Matches 1 - 50 out of 118 1 2 3 >


Match Document Document Title
US20140266278 PROBE NEEDLE  
A probe needle for connecting to a circuit board for inspection and to an inspection main board of a testing apparatus includes a conductive shaft having two ends of a connection end and an...
US20120019277 SPRING WIRE ROD, CONTACT PROBE, AND PROBE UNIT  
A spring wire rod includes a wire core that is made of a conductive material having an electrical resistivity of equal to or lower than 5.00×10−8 Ω•m, and a coating member 3 that is made of a...
US20110050263 PROBE AND METHOD OF MANUFACTURING PROBE  
A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a...
US20110248736 PROBE PIN AND AN IC SOCKET WITH THE SAME  
The probe pin includes a plunger formed of a sheet metal, and a coil spring unit formed of a metal wire and configured to hold the plunger thereon. In a developed state, the plunger includes first...
US20130099814 CONTACT PROBE AND PROBE UNIT  
A contact probe includes a conductive first plunger including, on a same axis, a distal end portion, a flange portion, a boss portion, and a base end portion, a conductive second plunger...
US20150153390 MEASURING ELECTRONICS COMPRISING A CONTACT STRUCTURE  
The invention relates to a spring contact structure for contacting an electronic assembly and at least one contact element of an electric or electronic component, wherein the contact element is a...
US20110169516 PROBE ELEMENT HAVING A SUBSTANTIALLY ZERO STIFFNESS AND APPLICATIONS THEREOF  
A microelectronic probe element can include a base, a tip, and a spring assembly coupled between the tip and the base. The spring assembly can include a first spring and a second spring, wherein...
US20110221464 CONTACT PROBE AND SOCKET, AND MANUFACTURING METHOD OF TUBE PLUNGER AND CONTACT PROBE  
A contact probe has a tubular plunger which is not made by press working and rounding so that quality control of gold plating or the like is not necessary or not difficult. The tubular plunger is...
US20140253163 INSPECTION PROBE AND AN IC SOCKET WITH THE SAME  
An inspection probe 16Ai is formed by subjecting a thin sheet material made of a copper alloy to press working. The inspection probe 16Ai includes: a device side plunger 16A having a contact point...
US20090212805 PROBE OF VERTICAL PROBE CARD  
A probe of a vertical probe card is disclosed. The probe has a probe tip and a surface region extended from the probe tip about 1-10 mil. The surface region is coated with a nano-film of high...
US20090015284 SEMI-GENERIC IN-CIRCUIT TEST FIXTURE  
A semi-generic test fixture for testing printed circuit boards (PCBs) and/or for testing printed circuit boards assemblies (PCBAs) is presented. The semi-generic test fixture implements a...
US20140247065 PROBE UNIT  
The probe unit includes probe groups of two or more contact probes to be in contact with one electrode of a contact target body on a side of one end in a longitudinal direction and the respective...
US20120313659 Probe Card for Probing Integrated Circuits  
An apparatus includes a metal housing, and a pogo pin penetrating through the metal housing. The pogo pin has a first end extending out of a first surface of the metal housing, and a second end...
US20140210504 TESTING DEVICE FOR ELECTRONIC DEVICE TESTING  
A testing device includes a test board, a number of locating pins, a pin holder, a number of metal pins, a connector holder, a connector, a number of elastic elements, and a pressure block. The...
US20090045831 CONTACT WITH PLURAL BEAMS  
To precisely control behavior of a probe at a portion near a contact, and to provide a probe with small electric capacity which can be used to inspect chips having high-speed and high-capacity...
US20130009658 INSPECTION JIG AND CONTACT  
In an inspection jig (1) for electrical inspection of printed circuit boards, an electrode section (40) has an electrode (41) disposed on a surface of an electrode plate (42), and a contact (10)...
US20090219047 PROBE FOR TESTING ELECTRICAL PROPERTIES OF A TEST SAMPLE  
A probe for testing electrical properties of test samples includes a body having a probe arm defining proximal and distal ends, the probe arm extending from the body at the proximal end of the...
US20080150569 Contactor with angled spring probes  
A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts...
US20100007365 SOCKET FOR DOUBLE ENDED PROBE, DOUBLE ENDED PROBE, AND PROBE UNIT  
A socket for a double ended probe with a first probe and a second probe includes a hollow pipe member housing the first probe and the second probe, the first probe and the second probe are...
US20120319710 METHOD AND APPARATUS FOR IMPLEMENTING PROBES FOR ELECTRONIC CIRCUIT TESTING  
Disclosed is an improved probe having a spring portion which allows effective contact with a device under test without requiring a lower die portion. The probe includes a slot retention and...
US20120268154 TESTING JIG FOR POGO PIN CONNECTOR  
A testing jig of a pogo pin connector for testing a connection between at least one pogo pin and an electrical plug is disclosed. The testing jig includes a first support element, a second support...
US20090261851 SPRING PROBE  
According to some example embodiments, an interconnect has a crown with contact tips, in which each of the contact tips is structured to physically contact a substantially spherical solder ball...
US20150048859 PROBE AND METHOD OF MANUFACTURING PROBE  
A probe for connecting an electrode terminal of an electric circuit or an electric component includes a first spring; a second spring covering the first spring; a cover covering the second spring;...
US20090134898 Coaxial Spring Probe Grounding Method  
The present invention provides a spring probe array for use in a semiconductor test fixture wherein the spring probes provide electrical continuity between a device under test and a test system....
