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Match Document Document Title
US20150054539 WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD  
A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad...
US20090039907 PROBE CARD FOR SEMICONDUCTOR TEST  
A probe card for testing semiconductor devices is disclosed, which can precisely test semi-conductor chips, in which probes, probe bars, and a probe block housing of the probe card are improved,...
US20090002001 INTEGRATED LIGHT CONDITIONING DEVICES ON A PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING SAME  
A probe card is disclosed which includes a body, at least one housing in the body, the housing having at least one light opening, and at least one light conditioning device in the at least one...
US20090189624 Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the same  
An interposer and a probe card assembly for electrical die sorting is provided. The assembly may include probes electrically contacting pads of dies on a substrate, a first wiring unit including a...
US20080303540 Probe card assembly  
The invention relates to a probe card assembly comprising a stiffener (1), comprising a PCB (2) disposed in the stiffener (1), and comprising a spider (3) supported by the stiffener and the PCB...
US20140176173 PROBE CARD FOR POWER DEVICE  
A probe card 10 includes a first probe 11 configured to come into electric contact with an emitter electrode of a power device D; a block-shaped first connecting terminal 12 to which the first...
US20130265073 Probe Card And Manufacturing Method Therefor  
The present invention provides a ST board 2 that is formed with an lower surface electrode 22; a unit attachment plate 3 that is fastened on the ST board 2 and formed with an opening part 31...
US20130162276 PROBE CARD AND METHOD FOR MANUFACTURING SAME  
Provided is a probe card including a plurality of unit plates including pad areas and contact probe areas, a plurality of electrode pads formed in the pad areas, a plurality of contact probes...
US20080297185 Multi probe card unit, probe test device including the multi probe card unit, and methods of fabricating and using the same  
A multi probe card unit, a probe test device including the multi probe card unit, and methods of fabricating and using the same are provided. The multi probe card unit may include at least one...
US20100327893 Probing Structure for Evaluation of Slow Slew-Rate Square Wave Signals in Low Power Circuits  
An integrated circuit probing structure (40) is provided for evaluating functional circuitry (42), such as a slow slew-rate square wave signal from a low power circuit, where the probing structure...
US20080094096 Semiconductor testing equipment and semiconductor testing method  
In testing a large number of semiconductor devices, semiconductor testing equipment of the present invention is provided with combination determining unit 105 that determines the combination of...
US20080048685 Probe card having vertical probes  
A probe card includes a first probe plate having a first plurality of tapered apertures formed therein. Each of the tapered apertures has a first opening that is smaller than a second opening. The...
US20080297183 PROBE CARD HAVING COLUMNAR BASE PORTION AND METHOD OF PRODUCING THE SAME  
A probe card includes a flat plate-shaped wiring board, a columnar base portion, and a thee-dimensional spiral contactor. The base portion is interposed between a wiring pattern of the wiring...
US20140184259 METHOD AND DEVICE FOR TESTING WAFERS  
Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas...
US20090212795 Probe card with segmented substrate  
A probe card for testing of semiconductor dice is provided. The probe card includes a mounting plate and a plurality of substrate segments supported by the mounting plate.
US20070069745 PROBE CARD FOR INTEGRATED CIRCUITS  
A probe card for integrated circuit devices comprises a printed circuit board, at least one probe pin positioned on the printed circuit board, and at least one ultrasonic generator configured to...
US20090146673 Manufacturing method of probe card and the probe card  
A manufacturing method for probe card according to the present invention includes following processes. A film is formed on the surface of a circuit board. A connecting terminal and joint member...
US20150198631 Universal Probe Card PCB Design  
A printed circuit board (PCB) is disclosed. The PCB includes a plurality of first signal pads, a plurality of signal channels, and a plurality of second signal pads. The first signal pads are...
US20090128174 Probe card using thermoplastic resin  
Disclosed is a probe card using thermoplastic resin. The probe card includes: a printed circuit board; a probe head that includes a plurality of terminals disposed on one surface thereof, the...
US20070159193 Method of reproducing information using semiconductor probe and device adopting the semiconductor probe  
An information reproducing apparatus and a method using a semiconductor probe are provided. The information reproducing apparatus includes a semiconductor probe including a semiconductor tip...
US20080204066 Automatic test equipment capable of high speed test  
Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body...
US20060208747 Test system and connection box therefor  
A test system comprises a first ground line for connecting a first ground terminal of a tester to a second ground terminal of a prober; a ground plane that covers the bottom surface of the tester...
US20150015290 PROBE MODULE SUPPORTING LOOPBACK TEST  
A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has...
US20090039904 Probe card, production method thereof and repairing method of probe card  
A probe card 6 is produced by forming probe pins 2, each having a thin film portion 21, three-dimensionally on a substrate 1 having a concave portion 11 formed thereon, forming bumps 3 at base end...
US20080164893 Probe card for testing wafer  
Provided is a probe card for testing a wafer. The probe card includes: a main card having a flat plate in which a hole is formed; an auxiliary card vertically mounted on the main card through the...
US20080169830 PROBE CARD FOR TEST AND MANUFACTURING METHOD THEREOF  
A probe card includes a plurality of probe modules, a multi-layer ceramic substrate provided below the probe module, and a solder ball for connecting the probe module and the multi-layer ceramic...
US20080171452 Interposer, Probe Card and Method for Manufacturing the Interposer  
Disclosed is an interposer comprising a silicon substrate (20). A plurality of conductive holes (27) penetrating the silicon substrate (20) are formed by dry etching, and at least one end of each...
