Matches 1 - 29 out of 29


Match Document Document Title
US20120119775 CIRCUITRY FOR HOT-SWAPPABLE CIRCUIT BOARDS  
Electronic circuits and methods are provided for use in hot-swappable circuit board applications. Circuitry detects an electrical ground connection and signals operation of a hot-swap controller....
US20140266287 TESTING DEVICE FOR ELECTRICAL SAFETY USING WIRELESS COMMUNICATION  
Devices and methods for enhancing electrical safety are provided herein. Devices testing the safety of light fixtures are provided. Also provided are a variety of testing tools for improving...
US20130106459 3D-IC INTERPOSER TESTING STRUCTURE AND METHOD OF TESTING THE STRUCTURE  
An interposer for a 3D-IC is provided with a plurality of functional metal wiring segments where the plurality of functional metal wiring segments are connected in series by a plurality of dummy...
US20100045333 GENERATING TEST BENCHES FOR PRE-SILICON VALIDATION OF RETIMED COMPLEX IC DESIGNS AGAINST A REFERENCE DESIGN  
This invention (900) describes a method that generates and uses a test bench for verifying an electrical design module in semiconductor manufacturing against an electrical reference model...
US20090140761 METHOD OF TESTING SEMICONDUCTOR DEVICE  
A method of testing a semiconductor device, which can reduce a period of time for testing a packaged semiconductor chip. First, semiconductor chips to be tested are classified in a lot unit. The...
US20090128179 Wiring Pattern Characteristic Evaluation Mounting Board  
Wiring pattern characteristic evaluation mounting boards in which characteristics of wiring patterns formed on the mounting boards are previously evaluated when the mounting boards are...
US20140266286 THROUGH-SUBSTRATE VIA WITH A FUSE STRUCTURE  
A device includes a conductive via to provide an electrical path through a substrate. The device further includes a conductive element. The device further includes a fuse coupled to the conductive...
US20140091828 Sort Probe Gripper  
A sort probe gripper includes a body, a jaw mount inserted into the body, a plurality of grippers mounted in the jaw mount and an actuator sleeve slidable along the body to engage the plurality of...
US20150115992 GLASS SUBSTRATE FOR ELECTRONIC AMPLIFICATION AND METHOD FOR MANUFACTURING THE SAME  
There is provided a glass substrate for electronic amplification having through holes formed on a plate-like glass member and used for causing an electron avalanche in the through holes, wherein a...
US20090066355 Circuit Arrangement with Switchable Functionality and Electronic Component  
A circuit with switchable functionality has a first integrated circuit, which has, in a first operating mode, full functionality and which has, in at least one other operating mode, a...
US20100001754 SEMICONDUCTOR TEST DEVICE  
It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal outputted to a...
US20080068037 Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device  
A plurality of series circuits each consisting of a current-carrying element and an element to be measured are provided between a power supply potential VDD and a ground potential VSS. The...
US20090058449 METHOD AND APPARATUS FOR EMPLOYING PREVIOUS TEST INSERTION RESULTS FOR TESTING A DEVICE  
A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test...
US20090140248 On-Chip Test Circuit for an Embedded Comparator  
A semiconductor chip including an embedded comparator is provided with an on-chip test circuit for the comparator. The test circuit includes an analog input unit which, during a test mode of the...
US20120056637 APPARATUS AND METHOD FOR QUICKLY DETERMINING FAULT IN ELECTRIC POWER SYSTEM  
An apparatus for quickly determining a fault in an electric power system includes a current transformer, a current determination unit and a fault determination unit. The current transformer...
US20090302879 SEMICONDUCTOR DEVICE  
When a stop condition is satisfied, a stop condition determination circuit (10) issues a stop instruction to an operation stop control circuit (11) to stop the operation of a functional circuit...
US20050174140 Thin film transistor array inspection device  
A TFT array inspection device inspects a TFT array by irradiating a TFT substrate with a charged particle beam and detecting secondary electrons produced from a pixel electrode of the TFT...
US20090140745 Power converter current sensor testing method  
A method of testing power converter current sensors is disclosed. The method may include receiving a current sensor test request and receiving measured currents from current measurements from the...
US20090115443 SYSTEM AND METHOD FOR TESTING INTEGRATED CIRCUIT MODULES COMPRISING A PLURALITY OF INTEGRATED CIRCUIT DEVICES  
Embodiments of a system and method for testing an integrated circuit module comprising multiple integrated circuit devices, such as a memory module comprising multiple memory devices for example,...
US20080079455 IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package  
An interface between a test access port of an integrated circuit chip and a test equipment, which is designed to perform a functional test of the chip, is provided. The interface includes electric...
US20060181300 Method for testing a circuit unit and test apparatus  
A test apparatus comprises a receptacle unit for holding a circuit unit to be tested and for making contact with contact-making units of the circuit unit, a test system for generating input data...
US20090281757 Self-testing device component  
A device has a microcontroller (102) configured to operate in a fully-assembled mode if a device component (100) of the device is connected to a primary portion of the device when power is applied...
US20160099230 MULTI-CHIP PACKAGE, TEST SYSTEM AND METHOD OF OPERATING THE SAME  
A multi-chip package includes: a plurality of semiconductor chips that are coupled with each other through normal through silicon vias and repair through silicon vias; a state detection device...
US20160087428 SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SAME  
A semiconductor apparatus includes an input/output pad configured to exchange signals with an external device; a control pad configured to be inputted with a discharge signal from the external...
US20160003899 OSCILLATION-BASED SYSTEMS AND METHODS FOR TESTING RFID STRAPS  
Systems and methods are provided for testing remote frequency identification (RFID) straps. A testing system includes an amplifier electrically coupled to an inductor or inductive component. The...
US20150323592 CONNECTOR DISENGAGEMENT APPARATUS AND INSPECTION SYSTEM FOR LIQUID CRYSTAL DISPLAY MODULE  
The present disclosure provides a connector disengagement apparatus and an inspection system for a liquid crystal display module. The connector disengagement apparatus comprises a first member, a...
US20140118019 METHOD OF TESTING A SEMICONDUCTOR STRUCTURE  
A method of testing a semiconductor structure is provided, including providing at least a semiconductor structure having an interposer and a semiconductor element disposed on the interposer;...
US20110309519 SEMICONDUCTOR DEVICE WITH THROUGH-SILICON VIAS  
Disclosed is a semiconductor device with through-silicon vias (TSVs) that comprises a primary TSV group, a plurality of signal lines connected to the primary TSV group, a redundant TSV group and...
US20100295571 Device and Method for Configuring a Semiconductor Circuit  
A device and method for configuring a semiconductor circuit having at least two identical or similar functional units, the faulty unit being identified and deactivated if an error occurs in at...

Matches 1 - 29 out of 29