Matches 1 - 40 out of 40


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US20080106292 Probe card having cantilever probes  
A probe card includes a printed circuit board (PCB) and a probe ring coupled to the PCB. The probe card further includes a plurality of probes coupled to the PCB and to the probe card, and...
US20130241587 WAFER STAGE  
A wafer stage and a method of supporting a wafer for inspection. the wafer stage comprises a platform for supporting a wafer such that a backside of the wafer is suspended above a cavity of the...
US20130207680 DEVICE FOR THE ELECTROMAGNETIC TESTING OF AN OBJECT  
The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes (2), a structure (3) for supporting the network of probes (2) and a...
US20070080703 Camera based pin grid array (PGA) inspection system with pin base mask and low angle lighting  
An inspection system, for inspecting pin grid arrays on integrated circuit devices includes a pin base mask configured to receive a device having a pin grid array. A dark-field, low-angle lighting...
US20080284453 IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING  
Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated...
US20090302880 Wide Area Soft Defect Localization  
Various apparatus and methods of testing a semiconductor chip for soft defects are disclosed. In one aspect, a method of testing a semiconductor chip that has a surface and plural circuit...
US20090295414 TRANSIENT EMISSION SCANNING MICROSCOPY  
An apparatus for analyzing an integrated circuit to which one or more test signals are applied. An example apparatus includes an objective lens that views reflections from the integrated circuit,...
US20070229105 Desktop wafer analysis station  
A small-footprint wafer analysis, or test, station, suitable for personal or desktop use, includes a chuck mounted upon a base, an x-y motion mechanism slidably attached to the base, a contact...
US20090002000 FAILURE ANALYSIS METHOD AND FAILURE ANALYSIS APPARATUS  
Failure analysis method includes performing fixed radiation of semiconductor chip (wafer) by photocurrent generation laser beam, scanning and radiating a region to be observed on semiconductor...
US20090015274 METHOD FOR AUTOMATED STRESS TESTING OF FLIP-CHIP PACKAGES  
Methods for testing flip-chip packages includes aligning a microscope and a test engine. The package under test is placed between the microscope and the test engine, and an acoustic transducer is...
US20080216918 METHODS AND APPARATUS FOR DENSE PARTICLE LOADING  
Methods and apparatus enable filling a receptacle with solid particles introduced into the receptacle with a controlled flow rate and pattern of distribution of the particles. A pneumatic loader...
US20080204056 DEVICE AND METHOD FOR PERFORMING A TEST OF SEMICONDUCTOR DEVICES WITH AN OPTICAL INTERFACE  
A device and method for performing a test of semiconductor devices with an optical interface. In one embodiment, the device performs a test at a semiconductor device with an integrated self test...
US20110279136 ELECTRONIC COMPONENT TESTING DEVICE AND ELECTRONIC COMPONENT TRANSPORT METHOD  
An electronic component testing device includes a first imaging device for imaging an upper-surface electrode of an electronic component before the electronic component is held by a holding part,...
US20100013509 PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME  
A prober for a semiconductor wafer test includes a stage, a probe card, and an adjuster The stage has a first region and a second region other than the first region The first region is covered by...
US20090189629 SEMICONDUCTOR WAFER HAVING A MULTITUDE OF SENSOR ELEMENTS AND METHOD FOR MEASURING SENSOR ELEMENTS ON A SEMICONDUCTOR WAFER  
In the measurement of sensor elements in a wafer composite, whereby non-electric stimuli are to be applied to the sensor elements, a semiconductor wafer having a multitude of sensor elements, each...
US20070001707 Method and apparatus for electrical testing of a unit under test, as well as a method for production of a contact-making apparatus which is used for testing  
A contact-making apparatus for electrical connection of a unit under test to an electrical test device, having a plurality of electrical contacts which are associated with at least one holding...
US20140218061 MICRO POSITIONING TEST SOCKET AND METHODS FOR ACTIVE PRECISION ALIGNMENT AND CO-PLANARITY FEEDBACK  
Methods and structures for testing a microelectronic packaging structure/device are described. Those methods may include placing a device in a floating carrier, wherein the floating carrier is...
US20140111235 ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTING APPARATUS, AND ELECTRONIC COMPONENT TESTING METHOD  
There is provided an electronic component handling apparatus which can be reduced in size or can improve the throughput when the number of contact arms is increased. A handler comprises: a...
US20110254574 PROBER, TESTING APPARATUS, AND METHOD OF INSPECTING SEMICONDUCTOR CHIP  
A prober includes a probe card provided with a support board and a probe attached to the support board, a stage on which a measurement wafer is mounted, a camera provided over the probe card to...
