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US20150053856 |
Protein Layers And Their Use In Electron Microscopy
Protein layers (1) repeating regularly in two dimensions comprise protein protomers (2) which each comprise at least two monomers (5), (6) genetically fused together. The monomers (5), (6) are... |
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US20130001417 |
BACKGROUND REDUCTION SYSTEM INCLUDING LOUVER
A background reduction system may include, but is not limited to: a charged particle source configured to generate a charged-particle beam; a louvered structure including one or more apertures... |
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US20140231644 |
In Situ Reactivation of Fluorescence Marker
Vapor is provided locally at a sample surface to allow fluorescence of the fluorescent markers in a vacuum chamber. For example, a nanocapillary can dispense a liquid near a region of interest,... |
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US20120228493 |
WATER EQUIVALENT DEPTH MEASUREMENT
A method for determining a water equivalent depth between an entrance point and a reference point is disclosed. The method may comprise sending to a charged particle beam detector placed at a... |
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US20130130393 |
METHOD OF ANALYZING A PLURALITY OF FERROMAGNETIC PARTICLES
The invention relates to a method of analyzing a plurality of ferromagnetic particles (1). The method comprises the following steps: a) aligning the particles (1) of this plurality in such a... |
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US20120193530 |
System and Method for Localization of Large Numbers of Fluorescent Markers in Biological Samples
A method and system for the imaging and localization of fluorescent markers such as fluorescent proteins or quantum dots within biological samples is disclosed. The use of recombinant genetics... |
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US20130319090 |
TESTING OF SURFACE CRYSTALLINE CONTENT IN BULK AMORPHOUS ALLOY
Provided in one embodiment is a method, comprising: forming a part comprising a bulk amorphous alloy, wherein the part comprises a sampling portion; determining a parameter related to the part by... |
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US20110281743 |
SYSTEMS AND METHODS FOR ISOLATING CELLS IN CELL COLONIES IN CULTURE
Selecting and propagating a cell colony of interest from among a plurality of cell colonies carried on a common substrate in culture is carried out by: (a) selecting a cell colony of interest from... |
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US20100202672 |
Protein Layers And Their Use In Electron Microscopy
Protein layers (1) repeating regularly in two dimensions comprise protein protomers (2) which each comprise at least two monomers (5), (6) genetically fused together. The monomers (5), (6) are... |
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US20140117231 |
Automated Mineral Classification
The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in... |
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US20130078139 |
CONTROL OF DEFORMATION-INDUCED IMPERFECTIONS TO ENHANCE STRENGTH OF METALS AND ALLOYS
The disclosed invention specifies: 1) a metal or alloy with specific characteristics of its Deformation-induced Volumetric Microstructural Imperfections (DIVMI), 2) a method to measure these... |
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US20110196223 |
PROTON TOMOGRAPHY APPARATUS AND METHOD OF OPERATION THEREFOR
The invention relates to a method and apparatus for charged particle tomographic imaging using a tomography system. The tomography imaging system is optionally simultaneously operational with a... |
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US20130214156 |
CHARGED PARTICLE DETECTOR
A charged particle beam system for imaging and processing targets is disclosed, comprising a charged particle column, a secondary particle detector, and a secondary particle detection grid... |
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US20110284743 |
Method for Characterizing a Membrane in a Wet Condition By Positron Annihilation Spectrometer and Sample Holder Thereof
The present invention discloses a method for characterizing a membrane in a wet condition using a positron annihilation spectrometer and a sample holder thereof. Positron annihilation lifetime... |
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US20130145827 |
TRACERS FOR DETECTING THE PRESENCE OF SOLID ADMIXTURES
In some variations, this disclosure provides a method of verifying the presence of an admixture in association with a solid base material, by combining the admixture with a stable inorganic... |
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US20140117230 |
Mineral Identification Using Mineral Definitions Including Variability
An improved mineral analysis system includes mineral definitions that include not only characteristics of the minerals, but also variability in those characteristics. The variabilities allow the... |
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US20120126115 |
SPECIMEN HOLDER HAVING ALIGNMENT MARKS
