Matches 1 - 15 out of 15


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US20080186039 Heat exchanger with finned tube and method of producing the same  
A heat exchanger for a gas boiler for producing hot water is provided with a casing extending along a first axis and through which combustion fumes flow; a tube along which water flows, and which...
US20090096475 TEST DEVICE  
A test device includes a movable mounting table having a temperature controlling mechanism therein; a probe card provided with a plurality of probes positioned above the mounting table; and a...
US20050017749 Electronic devices mounted on electronic equipment board test system and test method  
An electronic device test system includes electronic equipment having a board on which pluralities of electronic devices are mounted and isolation means which isolates from surrounding air an...
US20080186040 APPARATUS FOR TESTING DEVICES  
Methods and apparatus for testing semiconductor devices are provided herein. In some embodiments, an assembly for testing semiconductor devices can include a probe card assembly; and a thermal...
US20080246499 SYSTEM AND METHOD FOR THE ELECTRICAL CONTACTING OF SEMICONDUCTOR DEVICES  
A device and a method for the electrical contacting of semiconductor devices. One embodiment provides for testing semiconductor devices by using a contacting device for the electrical contacting...
US20100134129 MECHANICAL DECOUPLING OF A PROBE CARD ASSEMBLY TO IMPROVE THERMAL RESPONSE  
A stiffener structure, a wiring substrate, and a frame having a major surface disposed in a stack can be part of a probe card assembly. The wiring substrate can be disposed between the frame and...
US20090058446 INSPECTION APPARATUS AND INSPECTION METHOD  
An inspection apparatus for inspecting electric characteristics of a plurality of devices formed on a target object includes a vertical drive mechanism for lifting and lowering a movable mounting...
US20080231304 Apparatus and method for controlling temperature in a chuck system  
An apparatus and method of controlling the temperature of a thermal chuck system are disclosed. The system includes a temperature controller which controls a temperature transition in a thermal...
US20090027073 DEVICE MOUNTED APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM  
A device mounted apparatus includes a board on which a plurality of devices are mounted and a device cooling cover covering the plurality of devices, and formed inside it with a channel through...
US20100134128 Thermocentric Alignment Of Elements On Parts Of An Apparatus  
A first device and a second device can include at least one alignment feature and at least one corresponding constraint. The alignment feature and the constraint can be configured to align the...
US20080180124 COOLING APPARATUS FOR SEMICONDUCTOR DEVICE  
Provided is a cooling apparatus for a semiconductor device. The apparatus includes: a main body capable of moving vertically to face the semiconductor device that is mounted on a test unit in...
US20080231303 SEMICONDUCTOR DEVICE FOR ELECTRICAL CONTACTING SEMICONDUCTOR DEVICES  
A semiconductor device with a number of contact pads for the electrical contacting of the semiconductor device is disclosed. A padding layer, which is manufactured of a hard material, is provided...
US20100134130 INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISM  
A probing apparatus for integrated circuit devices comprises a probe card, a probe holder for holding the probe card, a test head and a temperature-adjusting mechanism. The probe card comprises at...
US20080211526 Wafer holder, heater unit used for wafer prober and having wafer holder, and wafer prober  
By wafer holder including a chuck top for mounting a wafer and a supporter supporting the chuck top and having flatness of at most 0.1 mm, a heater unit for a wafer prober and the wafer prober...
US20170010306 PROBE CARD, THERMAL INSULATION COVER ASSEMBLY FOR PROBE CARD, AND SEMICONDUCTOR DEVICE TEST APPARATUS INCLUDING THE SAME  
A probe card includes a circuit substrate to transmit an electrical signal for testing a semiconductor device, a probe block on a lower surface of the circuit substrate, the probe block having a...

Matches 1 - 15 out of 15