Matches 1 - 50 out of 194 1 2 3 4 >


Match Document Document Title
US20140016122 Chemical Indicator Obstruction Detection System and Method For An Aquatic Environment  
A system and method for determining adverse conditions associated with a chemical indicator in an aquatic environment monitoring system in which reference illumination from an optical reader is...
US20070182953 Inspection apparatus for conveyor system  
A video monitor for a conveyor system consists of a camera assembly, a recorder assembly and a power supply. The camera assembly includes a camera tube which contains the camera. The camera tube...
US20050231713 Imaging semiconductor structures using solid state illumination  
The invention consists of a camera, light sources, lenses and software algorithms that are used to image and inspect semiconductor structures, including through infrared radiation. The use of...
US20140300384 Solar Cell Characterization System With an Automated Continuous Neutral Density Filter  
Techniques for solar cell electrical characterization are provided. In one aspect, a solar testing device is provided. The device includes a solar simulator; and a continuous neutral density...
US20130271753 SOILING CHECK OF THE WINDOW OF A MEASURING APPARATUS FOR CHECKING SHEET MATERIAL  
A method carries out a soiling check of the measurement window of a measuring device for checking sheet material. A measuring device carries out the method. A device for processing a sheet...
US20050162643 Automotive fuel tank inspection device  
An inspection device for inspecting the interior of an enclosed volume. The inspection device includes a display and an imaging probe coupled to the display. The imaging probe includes a first end...
US20130222794 OPTICAL PROBE FOR VISION MEASUREMENTS  
A coordinate measurement machine having a feeler whose position is determined optically and a lens for use in such a machine and a method for making a lens for a coordinate measurement machine,...
US20150198480 LED TESTING PROCESS AND CORRECTION METHODS THEREFOR  
Disclosed is a method of generating a correction function for a light-emitting diode (LED) testing process. The method comprises the steps of: detecting light emitted by a reference LED and...
US20080165351 Detection Circuit  
A method for inspecting a strip in a reversible rolling plant comprising at least one cage arranged between two winding/unwinding devices each having a mandrel. The rolling is performed in several...
US20130169956 MARKING AND DEFECT RECOGNITION PROCEDURE IN PREPREG MATERIAL  
A defect recognition procedure in prepreg materials (1) draws a first transversal cross line (4b) at the beginning boundary (3b) of a defective area (2) in a prepreg material (1). A second...
US20120050728 IDENTIFYING DEFECTS  
Identifying systematic defects in wafer processing including performing defect inspection of a plurality of wafers, identifying defects in each of the plurality of wafers as not being associated...
US20080192244 Jewish-Law-Compliant Insect Checker and Sabbath Toothbrush  
Devices for assisting in the observance of Jewish law are provided. An insect checking devise includes a light source in the form of a light board including a translucent surface powered by...
US20110292384 SYSTEM AND METHOD FOR DETECTION OF FLEXIBLE PIPE ARMOR WIRE RUPTURES  
A system and method for detecting breakage, rupture or malfunctioning of a pipe or cable structure, including sensing elements for monitoring the structure and placed in, on or around the...
US20130321795 DEFECT TESTER  
A defect tester for detecting a defect in an article in a machine arrangement includes a starwheel having one or more pockets configured to hold respective one or more articles. The defect tester...
US20140016124 OPTICAL INSPECTION DEVICE  
An optical inspection device includes a circuit board having at least one first opening, a mounting plate disposed on a top or bottom surface of the circuit board and having at least one second...
US20050174567 Crack detection system  
A system is provided to determine the presence of cracks in parts. The presence of cracks is determined through the use of an imaging device and illumination source. The part is moved along a...
US20130111852 Method of Using a Sterilization Wrap System  
A method of using a sterilization wrap system including a permeable material having barrier properties and having a first surface and a second opposing surface, the exterior panel being...
US20090116003 APPARATUS FOR DETECTING JOINTS IN RUBBER SHEETS  
A method for detecting defects in, and/or geometrical characteristics of, at least one joint or splice of sheet pieces, in a unloaded state, characterised by the following steps: a. subjecting...
US20130050688 MASK INSPECTING METHOD  
A mask inspecting method includes the following steps. A processing parameter is defined. An incident light is decided by the processing parameter. At least a portion of the incident light is...
US20080302705 Process for determining whether used friction elements may be returned to service  
A sorting process for used friction elements such as friction discs is provided, including determining whether the friction elements are heat compromised based at least in part on a wave...
US20070260406 AUTOMATED LOCATION SYSTEM  
An automated location system that includes providing the number of rows and columns of a receptacle to the automated location system; scanning the receptacle to determine changes in reflectivity;...
US20090237652 APPARATUS FOR INSPECTING DEFECTS OF HONEYCOMB STRUCTURE  
According to an apparatus for inspecting defects of a honeycomb structure that is provided with a current plate and an air current formation means (air source and a header tube), fine defects or...
US20090107896 AIR SEPARATOR CONVEYOR AND VISION SYSTEM  
A system for accurately determining whether a work piece such as a plastic molded bottle cap is defective from quality norms and removing those defective pieces from a stream of work pieces...
US20070268483 Inspection apparatus for image pickup device, optical inspection unit device, and optical inspection unit  
A probe card is equipped with a plurality of openings that transmit light to an image pickup device. An optical inspection unit that emits a test light through the plurality of openings of the...
US20110063606 AUTOMATED FILLET INSPECTION SYSTEM WITH CLOSED LOOP FEEDBACK AND METHODS OF USE  
Systems and methods for automated inspection of fillet formation along on or more peripheral edges (13a) of a packaged microelectronic device (14) that is attached to a supporting substrate (16),...
