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Match Document Document Title
US20140035606 TEST PLATFORM  
A test platform includes a supporting member, a first slide rail located below the supporting member, and a conductive second slide rail located below the first slide rail for being electrically...
US20110234248 CIRCUIT BOARD TESTING DEVICE WITH SELF ALIGNING PLATES  
A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom,...
US20150109012 Multi-Stage Circuit Board Test  
Multi-stage in circuit test of a circuit board has support to reduce strain placed on the circuit board during each test stage. A shuttle plate is disposed between a load plate that supports a...
US20150204904 System for the Combined, Probe-Based Mechanical and Electrical Testing of MEMS  
A system for testing MEMS-structures includes a microforce sensor, two or more multi-axis micropositioning units, at least one electrical probe and a sample holder on which a MEMS-structure is...
US20130106454 PRINTED CIRCUIT BOARD TESTING DEVICE  
A printed circuit board testing device for performing an electrical test on a printed circuit board having test contacts includes a test platform, a positioning unit, an electrical connection...
US20150115988 AUTOMATION TESTING SYSTEM FOR TESTING A MOTHERBOARD  
An automation testing system for testing a motherboard includes a frame, a first jig plate, a second jig plate, a platform, a first driving mechanism, a second driving mechanism and a console...
US20140253159 HIGH ACCURACY ELECTRICAL TEST INTERCONNECTION DEVICE AND METHOD FOR ELECTRICAL CIRCUIT BOARD TESTING  
A high accuracy electrical test interconnect method employs a tester interface transfer block to enable the transfer of electrical contact from less accurate tester resource probes to target...
US20130176046 MOBILE TRANSFORMER TESTING SYSTEM  
A system includes a transformer testing system that includes a mobile platform configured to couple to a vehicle and an impulse testing system coupled to the mobile platform. The impulse testing...
US20070115012 Reinforced guide panel for vertical probe card  
A guide panel for a vertical probe card is disclosed to have a via area and a reinforcing area. The via area has a plurality of feed through vias. The reinforcing area is bonded to the via area....
US20130249582 AUXILIARY ELEMENT OF PRINTED CIRCUIT BOARD MODULE  
An auxiliary element of a printed circuit board defining a plurality of vias with different shapes and sizes includes a test board defining a plurality of test holes with different shapes and...
US20130127485 PRINTED CIRCUIT BOARD TESTING DEVICE  
A printed circuit board testing device for performing electrical tests on a printed circuit board having test contacts includes a test platform. An installable and uninstallable positioning module...
US20140292362 DUAL STAGE VACUUM CHAMBER WITH FULL CIRCUIT BOARD SUPPORT  
A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is...
US20130271171 DUAL STAGE VACUUM CHAMBER WITH FULL CIRCUIT BOARD SUPPORT  
A dual-stage fixture for a circuit tester includes a slide plate that can be slid between at least a first position and a second position. In the first position, an upper stripper plate is...
US20140327461 Probe Card Assembly For Testing Electronic Devices  
A probe card assembly can comprise a guide plate comprising probe guides for holding probes in predetermined positions. The probe card assembly can also comprise a wiring structure attached to the...
US20140210502 ENHANCED REVERBERATION CHAMBER  
A method and apparatus for an enhanced reverberation chamber are disclosed. In one embodiment, one or more positioners are coupled to a tuner, such that when the tuner moves, the positioner moves....
US20130169302 SYSTEM AND ADAPTER FOR TESTING PACKAGED INTEGRATED CIRCUIT CHIPS  
High precision connectivity for a device under test (DUT) in an electronic test system at reduced cost and superior performance characteristics is provided by incorporating an appropriate contact...
US20150192616 Method of Test Probe Alignment Control  
A system and method for aligning a probe, such as a wafer-level test probe, with wafer contacts is disclosed. An exemplary method includes receiving a wafer containing a plurality of alignment...
US20130335109 METHOD OF TEST PROBE ALIGNMENT CONTROL  
A system and method for aligning a probe, such as a wafer-level test probe, with wafer contacts is disclosed. An exemplary method includes receiving a wafer containing a plurality of alignment...
US20140340104 Assembly and Method for Testing an Electronic Circuit Test Fixture  
A method provides testing of an electronic circuit test system that includes a test fixture having headed and headless test probes, a shorting plate and a test probe verification plate with...
US20150054537 SYSTEM AND METHOD FOR ASSEMBLING A PROBE HEAD  
A method of assembling a probe head for a probe card interface is disclosed. The probe head includes a plurality of alignment plates, wherein each of the alignment plates includes a set of holes....
US20150091596 PROBE RETENTION ARRANGEMENT  
A retention arrangement that includes one or more templates for securing and aligning probes for testing a device under test.
US20140118016 Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes  
Elongated flexible probes can be disposed in holes of upper and lower guide plates of a probe card assembly. Each probe can include one or more spring mechanisms that exert normal forces against...
US20130033278 INSPECTION CONTACT ELEMENT AND INSPECTING JIG  
Provided is a micro contact element which is capable of coping with the miniaturization and greater complexity of substrates or boards, which is simplified due to a reduction in the number of...
US20120217986 MODULE ASSEMBLY HOLDING WORKBOARD  
A module assembly holding workboard is provided and includes a base having a central portion to support a computing module, a first wing at a first side of the central portion to support a first...
