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        <title>Free Patents Online: Radiant energy</title>
        <link>http://www.freepatentsonline.com/rssfeed/rsspat250.xml</link>
        <description>USPTO Class 250 Radiant energy</description>
        <language>en-us</language>
        <lastBuildDate>Tue, 07 Feb 2012 08:00:00 EST</lastBuildDate>
        <item>
            <title><![CDATA[Optical disk apparatus and emission control method]]></title>
            <link>http://www.freepatentsonline.com/8111598.html</link>
            <description><![CDATA[An optical disk apparatus according to the present invention includes a spindle motor that rotates an optical disk on whose information recording surface a plurality of addresses is recorded, an optical pickup that records/reproduces an information signal on/from the information recording surface of the optical disk rotated by the spindle motor, an strobe light-emitting unit that irradiates a label surface of the optical disk with light, and a control unit that causes the strobe light-emitting unit to emit light based on an address selected from the plurality of addresses as a reference address and a reference signal readable from the optical disk.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Image reading device capably scanning an image formed on a document in consideration of deterioration of the reference member]]></title>
            <link>http://www.freepatentsonline.com/8111433.html</link>
            <description><![CDATA[An image reading device includes a reference member, a reading unit, a first reference value setting unit, a detecting unit, a second reference value setting unit, a determining unit, and a pixel value setting unit. The reading unit obtains image data and reference data. The first reference value setting unit sets a first reference value based on the reference data. The detecting unit detects a usage state of the reading unit. The second reference value setting unit sets a second reference value in accordance with the usage state. If the determining unit determines that the first reference value is in a predetermined condition, the pixel value setting unit sets a pixel value based on the image data and the first reference value; otherwise, the pixel value setting unit sets the pixel value based on the image data and the second reference value.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Method and apparatus for residue detection in the edge deleted area of a substrate]]></title>
            <link>http://www.freepatentsonline.com/8111390.html</link>
            <description><![CDATA[Apparatus and methods for detecting residue on a glass substrate and method of use are disclosed. The apparatus comprises a substrate support, a sensor, a controller and a peripheral device in communication with the controller. The apparatus measures the height or thickness of a main surface and an edge delete surface of a substrate to determine if film residue is present on the edge delete surface.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Methods of packaging imager devices and optics modules, and resulting assemblies]]></title>
            <link>http://www.freepatentsonline.com/8110884.html</link>
            <description><![CDATA[A method of packaging imager devices and optics modules is disclosed which includes positioning an imager device and an optics module in each of a plurality of openings in a carrier body, introducing an encapsulant material into each of the openings in the carrier body and cutting the carrier body to singulate the plurality of imager devices and optics modules into individual units, each of which comprise an imager device and an optics module. A device is also disclosed which includes an imager device comprising a plurality of photosensitive elements and an optics module coupled to the imager device, the optics module comprising at least one lens that, when the optics module is coupled to the imager device, is positioned a fixed, non-adjustable distance from the plurality of photosensitive elements.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Shielded container structure for the transport and storage of a radioactive source for medical use]]></title>
            <link>http://www.freepatentsonline.com/8110821.html</link>
            <description><![CDATA[A container for transporting a receptacle (2) containing a radioactive substance for medical use. includes a shielded body made up of a belt of side walls connected to a base element and defining a top opening, and a shielded closing lid attachable to the top opening by locking elements shaped so as to be activated by a translational movement of the lid in the top opening, this “locking movement” taking place along the axis of the opening and towards the opposing base element. The lid is further equipped with elements for deactivating the locking elements to enable it to be separated from the container body. In one advantageous embodiment, the lid has a plurality of retractable projecting studs designed to fit by a snap-action type phenomenon into at least one complementary housing formed in the opening of the container body during the locking movement.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Ion beam apparatus and method for ion implantation]]></title>
            <link>http://www.freepatentsonline.com/8110820.html</link>
