Matches 1 - 24 out of 24


Match Document Document Title
US20140340105 TEST ASSEMBLY  
A test assembly adapted to test a semiconductor device is provided. The test assembly includes a main circuit board, an intermediate dielectric board, an intermediate circuit board, a plurality of...
US20060170440 Vertical probe card, probes for vertical probe card and method of making the same  
A vertical probe card includes a circuit board and a probe set having a base and a plurality of probes provided at the base and electrically connected to the circuit board. Each probe has a foot,...
US20120038382 PROBE AND METHOD OF MANUFACTURING SAME  
A probe includes a plurality of boards each of which has a plurality of magnets, a plurality of the boards include a first board and a second board laid on the first board, a plurality of the...
US20140327461 Probe Card Assembly For Testing Electronic Devices  
A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the...
US20140043055 CONTACT PROBE AND PROBE CARD  
A contact probe electrically connects the tester side and an electrode pad of a circuit to be tested. This contact probe has a mounting portion on a base end portion mounted on a probe card, a...
US20070007974 Method for reducing integral stress of a vertical probe with specific structure  
A method for reducing integral stress of a vertical probe with specific structure is disclosed. The vertical probe includes a probe tip, an insert part and a bent part. The bent part has a first...
US20100289513 TEST SOCKET ASSEMBLY HAVING HEAT DISSIPATION MODULE  
A test socket assembly (100) comprises a test socket (10) and a heat dissipation module (5) assembled on the test socket (10), the test socket (10) comprises a base (1) with a plurality of...
US20110128026 HELICAL SENSOR FOR TESTING A COMPOSITE MEDIUM  
A sensor is provided for testing a composite medium. The sensor includes a tube and three or more conductors which are wound in a continuously parallel helix around the tube such that the...
US20090072851 Multi-Pivot Probe Card For Testing Semiconductor Devices  
A novel probe design is presented that comprises a plurality of pivots. These pivots allow the probe to store the displacement energy more efficiently. The novel probe comprises a substrate, and a...
US20130265075 CONTACT AND CONNECTOR  
A contact for electrically connecting two electric components, includes a first end portion which contacts an object to be contacted; a second end portion for passing a signal from the first end...
US20130249583 MULTIPLE RIGID CONTACT SOLUTION FOR IC TESTING  
A chip testing solution having two separate contacts: one to provide current and one to measure voltage. One contact acts as the force and other as sense, and with its unique short wipe stroke...
US20050174136 Test pin back surface in probe apparatus for low wear multiple contacting with conductive elastomer  
A probe apparatus for preferably testing packaged circuit chips combines an ACE with plunger pins placed in between the ACE and the test contact. A plunger pin provides a contact end for...
US20100073021 ELECTRICAL CONTACT PROBE  
A contact probe assembly, for placement within a probe receptacle for performing tests on an electrical device, includes the following elements. The hollow barrel has two openings at two opposite...
US20140333336 TESTING OF ELECTRONIC DEVICES THROUGH CAPACITIVE INTERFACE  
An embodiment of a test apparatus for executing a test of a set of electronic devices having a plurality of electrically conductive terminals, the test apparatus including a plurality of...
US20140333337 CURRENT APPLYING DEVICE  
A current applying device in which a contact electrode is destroyed firstly when a large current is applied in the event of failure. A probe device is configured by serially connecting a contact...
US20150168449 WAFER INSPECTION INTERFACE AND WAFER INSPECTION APPARATUS  
A wafer inspection interface 40 includes a probe card 43 including probes 43b provided on a surface facing a wafer W; a pogo frame 42 that supports a surface of the probe card 43 opposite to the...
US20120105090 PROBE DEVICE FOR TESTING  
The present invention relates to a probe device for testing a semiconductor chip, and has the aim of providing a probe device for testing with higher test reliability through an improved structure...
US20170074926 Wafer Level Integrated Circuit Probe Array and Method of Construction  
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact...
US20160223585 PROBE STRUCTURE  
A probe structure includes a sleeve, a needle shaft and an elastic member. The needle shaft is accommodated in the sleeve and includes a first groove for accommodating the elastic member. The...
US20160116502 TEST PROBE, TEST PROBE COMPONENT AND TEST PLATFORM  
The present invention discloses a test probe, a test probe component, and a test platform. The test probe comprises a probe body, wherein one end of the probe body is of a hollow design, thereby...
US20160109481 Cantilever Microprobes For Contacting Electronic Components  
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to...
US20150355235 PROBE AND METHOD FOR MANUFACTURING THE PROBE  
A probe for a probe head having lower and upper dies includes a main portion, a conductive portion stacked on at least a part of the main portion, an attachment layer covering the main portion and...
US20140225638 CONTACTOR AND PROBE USING SAME  
A contactor including a bellows body, a fixed portion connected to one end of the bellows body, and a movable portion connected to the other end of the bellows body, where the bellows body, the...
US20140218062 CONTACTOR  
A contactor including a bellows body, a fixed portion connected to one end of the bellows body, a movable portion connected to the other end of the bellows body, and a movable touch piece that...

Matches 1 - 24 out of 24