US20140266275 GUIDE PLATE FOR PROBE CARD  
The invention provides a guide plate for a probe card including a silicon substrate including a surface and a through-hole, an edge part of the through-hole, and a curved-face part. The...
US20130257467 CONTACT TEST DEVICE  
Because a guide hole that guides a plunger of a probe requires cumbersome machining of a hole, it is difficult to accommodate to narrowing of pitch and multi-polarization of terminals or...
US20140070828 METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST  
Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications....
US20060279302 Probe card and method for using probe card, wafer prober utilizing same  
An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the...
US20140333334 PARALLELISM ADJUSTING DEVICE AND PARALLELISM ADJUSTING METHOD  
A parallelism adjusting device and a parallelism adjusting method capable of adjusting the parallelism between the surface of a semiconductor and the surface of an electrode by reducing the load...
US20150241477 EFFECTIVE AND EFFICIENT SOLUTION FOR PIN TO PAD CONTACTOR ON WIDE RANGE OF SMD PACKAGE TOLERANCES USING A REVERSE FUNNEL DESIGN ANVIL HANDLER MECHANISM  
The problem of poor device pad to contactor pin presentation because of wide range of package size tolerance limited by process capability is minimized by a reverse funnel anvil design.
US20150204911 TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM  
A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit...
US20130234746 SHIELDED PROBE ARRAY  
Shielded probe array. In accordance with a first embodiment, an article of manufacture includes a plurality of rows of electronic probes. Each row of probes is substantially in a plane. Each probe...
US20060017451 Substrates including alignment fences  
A substrate includes a fence that receives and aligns a semiconductor device, such as a flip-chip type semiconductor device, therewith. The fence may include a plurality of adjacent, mutually...
US20150204910 Multifunction Test Instrument Probe  
A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a...
US20140266274 PROBE GUIDE PLATE AND METHOD FOR MANUFACTURING THE SAME  
There is provided a probe guide plate. The probe guide plate includes: a substrate having a through hole for guiding a probe, which is formed through the substrate, wherein the substrate includes...
US20060220665 Alignment fences and devices and assemblies including the same  
A fence is configured to receive and align a semiconductor device, such as a flip-chip type semiconductor device, with a substrate. The fence may include a plurality of adjacent, mutually adhered...
US20120194209 SYSTEM AND METHOD FOR PICKING AND PLACEMENT OF CHIP DIES  
According to an aspect of the invention, there is provided a chip die manipulator apparatus arranged for pick and placing of a chip die (30) in a chip manufacturing process, comprising: a pickup...
US20120235695 SOCKET, AND TEST APPARATUS AND METHOD USING THE SOCKET  
An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus...
US20130342233 Wafer Level Integrated Circuit Contactor and Method of Construction  
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact...
US20140232425 MULTI-PURPOSE INTEGRATED CIRCUIT DEVICE CONTACTOR  
A contactor uses a pogo block in a first configuration as a direct integrated circuit test socket and the contactor can be reconfigured to provide a pogo block assembly to interface between a main...
US20150260788 WAFER MOUNTING METHOD AND WAFER INSPECTION DEVICE  
Provided is a wafer mounting method that can prevent the structure of a wafer inspection device from becoming complicated. In a wafer inspection device (10) provided with a plurality of testers...
US20060022688 Probe card  
A probe card is commonly used for a plurality of kinds of semiconductor chips. The probe card has a probe card substrate and a multi-layer structure interconnection substrate connected to the...
US20140111236 TERMINAL TESTER  
A terminal testing device provides an adapter customized to a port of a connector being tested so that force applied to the adapter identifies loose and fixed terminals in the connector. The...
US20140266276 CROSS-BAR UNIT FOR A TEST APPARATUS FOR CIRCUIT BOARDS, AND TEST APPARATUS CONTAINING THE FORMER  
A cross-bar unit for a test apparatus for circuit boards having at least one cross-bar spanning a test field in which a circuit board to be tested may be placed, and is configured to hold...
US20070007948 Electrical connection device  
Inspection is performed without applying an excessive pressure to an inspection object to thereby resolve inspection failure caused by excessive pressure application. An electrical connection...
US20120280702 TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES  
A testing head for a test equipment of electronic devices of the type includes a plurality of contact probes inserted into guide holes which are realized in at least an upper guide and a lower...
US20070103179 SOCKET BASE ADAPTABLE TO A LOAD BOARD FOR TESTING IC  
A socket base adaptable to a load board for testing semiconductor devices is disclosed. The socket base includes a first fixing element having coupling plates, a probe element, and a second fixing...
US20140306730 ALIGNMENT ADJUSTING MECHANISM FOR PROBE CARD, POSITION ADJUSTING MODULE USING THE SAME AND MODULARIZED PROBING DEVICE  
An alignment adjusting mechanism for a probe card includes a frame, a substrate and positioning screws. The frame has an opening, an inner periphery wall surrounding around the opening, and an...
US20080122472 Testing jig of electronic signal  
A testing jig of electronic signal is disclosed. The testing jig of electronic signal capable of providing electrical connection between a plurality of contact pads of the circuit board and a...
US20150015287 TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TESTING  
The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a...

Matches 1 - 50 out of 127 1 2 3 >