US20110043794 Dark-Field Examination Device  
The present invention relates to a dark-field examination device. The dark-field examination device according to the present invention is characterized in that it comprises: an illumination unit...
US20090179656 LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE  
The present invention relates to a device for testing an optoelectronic module, comprising a first source for generating an electromagnetic beam or particle beam, a second source for illuminating...
US20080204733 Sensing in Meat Products and the Like  
Methods and devices for sensing foreign bodies and the like in products, such as food products, are described. Said products, which are generally light transmissive, are backlit by a source of...
US20120013897 DISTANCE ADJUSTMENT SYSTEM FOR USE IN SOLAR WAFER INSPECTION MACHINE AND INSPECTION MACHINE PROVIDED WITH SAME  
The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an...
US20090153847 VERIFICATION OF TOW CUT FOR AUTOMATIC FIBER PLACEMENT  
The operation of tow cutters in an automatic fiber placement machine are monitored to determine if inconsistencies in fiber placement are related to cutter operation. A machine vision system...
US20140285796 DEFECT DETECTION IN SATURABLE ABSORBERS  
Technologies are generally described for identifying defects in saturable absorbers, such as graphene, by the saturable property of decreasing light absorbance with increasing light intensity. For...
US20130242291 Photomultiplier Tube with Extended Dynamic Range  
The disclosure is directed to a photomultiplier tube with extended dynamic range. According to various embodiments, a repulsive electric field is introduced between a photocathode and a plurality...
US20130057855 PASSIVE POSITION COMPENSATION OF A SPINDLE, STAGE, OR COMPONENT EXPOSED TO A HEAT LOAD  
Disclosed herein is an apparatus for providing passive correction for thermal effects on a mounted mechanical component. Further disclosed is a wafer inspection system employing the passive...
US20140078498 Appearance Inspection Device, Appearance Inspection Method, And Program  
A burden on a user is reduced by referring to a measurement region set for a certain measurement tool among a plurality of measurement tools to be used by an appearance inspection device as a...
US20070273873 Object Inspection Machine  
An object inspection machine comprises one or more engaging units and one or more sustaining units on the turnplate of the nip device. With the sustaining unit and the engaging unit engaging to...
US20080079936 Internal thread inspection probe  
An apparatus is provided for detecting flaws in a threaded bore having at least one thread with a helical root is provided. The apparatus may include a thread engagement member configured to...
US20090097019 OPTICAL DEVICE FOR DETECTING LIVE INSECT INFESTATION  
The disclosure relates to a detection device for detecting movement of a live insect located within a seed or grain. The device may include a light source with a masking arrangement to block stray...
US20100091812 METHOD FOR AUTOMATED TESTING OF A MATERIAL JOINT  
In a method for automated, contactless and non-destructive testing of a material joint (4), a dynamic threshold value is varied between a minimum threshold value and a maximum threshold value,...
US20050099620 Process and plant for quality control inspection of bakery products  
In accordance with the invention, the products to be inspected are made to travel past the field of vision of a matrix camera (4) which captures successive images when the products are lit...
US20070030477 Systems Configured to Generate Output Corresponding to Defects on a Specimen  
Systems configured to generate output corresponding to defects on a specimen and systems configured to generate phase information about defects on a specimen are provided. One system includes an...
US20130342831 DEVICE-LIKE SCATTEROMETRY OVERLAY TARGETS  
In one embodiment, a semiconductor target for detecting overlay error between two or more successive layers of a substrate or between two or more separately generated patterns on a single layer of...
US20070097360 DIAGNOSING OR DETERMINING PARAMETERS FOR AN INSTALLATION FOR DETECTING OPEN DEFECTS IN THE SURFACES OF PARTS BY SWEATING  
A method of diagnosing or determining parameters for an installation for detecting open defects in the surfaces of parts by sweating, the method comprising passing at least one standard testpiece...
US20080084557 Optical inspection system  
The present invention relates to an optical system that allows accurate projection and inspection of a curved surface onto a flat plane. The present invention may be used to prevent or mitigate...
US20110058159 OPTICAL INSPECTION PROBE  
An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an...
US20140139815 IN-SITU METROLOGY  
Metrology methods and systems are provided, which measure metrology targets during the exposure stage using reflected or diffracted exposure illumination or additional simultaneous illumination...
US20080218749 METAL COMB STRUCTURES, METHODS FOR THEIR FABRICATION AND FAILURE ANALYSIS  
The present disclosure relates to a metal comb structure including a first comb which includes a first set of metal fingers each of the metal fingers being connected at one end thereof by a...
US20130258310 Metrology Method and Apparatus, Lithographic System and Device Manufacturing Method  
A lithographic process is used to form a plurality of target structures (T) on a substrate (W). Each target structure comprises overlaid gratings each having a specific overlay bias. Asymmetry (A)...
US20050206883 Single source, single camera inspection system  
An inspection system includes a source for emitting a light beam, a sensor for capturing images of a target area, and an optical system for splitting the light beam into a plurality of paths for...
US20080018886 OPTICAL ARTICLE HAVING A THERMALLY RESPONSIVE MATERIAL AS AN ANTI-THEFT FEATURE AND A SYSTEM AND METHOD FOR INHIBITING THEFT OF SAME  
An optical article for being transformed from a pre-activated state of functionality to an activated state of functionality is provided. The optical article includes a thermally responsive...
US20060274304 Systems and methods for inspecting an edge of a specimen  
Systems and methods for inspecting an edge of a specimen are provided. One system includes an illumination subsystem configured to direct light to the edge of the specimen at an oblique angle of...

Matches 1 - 50 out of 194 1 2 3 4 >