US20150015286 MICRO-VISION ALIGNMENT SYSTEM WITH GUIDING RINGS FOR IC TESTING  
A vision alignment system for an integrated circuit device testing handler includes a head guiding ring configured to be attached to a pick-and-place device, the head guiding ring having an...
US20140203830 TEST SYSTEM AND METHOD FOR WAFER INCLUDING OPTICAL COMPONENT  
A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port...
US20170160341 APPARATUS AND METHOD FOR EXCHANGING PROBE  
An apparatus for exchanging a probe includes a stacker configured to receive a probe and to align the probe, a probe connector connected to the probe, and a laser alignment unit including a light...
US20170153275 PROBE CARD WITH A NEEDLE AND A TESTING APPARATUS INCLUDING THE SAME  
A probe card includes a probe board and a needle disposed on the probe board, the needle including a needle tip. The needle tip includes a bottom surface having a long axis and a short axis that...
US20170146567 SYSTEMS AND METHODS FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAYS USING CELL CONTACT PROBING PADS  
A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of...
US20170131348 Multi-die Interface for Semiconductor Testing and Method of Manufacturing Same  
In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The interface apparatus comprises a housing substrate and two product substrates. The first...
US20170115326 PROBE MODULE  
A probe module includes a base adapted to be fixed to a tester, an engaging seat engaged with the base, a signal connector, an electrical signal transmitting member, and two probes located below...
US20170045577 IC DEVICE-IN-POCKET DETECTION WITH ANGULAR MOUNTED LASERS AND A CAMERA  
An apparatus includes a device holder including a device placement area configured to hold an electronic device, and a shoulder extending peripherally around the device placement area; a laser...
US20160377657 LOOP-BACK PROBE TEST AND VERIFICATION METHOD  
A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a...
US20160356843 IC HANDLER  
An IC handler (4) of the present invention transfers an IC device (D) to a test head (2). The test head (2) is provided with a socket (3), which has a placing surface (3a) having the IC device (D)...
US20160161553 PROBE APPARATUS AND PROBE METHOD  
A probe apparatus includes a stage, a first and a second imaging device, a first and a second imaging optical unit, and a projection optical unit. The stage is movable in horizontal and vertical...
US20160161527 PROBER  
A prober in which a probe head can be easily replaced is provided. A prober 10 includes a main body 12; a stage 11 provided within the main body 12 and configured to place a wafer W thereon; a...
US20160103178 VISION-GUIDED ALIGNMENT METHOD  
A method for performing an operation on an article, the article including a plurality of fiducial marks and a set of features. A digital imaging system is used to capture a digital image of the...
US20160103177 VISION-GUIDED ALIGNMENT SYSTEM  
A system is used to perform an operation on an article, the article including a plurality of fiducial marks and a set of features. A digital imaging system captures a digital image of the article,...
US20160103176 ELECTRICAL TEST METHOD WITH VISION-GUIDED ALIGNMENT  
A method for electrically testing devices fabricated on successive frames of a web of substrate, each frame including a plurality of fiducial marks. A digital imaging system is used to capture a...
US20160103175 ELECTRICAL TEST SYSTEM WITH VISION-GUIDED ALIGNMENT  
An electrical testing system is adapted to perform electrical tests on devices fabricated on successive frames of a web of substrate, each frame including a plurality of fiducial marks. A digital...
US20160025799 APPARATUS, METHODS AND SYSTEMS FOR MEASURING AND DETECTING ELECTRICAL DISCHARGE  
The invention relates to an apparatus, method and system for measuring and optionally detecting an electrical discharge having a discharge magnitude, wherein the electrical discharge causes a...
US20150369861 GROUP VISION ALIGNMENT FOR DOUBLE SIDED IC DEVICE TESTING  
A system for double sided integrated circuit device testing includes: (i) a picking section including: (a) a plurality of picking-section pockets; (b) a picking-section plate including: one or...
US20150362552 Probe Device  
A probe device of the present invention measures a position of every chip in a wafer to be inspected to acquire the position as actual measurement data. Then, the probe device calculates a...
US20150268298 FLEXIBLE CIRCUIT BOARD INSPECTING APPARATUS  
A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured...
US20140347081 SEMICONDUCTOR DEVICE ASSESSMENT APPARATUS  
A semiconductor device assessment apparatus that electrically assesses a semiconductor device formed on a semiconductor substrate includes a holding unit having a surface to hold the semiconductor...

Matches 1 - 40 out of 40