            <description><![CDATA[A multipurpose ion implanter beam line configuration constructed for enabling implantation of common monatomic dopant ion species and cluster ions, the beam line configuration having a mass analyzer magnet defining a pole gap of substantial width between ferromagnetic poles of the magnet and a mass selection aperture, the analyzer magnet sized to accept art ion beam from a slot-form ion source extraction aperture of at least about 80 mm height and at least about 7 mm width, and to produce dispersion at the mass selection aperture in a plane corresponding to the width of the beam, the mass selection aperture capable of being set to a mass-selection width sized to select a beam of the cluster ions of the same dopant species but incrementally differing molecular weights, the mass selection aperture also capable of being set to a substantially narrower mass-selection width and the analyzer magnet having a resolution at the mass selection aperture sufficient to enable selection of a beam of monatomic dopant ions of substantially a single atomic or molecular weight.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Computer peripherals sterilization system]]></title>
            <link>http://www.freepatentsonline.com/8110819.html</link>
            <description><![CDATA[A system and method including a wand-type ultraviolet (UV) light assembly positioned above a keyboard and other computer peripheral device(s) to be sanitized. The UV light assembly is preferably moved across the peripheral device surface to eliminate nearly all germs, bacteria, viruses, pathogens and other microorganisms that have accumulated on the surfaces of the keyboard and other peripherals. Desirably, the system operation is managed by a controller device which is in communication with a host computer. In addition, the system allows for the collection and analysis of system performance data. The invention provides an extremely effective, compact, virtually cost-free and environmentally-friendly solution to disinfecting surfaces of keyboards and other peripheral devices.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system]]></title>
            <link>http://www.freepatentsonline.com/8110818.html</link>
            <description><![CDATA[A method of controlling particle absorption on a wafer sample being inspected by a charged particle beam imaging system prevents particle absorption by grounding the wafer sample and kept electrically neutral during the transfer-in and transfer-out process.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Probe array and method of manufacturing the same]]></title>
            <link>http://www.freepatentsonline.com/8110817.html</link>
            <description><![CDATA[A probe array includes a probe-carrying substrate and a base member. The probe-carrying substrate has first and second principal surfaces extending parallel to each other, and a plurality of probe carriers carrying probe molecules. The base member has a reference surface extending parallel to a fluorescence-receiving surface, and a seating surface supporting the probe-carrying substrate and extending in a direction other than a direction parallel to the reference surface. The probe carriers each have a plurality of surfaces forming different angles with respect to the fluorescence-receiving surface, the plurality of surfaces including a bottom surface and uprising surfaces extending from the bottom surface. Accordingly, the plurality of surfaces have different sensitivities, realizing a wide dynamic range.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Fluorescence detection system]]></title>
            <link>http://www.freepatentsonline.com/8110816.html</link>
            <description><![CDATA[A fluorescence detection system capable of detecting fluorescence with a high sensitivity even if a sample generating fluorescence is small in amount includes a light source emitting excitation light, a probe arranged in opposition to a sample unit, an optical multiplexer/demultiplexer, a detector, a first optical fiber connecting the light source to the optical multiplexer/demultiplexer, a second optical fiber connecting the probe to the optical multiplexer/demultiplexer, and a third optical fiber connecting the detector to the optical multiplexer/demultiplexer. An excitation filter, serving as a short-pass filter, is arranged on the first optical fiber and a detection filter serving as a long-pass filter is arranged on the third optical fiber. The optical multiplexer/demultiplexer includes a multiplexing/demultiplexing filter serving as a long-pass filter.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Vapor delivery to devices under vacuum]]></title>
            <link>http://www.freepatentsonline.com/8110815.html</link>
            <description><![CDATA[Providing vapor to a vapor-receiving device housed in a high vacuum chamber. An ion beam implanter, as an example, has a removable high voltage ion source within a high vacuum chamber and a vapor delivery system that delivers vapor to the ion source and does not interfere with removal of the ion source for maintenance. For delivering vapor to a vapor-receiving device, such as the high voltage ion source under vacuum, a flow interface device is in the form of a thermally conductive valve block. A delivery extension of the interface device automatically connects and disconnects within the high vacuum chamber with the removable vapor receiving device by respective installation and removal motions. In an ion implanter, the flow interface device or valve block and source of reactive cleaning gas are mounted in a non-interfering way on the electrically insulating bushing that insulates the ion source from the vacuum housing and the ion source may be removed without disturbing the flow interface device. Multiple vaporizers for solid material, provisions for reactive gas cleaning, and provisions for controlling flow are provided in the flow interface device.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Ion sources, systems and methods]]></title>
