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US20060214673 Intrument for testing solid-state imaging device  
A testing apparatus, by which an optical system to irradiate a test light to a solid-state imaging device is easily aligned with the solid-state imaging device and highly efficient tests can be...
US20090015276 PROBE ASSEMBLY AND METHOD FOR PRODUCING IT  
A method of producing a probe assembly which uses thermal energy of a laser light for bonding a plurality of connection pads provided on a probe board and a probe disposed on each connection pad....
US20060227236 Camera module and method of manufacturing the same  
The present invention relates to a camera module, and more particularly, to a camera module which is miniaturized by changing the structure of a housing joined to a PCB on which a standardized...
US20090179656 LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE  
The present invention relates to a device for testing an optoelectronic module, comprising a first source for generating an electromagnetic beam or particle beam, a second source for illuminating...
US20150061715 Method and Apparatus for Non-Contact Measurement of Forward Voltage, Saturation Current Density, Ideality Factor and I-V Curves in P-N Junctions  
Non-contact measurement of one or more electrical response characteristics of a p-n junction includes illuminating a surface of the p-n junction with light of a first intensity having a modulation...
US20150241512 Method and Apparatus for Non-Contact Measurement of Sheet Resistance and Shunt Resistance of P-N Junctions  
Non-Contact measurement of characteristics of p-n junctions includes illuminating an illumination area of a surface of a p-n junction with light, measuring a first junction photovoltage (JPV)...
US20070222471 Front and back side dynamically-biased photon emission microscopy  
An apparatus for testing emissions from a packaged integrated circuit is described. The apparatus comprises an ATE for generating input stimulus to said integrated circuit, a universal PEM board....
US20100045331 Method of locating failure site on semiconductor device under test  
In an analysis of a semiconductor device under test (DUT) using a Thermal Induced Voltage Alteration (TIVA) tool, the TIVA is connected to an output of the DUT and the DC component on the output...
US20100060307 Electrical Characterization of Semiconductor Materials  
A system and method for characterizing electronic properties of a semiconductor sample includes illuminating the surface of the semiconductor sample with a pulse of light, measuring a...
US20130127487 NON-CONTACT TESTING OF PRINTED ELECTRONICS  
Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired...
US20100039134 HIGH-POWER OPTICAL BURN-IN  
Semiconductor lasers are aged to identify weak or flawed devices, resulting in improved reliability of the remaining devices. The lasers can be aged using a high-power optical burn-in that...
US20080018349 METHOD FOR TESTING ELECTRICAL ELEMENTS USING AN INDIRECT PHOTOELECTRIC EFFECT  
A method for testing or measuring electric elements uses at least one electron-discharging electrode, at least one electron-collecting electrode and at least one source of a beam of particles. The...
US20090150098 SYSTEM AND METHOD FOR PHOTOEMISSION-BASED DEFECT DETECTION  
An IREM image of an IC is obtained. The emission intensity at each emission site is measured/calculated and is compared to reference intensity. The calculated intensity may be plotted against...
US20080122463 Testing microelectronic devices using electro-optic modulator probes  
Testing microelectronic devices using electro-optic modulator probes is disclosed. In one aspect, a testing apparatus may include an electrical signaling medium to exchange electrical signals with...
US20060028217 System of detection and repair and method thereof  
A system of detection and repair is to detect and repair an organic electroluminescent apparatus. When detecting locations of defects, the system charges a bias to the detected locations of the...
US20130222004 INSPECTION APPARATUS AND INSPECTION METHOD  
An inspection apparatus inspects a photovoltaic cell panel in which the photo device is formed. The inspection apparatus includes: an irradiation part that irradiates the photovoltaic cell panel...
US20080143355 Method and System for Testing or Measuring Electrical Elements  
A method for testing or measuring electric elements, includes applying a beam of particles to a location of an electric element. Charges are liberated under the effect of the application of the...
US20090206863 System and Method for Testing a Plurality of Circuits  
A system for, and method of, testing a plurality of circuits, which may be unsingulated die on a wafer. In one embodiment, the system includes: (1) a test data interconnect that connects a test...
US20100121593 IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE  
Some embodiments of the present invention provide a system for in-situ characterization of a solid-state light. First, a voltage and a current of the solid-state light source are monitored. Then,...
US20090189630 ANGULAR SPECTRUM TAILORING IN SOLID IMMERSION MICROSCOPY FOR CIRCUIT ANALYSIS  
A method and structure for locating a fault in a semiconductor chip. The chip includes a substrate on a dielectric interconnect. A first electrical response image of the chip, which includes a...
US20080224724 Photoconductive Based Electrical Testing of Transistor Arrays  
Apparatus for testing microelectronic components on a substrate, including a scanner operative to scan a light beam over a plurality of thin film transistors disposed on a substrate, one...
US20090195265 DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUITS  
A method and device for testing an integrated circuit. The method includes selecting between a shadow latch data retention mode and a shadow latch test mode; performing first test of an integrated...
US20070229096 System and method for detecting single event latchup in integrated circuits  
A method for testing an integrated circuit for potential latchup sites includes applying a voltage to the integrated circuit, measuring a current through the integrated circuit, applying at least...
US20100321055 IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING  
Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated...
US20090121736 DISPOSABLE BUILT-IN SELF-TEST DEVICES, SYSTEMS AND METHODS FOR TESTING THREE DIMENSIONAL INTEGRATED CIRCUITS  
A device and method for self-testing an integrated circuit layer for a three-dimensional integrated circuit includes integrally forming a disposable self-test circuit on a common substrate with a...
