Matches 1 - 50 out of 241 1 2 3 4 5 >


Match Document Document Title
US20150153403 DETECTION FIXTURE FOR CONNECTOR  
A detection fixture for a connector is provided. The fixture includes a first fixing block, a second fixing block fixed on the first fixing block, a probe, a probe cable, a controlling board...
US20140091821 COMPOSITE WIRE PROBES FOR TESTING INTEGRATED CIRCUITS  
An electrical probe of an aspect includes a high yield strength wire core. The high yield strength wire core includes predominantly one or more materials selected from tungsten, tungsten-copper...
US20140176172 COMPOSITE WIRE PROBE TEST ASSEMBLY  
An examples includes a substrate, including a conductive trace and a layer disposed on top of the conductive trace, the layer defining at least one cavity extending to the conductive trace and an...
US20150070037 TEST FIXTURE FOR PROBE APPLICATION  
Systems and methods to fixture and utilizing a probe which tests a capacitive array are described herein. A support bracket with freedom about a plurality of axes may aid in locating a probe and...
US20140043054 VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY  
A testing method (and the probes used) comprising providing one or more probes each comprising: a body portion which is substantially straight; an extended portion extending from the body portion...
US20110273198 LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONTACT INDUCTANCE  
A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm...
US20120319713 AUTOMATIC PROBE CONFIGURATION STATION AND METHOD THEREFOR  
A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device...
US20150192615 MULTIPLE CONTACT PROBES  
The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.
US20150137845 Methods and Devices for Testing Segmented Electronic Assemblies  
Methods and devices are disclosed for testing an electronic assembly comprising a number of segments. In one embodiment, a scalable periphery amplifier may comprise a number of amplifier segments....
US20080106292 Probe card having cantilever probes  
A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and...
US20140354317 CIRCUIT BOARD INSPECTION APPARATUS, CIRCUIT BOARD INSPECTION METHOD AND CIRCUIT BOARD INSPECTION TOOL  
A circuit board inspection apparatus configured to perform electrical inspection of wiring patterns formed on a circuit board with a built-in electronic component is provided with a plurality of...
US20150168455 ALLOY MATERIAL, CONTACT PROBE, AND CONNECTION TERMINAL  
An alloy material includes: a composition containing 17 at % to 25 at % of silver (Ag), 30 at % to 45 at % of palladium (Pd), and 30 at % to 53 at % of copper (Cu) in a composition range of a...
US20130002281 CONTACT PROBE AND PROBE UNIT  
A contact probe having a substantially flat plate shape, used to connect different substrates and having a uniform plate thickness includes: a first contact portion which has a side surface curved...
US20150160285 Apparatus and Methods for Qualifying HEMT FET Devices  
A method includes coupling a gate pulse generator to a gate terminal of a power transistor device under test, coupling a drain pulse generator to a drain terminal of the power transistor device...
US20120319714 PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES  
Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure...
US20140167801 RIGID PROBE WITH COMPLIANT CHARACTERISTICS  
A probe conducts testing of a circuit. The probe includes a base coupled to a substrate. The probe also includes a cantilever attached to the base at a first end, the cantilever deflecting from a...
US20140300380 METHOD OF DETERMINING SCATTERING PARAMETERS USING MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRONIC CIRCUIT  
A method for determining scattering parameters using a calibration substrate having at least one calibration standard with at least two electrical connection points, each for one measurement gate...
US20150015289 Multipath Electrical Probe And Probe Assemblies With Signal Paths Through Secondary Paths Between Electrically Conductive Guide Plates  
A multiple conduction path probe can provide an electrically conductive signal path from a first contact end to a second contact end. The probe can also include an electrically conductive...
US20140184259 METHOD AND DEVICE FOR TESTING WAFERS  
Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas...
US20140354316 CIRCUIT BOARD INSPECTION METHOD, CIRCUIT BOARD INSPECTION APPARATUS AND CIRCUIT BOARD INSPECTION TOOL  
There is provided a circuit board inspection tool configured to electrically connect a circuit board with a built-in electronic component and a circuit board inspection apparatus configured to...
US20130314115 WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE  
A wafer testing system and associated methods of use an manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a...
US20080048688 METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR  
A planarizer for a probe card assembly. A planarizer includes a first control member extending from a substrate in a probe card assembly. The first control member extends through at least one...
US20130038343 TEST CIRCUIT FOR TESTING SHORT-CIRCUIT  
A test circuit includes two probes, a comparison circuit, a switch circuit, and an indication circuit. The probes are connected to an electronic component to be tested, and a low level signal is...
US20110115512 Integrated circuit tester with high bandwidth probe assembly  
Described herein is a probe card assembly providing signal paths for conveying high frequency signals between bond pads of an integrated circuit (IC) and an IC tester. The frequency response of...
US20150168485 CIRCUIT BOARD TESTING SYSTEM  
A circuit board testing system includes a testing fixture and a computer system. The testing fixture includes a contact element, a switching circuit, and a data acquisition unit. The contact...
US20150015290 PROBE MODULE SUPPORTING LOOPBACK TEST  
A probe module, which supports loopback test and is provided between a PCB and a DUT, includes a substrate, a probe base, two probes, two signal path switchers, and a capacitor. The substrate has...