US20100033201 MEMS PROBE FABRICATION ON A REUSABLE SUBSTRATE FOR PROBE CARD APPLICATION  
A Micro-Electro-Mechanical-Systems (MEMS) probe is fabricated on a substrate for use in a probe card. The probe has a bonding surface to be attached to an application platform of the probe card....
US20090079455 REDUCED SCRUB CONTACT ELEMENT  
Embodiments of resilient contact elements and methods for fabricating and using same are provided herein. In one embodiment, a resilient contact element includes a lithographically formed...
US20090066352 Making And Using Carbon Nanotube Probes  
Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and...
US20120182034 CONTACT ASSEMBLY  
A contact assembly for receiving a spring probe unit includes an elongate contact element adapted to electrically contact the spring probe unit. The contact element includes a stop for restraining...
US20080042676 Jig for Kelvin test  
A jig for Kelvin Test, includes: a pair of probes, including a first probe and a second probe which are arranged in parallel in a socket comprised of insulating material, each probe including: an...
US20050231220 Terminal of IC test fixture  
A terminal of IC test fixture comprising a body, a spring contact arm and a soldering portion and there are at least one hollow holes on the body of the terminal. During testing, the electronic...
US20140111237 CONTACT SPRING FOR A TESTING BASE FOR THE HIGH CURRENT TESTING OF AN ELECTRONIC COMPONENT  
A contact spring for a testing base for high current testing of an electronic component, which is produced from a spring metal sheet of a predetermined thickness and possesses two identical...
US20080036484 Test probe and manufacturing method thereof  
Disclosed herein are a test probe and a method of manufacturing the test probe. The invention has a simple structure, thus affording ease of manufacture, and eliminates contact resistance during a...
US20130207682 PROBE PIN AND METHOD OF MANUFACTURING THE SAME  
Disclosed are a spring-type probe pin having upper and lower contacts, and a manufacturing method thereof. The spring-type probe pin includes: cylindrical upper and lower sleeves having upper and...
US20140132300 FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRICATE AND ASSEMBLE SAME  
An apparatus for testing electronic devices is disclosed. The apparatus includes a plurality of probes attached to a substrate; each probe capable of elastic deformation when the probe tip comes...
US20100066394 INSPECTION UNIT  
An inspection unit includes: a metal block having a through hole; a contact probe for grounding which is coaxially arranged in through hole; and a coil spring having electrical conductivity at...
US20090302877 Reduced Ground Spring Probe Array and Method for Controlling Signal Spring Probe Impedance  
A reduced ground spring probe array and a method for controlling the impedance of the signal spring probes in the reduced ground spring probe array. Signal spring probes are positioned in a...
US20140111238 SPIRAL PROBE AND METHOD OF MANUFACTURING THE SPIRAL PROBE  
A spiral probe includes a tapered distal end portion (2) configured to be brought into direct contact with an inspection object, a hollow, nearly cylindrical distal body (3) extending in one...
US20120001650 Test Probe  
A test probe is configured to provide conductive contact with a surface on application of the probe to the surface. The probe includes a probe body having a proximal and distal end, a probe tip...
US20080012595 Wafer test card using electric conductive spring as wafer test interface  
A wafer test card for testing the electric property of the chips on a wafer comprising a base board and a group of electric conductive springs or electric conductive spring pins connected to the...
US20150247882 SPRING PROBE  
A spring probe includes a spring sleeve and a needle having a body located inside the spring sleeve and a head protruded out of a lower non-spring section of the spring sleeve and having a...
US20090212802 Test system with high frequency interposer  
An interposer with a conductive housing is disclosed. Conductive members pass through insulators positioned in openings in the conductive housing. The conductive housing may be grounded, providing...
US20050184747 Spring plunger probe  
A single-piece contact probe includes a tip, coil and base formed from a single piece of electrically conductive material. A helical groove is machined around the center portion of the probe then...
US20130049785 INSPECTION DEVICE FOR GLASS SUBSTRATE  
Disclosed is an inspection device for a glass substrate, comprising at least one probe, a holder, a stretch controller and a control circuit. The probe is installed on the stretch controller, the...
US20150212114 Printed Circuits With Sacrificial Test Structures  
Electrical components may be soldered to a printed circuit. The printed circuit may have an edge with an opening. Printed circuit contacts in the opening may be configured to form electrical...
US20080116924 Device under test pogo pin type contact element  
A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is...
US20110203108 PROBE APPARATUS ASSEMBLY AND METHOD  
A probe apparatus is provided and includes a probe layer formed with a through-hole, a conductor, electrically coupled to test equipment, disposed on and insulated from a through-hole sidewall, a...
US20080088331 Socket for test  
A socket for test includes: a support block, having a first face and a second face different from the first face, and formed with through holes; probes, provided in the through holes, and...
US20090174421 Vertical Probe and Methods of Fabricating and Bonding the Same  
Disclosed is a vertical probe and methods of fabricating and bonding the same. The probe is comprised of a contactor equipped with two tips, a connector electrically linking with a measuring...
US20080143367 COMPLIANT ELECTRICAL CONTACT HAVING MAXIMIZED THE INTERNAL SPRING VOLUME  
A spring loaded electrical contact assembly for making a connection between two surfaces that consist of two U-shaped components axially opposed and rotated 90 degrees with respect to each other...
US20070063714 High bandwidth probe  
A probe head provides an electrical signal to a receiving device. The probe head has a probe tip and a signal-ground transport element and the signal-ground transport element is configured to...

Matches 1 - 50 out of 118 1 2 3 >