For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for... |
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US20120037802 |
Distributed Potential Charged Particle Detector
A charged particle beam system for imaging and processing targets is disclosed, comprising a charged particle column, a secondary particle detector, and a secondary particle detection grid... |
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US20090086903 |
Selective elemental color providing for X-ray fluorescence visualization, imaging, or information providing
One aspect relates to selective X-ray fluorescence visualization, imaging, or information providing of an at least some matter of an at least a portion of an individual that at least partially... |
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US20150010673 |
P-CRESOL SULPHATE AS A BIOMARKER FOR HEALTHY AGING
Using NMR/MS based metabonomics and targeted lipidomics approaches the inventors have explored the metabolic phenotypes of aging and longevity in a cohort compromising centenarians, elderly and... |
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US20100126911 |
Method For Using Native Bitumen Markers To Improve Solvent-Assisted Bitumen Extraction
In solvent-assisted bitumen extraction, a native marker, for example: sulfur, nickel, vanadium, iron copper, or manganese, is used to control the solvent to bitumen ratio in a process stream such... |
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US20120070848 |
TUMOR CELL-DERIVED MICROVESICLES
The present invention relates to a method for diagnosis of cancer and for monitoring the progression of cancer and/or the therapeutic efficacy of an anti-cancer treatment in a sample of a subject... |
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US20150241593 |
DISCRIMINATION OF LOW-ATOMIC WEIGHT MATERIALS USING SCATTERING AND STOPPING OF COSMIC-RAY ELECTRONS AND MUONS
Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over... |
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US20150168138 |
METHOD OF TESTING BLOCKING ABILITY OF PHOTORESIST BLOCKING LAYER FOR ION IMPLANTATION
A method of testing a blocking ability of a photoresist blocking layer for ion implantation, comprising: forming a photoresist blocking layer (S1) on a substrate; measuring a first thickness (S2)... |
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US20120213335 |
METHOD FOR IDENTIFYING NANO TEXTILE
A method for identifying a nano textile, including: (1) determining whether a textile belongs to a woven fabric or a non-woven fabric by appearance; and (2) when the textile is a woven fabric,... |
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US20110127427 |
SPECIMEN HOLDER USED FOR MOUNTING
A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and... |
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US20130099115 |
MICROFABRICATED HIGH-BANDPASS FOUCAULT APERTURE FOR ELECTRON MICROSCOPY
A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB)... |
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US20100327161 |
METHOD FOR DISCRIMINATION OF BACKSCATTERED FROM INCOMING ELECTRONS IN IMAGING ELECTRON DETECTORS WITH A THIN ELECTRON-SENSITIVE LAYER
Methods are disclosed for operating a device having a high energy particle detector wherein the particles create first incoming traversal events, outgoing backscatter events, higher-order in and... |
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US20080217531 |
INTEGRATED DEFLECTORS FOR BEAM ALIGNMENT AND BLANKING IN CHARGED PARTICLE COLUMNS
A charged particle beam column package includes an assembly (e.g., comprising a plurality of layers, which can have a component coupled to one of the layers), and at least one deflector between an... |
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US20120244631 |
Apparatus and Method for Determining Microscale Interactions Based on Compressive Sensors such as Crystal Structures
Techniques for determining values for a metric of microscale interactions include determining a mesoscale metric for a plurality of mesoscale interaction types, wherein a value of the mesoscale... |
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US20140001357 |
On-Axis Detector for Charged Particle Beam System
A split grid multi-channel secondary particle detector for a charged particle beam system includes a first grid segment and a second grid segment, each having independent bias voltages creating an... |
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US20150226687 |
ELECTRON BEAM INSPECTION OPTIMIZATION
An electron beam (E beam) inspection optimization is provided, in which a plurality of initial inspection regions in a chip are obtained, wherein a center of each of the initial inspection regions... |
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US20140346351 |
ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN TRANSMISSION ELECTRON MICROSCOPY
Methods of orientation imaging microscopy (OIM) techniques generally performed using transition electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed... |
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US20120025073 |
