Matches 1 - 50 out of 81 1 2 >


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US20130241569 ARC RESISTANCE PERFORMANCE EVALUATION DEVICE, ARC RESISTANCE PERFORMANCE EVALUATION SYSTEM, AND ARC RESISTANCE PERFORMANCE EVALUATION METHOD  
The present device includes a high frequency induction thermal plasma generation unit 10; a second tube portion 20, which is connected to a first tube portion 13 and which includes window 25 on at...
US20110193561 CHUCKS FOR SUPPORTING SOLAR CELL IN HOT SPOT TESTING  
In an embodiment, a chuck to support a solar cell in hot spot testing is provided. This embodiment of the chuck comprises a base portion and a support portion disposed above the base portion. The...
US20130027051 NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES  
An on-chip technique for noncontact electrical testing of a test structure on a chip is provided. On-chip photodiodes receives pump light from a pump light source, where the on-chip photodiodes...
US20120182023 METHOD FOR LOCATING FAULT OF SUBMARINE CABLE, REPEATER, AND COMMUNICATION SYSTEM  
A method for locating a fault of a submarine cable, a device, and a communication system are provided. A light pulse output by a Repeater (RPT) is incident to a location of a fault as a probe...
US20060226848 Mass-production LED test device for mass production  
A mass-production LED test device includes a control module, at least one integrating sphere module electrically connected to the control module and at least one test board corresponding to at the...
US20050057258 Hand mounted holiday tester  
A hand mounted holiday tester includes a control unit with electrical sensing apparatus for detecting a completed circuit between a positive pole and a negative pole of the control unit. The...
US20120025837 METHOD TO DICE BACK-CONTACT SOLAR CELLS  
A method of processing of solar cells includes determining that a back-contact solar cell is defective. The back-contact solar cell includes a first plurality of interconnect pads at a first edge...
US20090072837 METHOD OF TESTING DURABILITY OF CIS BASED THIN-FILM SOLAR CELL MODULE  
The property of CIS based thin-film solar cell modules that the modules recover their conversion efficiency, etc. upon irradiation with a weak light is correctly evaluated. A CIS based thin-film...
US20130229188 SYSTEM AND METHOD FOR TESTING ELECTRICAL CIRCUITS USING A PHOTOELECTROCHEMICAL EFFECT  
A test system for medical devices that does not require physical contact with an electrical site along a conductive path is described. Not having to physical contact an electrical site while...
US20140203815 WIRING FAULT DETECTION METHOD AND WIRING FAULT DETECTION APPARATUS  
A wiring fault detection method and apparatus capable of appropriately detecting a fault in the case of capturing an image of a panel a plurality of times using an infrared camera are provided....
US20070108990 Arc monitoring system  
An arc monitor system locates an arc based on optimal frames from a frame obtained before an arc discharge to a frame obtained immediately after the arc discharge. The arc monitor system, used to...
US20050237067 Arrangement and method for detection and localization of short circuits in membrane electrode arrangements  
An arrangement for non-destructive detection and localization of short circuits in a membrane electrode arrangements (MEA), that includes the following components: a) a sample holder for holding...
US20130027050 SYSTEM AND METHOD FOR INSPECTION OF ELECTRICAL CIRCUITS  
A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense...
US20090322343 3-D Mapping Focused Beam Failure Analysis  
A reflector tool and a method are provided for three-dimensional integrated circuit (IC) failure analysis. An IC (die) has top and bottom surfaces, a perimeter, and a first side. The IC is...
US20130214922 ELECTRICAL PANEL SAFETY MONITOR  
An electrical safety monitor for monitoring electrical energy potentials of one or more electrical power input lines of an A.C. circuit. The electrical safety monitor including one or more...
US20090179651 PHOTOVOLTAIC CELL SOLAR SIMULATOR  
Embodiments of the present invention relate to a solar simulator module of a solar cell production line. In one embodiment the solar simulator receives a solar cell module in a horizontal position...
