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US20120250010 Aerial Inspection System(s) and Method(s)  
An aerial inspection system has at least one transmission line, an aerial vehicle, and a detection device coupled to the aerial vehicle. The detection device is configured to detect a condition of...
US20060239536 Method for analyzing defect data and inspection apparatus and review system  
The distribution states of defects are analyzed on the basis of the coordinates of defects detected by an inspection apparatus to classify them into a distribution feature category, or any one of...
US20050018181 Defect detection system  
Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is...
US20110194107 SYSTEM AND METHOD FOR MONITORING STRUCTURES  
A technique facilitates the monitoring of elongate structures. An elongate structure is combined with an optical fiber deployed along the structure. An interrogation system is operatively joined...
US20080258704 METHOD AND APPARATUS FOR IDENTIFYING BROKEN PINS IN A TEST SOCKET  
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the...
US20120041583 MEASUREMENT SYSTEM AND METHOD  
A method of measuring planar defects in a substrate may include positioning a sensor proximate to an area configured to receive a substrate.
US20060066842 Wafer inspection with a customized reflective optical channel component  
A method is described that adjusts the position of a item and sets a tilt angle for each of a plurality of micro-mirrors of a digital micro-mirror device. The setting of the tilt angles is to...
US20100045988 SYNCHRONOUS OPTICAL MEASUREMENT AND INSPECTION METHOD AND MEANS  
The invention relates to a method for finding holes, and other related defects and measuring characteristics of sheets of industrial material. Optical detections systems are constantly plagued by...
US20110006837 Graphene Device, Method of Investigating Graphene, and Method of Operating Graphene Device  
The present invention provides for a graphene device comprising: a first gate structure, a second gate structure that is transparent or semi-transparent, and a bilayer graphene coupled to the...
US20100208247 Quality assurance testing for rotor blades of a wind energy installation  
To check whether the glass fiber or carbon fiber mats in a rotor blade for a wind energy installation have faults, upward bulges or folds after they have been manufactured, a point or line laser...
US20060012791 Wafer inspection system  
Apparatus for inspecting a surface, including a plurality of pump sources having respective pump optical output ends and providing respective pump beams through the pump optical output ends, and a...
US20070002315 Apparatus and method for inspecting screw portion  
A screw portion inspection apparatus for inspecting, by image processing, a screw portion provided in an object. The apparatus includes an imaging section for picking up an image of a region,...
US20080018886 OPTICAL ARTICLE HAVING A THERMALLY RESPONSIVE MATERIAL AS AN ANTI-THEFT FEATURE AND A SYSTEM AND METHOD FOR INHIBITING THEFT OF SAME  
An optical article for being transformed from a pre-activated state of functionality to an activated state of functionality is provided. The optical article includes a thermally responsive...
US20050134838 Method and apparatus for checking a thread of a fastener with respect to damages  
A thread (2) of a fastener (3) such as a screw, a bolt or a nut is checked with respect to damages. Light beams are directed onto the thread (2) in a way that the light beams are directed...
US20050110985 Advanced mask cleaning and handling  
Apparatus for semiconductor device fabrication, includes at least one lithography station, which is adapted to project a pattern of radiation from a mask onto a semiconductor wafer. A mask...
US20070268483 Inspection apparatus for image pickup device, optical inspection unit device, and optical inspection unit  
A probe card is equipped with a plurality of openings that transmit light to an image pickup device. An optical inspection unit that emits a test light through the plurality of openings of the...
US20060239535 Pattern defect inspection method and apparatus  
A method and an apparatus for irradiating a measurement sample with an energy beam, a pattern being formed in the measurement sample, providing an optical system for detecting transmitted energy...
US20050174567 Crack detection system  
A system is provided to determine the presence of cracks in parts. The presence of cracks is determined through the use of an imaging device and illumination source. The part is moved along a...
US20110273702 OPTICAL MEASURING METHOD AND SYSTEM  
A detecting system for detecting flaws in a sample includes an illumination assembly and detecting assembly. The illumination assembly has an infra-red light source and illumination optics for...
US20110122403 INSPECTION METHOD FOR BONDED WAFER USING LASER  
Provided is a bonded wafer inspection method using a laser method allowing a simple and reliable test in an examination of a bonded wafer interface using a laser. To do this, a laser used bonded...
US20050162643 Automotive fuel tank inspection device  
An inspection device for inspecting the interior of an enclosed volume. The inspection device includes a display and an imaging probe coupled to the display. The imaging probe includes a first end...
US20150232746 FILM-FORMING INK, DISCHARGE INSPECTION METHOD, DISCHARGE INSPECTION APPARATUS, METHOD FOR MANUFACTURING LIGHT EMITTING ELEMENT, LIGHT EMITTING ELEMENT, LIGHT EMITTING APPARATUS, AND ELECTRONIC EQUIPMENT  
A film-forming ink includes a film-forming material which is a material which configures a hole transport layer or a hole injection layer which is included in an organic electroluminescence...
US20140016124 OPTICAL INSPECTION DEVICE  
An optical inspection device includes a circuit board having at least one first opening, a mounting plate disposed on a top or bottom surface of the circuit board and having at least one second...
US20060187444 Thin film inspection apparatus and thin film inspection method  
The measurement light radiated from a radiator 2 enters an object of inspection through an integrating sphere 22. The measurement light is reflected on a base 52 of the object or a thin film 54....
US20150042980 DEVICE FOR DETECTING QUALITY LEVEL OF MICROELECTRONIC PACKAGING SAMPLES USING PHOTO-THERMAL IMAGING  
An image acquisition device based on photo-thermal imaging, including a support beam, a translational electric motor, an imaging probe, and a light emitter. The translational electric motor is...
