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US20130265076 ADAPTER BOARD AND DC POWER SUPPLY TEST SYSTEM USING SAME  
An adapter board includes a PCB, a first gold finger mounted on the PCB, and a plurality of first connectors mounted on the PCB. The first gold finger includes a first ground pin and a plurality...
US20150109012 Multi-Stage Circuit Board Test  
Multi-stage in circuit test of a circuit board has support to reduce strain placed on the circuit board during each test stage. A shuttle plate is disposed between a load plate that supports a...
US20140292366 LIGHTING JIG FOR INSPECTION OF A LIQUID CRYSTAL PANEL  
A lighting jig for inspection of a liquid crystal panel, which includes: a base plate; a first supporting plate and a second supporting plate, which are respectively located on and orthogonal to...
US20140139252 ELONGATION TESTER  
An elongation tester includes a fixed holder configured to hold an end of a tested material, a variable holder configured to hold a side of the tested material, the variable holder being formed of...
US20110267089 TESTING BOARD  
The testing board is used to carry electrical device for electric testing. The testing board is constructed by a main testing board and a supporting board assembled on the lower surface of the...
US20120212244 Test Board and Method of Using Same  
A test board is provided. The test board includes a test module configured to accommodate an integrated circuit (IC) device and first wirelessly enabled functional blocks located in the test...
US20120229160 WIRING BOARD FOR ELECTRONIC PARTS INSPECTING DEVICE AND ITS MANUFACTURING METHOD  
A wiring board for an electronic parts inspecting device that can be designed and produced relatively quickly, inexpensively, and with few jigs is provided. In certain embodiments the wiring board...
US20050264308 Test board locking device including stiffener  
A test board locking device includes a stiffener having a plurality of spaced-apart fix bars. A test board has first fix holes each corresponding to the fix bars adapted for coupling to the...
US20110037493 PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES  
Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure...
US20140002124 Wire Probe Assembly and Forming Process for Die Testing  
A wire probe assembly and forming process is described. In one example, a method includes inserting a plurality of wires through a probe former and a tip retainer to contact a probe head...
US20140055159 Interposer with Edge Probe Points  
An interposer is shown with contact points on a lateral edge. When assembled between a board under test and an integrated circuit, traces of the interposer carry signals between the board under...
US20140197860 CURRENT-DIVERTING GUIDE PLATE FOR PROBE MODULE AND PROBE MODULE USING THE SAME  
A current-diverting guide plate for use in a probe module is disclosed to include a plate body having a first surface, a second surface opposite to the first surface, and a plurality of through...
US20130314115 WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE  
A wafer testing system and associated methods of use an manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a...
US20130229202 POWER TEST APPARATUS FOR POWER SUPPLY  
A power test board for a power supply includes a main board and a load circuit. The load circuit includes at least one switch, at least one control circuit, and at least one load resistor. A...
US20090256582 TEST CIRCUIT BOARD  
A test circuit board used for disposing at least one device under test is disclosed. The circuit board transmits a plurality of testing signals generated by a tester to test the device under test....
US20100201386 PROBE BOARD, TEST FIXTURE, METHOD FOR MAKING A PROBE BOARD, AND METHOD FOR TESTING A PRINTED CIRCUIT BOARD (PCB)  
Probe board for testing a target Printed Circuit Board, PCB (4) preferably to be used in a test fixture (1), provided with probes for contacting target points on the target PCB (4), wherein the...
US20100301889 CIRCUIT BOARD UNIT AND TESTING APPARATUS  
Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a...
US20110227597 Test Adapter Configuration  
The invention provides a base plate for a test adapter for use in testing devices in a production line. The base plate comprises a first interface configured to connect to a product-specific part...
US20100176832 Vertical Guided Layered Probe  
The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate...
US20110204915 DIE TESTING USING TOP SURFACE TEST PADS  
Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the...
US20110025362 APPARATUS AND METHOD FOR MEASURING PHASE NOISE/JITTER IN DEVICES UNDER TEST  
A system for testing integrated circuit products and other devices under test (DUT) includes a DUT tester, which stimulates the devices under test and analyzes signals from the devices under test....
US20060197543 Electronic appliance including a circuit board  
A conventional problem is solved by: providing a guide rail 2 integrally molded in a housing 1 and vertical to a front face X of the housing 1 for inserting and holding one side end of a circuit...
US20120139573 TEST BRACKET FOR CIRCUIT BOARD  
A test bracket for testing a circuit board includes a base, two connection pieces, and a supporting member for supporting the circuit board. The base includes a board and two posts extending up...
US20120126844 CHIP STACK DEVICE TESTING METHOD, CHIP STACK DEVICE REARRANGING UNIT, AND CHIP STACK DEVICE TESTING APPARATUS  
A plurality of chip stack devices having different external sizes can be tested accurately and efficiently with low cost. The present invention provides a chip stack device testing method testing...
US20060114008 Probe card for testing semiconductor element, and semiconductor device tested by the same  
An apparatus which reduces a contact resistance by appropriately overdriving a measuring probe of a probe card to ensure a stable contact pressure. The probe card comprises a measuring probe...
US20070159188 Method for testing electronic modules using board with test contactors having beam contacts  
A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on...