US20090278546 SOLAR CELL TESTING APPARATUS  
A solar cell testing apparatus including a stage, a movable chuck, a light source and a plurality of probes is provided. The movable chuck is disposed on the stage and capable of carrying a sample...
US20130033267 OPTICAL SENSOR ASSEMBLY FOR INSTALLATION ON A CURRENT CARRYING CABLE  
An optical sensor assembly, for installation on a current carrying cable, senses the current in the cable and provides an electrical output indicating the current. To sense the current, a magnetic...
US20090010526 TUNGSTEN PLUG DEPOSITION QUALITY EVALUATION METHOD BY EBACE TECHNOLOGY  
A first embodiment of the invention relates to a method for evaluating the quality of structures on an integrated circuit wafer. Test structures formed on either on the integrated or on a test...
US20120129274 PHOTODIODE SELF-TEST  
A photodetector array includes a plurality of photodetector cells such as avalanche photodiodes and readout circuits. An array self-tester tests a dark count or other performance characteristic of...
US20090261840 TIME RESOLVED RADIATION ASSISTED DEVICE ALTERATION  
A method of time resolved radiation assisted device alteration testing of a semiconductor circuit which includes performing spatially resolved radiation assisted circuit testing on the...
US20120139550 ARC FAULT DETECTION METHOD AND SYSTEM  
An example arc fault detection system includes an electrical system, an electrical controller, a sensor, and a master controller. The electrical controller detects a voltage of the electrical...
US20120133372 Solar Photovoltaic Panel Test Platform  
A solar photovoltaic panel test platform includes a test section and a signal processing section. The test section has a frame, a light-emitting unit disposed on the frame, a first angle...
US20100066382 TEST DEVICE AND TEST METHOD FOR A PV CONCENTRATOR MODULE  
The invention relates to a test device for a PV concentrator module, comprising a first light source for generating a light that simulates solar irradiation, a lens system which concentrates the...
US20120217973 System and Method for Flash Bypass  
A solar photovoltaic panel is disclosed that includes a photovoltaic cell, a local management unit connected between the cell and a string bus, and a bypass device connected to the cell that is...
US20080238435 INTEGRATED CIRCUIT TESTING WITH LASER STIMULATION AND EMISSION ANALYSIS  
A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be...
US20090096461 TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAGE CONTRAST INSPECTION  
A test structure for resistive open detection using voltage contrast (VC) inspection and method for using such structure are disclosed. The test structure may include a comparator within the IC...
US20090309606 SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES  
A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in...
US20140203814 METHOD AND APPARATUS FOR MEASURING ALPHA PARTICLE INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES  
An apparatus includes a probe card, an alpha particle source and a shutter. The probe card includes a plurality of contact elements. The contact elements define a measuring position. The shutter...
US20090268869 X-Ray Inspection System and Method  
The invention provides an automatic system and method using x-ray inspection to image arrays of electrical interconnections on electronic devices. The electron beam of a rotating anode X-ray tube...
US20090066357 Method and apparatus for detecting impairment of a solar array  
An apparatus for detecting an impairment of a solar array. The apparatus comprises an impairment detection module for performing a comparison of a power production profile and at least one...
US20100001738 System and Method for Conducting Accelerated Soft Error Rate Testing  
An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where...
US20100236035 SYSTEM AND METHOD FOR DETECTING DEFECTS IN A SOLAR CELL AND REPAIRING AND CHARACTERIZING A SOLAR CELL  
A system and method for detecting a defect in a solar cell and repairing and characterizing a solar cell includes applying a test signal to the solar cell, monitoring the response of solar cell,...
US20090325325 Laser Optical Path Detection in Integrated Circuit Packaging  
A method is provided for detecting laser optical paths in integrated circuit (IC) packages. The method provides an IC die encapsulated as a package in a compound of glass spheres and epoxy. Power...
