Matches 1 - 14 out of 14


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US20070069756 Test fixture  
A test fixture is adapted to shield a device under test (DUT) from time dependent electromagnetic radiation.
US20070139061 PROBING APPARATUS WITH GUARDED SIGNAL TRACES  
A probing apparatus can comprise a substrate, conductive signal traces, probes, and electromagnetic shielding. The substrate can have a first surface and a second surface opposite the first...
US20130033279 Electromagnetic Test Enclosure  
The present disclosure is directed to systems and methods for operating, designing, testing and verifying the performance of wireless communication devices. Specifically, the present systems and...
US20150130487 INTEGRATED CIRCUIT (IC) TEST SOCKET WITH FARADAY CAGE  
An integrated circuit test socket includes a highly conductive compliant material that is cut and installed into the test socket. The conductive material draws electrical charge away from the test...
US20080164901 Multilayer type test board assembly for high-precision inspection  
There is provided a multilayer type test board assembly for high-precision inspection. The multilayer test board assembly comprises: a plurality of test boards separated from each other according...
US20130257468 Stackable Electromagnetically Isolated Test Enclosures  
The present disclosure is directed to systems and methods for operating, designing, testing and verifying the performance of wireless communication devices. Specifically, the present systems and...
US20080116918 PROBE STATION TO TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EMI SHIELDING  
A probe station for testing semiconductor substrates, i.e., wafers and other electronic semiconductor elements, suitable for carrying out low-current and low-voltage measurement, comprises a...
US20140347082 SEMICONDUCTOR DEVICE TEST SOCKET  
A test socket for connecting a device under test (DUT) electrically to a high-frequency power source comprises a plurality of pogo pins each having an electrode, an electron-to-heat conversion...
US20060186904 Wafer holder for wafer prober and wafer prober equipped with the same  
The invention provides a wafer-prober wafer holder that allows positional precision and temperature uniformity to be increased, and also allows the chip to be heated and cooled rapidly, and a...
US20090212806 System for Making Contact Between a Transmit/Receive Module and a Testing Device  
A system for making electrical contact between a transmit/receive module and a testing device for the transmission of high-frequency signals includes a mechanically guided, frame-shaped contacting...
US20090085599 Semiconductor device having ESD protection circuit and method of testing the same  
A semiconductor device having an electrostatic discharge (ESD) protection circuit and a method of testing the same may provided. The semiconductor device may include one or more stacked chips,...
US20150054538 ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS  
A probe card includes a number probes. Each probe is adapted to contact a corresponding terminal of a circuit integrated in at least one die of a semiconductor material wafer during a test phase...
US20170097390 COMPACT ELECTRONICS TEST SYSTEM HAVING USER PROGRAMMABLE DEVICE INTERFACES AND ON-BOARD FUNCTIONS ADAPTED FOR USE IN PROXIMITY TO A RADIATION FIELD  
Various apparatus and methods associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are...
US20160084900 ELECTRICAL CONNECTOR FOR DETECTING DISCONTINUITIES IN AN ELECTRICAL NETWORK  
The invention concerns an electrical connection member, characterised in that it is capable of detecting discontinuities in an electrical network and comprises a casing having at least three...

Matches 1 - 14 out of 14