            <link>http://www.freepatentsonline.com/8110814.html</link>
            <description><![CDATA[Ion sources, systems and methods are disclosed.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Charged particle optical system comprising an electrostatic deflector]]></title>
            <link>http://www.freepatentsonline.com/8110813.html</link>
            <description><![CDATA[A charged particle optical system comprising a beamlet generator for generating a plurality of beamlets of charged particles and an electrostatic deflector for deflecting the beamlets. The electrostatic deflector comprises first and second electrodes adapted for connection to a voltage for generating an electric field between the electrodes for deflection of the beamlets, the electrodes being at least partially freestanding in an active area of the electrostatic deflector. The electrodes define at least one passing window for passage of at least a portion of the beamlets between the electrodes, the passing window having a length in a first direction and a width in a transverse direction. The system is adapted to arrange the beamlets in at least one row and to direct a single row of the beamlets through the passing window of the electrostatic deflector, the beamlets of the row extending in the first direction. A substantial part of the electrostatic deflector extends beyond the passing window in the first direction.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Method and system for detecting nitrogenous materials via gamma-resonance absorption (GRA)]]></title>
            <link>http://www.freepatentsonline.com/8110812.html</link>
            <description><![CDATA[A method for detecting nitrogenous materials within an object by means of Gamma-Resonance Absorption (GRA), including placing on one side of an object a target containing 13C for bombardment with a proton beam of approximately 1.75 MeV energy, to produce a source of 9.172 MeV gamma-rays for scanning the object, reading from the gamma-ray detector the total and the non-resonant attenuations of the incident photon flux, and deriving from the attenuations the net resonant attenuation and the spatial distribution thereof; wherein scanning the object includes: I. performing a rapid pre-scan to classify the overall gamma-ray-attenuation regime and locate regions of high physical density, in which longer scanning times might be required; II. performing a full scan to identify and locate regions that contain nitrogenous materials; and III. performing a plurality of scans in same or different segments to establish presence of explosives.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Devices and methods related to radiation delivery]]></title>
            <link>http://www.freepatentsonline.com/8110811.html</link>
            <description><![CDATA[Devices and methods are disclosed which relate to the calibration and quality assurance of motion tracking enabled radiation therapy machines. A phantom, capable of mimicking human breathing through inflation and deflation of the lungs, houses an independently moving target (tumor) that detects the amount of radiation received from the radiation therapy machine. This amount can be compared with a desired amount to determine if adjustment or repositioning is necessary. The servo-mechanism(s) of the motion tracking enabled radiation therapy machine(s) are adjusted in comparison of detected versus programmed motion of the respiring phantom having incorporated independently moving target that incorporated radiation dose detector(s). In the invention, motion tracking and irradiation mechanisms of the radiation therapy machine are adjusted to calibrate with reference to performance specifications of the radiation therapy machine.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Methods for increasing the sensitivity of gamma-ray imagers]]></title>
            <link>http://www.freepatentsonline.com/8110810.html</link>
            <description><![CDATA[Methods are presented that increase the position resolution and granularity of double sided segmented semiconductor detectors. These methods increase the imaging resolution capability of such detectors, either used as Compton cameras, or as position sensitive radiation detectors in imagers such as SPECT, PET, coded apertures, multi-pinhole imagers, or other spatial or temporal modulated imagers.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Radiation detector and radiographic inspection apparatus]]></title>
            <link>http://www.freepatentsonline.com/8110809.html</link>
            <description><![CDATA[On a wiring board 21, first and second semiconductor detection device arrays 22a and 22b are arranged along a depth direction (Y-axial direction). Each of the first and the second semiconductor detection device arrays 22a and 22b is composed by arranging six semiconductor detection devices 231 through 236 in one line in an arrangement direction (X-axial direction). Guard members 28a and 28b are arranged one on each end in the arrangement direction. In the semiconductor detection devices 231 through 236 of the first and the second semiconductor detection device arrays 22a and 22b, a kth (k is one of the number from 1 to 6) semiconductor detection device 23k from a reference line Xa is arranged by being shifted from others by ½ of a gap PT of the semiconductor detecting devices 231 through 236 in the arrangement direction.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Floating intelligent perimeter sensor system]]></title>
