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US20060082650 Helping hand  
This device is made to help those peopl that are viually impaired live a more normal life By being able to read and view pictures and what ever the would like to look at that the Normaly would be...
US20080094469 Circuitry testing method and circuitry testing device  
A circuitry testing method, comprising: providing a circuit board needing testing; applying a potential(160) to the circuit board needing testing so that the circuit board works and operating...
US20140055603 AUTOMATIC OPTICAL INSPECTION DEVICE  
Disclosed is an automatic optical inspection device. The automatic optical inspection device comprises a substrate support platform, a sensor fixed platform, an image sensor, and a backlight...
US20070153084 Semiconductor wafer reader and illumination system  
A reader for semiconductor wafers includes a camera for reading a mark on a semiconductor wafer. The wafer is positioned adjacent a surface of the housing including a reading window and an...
US20120140060 INSPECTION APPARATUS AND METHOD  
An inspection apparatus and method, which can perform defect determination and estimate a defect on a mask and the resultant influence on a wafer. Each of the transfer images is reviewed in order...
US20070291114 Imaging Device, Product Package, and Semiconductor Integrated Circuit  
The image pickup apparatus (1) of the present invention includes: a shaking motion detecting section (101a and 101b) for detecting a shaking motion of the image pickup apparatus (1) and for...
US20110216186 SOLDER PRINTING INSPECTION APPARATUS AND SOLDER PRINTING SYSTEM  
A solder printing inspection apparatus for inspection of solder printed on a circuit board has a multiplicity of lands for mounting of electronic components. The apparatus includes an irradiation...
US20060268106 Optical display screen device  
A display screen is provided having both a diffusion layer and an absorption layer. The screen may be formed by coextrusion and may be suitable for use in rear projection applications.
US20150228522 SYSTEM AND METHOD FOR AUTOMATICALLY CORRECTING FOR ROTATIONAL MISALIGNMENT OF WAFERS ON FILM FRAMES  
Automatically correcting for rotational misalignment of a wafer improperly mounted on a film frame includes capturing an image of portions of the wafer using an image capture device, prior to...
US20060210142 Pattern inspection method and apparatus  
A color image of an inspection object is taken by an imaging means capable of taking a color image to obtain color information of an RGB color space. A gray-scale image of a color component of the...
US20130235186 Apparatus and Method for Inspecting Chip Defects  
Disclosed is a chip defect inspection apparatus including a linear array image acquisition module, an illumination control module, a chip defect detection module connected to the LIA module, and...
US20110164130 METHODS AND APPARATUS FOR SIMULTANEOUSLY INSPECTING MULTIPLE ARRAY REGIONS HAVING DIFFERENT PITCHES  
One embodiment relates to a method of automatically inspecting multiple array regions (102) simultaneously using an imaging apparatus (302). The method includes selecting (211 or 212) an optimal...
US20100295938 Apparatus for the Optical Inspection of Wafers  
An apparatus (1) for the optical inspection of wafers is disclosed, which comprises an assembly unit (10) which carries optical elements (30, 31, 32, 33) of at least one illumination path (3) for...
US20110234790 TIME RESOLVED PHOTOLUMINESCENCE IMAGING SYSTEMS AND METHODS FOR PHOTOVOLTAIC CELL INSPECTION  
A time-resolved photoluminescence technique is disclosed to image photovoltaic cells and wafers. The effective lifetime is measured directly using a photodetector that has a fast response. A...
US20130286189 SOLDER CONNECTION INSPECTION APPARATUS AND METHOD  
In accordance to an embodiment, there is provided an apparatus for inspecting at least one through-hole solder connection on a PCB. The device includes a light source and a light sensor on...
US20150022654 CLOSED-LOOP AUTOMATIC DEFECT INSPECTION AND CLASSIFICATION  
Inspection apparatus includes an imaging module, which is configured to capture images of defects at different, respective locations on a sample. A processor is coupled to process the images so as...
US20090315988 OBSERVATION DEVICE, INSPECTION DEVICE AND INSPECTION METHOD  
An inspection device is configured having: an illumination unit that illuminates a wafer with illumination light having a plurality of kinds of wavelengths; a photographing unit that photographs...
