBJECT  
A method for measuring a surface structure of a near-field object is provided. A light source produces at least a first light beam and a second light beam; guiding the first light beam and the...
US20080151261 Process and apparatus for online detection of surface irregularity in threadlines  
The invention concerns a process and apparatus for monitoring the level of surface irregularity in a moving threadline, comprising: (a) illuminating the threadline via a light source positioned...
US20070149882 Device for visualizing object attributes  
A device for visualizing object attributes is provided. The visualization device includes a projector that is operative to project in a position-directed manner. A data input device is operative...
US20100328676 METHOD FOR DETECTING IMPURITIES ON A SURFACE  
A method is provided for detecting not fully set coatings and liquid or smearing impurities on a surface, in which in a first step a film is pressed onto a surface of a coating using a predefined...
US20100037674 Test Surfaces Useful for Calibration of Surface Profilometers  
The present invention provides for test surfaces and methods for calibration of surface profilometers, including interferometric and atomic force microscopes. Calibration is performed using a...
US20110080645 HARD-COATED ANTIGLARE FILM, POLARIZING PLATE AND IMAGE DISPLAY INCLUDING THE SAME, METHOD FOR PRODUCING THE SAME, AND METHOD FOR EVALUATING THE SAME  
A hard-coated antiglare film that has superior antiglare properties, allow high definition to be provided even in the case of a low haze value, can prevent white blur in an oblique direction from...
US20110080644 HARD-COATED ANTIGLARE FILM, POLARIZING PLATE AND IMAGE DISPLAY INCLUDING THE SAME, METHOD FOR PRODUCING THE SAME, AND METHOD FOR EVALUATING THE SAME  
A hard-coated antiglare film that has an extremely low haze value, superior anti-fluorescent lamp glare properties, and anti-face glare properties, and can improve the depth of black in black...
US20070273890 Method and Device for Measuring Coarseness of a Paint Film  
A method for analyzing the visual coarseness of a paint film comprising effect pigments by means of a measuring device having a cavity with reflective inner walls and a sample opening, the device...
US20130222788 ROUGHNESS EVALUATING APPARATUS, AND OBJECT EVALUATING APPARATUS AND ROUGHNESS EVALUATING METHOD USING THE SAME  
Provided is a roughness evaluating apparatus including: a generating unit configured to generate an electromagnetic wave pulse; a detecting unit configured to detect the electromagnetic wave pulse...
US20130222787 ROUGHNESS EVALUATING APPARATUS, AND OBJECT EVALUATING APPARATUS AND ROUGHNESS EVALUATING METHOD USING THE SAME  
Provided is a roughness evaluating apparatus including: a generating unit configured to generate an electromagnetic wave pulse; a detecting unit configured to detect the electromagnetic wave pulse...
US20090042481 METHOD OF CALIBRATING OR COMPENSATING SENSOR FOR MEASURING PROPERTY OF A TARGET SURFACE  
A method of calibrating or compensating a sensor for measuring property of target surface is provided. In one embodiment, a liquid reference surface is formed on a platen. A sensor is used to...
US20110135330 PAPER TYPE DETERMINATION DEVICE  
A paper type determination device of the invention drives plural light emitting points different from one another and having sequentially increasing distances from a reference point to emit light...
US20080013102 Micro-electromechanical sensor device  
A sensor device (100) comprises a holding body (10), at least one deflectable sensor element (20) fixed to the holding body (10), and a sensor array (30) with a plurality of sensitive layers (31)...
US20090310143 APPARATUS FOR MEASURING CARRIAGEWAY SURFACE PROPERTIES  
An apparatus for measuring surface properties of a carriageway or road, comprising a platform arranged to move over the carriageway, the platform carrying a light source arranged to illuminate the...
US20120019835 DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS  
Provided are a defect inspecting method and a defect inspecting apparatus, wherein defect detecting sensitivity is improved and also haze measurement is performed using polarization detection,...
US20090290168 Inspecting Method and Inspecting Apparatus for Substrate Surface  
To inspect a substrate such as a semiconductor substrate for surface roughness at high precision. The surface roughness of the substrate is measured in each frequency band of the surface roughness...
US20060268283 Optical method and device for texture quantification of photovoltaic cells  
The invention relates to an optical method and device for the texture quantification of photovoltaic cells. The inventive method and device are suitable for texture morphologies that are...
US20140153000 APPARATUS FOR DETECTING THE FLATNESS OF WAFER AND THE METHOD THEREOF  
An apparatus for detecting the flatness of a top surface of a wafer includes a plurality of detector elements, a metal sink and a plurality of injection pipes. Each detector element comprises: a...
US20100134804 Method and device for determining the topography of a material surface  
A method and a device for determining a topography under load of the surface of a material, wherein a test piece (40) of the material intended to be determined is subjected to a compression with a...
US20130208285 METHOD AND DEVICE FOR MEASURING THE COLOUR AND OTHER PROPERTIES OF A SURFACE  
The invention relates to a device and method for measuring the properties of a surface. The device comprises means for producing illuminating light, which means are arranged to aim the...
US20070229791 Step Measuring Device and Apparatus, and Exposure Method and Apparatus  
A step measuring method by which height distribution can be accurately measured in the case of exposing an object by a scanning exposure method, even when a plurality of areas having different...

Matches 1 - 50 out of 80 1 2 >