            <link>http://www.freepatentsonline.com/8110808.html</link>
            <description><![CDATA[A system, method, and floating intelligent perimeter sensor, provide protection for waterways and critical infrastructures. The system and method utilize one or more floating intelligent perimeter sensors to detect, and in some cases identify, hazardous materials associated with vessels in the waterways. The hazardous materials detected, and optionally identified, can include radiological materials, fissile materials, explosives, chemicals and biological materials (CBRNE). A set of radiation data associated with a radiation source in a vessel is received from the one or more floating intelligent perimeter sensors. At least one histogram is generated based on the set of radiation data. The at least one histogram is compared to multiple spectral images associated with known materials. The at least one histogram is determined to substantially match at least one of the multiple spectral images. A determination is made whether a material associated with the radiation source is a hazardous material.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Rediation detector system for locating and identifying special nuclear material in moving vehicles]]></title>
            <link>http://www.freepatentsonline.com/8110807.html</link>
            <description><![CDATA[The invention uses a series of combined passive neutron and gamma ray sensors systematically placed along a path of commercial traffic, for example an airport runway, combined with a pulsed source of low energy protons and deuterons. The pulsed source produces monoenergetic gamma rays and low energy (60 keV) neutrons. This pulsed source uses a pinch-reflex ion diode operated on a pulsed power generator to produce proton beams. These beams bombard a PTFE (Teflon) target to produce characteristic gamma-rays. These gamma rays would induce a fission reaction in any fissile material creating gamma rays and neutrons. The passive sensors located in the path of commercial traffic would sense both the resultant gamma and neutron products of the reaction. The short interrogation pulse, approximately 50 nanoseconds, provides a timing marker which can be used to turn on the passive detectors after the interrogation pulse so as to avoid saturation and to enable measuring the spectrum of the fast neutrons using time of flight. The decay rate of the intensity of fast and slow (thermalized by interaction with the runway materials) neutrons provides an unambiguous signature of the presence of fissile material.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Solid-state photomultiplier having improved timing resolution]]></title>
            <link>http://www.freepatentsonline.com/8110806.html</link>
            <description><![CDATA[A solid-state photomultiplier is provided for use in imaging detectors. The solid-state photomultiplier includes a plurality of microcells configured to detect impinging photons. Each of the plurality of microcells further includes a photodiode coupled to a common electrode through a quenching resistor and configured to convert the impinging photons into electrical signals, and an impedance device coupled in parallel with the quenching resistor so as to reduce overall quenching impedance at high frequency. Further, techniques are provided for implementing low impedance device with controllable value to the SSPM for optimized timing resolution.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Iterative algorithms for crystal efficiencies estimations from TOF compressed normalization data]]></title>
            <link>http://www.freepatentsonline.com/8110805.html</link>
            <description><![CDATA[Time-of-flight (TOF) clinical data collected during a PET scan are very sparse and have significant size. These data undergo TOF axial rebinning and azimuthal mashing if histogrammed data-based reconstruction algorithms are used. In a clinical environment, TOF compression is typically performed by the hardware rebinner. Normalization data, acquired on a regular basis and used for estimation of some norm components, are compressed by the hardware rebinner in a similar manner. This disclosure presents simple update iterative algorithms for crystal efficiencies norm component estimation from TOF compressed normalization data. Previously known methods are not directly applicable since the compression procedure significantly complicates normalization data model equations. The iterative algorithms presented herein have advantages of being easily adapted to any acquisition geometry, and of allowing estimation of parameters at crystal level when a number of crystals is relatively small. A monotonic sequential coordinate descent algorithm, which optimizes the Least Squares objective function, is presented. A simultaneous update algorithm, which possesses the advantage of easy parallelization, is also presented.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Through substrate optical imaging device and method]]></title>
            <link>http://www.freepatentsonline.com/8110804.html</link>