ORIENTATION IMAGING USING WIDE ANGLE CONVERGENT BEAM DIFFRACTION IN TRANSMISSION ELECTRON MICROSCOPY
Methods of orientation imaging microscopy (OIM) techniques generally performed using transition electron microscopy (TEM) for nanomaterials using dynamical theory is presented. Methods disclosed... |
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US20130175444 |
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, an isotope of Neon is used. |
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US20100314540 |
Electron microscope with an emitter operating in medium vacuum
An electron microscope is described. This electron microscope includes an electron emitter that has an evaporation or sublimation rate that is significantly less than that of tungsten at the... |
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US20100032564 |
Particle Detection and Applications in Security and Portal Monitoring
Techniques, apparatus and systems for detecting particles such as muons. In one implementation, a monitoring system has a cosmic ray-produced charged particle tracker with a plurality of drift... |
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US20090166536 |
Sample Holder, Method for Observation and Inspection, and Apparatus for Observation and Inspection
A sample holder used in SEM (scanning electron microscopy) or TEM (transmission electron microscopy) permitting observation and inspection at higher resolution. The holder has a frame-like member... |
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US20090000365 |
AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope
AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises... |
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US20090212212 |
Scanning Electron Microscope system and Method for Measuring Dimensions of Patterns Formed on Semiconductor Device By Using the System
The present invention is for providing a scanning electron microscope system adapted to output contour information fitting in with the real pattern edge end of a sample, and is arranged to... |
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US20080258056 |
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENT
A method for sample examination in a dual-beam FIB calculates a first angle as a function of second, third and fourth angles defined by the geometry of the FIB and the tilt of the specimen stage.... |
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US20150060663 |
Electron source and X-ray fluorescence analyser using an electron source
An electron source of an X-ray fluorescence analyser includes a photon source (201) and a photoelectric converter (203, 204) for converting photons into electrons. An electron multiplier (203,... |
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US20080048116 |
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING SPECIMEN
A charged particle beam device is provided. The device includes a primary objective lens for focusing a primary charged particle beam, the primary objective lens defining an optical axis, a... |
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US20090242759 |
SLICE AND VIEW WITH DECORATION
Imprecisely located defects are imaged by milling a series of slices and performing a light, preferential etch to provide a topographical interface between materials having similar secondary... |
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US20080142711 |
METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRICAL CHARACTERIZATION AND PHYSICAL CHARACTERIZATION
An analysis system has a charged particle beam instrument and a scanning probe microscope operably coupled with the charged particle beam instrument. A stage defines an aperture, the stage is... |
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US20140319339 |
Nanopore Fabrication And Applications Thereof
In one aspect, methods of nanopore formation in solid state membranes are described herein, In some embodiments, a method of forming an aperture comprises providing at least one solid state... |
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US20090057664 |
E-BEAM INSPECTION STRUCTURE FOR LEAKAGE ANALYSIS
A testing structure, and method of using the testing structure, where the testing structure comprised of at least one of eight test structures that exhibits a discernable defect characteristic... |
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US20100294927 |
High throughput inspecting
The various embodiments provide methods and apparatus high-throughput reading and decoding of information-encoding features (especially identification features) on pharmaceutical compositions for... |
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US20090157328 |
METHOD OF DETERMING EXCRETION OF SODIUM AND OTHER ANALYTES
Methods and kits of the invention are useful for calculating 24-hour excretion of sodium without the need to collect urine for 24 hours. |
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US20120012747 |
Contrast for Scanning Confocal Electron Microscope
A scanning confocal transmission electron microscope includes a descan deflector and a corrector below the sample. The microscope uses a detector that is preferably significantly larger than the... |