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US20050270058 System for testing integrated circuit devices  
A voltage generating circuit for generating internal voltage for a packaged integrated circuit memory device, is controllable to provide incremental adjustments in the voltage for testing of the...
US20070109003 Test Pads, Methods and Systems for Measuring Properties of a Wafer  
Test pads, methods, and systems for measuring properties of a wafer are provided. One test pad formed on a wafer includes a test structure configured such that one or more electrical properties of...
US20110175634 FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE  
To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films...
US20070114529 SCAN TESTING SYSTEM, METHOD AND APPARATUS  
Test circuits located on semiconductor die enable a tester to test a plurality of die/ICs in parallel by inputting both stimulus and response patterns to the plurality of die/ICs. The response...
US20120126840 Semiconductor Device with Cross-shaped Bumps and Test Pads Alignment  
A semiconductor device includes a semiconductor substrate; bumps disposed in a plurality of rows along a first axis direction of the semiconductor substrate; and test pads disposed in one or more...
US20070236232 SYSTEM AND APPARATUS FOR USING TEST STRUCTURES INSIDE OF A CHIP DURING THE FABRICATION OF THE CHIP  
The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of...
US20060132167 Contactless wafer level burn-in  
A method and apparatus for performing a wafer-level burn-in. The method comprises the steps of providing the wafer into a burn-in chamber; and outputting a power and a test initiation signal to a...
US20080111578 Device for Measurement and Analysis of Electrical Signals of an Integrated Circuit Component  
According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6)...
US20110102006 CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR APPARATUS  
A circuit for testing a semiconductor apparatus includes a test voltage applying unit configured to apply a test voltage to a first end of a through-silicon via (TSV) in response to a test mode...
US20110273197 SIGNAL GENERATOR FOR A BUILT-IN SELF TEST  
An integrated circuit with Built-in Self Test (BiST) is described. The integrated circuit includes a signal generator used to perform a BiST on the integrated circuit. The integrated circuit also...
US20090033373 Circuit and Method for Trimming Integrated Circuits  
A programmable after-package, on-chip reference voltage trim circuit for an integrated circuit having a plurality of programmable trim cells generating a programmed sequence. A converter is...
US20130108064 CONNECTORS FOR INVOKING AND SUPPORTING DEVICE TESTING  
Electronic devices may be provided with audio circuits and circuitry configured to support communications and test mode operations. During normal operation, a standards-compliant connector such as...
US20110080184 METHOD FOR TESTING THROUGH-SILICON-VIA AND THE CIRCUIT THEREOF  
The method and circuit for testing a TSV of the present invention exploit the electronic property of the TSV under test. The TSV under test is first reset to a first state, and is then sensed at...
US20080036487 Integrated circuit wearout detection  
An integrated circuit is provided with latency detecting circuitry for detecting signal generation latency within one or more functional circuits and in response thereto to generate a wearout...
US20060232292 Semiconductor integrated circuit and method for testing connection state between semiconductor integrated circuits  
A semiconductor integrated circuit including an input terminal and an input circuit connected to the input terminal includes the following elements. A testing circuit is provided between the input...
US20130108065 METHODS FOR INVOKING TESTING USING REVERSIBLE CONNECTORS  
Electronic devices may be provided with audio circuits and controller circuitry configured to support test mode operations. A connector such as a reversible connector may be inserted into a mating...
US20120262196 SEMICONDUCTOR DEVICE INCLUDING PLURAL CORE CHIPS AND INTERFACE CHIP THAT CONTROLS THE CORE CHIPS AND CONTROL METHOD THEREOF  
Disclosed herein is a device includes first and second core chips and a test circuit. The first core chip outputs an internal signal to a second node thereof in response to a core-chip test signal...
US20110313711 Identifying Defective Semiconductor Components on a Wafer Using Component Triangulation  
Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a...
US20060181297 Method and Apparatus for Non-Invasively Testing Integrated Circuits  
The preferred embodiments of the present invention provide non-invasive approaches of testing ICs that use photon emission from semiconductor devices to provide results of various testing...
US20090104342 PHOTOVOLTAIC FABRICATION PROCESS MONITORING AND CONTROL USING DIAGNOSTIC DEVICES  
The formation of diagnostic devices on the same substrate used to fabricate a photovoltaic (PV) cell is described. Such devices, also referred to as process diagnostic vehicles (PDVs), are...
US20090153176 Semiconductor device  
Disclosed is a semiconductor device including chips having output terminals connected in common to an external terminal. Each of the chips includes a data input and output section that provides a...
US20070241766 Semiconductor integrated circuit  
A semiconductor integrated circuit includes a wiring capable of connecting a plurality of chips on a wafer and has a configuration which is capable of cutting the wiring electrically and which...
US20090102503 SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP, INTERCHIP INTERCONNECT TEST METHOD, AND INTERCHIP INTERCONNECT SWITCHING METHOD  
A semiconductor device is provided with a first wiring (110) between chips, for electrically connecting a first semiconductor chip with a second semiconductor chip; an auxiliary second wiring...
US20140225635 ALL-DIGITAL PHASE LOCKED LOOP SELF TEST SYSTEM  
A method and apparatus for an all-digital built in self test (BIST) of a phase locked loop includes a phase detector (PD), wherein the PD produces a digital signal describing a comparison between...
US20160077142 POWER ELECTRONICS DEVICE  
According to one embodiment, a power electronics device has an output connected to an output of a different power electronics device by a power line. The power electronics device includes a...
US20070290708 INSPECTION SYSTEM AND INSPECTION CIRCUIT THEREOF, SEMICONDUCTOR DEVICE, DISPLAY DEVICE, AND METHOD OF INSPECTING SEMICONDUCTOR DEVICE  
The present invention provides an inspection system with small increase in circuit area and capable of controlling increase in cost to be small. An inspection circuit intervenes between a first...