            <description><![CDATA[A through-substrate optical imaging device for through-imaging of translucent work objects, includes a radiation source outputting radiation that will be transmissive through the work object and an imaging system configured for capturing inspection information from the radiation source through the work object. The radiation source is configured such that the radiation impinges on the surface of the work object under various angles of incidence. A method for through-substrate optical imaging of a translucent work object includes irradiating the translucent work object by radiation from a radiation source; capturing inspection information from the radiation source through the translucent work object, the inspection information being captured by an imaging system; and irradiating the translucent work object. The translucent work object is irradiated by radiation which impinges on the surface of the translucent work object under one of various angles of incidence and orientations.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Sighting system and method]]></title>
            <link>http://www.freepatentsonline.com/8110803.html</link>
            <description><![CDATA[This invention relates to optical sighting apparatus systems, and to methods for visualization and for identifying remote target surface areas without physical contact for the purpose of measurement and/or of treatment of the remote surface. An arrangement of projected light beams indicates the position and size of the target surface in relation to a measurement detector or treatment device, so that the device is accurately directed to the target. In a preferred arrangement separate laser beams form a light distribution indication or brightness pattern at the target and the device is sighted toward the pattern on the target surface area.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Photodetecting device including base with positioning portion]]></title>
            <link>http://www.freepatentsonline.com/8110802.html</link>
            <description><![CDATA[In a photodetecting device 3, positional alignment marks 18A, 18B to serve as positional references of a photodetecting element 11 are formed at the front surface side of the photodetecting element 11. Moreover, a pin base 13 is provided with a threaded fitting pin 32 to be fitted with a cold plate 2, and the threaded fitting pin 32 is accurately positionally aligned with respect to the photodetecting element 11 via a positioning portion 33 positioned with respect to the positional alignment marks 18A, 18B exposed from a slit portion 23 and a cutaway portion 24 of a wiring board 12. Accordingly, in the photodetecting device 3, by only fitting the threaded fitting pin 32 with a recess portion 4 of the cold plate 2, the photodetecting element 11 is accurately positionally aligned with respect to the cold plate 2.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Layered scanning charged particle microscope package for a charged particle and radiation detector]]></title>
            <link>http://www.freepatentsonline.com/8110801.html</link>
            <description><![CDATA[A scanning charged particle microscope includes a layered charged particle beam column package; a sample holder; and a layered micro-channel plate detector package located between the column package and the sample holder.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Scanning electron microscope system and method for measuring dimensions of patterns formed on semiconductor device by using the system]]></title>
            <link>http://www.freepatentsonline.com/8110800.html</link>
            <description><![CDATA[The present invention is for providing a scanning electron microscope system adapted to output contour information fitting in with the real pattern edge end of a sample, and is arranged to generate a local projection waveform by projecting the scanning electron microscope image in the tangential direction with respect to the pattern edge at each point of the pattern edge of the scanning electron microscope image, estimate the cross-sectional shape of the pattern transferred on the sample by applying the local projection waveform generated at each point to a library, which has previously been created, correlating the cross-sectional shape with the electron beam signal waveform, obtain position coordinate of the edge end fitting in with the cross-sectional shape, and output the contour of the pattern as a range of position coordinates.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Confocal secondary electron imaging]]></title>
            <link>http://www.freepatentsonline.com/8110799.html</link>
            <description><![CDATA[One embodiment relates to an apparatus using electrons for inspection or metrology of a semiconductor substrate. The apparatus includes an electron source, electron lenses, scan deflectors, an objective electron lens, a collection electron lens, a pin-hole filter, de-scan deflectors, and a detector. The collection electron lens is configured to focus the secondary electrons so as to form a secondary electron beam which is focused at a conjugate focal plane, and the pin-hole filter is positioned at the conjugate focal plane. The de-scan deflectors are configured to controllably deflect the secondary electrons so as to counteract an influence of the scan deflectors such that a center portion of the secondary electron beam passes through the filter and a remainder portion of the secondary electron beam is filtered out by the filter. Other embodiments and features are also disclosed.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Method for cooling ions in a linear ion trap]]></title>
