Match Document Document Title
US20150053856 Protein Layers And Their Use In Electron Microscopy  
Protein layers (1) repeating regularly in two dimensions comprise protein protomers (2) which each comprise at least two monomers (5), (6) genetically fused together. The monomers (5), (6) are...
US20130001417 BACKGROUND REDUCTION SYSTEM INCLUDING LOUVER  
A background reduction system may include, but is not limited to: a charged particle source configured to generate a charged-particle beam; a louvered structure including one or more apertures...
US20140231644 In Situ Reactivation of Fluorescence Marker  
Vapor is provided locally at a sample surface to allow fluorescence of the fluorescent markers in a vacuum chamber. For example, a nanocapillary can dispense a liquid near a region of interest,...
US20120228493 WATER EQUIVALENT DEPTH MEASUREMENT  
A method for determining a water equivalent depth between an entrance point and a reference point is disclosed. The method may comprise sending to a charged particle beam detector placed at a...
US20130130393 METHOD OF ANALYZING A PLURALITY OF FERROMAGNETIC PARTICLES  
The invention relates to a method of analyzing a plurality of ferromagnetic particles (1). The method comprises the following steps: a) aligning the particles (1) of this plurality in such a...
US20120193530 System and Method for Localization of Large Numbers of Fluorescent Markers in Biological Samples  
A method and system for the imaging and localization of fluorescent markers such as fluorescent proteins or quantum dots within biological samples is disclosed. The use of recombinant genetics...
US20130319090 TESTING OF SURFACE CRYSTALLINE CONTENT IN BULK AMORPHOUS ALLOY  
Provided in one embodiment is a method, comprising: forming a part comprising a bulk amorphous alloy, wherein the part comprises a sampling portion; determining a parameter related to the part by...
US20110281743 SYSTEMS AND METHODS FOR ISOLATING CELLS IN CELL COLONIES IN CULTURE  
Selecting and propagating a cell colony of interest from among a plurality of cell colonies carried on a common substrate in culture is carried out by: (a) selecting a cell colony of interest from...
US20100202672 Protein Layers And Their Use In Electron Microscopy  
Protein layers (1) repeating regularly in two dimensions comprise protein protomers (2) which each comprise at least two monomers (5), (6) genetically fused together. The monomers (5), (6) are...
US20140117231 Automated Mineral Classification  
The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in...
US20130078139 CONTROL OF DEFORMATION-INDUCED IMPERFECTIONS TO ENHANCE STRENGTH OF METALS AND ALLOYS  
The disclosed invention specifies: 1) a metal or alloy with specific characteristics of its Deformation-induced Volumetric Microstructural Imperfections (DIVMI), 2) a method to measure these...
US20110196223 PROTON TOMOGRAPHY APPARATUS AND METHOD OF OPERATION THEREFOR  
The invention relates to a method and apparatus for charged particle tomographic imaging using a tomography system. The tomography imaging system is optionally simultaneously operational with a...
US20130214156 CHARGED PARTICLE DETECTOR  
A charged particle beam system for imaging and processing targets is disclosed, comprising a charged particle column, a secondary particle detector, and a secondary particle detection grid...
US20110284743 Method for Characterizing a Membrane in a Wet Condition By Positron Annihilation Spectrometer and Sample Holder Thereof  
The present invention discloses a method for characterizing a membrane in a wet condition using a positron annihilation spectrometer and a sample holder thereof. Positron annihilation lifetime...
US20130145827 TRACERS FOR DETECTING THE PRESENCE OF SOLID ADMIXTURES  
In some variations, this disclosure provides a method of verifying the presence of an admixture in association with a solid base material, by combining the admixture with a stable inorganic...
US20140117230 Mineral Identification Using Mineral Definitions Including Variability  
An improved mineral analysis system includes mineral definitions that include not only characteristics of the minerals, but also variability in those characteristics. The variabilities allow the...
US20120126115 SPECIMEN HOLDER HAVING ALIGNMENT MARKS  
For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for...
US20120037802 Distributed Potential Charged Particle Detector  
A charged particle beam system for imaging and processing targets is disclosed, comprising a charged particle column, a secondary particle detector, and a secondary particle detection grid...
US20090086903 Selective elemental color providing for X-ray fluorescence visualization, imaging, or information providing  
One aspect relates to selective X-ray fluorescence visualization, imaging, or information providing of an at least some matter of an at least a portion of an individual that at least partially...
US20150010673 P-CRESOL SULPHATE AS A BIOMARKER FOR HEALTHY AGING  
Using NMR/MS based metabonomics and targeted lipidomics approaches the inventors have explored the metabolic phenotypes of aging and longevity in a cohort compromising centenarians, elderly and...
US20100126911 Method For Using Native Bitumen Markers To Improve Solvent-Assisted Bitumen Extraction  
In solvent-assisted bitumen extraction, a native marker, for example: sulfur, nickel, vanadium, iron copper, or manganese, is used to control the solvent to bitumen ratio in a process stream such...
US20120070848 TUMOR CELL-DERIVED MICROVESICLES  
The present invention relates to a method for diagnosis of cancer and for monitoring the progression of cancer and/or the therapeutic efficacy of an anti-cancer treatment in a sample of a subject...
US20150241593 DISCRIMINATION OF LOW-ATOMIC WEIGHT MATERIALS USING SCATTERING AND STOPPING OF COSMIC-RAY ELECTRONS AND MUONS  
Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over...
