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Match Document Document Title
US20140300383 PROBE ASSEMBLY AND PROBE BASE PLATE  
A probe assembly includes a wiring base plate arranged on a lower surface side of a reinforcing plate and a probe base plate arranged on a lower surface side of the wiring base plate. The probe...
US20140125371 STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING  
A probe card includes at least two connection arrangements on a printed circuit board and a daughter board connected to the printed circuit board through one of the connection arrangements. The...
US20140340105 TEST ASSEMBLY  
A test assembly adapted to test a semiconductor device is provided. The test assembly includes a main circuit board, an intermediate dielectric board, an intermediate circuit board, a plurality of...
US20120038384 PROBE BOARD AND METHOD OF MANUFACTURING THE SAME  
There are provided a probe board and a method of manufacturing the same. The probe board includes a ceramic substrate having an uneven portion in one surface thereof, one or more electrode pads...
US20120074974 Test Unit and Test System  
A test unit to be used with a tester that tests an electrical characteristic of a circuit formed in a wafer includes a tester a board electrically connected to the tester; a first wireless port...
US20130162281 Probe Card and Fabricating Method Thereof  
A probe card includes a circuit board and an integrated circuit (IC) test interface. The IC test interface includes a first probe assembly, disposed on a terminal of the circuit board, and a...
US20120194212 Fine pitch guided vertical probe array having enclosed probe flexures  
Probes suitable for use with densely packed fine-pitch 2-D contact arrays are provided by use of an electrically insulating guide plate in connection with vertical probes, where the vertical...
US20060170440 Vertical probe card, probes for vertical probe card and method of making the same  
A vertical probe card includes a circuit board and a probe set having a base and a plurality of probes provided at the base and electrically connected to the circuit board. Each probe has a foot,...
US20130127488 CONFIGURABLE TESTING PLATFORMS FOR CIRCUIT BOARDS WITH REMOVABLE TEST POINT PORTION  
Circuit boards are provided that include a functional portion and at least one removable test point portion. The removable test point portion may include test points which are accessed to verify...
US20070115012 Reinforced guide panel for vertical probe card  
A guide panel for a vertical probe card is disclosed to have a via area and a reinforcing area. The via area has a plurality of feed through vias. The reinforcing area is bonded to the via area....
US20110291685 PROBE  
[Problem] It is aimed to provide a probe whose handling is easy at probe replacement and mounting times and which allows arrangement at a narrow pitch.[Solving Means]A probe is composed of a...
US20130162280 PROBE CARD AND METHOD OF MANUFACTURING THE SAME  
There are provided a probe card and a method of manufacturing the same, in which an electrode pad having a probe pin bonded thereto may be prevented from being delaminated from a substrate. The...
US20120206159 INTERFACE  
Embodiments of interfaces are disclosed. One such interface has a plurality of connector assemblies, each connector assembly in a single opening of a plurality of openings passing completely...
US20130154682 PROBE ASSEMBLY, PROBE CARD INCLUDING THE SAME, AND METHODS FOR MANUFACTURING THESE  
Quality of connection portions between respective probes and respective wires in a probe assembly is improved. Also, time required for work for connection between the probes and the wires is...
US20150022229 PROBE CARD AND METHOD OF MANUFACTURING THE SAME  
A probe card, includes, a wiring substrate having an opening portion and including a first connection pad and a second connection pad, the first connection pad being arranged at a periphery of the...
US20110128029 STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES  
A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a...
US20110043240 METHOD AND APPARATUS FOR PROVIDING ACTIVE COMPLIANCE IN A PROBE CARD ASSEMBLY  
A probe card assembly can comprise a first source of compliance and a second source of compliance. The probe card assembly can further comprise a controller, which can be configured to apportion a...
US20130088251 PROBE CARD AND MANUFACTURING METHOD THEREOF  
There are provided a probe substrate and a manufacturing method thereof that may prevent an electrode pad bonded with a probe pin from being released from the probe substrate. The probe card...
US20140028341 PROBE CARD AND TESTING APPARATUS  
Provided is a probe card capable of effectively placing electronic parts. A probe card according to the present invention includes a plurality of probes that come into contact with a plurality of...
US20080106292 Probe card having cantilever probes  
A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and...
US20080315902 TEST DEVICE, TEST CARD, AND TEST SYSTEM  
A test device to be connected to a multi-card slot of an electronic apparatus performs test for connection between a card inserted into the multi-card slot and the multi-card slot with a plurality...
US20080122470 Probe installed to a probe card  
A probe installed to a probe card is provided. A tip or a body of the probe are electroplated with a conductive film and the probe card is placed in a vacuum electroplating furnace. Or, the body...
US20140077833 PROBE CARD AND MANUFACTURING METHOD THEREOF  
A probe card for being abutted against a plurality of probes is provided. The probe card includes a substrate, at least two IC boards, and a plurality of probe pads. The IC boards are located on...
US20080252328 PROBE FOR TESTING SEMICONDUCTOR DEVICES  
A novel probe design is presented that increases a probe tolerance to stress fractures. Specifically, what is disclosed are three features increase stress tolerance. These features include a...
US20130234748 TRANSFERRING ELECTRONIC PROBE ASSEMBLIES TO SPACE TRANSFORMERS  
Transferring electronic probe assemblies to space transformers. In accordance with a first method embodiment, a plurality of probes is formed in a sacrificial material on a sacrificial substrate...