US20090315581 CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE  
A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test...
US20110006799 METHOD FOR MANUFACTURING PROBE SUPPORTING PLATE, COMPUTER STORAGE MEDIUM AND PROBE SUPPORTING PLATE  
A prescribed pattern is formed on a thin metal plate by photolithography. The thin metal plate is etched by using the pattern as a mask to form a plurality of through-holes having diameters...
US20100301886 TEST BOARD  
A test board is provided. The test board includes a power connecting interface, diode modules, a power module a detecting module, and a processor. The power connecting interface includes power...
US20070085554 Replaceable modular probe head  
A replaceable modular probe head is composed of a plurality of in-parallel probing modules. Each probing module has a plurality of in-series probing regions. In the present embodiment, each...
US20090284273 METHOD FOR ASSEMBLING ELECTRICAL CONNECTING APPARATUS  
A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either...
US20060038579 Rf chip testing method and system  
A method and system for testing RF chips for radio specification compliance is described. The system comprises a test board (80) having a plurality of interconnected sockets (82a,b,c) for...
US20080007285 Handler and method of testing semiconductor device by means of the handler  
An object of the present invention is to provide a handler and a testing method thereof which enable efficient measurements on a plurality of semiconductor devices. An arm control unit 106...
US20070247179 Surface mount component RF test fixture  
A surface mount component RF test fixture and method for testing a surface mount device are provided. The test fixture includes a testing board configured to receive a surface mount device and at...
US20110156741 TEST OF ELECTRONIC DEVICES WITH BOARDS WITHOUT SOCKETS BASED ON MAGNETIC LOCKING  
An embodiment is proposed for testing electronic devices; each electronic device has a plurality of terminals for electrically contacting the electronic device. A corresponding test system...
US20120105088 APPARATUS AND METHOD FOR TESTING BACK-CONTACT SOLAR CELLS  
The present invention relates to an apparatus for testing of back-contact solar cells. In one embodiment, the apparatus includes a support plate having vacuum holes with suction cups partially...
US20090219045 TESTBED FOR TESTING ELECTRONIC CIRCUITS AND COMPONENTS  
There is disclosed an electronic testbed, an electronic testbed board, and a method for positioning receptacles for nails in the electronic testbed board. In an embodiment, the electronic testbed...
US20080272796 PROBE ASSEMBLY  
The probe assembly according to the present invention comprises a probe board and a plurality of probes. Each probe has an arm portion extending from the probe board at a distance and...
US20090206858 DIAGNOSIS BOARD ELECTRICALLY CONNECTED WITH A TEST APPARATUS FOR TESTING A DEVICE UNDER TEST  
There is provided a test apparatus having a test head containing test modules for sending/receiving signals to/from a device-under-test, a device mounting section having a socket for mounting the...
US20090128172 CALIBRATION BOARD FOR ELECTRONIC DEVICE TEST APPARATUS  
A calibration board mounted on a socket when calibrating an electronic device test apparatus for testing an IC by bringing ball contacts of the IC into electrical contact with contact terminals of...
US20130342236 TEST INTERFACE BOARDS AND TEST SYSTEMS  
A test interface board comprises at least one switch matrix including a plurality of switching elements that connect a plurality of connection nodes to each other. The at least one switch matrix...
US20140327464 TESTING OF SEMICONDUCTOR CHIPS WITH MICROBUMPS  
A test structure including an array of microbumps electrically connecting a chip and a substrate, wherein a width of each microbump of the array of microbumps is equal to or less than about 50...
US20080088331 Socket for test  
A socket for test includes: a support block, having a first face and a second face different from the first face, and formed with through holes; probes, provided in the through holes, and...
US20070132469 Inspection device and method  
A second temperature control mechanism is configured by providing a gas circulator circulating a gas, in this case air, with an expected temperature, a pair of temperature sensors installed on...
US20110241718 Test Plate for Electronic Component Handler  
Test plates with improved test pockets are described herein. One embodiment is a circular test plate comprising a plurality of test pockets, each test pocket being a quadrilateral hole in the test...
US20120146681 CONNECTOR TEST SYSTEM  
A connector test system includes a number of adapters, a number of testers, and a motherboard. Each tester is connected to a corresponding one of the adapters. The motherboard is configured for...
US20150241471 Probe Card  
An apparatus and a method are disclosed herein. The apparatus includes a circuit board, a housing, a spacer and a pin. The circuit board is configured to test a device-under-test (DUT). The...
US20140197857 SYSTEM AND METHOD FOR A REMOTE CONTROL TESTER  
A system and method for testing remote controls. A number of remote controls are identified. The remote controls are received on a tray of a remote control tester. The tray is positioned for...
US20150028912 BOARD FOR PROBE CARD, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD  
A board for a probe card includes a ceramic board including a first insulating layer, and second insulating layers disposed on one surface of the first insulating layer and including cavities for...
US20120268157 TEST CARRIER AND BOARD ASSEMBLY  
A test carrier 10A comprises: a base board 21A which holds a die 90; and a cover board 31A which is laid over the base board 21A so as to cover the die 90. The test carrier 10A comprises a seal...
Matches 1 - 50 out of 95 1 2 >