US20080106288 Circuit boards including removable test point portions and configurable testing platforms  
Circuit boards are provided that include a functional portion and at least one removable test point portion. The removable test point portion may include test points which are accessed to verify...
US20070236242 Integrated circuit with improved test capability via reduced pin count  
An integrated circuit that supports testing of multiple pads via a subset of these pads includes at least two sections. Each section has multiple pads and multiple test access circuits coupled to...
US20150168452 CIRCUIT BOARD TESTING SYSTEM  
A circuit board testing system includes a testing fixture and a computer system. The testing fixture includes a contact element, a switching circuit, a connection module, and a data acquisition...
US20150087089 3D IC Testing Apparatus  
A method comprises connecting a testing setup having a plurality of probes to a device under test having a plurality of vias, wherein a probe is aligned with a corresponding via of the device...
US20140333335 PROBE  
A probe includes a first deforming portion which includes a linkage mechanism formed by a vertical probe and a plurality of horizontal beams extending in a direction perpendicular to vertical...
US20050099196 Semiconductor inspection device based on use of probe information, and semiconductor inspection method  
A semiconductor inspection device and a method of inspection capable of reducing labor for species registration using a prober and of improving operation rate of the prober. The semiconductor...
US20120176150 MEASURING EQUIPMENT FOR PROBE-EFFECT CANCELLATION AND METHOD THEREOF  
A measuring equipment, such as a vector network analyzer, is provided. The measuring equipment includes a first port and a second port, a probe connected to the first port, an antenna connected to...
US20130300445 VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD  
A continuous variable spacing probe pin device, including first and second probe pins. The first and second probe pins are configured to measure a property of a conductive layer. In a first...
US20110169515 METHOD FOR PROVIDING ALIGNMENT OF A PROBE  
A method for aligning a probe relative to a supporting substrate defining a first planar surface, an edge, and a first crystal plane includes the steps of masking the surface of the substrate to...
US20130314114 MULTIPLE CONTACT TEST PROBE  
A probe apparatus may include a plurality of probe pins attached to a probe head portion. Each of the probe pins may be independently movable relative to the probe head portion.
US20090251162 Wireless Test Cassette  
A base controller disposed in a test cassette receives test data for testing a plurality of electronic devices. The base controller wirelessly transmits the test data to a plurality of wireless...
US20060028228 Test pads for IC chip  
The testing pads for multi-chip package are alternately placed at two ends or open area of the chip, so that the spacing between the test pads is wide enough for test probes to access.
US20140375346 TEST CONTROL DEVICE AND METHOD FOR TESTING SIGNAL INTEGRITIES OF ELECTRONIC PRODUCT  
A test control device and a method automatically test signal integrities of an electronic product. The test control device includes an oscilloscope and robot devices each holding a probe of the...
US20060114008 Probe card for testing semiconductor element, and semiconductor device tested by the same  
An apparatus which reduces a contact resistance by appropriately overdriving a measuring probe of a probe card to ensure a stable contact pressure. The probe card comprises a measuring probe...
US20150212112 Active Probe Card  
An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed...
US20070013408 Inspection device for display panel and interface used therein  
An interface 100, which connects a prober 14 having a contact probe 15 which contacts an electrode pad on a display panel 12 with a test head 13 which applies a test signal to the electrode pad...
US20070035318 Donut-type parallel probe card and method of testing semiconductor wafer using same  
A donut-type parallel probe card comprises a main substrate and a plurality of probing blocks installed on a surface of the main substrate, wherein each probe block comprises a plurality of...
US20150077149 TEST TERMINAL BLOCK  
A test terminal block is formed of a series terminal block and a test plug block pluggable onto the series terminal block and fastening clamps for releasably securing them together. Each of two...
US20060006892 Flexible test head internal interface  
A connection module for use with a test head system is provided, the test head system including a test head for testing devices. The connection module includes a plurality of flexible circuits for...
US20050174139 Apparatus for high speed probing of flat panel displays  
The invention includes an apparatus for high speed probing of flat panel displays. In this invention the above said system apparatus consists of a frame, a precision dual gantry mechanism which...
US20080197866 Method of Manufacturing Needle for Probe Card Using Fine Processing Technology, Needle Manufactured by the Method, and Probe Card Comprising the Needle  
Disclosed are probe card needles manufactured using microfabrication technology, a method for manufacturing the probe card needles, and a probe card having the probe card needles. The probe...
US20110204911 PROBER UNIT  
To facilitate connection between a narrow-pitched probe assembly and a coarse-pitched printed circuit board. A prober unit in which probes are brought into contact with to-be-tested semiconductor...
US20110025355 APPARATUS FOR ADJUSTING DIFFERENTIAL PROBE  
An apparatus for adjusting a differential probe includes a regulator arranged therein capable of adjusting a distance between two tips of the probe. The probe is supported on the apparatus. The...
US20050088168 Control module for use with a test probe  
A control module for an electronic test probe is built including a switch or other control device coupled to the test equipment, and electrically isolated from the probe tip, such that a user may...

Matches 1 - 50 out of 241 1 2 3 4 5 >