US20110216312 SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD  
For a semiconductor device S, an inspection is performed in a zero-bias state by use of electromagnetic waves generated by irradiation of pulsed laser light, and an inspection range is set with...
US20080204733 Sensing in Meat Products and the Like  
Methods and devices for sensing foreign bodies and the like in products, such as food products, are described. Said products, which are generally light transmissive, are backlit by a source of...
US20060244954 System and method for inspecting packaging quality of a packaged food product  
A method for inspecting the packaging of a packaged product is presented wherein the packaged product includes a tray and a film enwrapping a product carried on the tray forming a packaging. The...
US20060203229 Method and apparatus for inspecting defect in surface of metal roll  
A method for inspecting a defect in a surface of a roll, the method comprising: applying parallel light rays onto the roll which is rotating; projecting reflected light rays from the roll onto a...
US20050024630 Device for examining end part  
A device for examining an end part according to the present invention includes a light projecting portion, a light receiving portion, a displacement sensor amplifier, and a data processing...
US20080079932 Visual inspection apparatus and visual inspection method  
The present invention is related to a visual inspection apparatus which can perform various adjustments simply and rapidly. The visual inspection apparatus includes a wafer holder for holding a...
US20090116003 APPARATUS FOR DETECTING JOINTS IN RUBBER SHEETS  
A method for detecting defects in, and/or geometrical characteristics of, at least one joint or splice of sheet pieces, in a unloaded state, characterised by the following steps: a. subjecting...
US20130278927 Raised Vial Stopper Detection System  
A system for inspecting the closures of packaged products employing lasers and receivers to scan multiple sides of a package thereby measuring and determining a pass/fail status of a parameter of...
US20080186481 Optical vision inspection apparatus  
The present invention discloses an optical vision inspection apparatus, wherein the light supply unit thereof includes a light source base having a concaved surface and a plurality of...
US20080182008 Apparatus and method for coating and inspecting objects  
An apparatus and method for inspecting objects for an inspection criteria thereon includes a conveyor to receive a plurality of objects, a removal assembly located along the conveyor for removing...
US20080049218 Substrate inspection device and lamp unit used therein  
In this invention, having as an object the facilitation of replacement of a lamp light source in a substrate inspection apparatus with heightened cleanliness within the apparatus, a substrate...
US20170010221 Systems and Methods for Analyzing Contaminants in Flowing Bulk Powder Compositions  
Methods including optically interacting electromagnetic radiation with a flowing powder composition and a first integrated computation element (“ICE”), the first ICE being configured to detect a...
US20070153260 Robot system and method for anode surface inspection and burr elimination in smelting and electrorefining processes  
At present, the elimination of burrs has the disadvantage of being carried out manually or in a semiautomatic way which causes the system to be less efficient. Also, the anode surface inspection...
US20120086800 Surface Inspection System with Advanced Illumination  
Disclosed are apparatuses, methods, and lithographic systems for surface (e.g., mask) inspection. A surface inspection system can include a plurality of illumination sources, an optical system,...
US20120057172 OPTICAL MEASURING SYSTEM WITH ILLUMINATION PROVIDED THROUGH A VOID IN A COLLECTING LENS  
An optical measuring system includes a scatterometer in which an illumination beam is provided through an aperture in a lens used to collect light for the scattering detection. The void may be a...
US20150300959 Pulley lagging laminate having a visual wear indicator  
A pulley lagging laminate with at least one inner layer having different light reflecting embodiments than the outer layer. When the outer layer wear reaches the inner layer(s), the different...
US20060139627 Device and method for inspecting matrix substrate  
A device (2) for inspecting a matrix substrate (26) includes a light source (22), an electro-optical device (20) determining whether light beams penetrate through or not, a photodetector (23)...
US20050099620 Process and plant for quality control inspection of bakery products  
In accordance with the invention, the products to be inspected are made to travel past the field of vision of a matrix camera (4) which captures successive images when the products are lit...
US20050046830 Polarized material inspection apparatus and system  
A polarized material inspection device that includes a light source, a first polarizing filter disposed within the optical path of the light source, a frame into which a second polarizing filter...
US20080079936 Internal thread inspection probe  
An apparatus is provided for detecting flaws in a threaded bore having at least one thread with a helical root is provided. The apparatus may include a thread engagement member configured to...
US20070260406 AUTOMATED LOCATION SYSTEM  
An automated location system that includes providing the number of rows and columns of a receptacle to the automated location system; scanning the receptacle to determine changes in reflectivity;...
US20050286044 Method and apparatus for qualitatively analyzing uniformity in microelectromechanical devices  
The method and apparatus of the invention qualitatively evaluate the product quality of a wafer having microelectromechanical devices that have deflectable reflective planar members using an...
US20070236696 Visual Inspection Apparatus  
A beam emitted from a light source 58 is converted into a line-shaped collimated beam by a lens 59. The line-shaped collimated beam reaches a beam splitter 60. The beam splitter 60 reflects a half...
US20060176475 Method and device for inspecting products  
Device for the inspection of products, whereby this device (1) comprises means to convey these products (2) along a track (4) in the shape of a product flow (5) extending in the width,...
US20070182953 Inspection apparatus for conveyor system  
A video monitor for a conveyor system consists of a camera assembly, a recorder assembly and a power supply. The camera assembly includes a camera tube which contains the camera. The camera tube...

Matches 1 - 50 out of 66 1 2 >