US20090184727 Space Transformer, Manufacturing Method of the Space Transformer and Probe Card Having the Space Transformer  
Provided is a probe card of a semiconductor testing apparatus, including a printed circuit board to which an electrical signal is applied from external, a space transformer having a plurality of...
US20090184725 PROBE CARD ASSEMBLY WITH INTERPOSER PROBES  
A probe test card assembly for testing a device under test includes interposer probes to connect a printed circuit board to a substrate. The probe test card assembly includes a printed circuit...
US20100083489 CARBON NANOTUBE COLUMNS AND METHODS OF MAKING AND USING CARBON NANOTUBE COLUMNS AS PROBES  
Carbon nanotube columns each comprising carbon nanotubes can be utilized as electrically conductive contact probes. The columns can be grown, and parameters of a process for growing the columns...
US20100001748 Probe Card  
A probe card includes a flat wiring board having a wiring pattern corresponding to a circuit structure for generating a signal for a test, an interposer that is stacked on the wiring board and...
US20090128171 Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program  
An inspecting method which is for a microstructure with a movable portion and executes a highly precise inspection without damaging a probe or an inspection electrode by supressing the effect of a...
US20090153177 SEPARATE TESTING OF CONTINUITY BETWEEN AN INTERNAL TERMINAL IN EACH CHIP AND AN EXTERNAL TERMINAL IN A STACKED SEMICONDUCTOR DEVICE  
A stacked semiconductor device is disclosed which is capable of conducting a test to determine whether or not there is continuity between an external terminal and a corresponding internal terminal...
US20080174326 PROBE, PROBE ASSEMBLY AND PROBE CARD FOR ELECTRICAL TESTING  
A probe card for transmitting electric signals between a test head and an inspection object includes a printed circuit board provided with a plurality of electrode pads, a supporter attached to...
US20120112778 METHODS AND APPARATUS FOR MULTI-MODAL WAFER TESTING  
Access to integrated circuits of a wafer for concurrently performing two or more types of testing, is provided by bringing a wafer and an edge-extended wafer translator into an attached state. The...
US20140145741 PROBE CARD AND INSPECTION DEVICE  
A probe card comes in touch with a test object to perform an inspection. The probe card contains: a probe substrate provided with a plurality of probes on the first surface and a plurality of...
US20130015872 Test Schemes and Apparatus for Passive Interposers  
A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first...
US20100019795 VARIABLE DELAY CIRCUIT, TIMING GENERATOR AND SEMICONDUCTOR TESTING APPARATUS  
The accuracy of the delay amount to be imparted to a timing signal is improved by increasing the delay amount obtained by a first stage of a delay element. A variable delay 50 which comprises a DA...
US20090144971 PROBE CARD  
An object of the present invention is to finely conduct an inspection of high integration devices by making it possible to form guide holes in a support plate of a probe card in a narrower pitch...
US20120194210 PROBE CARD WIRING STRUCTURE  
The present disclosure provides a probe card for wafer level testing. The probe card includes a space transformer having first power/ground lines and first signal lines embedded therein, wherein...
US20100013511 Intelligent Multi-meter with Automatic function selection  
Intelligent Multi-meter with Automatic function selection A measuring device with the function of automatically determining the type of device under test (DUT) and selecting measuring function,...
US20080143358 ELECTRICAL GUARD STRUCTURES FOR PROTECTING A SIGNAL TRACE FROM ELECTRICAL INTERFERENCE  
A method of fabricating a guard structure can include depositing an insulating material over at least a portion of electrical signal conductors disposed on a component of a probe card assembly,...
US20100327891 METHOD AND APPARATUS FOR THERMALLY CONDITIONING PROBE CARDS  
Embodiments of probe cards and methods for fabricating and using same are provided herein. In some embodiments, an apparatus for testing a device (DUT) may include a probe card configured for...
US20090261850 Probe card  
Disclosed is a probe card capable of simplifying the manufacturing process and the repair work. The probe card includes a printed circuit board including a substrate through hole; at least one...
US20070145989 Probe card with improved transient power delivery  
In high current integrated circuit wafer test applications, a high capacitance density capacitor may be formed in association with a probe card at a position closer to a wafer under test. This...
US20110012633 APPARATUS AND METHOD FOR TESTING OF STACKED DIE STRUCTURE  
An integrated circuit device is described that includes a stacked die and a base die having probe pads that directly couple to test logic of the base die so as to implement a scan chain for...
US20080116924 Device under test pogo pin type contact element  
A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is...
US20090033346 GROUP PROBING OVER ACTIVE AREA PADS ARRANGEMENT  
A group probing over active area (POAA) pads arrangement includes a chip having a set of bonding pads, at least a first set of probing pads and a second set of probing pads. Each of the first set...
US20090136235 Probe card with optical transmitting unit and memory tester having the same  
Example embodiments provide a probe card having an optical transmitting unit and a memory tester having the probe card. The probe card may include a plurality of needles connected to test...
US20090212801 METHOD OF MAKING HIGH-FREQUENCY PROBE, PROBE CARD USING THE HIGH-FREQUENCY PROBE  
A high frequency probe preparation method for making a high frequency probe for high frequency testing to assure signal integrity by means of making a sleeve assembly subject to the size of a...

Matches 1 - 50 out of 117 1 2 3 >