US20140267692 AUTOMATED WAFER INSPECTION  
In semiconductor fabrication processes, one or more wafers are often exposed to processes such as chemical vapor deposition to form semiconductor components thereupon. Often, some of the wafers...
US20110317003 METHOD AND SYSTEM FOR EDGE INSPECTION USING A TILTED ILLUMINATION  
A method and an edge inspection system, the edge inspection system includes: an illumination unit; a support module for supporting an inspected object and for moving the inspected object in...
US20110261190 DEFECT OBSERVATION DEVICE AND DEFECT OBSERVATION METHOD  
A review SEM is provided with a means to store sets of images acquired using multiple imaging conditions or sets of images for which multiple imaging conditions are simulated using simulation, a...
US20090161094 WAFER BEVEL INSPECTION MECHANISM  
An imaging sensor for capturing images of the beveled surface of a wafer edge is herein disclosed. The imaging sensor is aligned with the edge of a wafer to maximize the area of the bevel that is...
US20150138341 APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS  
A component inspection process includes positioning a component (e.g., a semiconductor component or other object) such that component sidewalls are disposed along an optical path corresponding to...
US20150109434 INSPECTION DEVICE AND IMAGE CAPTURE ELEMENT  
An imaging device includes multiple sensor pixels that are arranged in a predetermined direction, each sensor pixel having multiple sensor pixel borders defining an outer edge part of the sensor...
US20120287264 BOARD INSPECTION APPARATUS  
An apparatus for inspecting a board is shown. The board inspection apparatus includes at least one illuminating module, an imaging lens, a first beam splitter, a first camera, and a second camera....
US20150070487 METHOD AND A DEVICE FOR THE PURPOSE OF ELCTROLUMINESCENCE INSPECTION AND/OR PHOTOLUMINESCENCE INSPECTION  
A method and a device are described that implement electroluminescence inspection, photoluminescence inspection or both of an object capable of luminescence. During the inspection, the object is...
US20140104412 INSPECTION APPARATUS AND INSPECTION APPARATUS SYSTEM  
A first output value evaluation device obtains an average value of output values of optical image data for each of unit regions and creates a distribution map of an average value in an inspected...
US20110109738 OBSERVATION DEVICE AND OBSERVATION METHOD  
An observation device (1) for observing a portion near the end of a wafer (10), comprising an imaging section (40) for imaging an image near the end of a wafer (10) from the extending direction of...
US20150062329 VISUAL INSPECTION APPARATUS  
A visual inspection apparatus 10 performing a visual inspection of an electronic component 13 including opposing sides 11, 11a and opposing sides 12, 12a, the apparatus 10 including an...
US20110169944 Dark Field Inspection System With Ring Illumination  
A dark field inspection system that minimizes the speckle noise due to sample surface roughness can include a plurality of beam shaping paths for generating a composite, focused illumination line...
US20100182421 METHODS AND APPARATUS FOR DETECTION AND CLASSIFICATION OF SOLAR CELL DEFECTS USING BRIGHT FIELD AND ELECTROLUMINESCENCE IMAGING  
Methods and apparatus for integrated, in-line metrology of solar cells involve three distinct inspection and testing operations, prior to string and module assembly. Two of the inspections are...
US20110199480 OPTICAL INSPECTION SYSTEM USING MULTI-FACET IMAGING  
An optical inspection system, the system includes: (i) an image sensor; and (ii) a single optical element, that at least partially surrounds an edge of an inspected object; wherein the optical...
US20140168418 DELTA DIE INTENSITY MAP MEASUREMENT  
With an optical inspection tool, images of a plurality of patches of a plurality of dies of a reticle are obtained. The patch images are obtained so that each patch image is positioned relative to...
US20140009601 METHOD OF INPSECTING A SUBSTRATE  
A method of inspecting a substrate is disclosed. The method is performed by a substrate-inspecting apparatus having at least one projecting module projecting a patterned light onto a substrate...
US20100321491 ACHIEVING CONVERGENT LIGHT RAYS EMITTED BY PLANAR ARRAY OF LIGHT SOURCES  
Systems and methods are provided for achieving convergent light rays emitted by a planar array of light sources. In one embodiment, an imaging device is provided for inspecting semiconductors or...