US20150168138 METHOD OF TESTING BLOCKING ABILITY OF PHOTORESIST BLOCKING LAYER FOR ION IMPLANTATION  
A method of testing a blocking ability of a photoresist blocking layer for ion implantation, comprising: forming a photoresist blocking layer (S1) on a substrate; measuring a first thickness (S2)...
US20120213335 METHOD FOR IDENTIFYING NANO TEXTILE  
A method for identifying a nano textile, including: (1) determining whether a textile belongs to a woven fabric or a non-woven fabric by appearance; and (2) when the textile is a woven fabric,...
US20110127427 SPECIMEN HOLDER USED FOR MOUNTING  
A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and...
US20130099115 MICROFABRICATED HIGH-BANDPASS FOUCAULT APERTURE FOR ELECTRON MICROSCOPY  
A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB)...
US20100327161 METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS IN IMAGING ELECTRON DETECTORS WITH A THIN ELECTRON-SENSITIVE LAYER  
Methods are disclosed for operating a device having a high energy particle detector wherein the particles create first incoming traversal events, outgoing backscatter events, higher-order in and...
US20080217531 INTEGRATED DEFLECTORS FOR BEAM ALIGNMENT AND BLANKING IN CHARGED PARTICLE COLUMNS  
A charged particle beam column package includes an assembly (e.g., comprising a plurality of layers, which can have a component coupled to one of the layers), and at least one deflector between an...
US20120244631 Apparatus and Method for Determining Microscale Interactions Based on Compressive Sensors such as Crystal Structures  
Techniques for determining values for a metric of microscale interactions include determining a mesoscale metric for a plurality of mesoscale interaction types, wherein a value of the mesoscale...
US20140001357 On-Axis Detector for Charged Particle Beam System  
A split grid multi-channel secondary particle detector for a charged particle beam system includes a first grid segment and a second grid segment, each having independent bias voltages creating an...
US20150226687 ELECTRON BEAM INSPECTION OPTIMIZATION  
An electron beam (E beam) inspection optimization is provided, in which a plurality of initial inspection regions in a chip are obtained, wherein a center of each of the initial inspection regions...
US20140346351 ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN TRANSMISSION ELECTRON MICROSCOPY  
Methods of orientation imaging microscopy (OIM) techniques generally performed using transition electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed...
US20120025073 ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN TRANSMISSION ELECTRON MICROSCOPY  
Methods of orientation imaging microscopy (OIM) techniques generally performed using transition electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed...
US20130175444 ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS  
Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, an isotope of Neon is used.
US20100314540 Electron microscope with an emitter operating in medium vacuum  
An electron microscope is described. This electron microscope includes an electron emitter that has an evaporation or sublimation rate that is significantly less than that of tungsten at the...
US20100032564 Particle Detection and Applications in Security and Portal Monitoring  
Techniques, apparatus and systems for detecting particles such as muons. In one implementation, a monitoring system has a cosmic ray-produced charged particle tracker with a plurality of drift...
US20090166536 Sample Holder, Method for Observation and Inspection, and Apparatus for Observation and Inspection  
A sample holder used in SEM (scanning electron microscopy) or TEM (transmission electron microscopy) permitting observation and inspection at higher resolution. The holder has a frame-like member...
US20090000365 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope  
AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises...
US20090212212 Scanning Electron Microscope system and Method for Measuring Dimensions of Patterns Formed on Semiconductor Device By Using the System  
The present invention is for providing a scanning electron microscope system adapted to output contour information fitting in with the real pattern edge end of a sample, and is arranged to...
US20080258056 METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT  
A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage....
US20150060663 Electron source and X-ray fluorescence analyser using an electron source  
An electron source of an X-ray fluorescence analyser includes a photon source (201) and a photoelectric converter (203, 204) for converting photons into electrons. An electron multiplier (203,...
US20080048116 CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING SPECIMEN  
A charged particle beam device is provided. The device includes a primary objective lens for focusing a primary charged particle beam, the primary objective lens defining an optical axis, a...
US20090242759 SLICE AND VIEW WITH DECORATION  
Imprecisely located defects are imaged by milling a series of slices and performing a light, preferential etch to provide a topographical interface between materials having similar secondary...
US20080142711 METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRICAL CHARACTERIZATION AND PHYSICAL CHARACTERIZATION  
An analysis system has a charged particle beam instrument and a scanning probe microscope operably coupled with the charged particle beam instrument. A stage defines an aperture, the stage is...
US20140319339 Nanopore Fabrication And Applications Thereof  
In one aspect, methods of nanopore formation in solid state membranes are described herein, In some embodiments, a method of forming an aperture comprises providing at least one solid state...
US20090057664 E-BEAM INSPECTION STRUCTURE FOR LEAKAGE ANALYSIS  
A testing structure, and method of using the testing structure, where the testing structure comprised of at least one of eight test structures that exhibits a discernable defect characteristic...
US20100294927 High throughput inspecting  
The various embodiments provide methods and apparatus high-throughput reading and decoding of information-encoding features (especially identification features) on pharmaceutical compositions for...
US20090157328 METHOD OF DETERMING EXCRETION OF SODIUM AND OTHER ANALYTES  
Methods and kits of the invention are useful for calculating 24-hour excretion of sodium without the need to collect urine for 24 hours.
US20120012747 Contrast for Scanning Confocal Electron Microscope  
A scanning confocal transmission electron microscope includes a descan deflector and a corrector below the sample. The microscope uses a detector that is preferably significantly larger than the...