US20140333319 CHARACTERIZATION OF SUBSTRATE DOPING AND SERIES RESISTANCE DURING SOLAR CELL EFFICIENCY MEASUREMENT  
Short-circuit current, maximum power, and open circuit voltage during a single flash are determined by varying intensity, voltage, and current. An apparatus determines the substrate doping and the...
US20100007352 Fiber Optic Fault Detection System and Method for Underground Power Lines  
Embodiments of the present invention are directed to a method and fault detection system for detecting and identifying the location of faults in underground power lines that can effectively and...
US20100283474 TEST CIRCUIT AND OPTICAL PICKUP DEVICE  
A test circuit for testing not only characteristics of a current-voltage conversion circuit in which a light-receiving element is used but also characteristics of the light-receiving element...
US20100109673 HEAT-RESISTANT LENS KIT  
A heat-resistant lens kit configured within the pogo tower of the wafer tester is disclosed. The heat-resistant lens kit has two parallel lenses and a main body with a through hole. The main body...
US20100182011 PHOTODIODE SELF-TEST  
A photodetector array (142) includes a plurality of photodetector cells (202) such as avalanche photodiodes (208) and readout circuits (210). An array self-tester (226) tests a dark count or other...
US20090096462 Wafer testing method  
A wafer testing method for wafer testing system comprises the steps: loading a wafer and then positioning the wafer relatively to a map file image stored in a map file. The map file is of a first...
US20110156716 System and method for localizing and passivating defects in a photovoltaic element  
The present invention relates to a system and method for localizing defects causing leakage currents in a photovoltaic element (100), a system and method for passivating defects causing leakage...
US20140103935 OPTICAL TO OPTICAL TIME AND SPATIAL RESOLUTION ENHANCEMENTS FOR IMPROVING CHARACTERIZATION OF SECONDARY ELECTRON EMISSION AND CONTROL FOR ETCH-, ELECTRON-, AND ION-BEAM DEVICES  
In decreasing the electron beam duration required for increased time resolution, the average beam current decreases, degrading measurement sensitivity and limiting practical systems to a time...
US20130169283 ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY METHOD  
A method is described for accurate measuring of the excess carrier lifetime on a semiconductor sample from the carrier decay after termination of the excitation pulse imposed on the steady-state...
US20110260733 FABRICATION PROCESS FOR PHOTOVOLTAIC CELL  
A photovoltaic strip is physically separated from a semiconductor wafer utilizing physical sawing or other techniques. In accordance with one embodiment, a type of semiconductor wafer is first...
US20100156430 Measuring instrument for photovoltaic systems  
The present invention relates to a measuring instrument for a photovoltaic system; the system is of the type comprising at least one photovoltaic module (FM1; FM2) and at least one conversion...
US20110013826 TEST STRUCTURE FOR CHARGED PARTICLE BEAM INSPECTION AND METHOD FOR DEFECT DETERMINATION USING THE SAME  
A test structure and method thereof for determining a defect in a sample of semiconductor device includes at least one transistor rendered grounded. The grounded transistor is preferably located...
US20120217974 METHOD AND APPARATUS FOR PROBING A WAFER  
A semiconductor wafer resting on a contact element has a spatially distributed force applied to its frontside and an equal and opposing force applied to its backside. The contact element comprises...
US20120056626 LASER ASSISTED DEVICE ALTERATION USING TWO-PHOTON ABSORPTION  
A Two-Photon Laser Assisted Device Alteration technique is presented. Fault localization is investigated by exploiting the non-linear two-photon absorption mechanism to induce LADA effects....
US20120025838 SUNLIGHT SIMULATOR  
A sunlight simulator and solar cell measuring device consisting of detecting device is disclosed, in which the housing is a closed space consisting of an opening gate, the closed space is...
US20120286795 METHODS, SYSTEMS, AND APPARATUS FOR DETECTING LIGHT AND ACOUSTIC WAVES  
A sensor includes a sensor head including an acoustic detector configured to receive light from a first light source and to reflect the light upon incidence of acoustic waves. The sensor also...

Matches 1 - 50 out of 81 1 2 >