US20120287263 INFRARED INSPECTION OF BONDED SUBSTRATES  
A method and apparatus for obtaining inspection information is described. A standard CCD or CMOS camera is used to obtain images in the near infrared region. Background and noise components of the...
US20110242313 Contamination monitoring of high voltage insulators  
Contamination monitoring of high voltage insulators provides a system and method producing an early predictor for high voltage insulator failure, allowing repairmen to either already be on site...
US20110128371 DEVICE AND METHOD FOR INSPECTING SEMICONDUCTOR WAFERS  
Semiconductor wafer inspection device comprising a wager transport arm provided with at least one wafer support element, a wafer gripper, the gripper having two distant branches designed to take...
US20150116701 DEFECT INSPECTION APPARATUS AND METHOD  
A defect inspection apparatus is disclosed that includes a stage, a photosensitive element, and a controller. The stage can support a semiconductor element that has a plurality of complete dies...
US20130271596 Systems and Methods for Sample Inspection and Review  
The disclosure is directed to systems and methods for sample inspection and review. In some embodiments, images are collected and/or defects are located utilizing separately addressable red,...
US20090153657 Method and apparatus for processing the image of the surface of a wafer recorded by at least one camera  
A method for processing the image data of the surface of a wafer (2) recorded by at least one camera (5) is disclosed, wherein an image field (15) is defined for each camera (5) in such a way that...
US20130286190 THERMAL IMAGING DEVICE, THERMAL IMAGING METHOD AND THERMAL IMAGING CONTROL SYSTEM  
A thermal imaging device includes an optical module gathering infrared radiation of a circuit board and correspondingly providing infrared light, a photo sensor converting the infrared light into...
US20150226678 SUBSTRATE DETECTION DEVICE AND METHOD  
A substrate detection device and a substrate direction method are disclosed in the embodiments for achieving a wide-range high-compatibility detection of leads in a peripheral circuit region of a...
US20140168419 INSPECTION METHOD  
To inspect a board, first, a measurement area is set on the board and a reference data of the measurement area is obtained. Then, a measurement data of the measurement area is obtained per colors,...
US20130314531 Substrate Storage Condition Inspecting Apparatus and Substrate Storage Facility Having Same  
A substrate storage condition inspecting apparatus includes an illumination device, an imaging device, and a substrate storage condition determining unit. The illumination device includes, on the...
US20130147946 LENS APPARATUS FOR INSPECTING OBJECT AND MACHINE VISION SYSTEM INCLUDING THE SAME  
Provided are a lens apparatus and a machine vision system including the lens apparatus. The lens apparatus includes: a first lens group and a second lens group which are designed to use a...
US20130141564 PIEZOELECTRIC MOTOR, DRIVING DEVICE, ELECTRONIC COMPONENT INSPECTION DEVICE, ELECTRONIC COMPONENT CONVEYING DEVICE, PRINTING DEVICE, ROBOT HAND, AND ROBOT  
A vibrating body which is formed of a piezoelectric material and has a convex portion in an end surface is accommodated in a vibrating body case, the convex portion of the vibrating body is...
US20110254945 ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTING APPARATUS, AND ELECTRONIC COMPONENT TESTING METHOD  
An electronic device handling apparatus, which handles an electronic device under test having a first main surface provided thereon with first device terminals and a second main surface provided...
US20100302360 DEFECT CORRECTING METHOD AND DEFECT CORRECTING DEVICE FOR AN ELECTRONIC CIRCUIT PATTERN  
Provided is a defect correcting device for an electronic circuit pattern, which is capable of making a defect seed obvious, and normalizing a pixel or forming a pixel into a semi-black spot. A...
US20100220186 Method And System For Detecting Micro-Cracks In Wafers  
An inspection method comprises receiving light emanating from a first surface of a wafer substantially along a first axis for obtaining a first image of the first surface therefrom, the wafer...
US20100128119 DEFECT REVIEW APPARATUS AND METHOD FOR WAFER  
A defect review apparatus includes a storage device which stores data about a defect of an inspection target object; a first imaging device which captures an image located in a position on a...

Matches 1 - 50 out of 76 1 2 >