Matches 1 - 18 out of 18


Match Document Document Title
US20050270048 Spring-loaded, removable test fixture for circuit board testers  
A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes...
US20140132296 HEAT SINK BLADE PACK FOR DEVICE UNDER TEST TESTING  
Embodiments of the present disclosure provide an apparatus configured to engage a device for testing the device via automatic test equipment. The apparatus includes a heat sink, wherein the heat...
US20140060790 HEAT SINK, MANUFACTURING METHOD THEREOF AND TESTING METHOD OF HEAT-DISSIPATING CAPABILITY  
An exemplary heat sink includes a heat-conducting substrate and a heat-conducting film formed on an outer surface of the substrate. A heat resistance of the heat-conducting film is lower than that...
US20140354314 THERMAL INTERFACE TECHNIQUES AND CONFIGURATIONS  
Embodiments of the present disclosure describe thermal interface techniques and configurations. In some embodiments, a thermal interface apparatus may include a flexible container, a plurality of...
US20140077830 High Speed, High Current, Closed Loop Load Transient Tester  
The present document relates to voltage regulators (101). In particular, the present document relates to the testing of voltage regulators subject to load transients. A test device (110)...
US20110267084 THERMAL INTERFACE MATERIAL, TEST STRUCTURE AND METHOD OF USE  
Non-corrosive thermal interface materials for use in a test structure and method of use. The test structure includes a heat sink for dissipating heat away from a device under test. The test...
US20090153171 Apparatus for testing objects under controlled conditions  
An apparatus for testing objects includes a test board having electrical connection areas to connect to the objects, a chamber fixture located on the test board to form test chambers that are...
US20060279306 Test equipment of semiconductor devices  
An test equipment includes a tester board that can be housed in a chamber, a plurality of sockets that are attached on a first main surface of the tester board and mounted respectively with...
US20110095773 COOLING STRUCTURE FOR A TEST DEVICE, AND A METHOD FOR TESTING A DEVICE  
An exemplary embodiment of the present invention aims at providing a cooling structure for a test device which has sufficient cooling performance and can reduce the size of the heat sink. The...
US20140253157 TEST SYSTEM WITH LOCALIZED HEATING AND METHOD OF MANUFACTURE THEREOF  
A test system, and a method of manufacture thereof, including: a thermal management head including a heat spreader; an electronic device in direct contact with the heat spreader; and an electrical...
US20060290370 TEMPERATURE CONTROL IN IC SOCKETS  
A system and method are provided which provides more accurate temperature control of integrated circuits. A system for testing integrated circuit (IC) packages comprises a plurality of IC testing...
US20070001692 Socket and electronic appliances using socket  
The present invention is made with the aim of suppressing heat generation and thus reducing voltage drop, regarding a socket comprising probes to be connected to an electronic device such as an IC...
US20100109673 HEAT-RESISTANT LENS KIT  
A heat-resistant lens kit configured within the pogo tower of the wafer tester is disclosed. The heat-resistant lens kit has two parallel lenses and a main body with a through hole. The main body...
US20060132159 Burn-in apparatus  
A radiating portion of each semiconductor laser element held by a holding portion contacts a heat sink, and therefore heat generated by operation of the semiconductor laser element is transmitted...
US20070132471 Method and apparatus for testing integrated circuits over a range of temperatures  
A method, system and device for testing an integrated circuit or device under test over a range of temperatures with a plunger, clamp or lid over the integrated circuit or device under test is...
US20070296434 Temperature control method and apparatus and test method and apparatus of semiconductor devices  
An electric power is supplied to a semiconductor device while thermally insulating the semiconductor device by bringing a thermal insulating material into contact with the semiconductor device. An...
US20120313657 TEMPERATURE CONTROL UNIT FOR ELECTRONIC COMPONENT AND HANDLER APPARATUS  
A temperature control unit for an electronic component and a handler apparatus, which are excellent in responsibility during cooling and heating, is obtained. The temperature control unit for an...
US20100125377 APPARATUS TO TEST SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME  
An apparatus to test a semiconductor device includes a chamber defining an inner space to receive a plurality of semiconductor devices, a temperature control apparatus connected to the chamber and...

Matches 1 - 18 out of 18