            <link>http://www.freepatentsonline.com/8110798.html</link>
            <description><![CDATA[Methods for cooling ions retained in an ion trap are described. In various embodiments, a cooling gas is delivered into a linear ion trap causing a non-steady state pressure elevation in at least a portion of the trap above about 8×10−5 Torr for a duration less than the ion-retention time. In various embodiments, the duration of pressure elevation can be based upon a period of time required for an ion to lose a desired amount of its kinetic energy.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Electrospray ionization mass spectrometry methodology]]></title>
            <link>http://www.freepatentsonline.com/8110797.html</link>
            <description><![CDATA[A method of enhanced speciation of both positive and negatives species in an analyte is disclosed. The method can include producing a first analyte solution comprising an analyte composition and an effective amount of silver triflate, and analyzing the first analyte solution with an electrospray ionization mass spectrometer. The method can also include producing a second analyte solution comprising a portion of the analyte composition and an effective amount of a compound of formula I, and analyzing the second analyte solution with an electrospray ionization mass spectrometer. The compound of formula I is [NX+][OH−], where X is a linear, branched, or cyclic C1-C10 alkane; an aryl; a heterocyclic aromatic; or a heterocyclic moiety.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Nanophotonic production, modulation and switching of ions by silicon microcolumn arrays]]></title>
            <link>http://www.freepatentsonline.com/8110796.html</link>
            <description><![CDATA[The production and use of silicon microcolumn arrays that harvest light from a laser pulse to produce ions are described. The systems of the present invention seem to behave like a quasi-periodic antenna array with ion yields that show profound dependence on the plane of laser light polarization and the angle of incidence. By providing photonic ion sources, this enables enhanced control of ion production on a micro/nano scale and direct integration with miniaturized analytical devices.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Laser system for MALDI mass spectrometry]]></title>
            <link>http://www.freepatentsonline.com/8110795.html</link>
            <description><![CDATA[Mass spectrometry with lasers generates ions from analyte molecules by matrix assisted laser desorption for a variety of different mass spectrometric analysis procedures. The mass spectrometers with laser systems supply laser light pulses having at least two different pulse durations, and mass spectrometric measuring techniques use the laser light pulses of different durations. The duration of the laser light pulses allows the characteristics of the ionization of the analyte molecules, particularly the occurrence of the ISD (in-source decay) and PSD (post-source decay) types of fragmentation, whose fragment ion spectra supply different kinds of information, to be adapted to the analytic procedure.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Soft ablative desorption method and system]]></title>
            <link>http://www.freepatentsonline.com/8110794.html</link>
            <description><![CDATA[Methods and systems are provided for the soft desorption of analyte from a sample, in which an optical beam absorbed within an irradiate zone of the sample causes vibrational excitations of a component within the sample. The optical beam, providing sufficient energy to superheat the component, is provided for a time interval that is less than the time duration required for the loss of energy out of the irradiated zone due to thermal diffusion and acoustic expansion. The superheated component thus drives ablation within the irradiated zone, resulting in the soft desorption of analyte without ionization and fragmentation. The ejected ablation plume may be directed towards the inlet of a mass analysis device for detection of the desorbed analyte, which is preferably ionized by a linear resonant photo-ionization step.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Tandem mass spectrometry with feedback control]]></title>
            <link>http://www.freepatentsonline.com/8110793.html</link>
            <description><![CDATA[The invention relates to acquisition methods for fragment ion spectra of biopolymer molecules in tandem mass spectrometers which are coupled to separation devices. The invention provides a real-time method for calculating a quality coefficient for each fragment ion spectrum. The quality coefficient indicates whether the fragment ion spectrum can be used successfully for identifying the biopolymer molecule or whether it should be acquired once more, possibly with other acquisition parameters.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Absolute position length measurement type encoder]]></title>
            <link>http://www.freepatentsonline.com/8110792.html</link>