US20090189629 SEMICONDUCTOR WAFER HAVING A MULTITUDE OF SENSOR ELEMENTS AND METHOD FOR MEASURING SENSOR ELEMENTS ON A SEMICONDUCTOR WAFER  
In the measurement of sensor elements in a wafer composite, whereby non-electric stimuli are to be applied to the sensor elements, a semiconductor wafer having a multitude of sensor elements, each...
US20070287205 METHOD OF MEASURING MINORITY CARRIER DIFFUSION LENGTH AND METHOD OF MANUFACTURING SILICON WAFER  
A method of measuring a diffusion length of a minority carrier in a silicon wafer by a surface photovoltage method including irradiating the surface-treated silicon wafer with ultraviolet...
US20110267087 APPARATUS AND METHOD FOR WAFER LEVEL CLASSIFICATION OF LIGHT EMITTING DEVICE  
The present disclosure provides a semiconductor test system. The semiconductor test system includes a wafer stage to hold a wafer having a plurality of light emitting devices (LEDs); a probe test...
US20150084661 Method for the Extraction of Recombination Characteristics at Metallized Semiconductor Surfaces  
The present disclosure relates to methods for determining recombination characteristics at metallized semiconductor surfaces and of metallized semiconductor junctions, based on photo-conductance...
US20150260789 SYSTEM AND METHOD FOR FAULT ISOLATION BY EMISSION SPECTRA ANALYSIS  
An apparatus and method for optical probing of a DUT is disclosed. The system enables identifying, localizing and classifying faulty devices within the DUT. A selected area of the DUT is imaged...
US20100194414 ELECTRO OPTICAL DETECTOR  
An electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the...
US20100271056 CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD  
The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container...
US20100231253 METHOD AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE  
The magnitude of an amplitude waveform of an electromagnetic wave generated when irradiating a pulse laser beam to a structure A including diffusion regions provided in the structure of a...
US20100156451 METHOD AND SYSTEM FOR MEASURING LASER INDUCED PHENOMENA CHANGES IN A SEMICONDUCTOR DEVICE  
A method and system for measuring laser induced phenomena changes of at least one of a resistance, a capacitance and an inductance in a semiconductor device. The method comprises applying a...
US20100156445 Apparatus and Method for Electrical Characterization by Selecting and Adjusting the Light for a Target Depth of a Semiconductor  
The present disclosure provides methods and apparatus that enable characterization of an electrical property of a semiconductor specimen, e.g., dopant concentration of a near-surface region of the...
US20100117667 Method and means for optical detection of internal-node signals in an integrated circuit device  
A continuous-wave laser beam is chopped to form pulses synchronized to the activity of a device under testing and/or to acquisition electronics. Chopping the laser beam to reduce the duty-cycle of...
US20170176520 TUNABLE WAVELENGTH ELECTRO-OPTICAL ANALYZER  
An electro-optical analyzing system is provided with a wavelength tunable laser so that a DUT may be laser illuminated at different wavelengths. The signal qualities are determined corresponding...
US20170131349 Waveform Mapping and Gated Laser Voltage Imaging  
Systems, methods, and computer readable media to improve integrated circuit (IC) debug operations are described. In general, techniques are disclosed for acquiring/recording waveforms across an...
US20170123003 SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INSPECTION METHOD  
A semiconductor device inspection system (1) includes a laser beam source (2), for emitting light, an optical sensor (12) for detecting the light reflected by the semiconductor device (10) from...
US20170089951 TERAHERTZ TRANSMISSION CONTACTLESS PROBING AND SCANNING FOR SIGNAL ANALYSIS AND FAULT ISOLATION  
An apparatus comprises a contactless sense probe, an electro optic sensor module, and a test signal emitter circuit. The contactless sense probe includes a photoconductive switch and the signal...
US20170082685 PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CONTROLLED BY LOCAL SAMPLE PROPERTIES  
A method for testing an integrated circuit (IC) using a nanoprobe, by using a scanning electron microscope (SEM) to register the nanoprobe to an identified feature on the IC; navigating the...
US20160377675 OPTICAL NANOPROBING OF INTEGRATED CIRCUITS  
Apparatus for electrical and optical nanoprobing at resolution beyond optical diffraction limit. Navigation microscope is configured for navigation to a region of interest. A probe spatial...
US20160349287 ELECTRO-OPTIC PROBE WITH MULTIPLE SENSITIVITY RANGES  
A test and measurement system including an electro-optical accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the...
US20160334459 SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INSPECTION METHOD  
A semiconductor device inspection system includes a laser beam source, a tester, an optical sensor, a first spectrum analyzer for measuring first phase information serving as phase information of...
US20160313395 OPTICAL ANTENNAS FOR ADVANCED INTEGRATED CIRCUIT TESTING  
A device testing approach employs optical antennas at test locations of a semiconductor device, usable as either/both radiators or receivers. As a radiator, an antenna responds to localized...
US20160291088 ADVANCED 4-DIMENSIONAL SIGNAL AND DEVICE TESTING USING CIRCUIT-STATE RECOGNITION  
The Fast Fourier transform describes functions into different dimensions or coordinates such as Cartesian to spherical. For example, a function could be represented in the domains of time and...
US20160248375 PHOTOELECTRIC CONVERSION ELEMENT EVALUATION APPARATUS  
A photoelectric conversion element evaluation apparatus includes: a probe light source that irradiates a photoelectric conversion element as the object of measurement with probe light; a pump...
US20160202313 LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES  
A pulsed-laser LADA system is provided, which utilizes temporal resolution to enhance spatial resolution. The system is capable of resolving CMOS pairs within the illumination spot using...
US20160161556 DEFECT ISOLATION METHODS AND SYSTEMS  
A test system for testing devices is disclosed. The test system includes a scanning microscope module and a test module. The scanning microscope module, when testing a device under test (DUT), is...
US20160139200 SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING  
An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a...

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