Title:
Method and apparatus for separating ions of respectively different specific electric charges
United States Patent 3197633


Abstract:
1,059,599. Mass spectrometers. SIEMENSSCHUCKERTWERKE A.G. Dec. 4, 1963 [Dec. 4, 1962], No. 47999/63. Heading HID. In a high-frequency mass spectrometer of the type described in Specifications 773,689 and 904,033 and with a direct or alternating electric field superimposed on the hyperbolic analysing field, the electrode configuration effectively comprises one quadrant only and the ion beam path is displaced from the central co-ordinate axis as compared with the prior arrangements. The assembly consists of a field electrode 1, Fig. 3, and a reference electrode having two planar portions 2, 3 at rightangles or at any angle substantially greater than 0 degrees and substantially less than 180 degrees, but preferably in the range 60 to 120 degrees. The reference electrode may comprise sheet metal, wire-mesh or arrays of wires and is supported by metal members (5), Fig. 4 (not shown), from the envelope wall (4). The field electrode (1) which may be hollow or solid is supported by insulators (17, 18) on the reference electrode (2). The ion beam from the ion source (11) travels on an axis defined by aperture diaphragms (121, 13).



Inventors:
Von, Zahn Ulf
Application Number:
US24222462A
Publication Date:
07/27/1965
Filing Date:
12/04/1962
Assignee:
SIEMENS AG
Primary Class:
International Classes:
H01J49/42
View Patent Images:
Foreign References:
GB888913A1962-02-07