US20080048687 PROBE, METHOD OF MANUFACTURING THE PROBE AND PROBE CARD HAVING THE PROBE  
A probe, a method of manufacturing the probe and a probe card having the probe are disclosed. The probe includes a first connecting member, a body and a tip. Specially, the body integrally...
US20110043238 METHOD OF MANUFACTURING NEEDLE FOR PROBE CARD USING FINE PROCESSING TECHNOLOGY, NEEDLE MANUFACTURED BY THE METHOD AND PROBE CARD COMPRISING THE NEEDLE  
Disclosed are probe card needles manufactured using microfabrication technology, a method for manufacturing the probe card needles, and a probe card having the probe card needles. The probe...
US20090212807 PROBE OF CANTILEVER PROBE CARD  
A probe of a cantilever probe card (Epoxy probe card) is disclosed. The probe has a tip and a surface region extended from the tip of the probe about 5-10 mil is coated with a nano-film of high...
US20150022230 PROBE CARD AND METHOD OF MANUFACTURING THE SAME  
A probe card includes a wiring substrate including an opening portion, a first connection pad, and a second connection pad arranged in an opposite area to the first connection pad, a resin portion...
US20090230981 INCREASING THERMAL ISOLATION OF A PROBE CARD ASSEMBLY  
A probe card assembly can include an electrical interface to a test system for testing electronic devices such as semiconductor dies. The probe card assembly can also include probes located at a...
US20080211525 Probe card assembly and method of forming same  
A probe card assembly has a probe contactor substrate having a plurality of probe contactor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts...
US20140361804 METHOD AND APPARATUS OF WAFER TESTING  
A system for testing a wafer includes a probe card and a wafer. The probe card includes at least one first probe site and at least one second probe site. The wafer includes a plurality of dies....
US20130207683 ELECTRICAL CONNECTING APPARATUS AND METHOD FOR ASSEMBLING THE SAME  
An electrical connecting apparatus includes a wiring base plate having a first surface coupled with a reinforcing plate and provided on an opposite surface with first electrical connection...
US20080048685 Probe card having vertical probes  
A probe card includes a first probe plate having a first plurality of tapered apertures formed therein. Each of the tapered apertures has a first opening that is smaller than a second opening. The...
US20090039910 TEST APPARATUS FOR SEMICONDUCTOR MODULES  
A test apparatus for semiconductor modules. One embodiment provides a test system. The test system includes a handler configured to receive at least one semiconductor module. The test system is...
US20110156740 PROBE CARD  
There is provided a probe card. A probe card according to an aspect of the invention may include: a printed circuit board; a horizontal regulator passing through the printed circuit board and...
US20120119770 AUTOMATED MULTI-POINT PROBE MANIPULATION  
A multi-point probe particularly suitable for automated handling is disclosed. An automated multi-point measuring system including the multi-point probe and a probe manipulator head is also...
US20140084955 FINE PITCH INTERPOSER STRUCTURE  
A fine pitch interposer structure includes a Multi-core base substrate and a plurality of buildup laminates. A surface of each Multi-core base substrate has a first circuit layer, and a second...
US20150015289 Multipath Electrical Probe And Probe Assemblies With Signal Paths Through Secondary Paths Between Electrically Conductive Guide Plates  
A multiple conduction path probe can provide an electrically conductive signal path from a first contact end to a second contact end. The probe can also include an electrically conductive...
US20120119773 Testing Auxiliary Apparatus  
A testing auxiliary apparatus for assisting a testing apparatus to test signals of testing points of a circuit board, includes: a testing base having a testing platform with probes vertically...
US20100013508 PROBE CARD CASSETTE AND PROBE CARD  
A holding section (2) holds a probe card (1). Transport mechanisms (3a to 3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided...
US20140139251 TESTER HAVING AN APPLICATION SPECIFIC ELECTRONICS MODULE, AND SYSTEMS AND METHODS THAT INCORPORATE OR USE THE SAME  
In one embodiment, an automated test equipment (ATE) system includes a tester having a tester electronics module, an application specific electronics module, and a tester-to-device under test...
US20070069745 PROBE CARD FOR INTEGRATED CIRCUITS  
A probe card for integrated circuit devices comprises a printed circuit board, at least one probe pin positioned on the printed circuit board, and at least one ultrasonic generator configured to...
US20140368229 PROBE CARD AND METHOD FOR MANUFACTURING THE SAME  
A probe card for an electric test of a device under test on a working table incorporating a heat source includes a circuit base plate including conductive paths connected to a tester, a probe base...
US20120187972 WAFER LEVEL TESTING STRUCTURE  
A wafer level testing structure, disposed between a wafer and a prober, for transmitting the electrical signal of the wafer to the prober, the wafer level testing structure includes: a socket and...
US20100007365 SOCKET FOR DOUBLE ENDED PROBE, DOUBLE ENDED PROBE, AND PROBE UNIT  
A socket for a double ended probe with a first probe and a second probe includes a hollow pipe member housing the first probe and the second probe, the first probe and the second probe are...
US20110227596 PROBE-UNIT BASE MEMBER AND PROBE UNIT  
A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes...
US20130207680 DEVICE FOR THE ELECTROMAGNETIC TESTING OF AN OBJECT  
The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes (2), a structure (3) for supporting the network of probes (2) and a...
US20080001612 Probes with self-cleaning blunt skates for contacting conductive pads  
A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing....
US20110148449 CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY  
A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted...

Matches 1 - 50 out of 419 1 2 3 4 5 6 7 8 9 >