US20130108063 INVOKING AND SUPPORTING DEVICE TESTING THROUGH AUDIO CONNECTORS  
Electronic devices may be provided with audio circuits and circuitry configured to support communications and test mode operations. During normal operation, a connector such as an audio connector...
US20100097087 EYE MAPPING BUILT-IN SELF TEST (BIST) METHOD AND APPARATUS  
A built-in self test for receiver operation is provided through a testing method that evaluates characteristics of a received signal eye diagram. The receiver receives a serial data signal and...
US20050270049 Semiconductor device  
It is an object to operate a semiconductor device within a desirable operating temperature range in a normal operation or a test operation. A semiconductor device 100 comprises a temperature...
US20100231252 TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD  
An integrated circuit (200) comprises a functional block (130) conductively coupled to a supply rail (110) via one or more switches (115). The IC further comprises selection means (220) responsive...
US20100201393 CHIP CARD WITH A MEASURING CIRCUIT THAT HAS A SENSOR, AND METHOD OF MAKING THE CHIP CARD  
The chip card (11) includes at least one integrated circuit (11) fitted with a memory unit, in which personal data and/or at least one chip card identification code and/or configuration parameters...
US20110221460 Integrated Circuit Arrangement Having a Defect Sensor  
The present disclosure relates to an integrated circuit arrangement. The circuit arrangement includes a semiconductor body having a first surface and defining a vertical direction running...
US20080258751 On-Chip Power Supply Noise Detector  
Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the...
US20090295420 SEMICONDUCTOR DEVICE AND TESTING METHOD  
A semiconductor device, comprising: a wafer; a radio receiving circuit chip that is formed on the wafer, and receives electric power and a test start signal transmitted by radio from outside; and...
US20080231310 FLEXIBLE ON CHIP TESTING CIRCUIT FOR I/O'S CHARACTERIZATION  
The present invention provides a flexible on-chip testing circuit and methodology for measuring I/O characterization of multiple I/O structures. The testing circuit includes a register bank, a...
US20080116910 Apparatus for mass die testing  
A semiconductor wafer includes a set of dice under test connected together by a plurality of signal buses; and at least one test die designed for carrying out tests of the dice under test, having...
US20070001694 On-die real time leakage energy meter  
A method includes measuring a temperature for a portion of an electronic component, determining the voltage being applied to the portion of the component, and determining a leakage power for the...
US20120212245 CIRCUIT AND METHOD FOR TESTING INSULATING MATERIAL  
An integrated circuit is disclosed. The integrated circuit includes an insulating material layer. The integrated circuit also includes a metal structure. Furthermore, the integrated circuit...
US20130321013 PHOTOVOLTAIC DEVICE FOR MEASURING IRRADIANCE AND TEMPERATURE  
A solar array system includes a plurality of power-generator modules, each power-generator module having an identical form factor and comprising a plurality of photovoltaic cells wired for power...
US20150377964 PROGRAMMABLE TEST PATTERN FOR A PIXEL ARRAY  
The disclosure provides a circuit capable of generating programmable test patterns for a pixel array. The circuit includes a pixel array having a plurality of pixels arranged in a plurality of...
US20160003910 SEMICONDUCTOR DEVICE  
The disclosed invention provides a semiconductor device that enables early discovery of a sign of aged deterioration that occurs locally. An LSI has a plurality of modules and a delay monitor...
US20130342229 LIQUID CRYSTAL DISPLAY AND DEAD PIXEL TEST CIRCUIT AND METHOD FOR LIQUID CRYSTAL DISPLAY  
A liquid crystal display includes a liquid crystal display panel and a test circuit. The liquid crystal panel includes a number of scanning lines and a number of data lines cooperatively forming a...
US20130076383 METHOD FOR TESTING AN INTEGRATED CIRCUIT  
A method for testing an integrated circuit and an integrated circuit. The integrated circuit has an internal testing structure which may be accessed via an internal test access port and a control...
US20050099199 Semiconductor device and its test method  
A second semiconductor chip including the operation of receiving operation instructions given from a first semiconductor chip and outputting a signal corresponding to it is mounted on mounting...
US20150276856 PASSIVE PROBING OF VARIOUS LOCATIONS IN A WIRELESS ENABLED INTEGRATED CIRCUIT (IC)  
Methods and apparatus are disclosed for wirelessly communicating among integrated circuits and/or functional modules within the integrated circuits. A semiconductor device fabrication operation...
US20160178665 FAULT DETECTION FOR A FLEXIBLE PROBE TIP  
A fault detection circuit for a flexible probe tip includes one or more conductive fault detection traces on a flexible substrate which are connected to a fault detector capable of determining if...
US20160299190 SEMICONDUCTOR APPARATUS AND TEST METHOD THEREOF  
A semiconductor apparatus includes a plurality of through-silicon vias, and a self repair block. The self repair block charges the plurality of through-silicon vias for a preset threshold time so...
US20100253381 On-Chip Logic To Support In-Field Or Post-Tape-Out X-Masking In BIST Designs  
Techniques for masking unknown and irrelevant response values that may be produced by a BIST process. Masking circuitry is provided for selectively masking the response values obtained from a BIST...
US20070200585 Semiconductor wafer, semiconductor chip, semiconductor device, and wafer testing method  
A semiconductor wafer of the present invention includes switch circuits each connecting a corresponding internal circuit formed in the semiconductor chip and the test pad. The semiconductor wafer...
US20120139570 SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME  
According to an embodiment, a semiconductor device includes a switch circuit selecting a signal pathway between a common terminal and one of a plurality of terminals using a plurality of FETs...

Matches 1 - 50 out of 107 1 2 3 >