Matches 1 - 24 out of 24


Match Document Document Title
US20140263613 BOARD TEST SYSTEM AND METHOD  
A system includes a microprocessor that executes microcode designed to query all or some of the electronic circuits that are on a device under test. The results of the query are written to an RFID...
US20130222002 CABLE WITH WIRE DISCONNECTION DETECTION FUNCTION  
A cable with a wire disconnection detection function includes a detecting wire including a conductor formed by twisting a plurality of strands, and a detected wire including a conductor formed by...
US20090108864 SYSTEM AND METHOD FOR TESTING AN OPERATING CONDITION OF LEDS ON A MOTHERBOARD  
A computer-implemented method for testing an operating condition of light emitting diodes (LEDs) on a motherboard includes assigning an LED identification for each LED according to positions of...
US20070296403 Semiconductor device, unique ID of semiconductor device and method for verifying unique ID  
The present invention relates to a semiconductor device, a unique ID of the semiconductor device and a method for verifying the unique ID. Thus, original data (bit string) having 127-bit length...
US20090063086 APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT  
An apparatus for testing a semiconductor integrated circuit includes an input part that inputs circuit description data that describes a circuit structure of the semiconductor integrated circuit,...
US20090066355 Circuit Arrangement with Switchable Functionality and Electronic Component  
A circuit with switchable functionality has a first integrated circuit, which has, in a first operating mode, full functionality and which has, in at least one other operating mode, a...
US20130141128 TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC DEVICES  
A test method includes: generating a start command in responses to a user input; testing each of the electronic devices in responses to the start command, and generating a test result for each of...
US20080094082 Die Infrared Transceiver Bus  
A semiconductor wafer adapted to wirelessly transfer data to a testing system. The wafer comprises a plurality of dies, each die adjacent another die and each die comprising an infrared...
US20090224793 Method And Apparatus For Designing A Custom Test System  
Methods, apparatus, and computer readable media for designing a custom test system are described. Examples of the invention can relate to a method of generating test system software for a...
US20080068037 Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device  
A plurality of series circuits each consisting of a current-carrying element and an element to be measured are provided between a power supply potential VDD and a ground potential VSS. The...
US20090134903 LOOP-BACK TESTING METHOD AND APPARATUS FOR IC  
A test system for testing operability of integrated circuits includes: a first IC, for modulating a first signal to generate a first modulated signal and transmitting the first modulated signal,...
US20140197857 SYSTEM AND METHOD FOR A REMOTE CONTROL TESTER  
A system and method for testing remote controls. A number of remote controls are identified. The remote controls are received on a tray of a remote control tester. The tray is positioned for...
US20090027077 METHOD AND APPARATUS FOR IDENTIFYING OUTLIERS FOLLOWING BURN-IN TESTING  
A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is...
US20090302881 Internal Memory for Transistor Outline Packages  
A transistor outline (TO) package includes a housing having a window and a substrate. Circuitry is coupled to the substrate within the housing. The circuitry comprises a laser diode and memory...
US20090152543 System, Structure and Method of Providing Dynamic Optimization of Integrated Circuits Using a Non-Contact Method of Selection, and a Design Structure  
A system, structure and method is provided for providing dynamic optimization of integrated circuits using a non-contact method of selection, and a design structure on which a subject circuit...
US20080094087 Device for detecting chip location and method of detecting chip location using the device  
In a device for detecting a chip location and a method of detecting a chip location using the device, the device includes a chuck to which a wafer to be inspected is fixable, an infrared...
US20080180126 DEVICE IDENTIFYING METHOD, DEVICE MANUFACTURING METHOD AND ELECTRONIC DEVICE  
There is provided a device identifying method for identifying an electronic device including therein an actual operation circuit and a test circuit having a plurality of test elements provided...
US20120153977 TEST APPARATUS  
To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage...
US20160291072 TESTING METHOD AND UNIT FOR MICRO ELECTRO-MECHANICAL SYSTEMS  
A testing method for a micro electro-mechanical system is described, comprising the steps of: i) feeding a system to be tested on a first tray; ii) collecting the system from the first tray; and...
US20120007624 SEMICONDUCTOR SYSTEM AND DEVICE FOR IDENTIFYING STACKED CHIPS AND METHOD THEREOF  
A semiconductor system for identifying stacked chips includes a first semiconductor chip and a plurality of second semiconductor chips. The first semiconductor chip generates a plurality of...
US20110313711 Identifying Defective Semiconductor Components on a Wafer Using Component Triangulation  
Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a...
US20110309852 Simultaneously Tagging of Semiconductor Components on a Wafer  
Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a...
US20110309851 Tagging of Functional Blocks of a Semiconductor Component on a Wafer  
Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a...
US20110227593 SEMICONDUCTOR DEVICE AND TEST APPARATUS INCLUDING THE SAME  
A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal...

Matches 1 - 24 out of 24