Matches 1 - 50 out of 260 1 2 3 4 5 6 >


Match Document Document Title
US20130033281 PROBE ASSEMBLY  
A probe assembly includes a probe, a transducer, and a cable electronically connecting the probe with the transducer. The cable has a jacket made of an extreme-environment resistant material.
US20100321056 SYSTEM AND METHOD OF MEASURING PROBE FLOAT  
A system and method allow accurate calculation of probe float through optical free-hanging and electrical planarity measurement techniques. In accordance with an examplary embodiment, probe float...
US20140091821 COMPOSITE WIRE PROBES FOR TESTING INTEGRATED CIRCUITS  
An electrical probe of an aspect includes a high yield strength wire core. The high yield strength wire core includes predominantly one or more materials selected from tungsten, tungsten-copper...
US20120153980 PROBE ASSEMBLY  
A probe assembly includes a transducer, a cable, and a probe. A cover of the cable is made of pliable metal material or a flexible metal conduit. Opposite ends of the cable are respectively...
US20140197859 Probe Head  
A probe head includes a plate, a probe, and at least one composite coating layer. The plate has at least one through hole therein. The probe is at least partially disposed in the through hole of...
US20140176172 COMPOSITE WIRE PROBE TEST ASSEMBLY  
An examples includes a substrate, including a conductive trace and a layer disposed on top of the conductive trace, the layer defining at least one cavity extending to the conductive trace and an...
US20150070037 TEST FIXTURE FOR PROBE APPLICATION  
Systems and methods to fixture and utilizing a probe which tests a capacitive array are described herein. A support bracket with freedom about a plurality of axes may aid in locating a probe and...
US20110025358 PROBE UNIT  
A probe unit includes: large diameter probes; a small diameter probes; a large-diameter probe holder having large hole portions which individually hold the large diameter probes, and hole portions...
US20110148448 LOADED PRINTED CIRCUIT BOARD TEST FIXTURE AND METHOD FOR MANUFACTURING THE SAME  
A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant...
US20130200910 3-DIMENSIONAL INTEGRATED CIRCUIT TESTING USING MEMS SWITCHES WITH TUNGSTEN CONE CONTACTS  
A test system for testing a multilayer 3-dimensional integrated circuit (IC), where two separate layers of IC circuits are temporarily connected in order to achieve functionality, includes a chip...
US20110210760 PROBE AND METHOD FABRICATING THE SAME  
A probe and a method fabricating the same are disclosed. The probe includes a wire and a bump, wherein the wire is formed on a substrate; and the bump is formed upon the wire. In addition, a probe...
US20110291685 PROBE  
[Problem] It is aimed to provide a probe whose handling is easy at probe replacement and mounting times and which allows arrangement at a narrow pitch.[Solving Means]A probe is composed of a...
US20120038382 PROBE AND METHOD OF MANUFACTURING SAME  
A probe includes a plurality of boards each of which has a plurality of magnets, a plurality of the boards include a first board and a second board laid on the first board, a plurality of the...
US20100039132 Probing Apparatus  
A probe for probing an electrical device under test is provided. The probe comprises a camera positioned adjacent a probing tip of the probe. Visual information captured by the camera is displayed...
US20130147502 VERTICAL PROBE ASSEMBLY WITH AIR CHANNEL  
A vertical probe assembly includes an upper die; a lower die; a plurality of probes, the probes comprising an electrically conductive material, wherein the probes extend from the upper die through...
US20120212249 HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF  
The present invention relates to a hard and wear-resisting probe and manufacturing method thereof, and particularly relates to a hard and wear-resisting probe comprising tungsten steel (WC) and...
US20110062978 MULTIPLE CONTACT PROBES  
The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.
US20110043232 CONTACT STRUCTURE FOR INSPECTION  
A plurality of metal plates and an insulating plate having a polished surface are laminated in a probe supporting plate. Through-holes into which probes are to be inserted are respectively formed...
US20130335111 EDDY CURRENT INSPECTION PROBE  
A probe for transporting a nondestructive inspection sensor through a tube, that employs wheels to reduce friction. The radial travel of the wheels are mechanically linked through a cam and...
US20130093450 VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION  
Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in...
US20110273199 VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION  
Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in...
US20110309853 SECTIONAL TEST PROBE ASSEMBLY FOR ELECTRIC METER  
The test probe assembly of the invention is used for an electric meter such as a multimeter or the like. The electric meter has a main body. The test probe assembly includes a pair of insulated...
US20080122470 Probe installed to a probe card  
A probe installed to a probe card is provided. A tip or a body of the probe are electroplated with a conductive film and the probe card is placed in a vacuum electroplating furnace. Or, the body...
US20110285416 MULTI-POINT PROBE FOR TESTING ELECTRICAL PROPERTIES AND A METHOD OF PRODUCING A MULTI-POINT PROBE  
A multi-point probe for testing electrical properties of a number of specific locations of a test sample comprises a supporting body defining a first surface, a first multitude of conductive probe...
US20090212807 PROBE OF CANTILEVER PROBE CARD  
A probe of a cantilever probe card (Epoxy probe card) is disclosed. The probe has a tip and a surface region extended from the tip of the probe about 5-10 mil is coated with a nano-film of high...
US20150084659 CONTACT ARRANGEMENTS AND METHODS FOR DETECTING INCORRECT MECHANICAL CONTACTING OF CONTACT STRUCTURES  
A contact arrangement is provided, including a contact structure and a sense structure. The sense structure may be arranged in proximity of the contact structure. The sense structure may be...
US20090212805 PROBE OF VERTICAL PROBE CARD  
A probe of a vertical probe card is disclosed. The probe has a probe tip and a surface region extended from the probe tip about 1-10 mil. The surface region is coated with a nano-film of high...
US20130113511 DC-AC PROBE CARD TOPOLOGY  
A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to...
US20130049783 VOLTAGE CLAMPING CIRCUIT AND USE THEREOF  
A voltage clamp circuit for reflecting a voltage at an input node includes a circuit for providing at least two currents at its output terminal, and at least two diodes each being connected to an...
US20140103951 AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES  
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the...
US20120286815 Inspection Device Applying Probe Contact for Signal Transmission  
An inspection device applying probe contact for signal transmission includes an inspection panel board; a probe base disposed on the inspection panel board and having a plurality of probes; a...
US20080094093 UNIVERSAL ARRAY TYPE PROBE CARD DESIGN FOR SEMICONDUCTOR DEVICE TESTING  
A universal system for testing different semiconductor devices provides a probe head with a probe pattern that may be used to test different test patterns formed on different semiconductor...
US20120319716 PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES  
Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure...
US20120119770 AUTOMATED MULTI-POINT PROBE MANIPULATION  
A multi-point probe particularly suitable for automated handling is disclosed. An automated multi-point measuring system including the multi-point probe and a probe manipulator head is also...
US20150192617 MULTI-ELECTRODE CONDUCTIVE PROBE, MANUFACTURING METHOD OF INSULATING TRENCHES AND MEASUREMENT METHOD USING MULTI-ELECTRODE CONDUCTIVE PROBE  
A multi-electrode conductive probe, a manufacturing method of insulating trenches and a measurement method using the multi-electrode conductive probe are disclosed. The conductive probe includes a...
US20110234250 PROBE  
A probe for testing electronic properties of a circuit board by contacting with a weld bead on the circuit board is provided. The probe includes a main body. The main body includes an end surface,...
US20140184259 METHOD AND DEVICE FOR TESTING WAFERS  
Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas...
US20080272793 Finger Tester for Testing Unpopulated Printed Circuit Boards and Method for Testing Unpopulated Printed Circuit Boards Using a Finger Tester  
The present invention relates to a finger tester for the testing of non-componented printed circuit boards using at least two test fingers (1), each of which has a test probe (2), and wherein...
US20120068726 ELECTRICAL TEST PROBE AND PROBE ASSEMBLY  
An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An...
US20130141130 Wafer Probe Card  
A wafer probe card has an adapter module and a probe module detachably mounted together. The adapter module has a holding member and an interposer mounted within the holding plate. The probe...
US20110089965 PROBE CARD ANALYSIS SYSTEM AND METHOD  
A system and method for evaluating wafer test probe cards under real-world wafer test cell condition integrates wafer test cell components into the probe card inspection and analysis process....
US20150177278 DEEP-ETCHED MULTIPOINT PROBE  
A multipoint probe for establishing an electrical connection between a test apparatus and a test sample, the multipoint probe comprising a base defining a top surface and a plurality of traces...
US20070139061 PROBING APPARATUS WITH GUARDED SIGNAL TRACES  
A probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first...
US20140062518 ADJUSTABLE MEASUREMENT DEVICE  
An adjustable measurement device includes a case, a positive contact portion, a negative contact portion, a test probe, a first wire, and a second wire. The positive contact portion is positioned...
US20130057308 CONNECTION TERMINAL AND CONNECTION JIG  
Provided is a connection terminal that maintains an approximately circular shape before or after a cylindrical part is fixed by resistance welding. The connection terminal used for a connection...
US20070152686 Knee probe having increased scrub motion  
Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The...
US20050225338 Hard drive test fixture  
The present invention is a method and apparatus for testing electrical or optical devices. The invention includes a test fixture having a top component, a first rail and a second rail coupled to...
US20080079453 Manufacture Method Of Vertical-Type Electric Contactor Vertical-Type Electric Contactor Thereof  
A method for fabricating a vertical-type electric contactor includes forming a first passivation pattern on a sacrificial substrate for forming at least one tip; performing an etch process, using...
US20110285417 PROBE  
Provided is a probe which secures large overdrive and makes strict control of a scrubbing amount. A probe includes a first deforming portion which includes a linkage mechanism formed by a...
US20090289646 TEST PROBE  
A test probe pin is disclosed. The test probe has a plurality of probes, each of which has a probe tip surface coated with a nano-film of conducting polymer, and the thickness of the nano-film is...

Matches 1 - 50 out of 260 1 2 3 4 5 6 >