            <description><![CDATA[An absolute position length measurement type encoder includes: a scale in which an ABS pattern based on a pseudorandom code is provided; a light-receiving element for receiving bright and dark patterns formed by the scale; and a signal processing circuit for processing signals subjected to output of the light-receiving element and measuring an absolute position of the scale to the light-receiving element, wherein the signal processing circuit includes a space-dividing number conversion circuit that obtains finer intervals D than the array interval PPDA of the ABS light-receiving element array of the light-receiving element, and simultaneously obtains and outputs a digital value for each of the intervals D subjected to output of the ABS light-receiving element array. Therefore, even where the minimum line width of the ABS pattern is not an integral multiple of the array interval of the ABS light-receiving element array, an arithmetic operation for the correlation can be carried out, and the moving distance can be measured at high accuracy.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Imaging device]]></title>
            <link>http://www.freepatentsonline.com/8110791.html</link>
            <description><![CDATA[An imaging device, particularly but not exclusively for use in a targeting sensor for missile seekers. The imaging device including at least one lens; a substantially planar sensor having a plurality of pixels; a light guiding arrangement for directing light received via said lenses toward said sensor; in which said light guiding arrangement includes a plurality of light guides.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Large depth of field line scan camera]]></title>
            <link>http://www.freepatentsonline.com/8110790.html</link>
            <description><![CDATA[A system for imaging an object comprising a surface for receiving the object to be imaged and an imaging device. The imaging device comprises a housing and a fixed focusing optical device mounted to the housing, whereby the fixed focusing optics comprises a lens for focusing light reflected from the object. A plurality of independent linear imaging sensors are positioned in the housing at different distances from the fixed focusing lens so that a face of each of the plurality of independent linear imaging sensors is aligned parallel to the surface. A processor is coupled to the plurality of independent linear imaging sensors for receiving an output signal from each of the plurality of independent linear imaging sensors representative of the reflected light. The lens defines a plane parallel to the surface, and the plurality of independent linear imaging sensors are adapted to receive reflected light from the object.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Electronic device and method for recording disassembly times thereof]]></title>
            <link>http://www.freepatentsonline.com/8110789.html</link>
            <description><![CDATA[An electronic includes a memory, a photosensitive element, and a processing element. The photosensitive element receives light beams and generating trigger signals when intensity of the received light beams reach a predetermined value. The processing element electrically connected to the photosensitive element and the memory, counts a number of disassembly times of the electronic device according to the times the trigger signals have been generated by the photosensitive element and stores the number in the memory.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Method and device for detecting weak optical signals]]></title>
            <link>http://www.freepatentsonline.com/8110788.html</link>
            <description><![CDATA[An optical detection device is disclosed. The device comprises a photoelectric unit, configured to sense incoming photons and to produce electrical signals pertaining to at least a few of the photons within a plurality of temporally resolved time-windows; an analog-to-digital unit, configured to generate digital representation of the electrical signals; and a digital integrating unit, configured to integrate the digital representation over at least part of the temporally resolved time-windows to provide integrated data corresponding to the photons.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Image sensor with a reflective waveguide]]></title>
            <link>http://www.freepatentsonline.com/8110787.html</link>
            <description><![CDATA[An image sensor having shield structures and methods of forming the same are provided. Generally, the image sensor includes: (i) substrate having at least one photosensitive element formed therein; (ii) a dielectric layer overlying the substrate and the photosensitive element; and (iii) an annular reflective waveguide disposed in the dielectric layer above the photosensitive element to reduce cross-talk between adjacent elements of the sensor while increasing sensitivity of the sensor. In certain embodiments, the sensor further includes a photoshield disposed in the dielectric above the photosensitive element and about the waveguide to further reduce the possibility of cross-talk. Other embodiments are also disclosed.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[Multi-element concentrator system]]></title>
            <link>http://www.freepatentsonline.com/8110786.html</link>
            <description><![CDATA[A novel concentrator system is described, which increases the efficiency of collecting and concentrating sunlight energy onto a target. This method uses an array of small movable reflective or refractive concentrator components that can move via a feedback mechanism which tracks the sun and concentrates the suns energy on to a second array of energy converting elements. In order to improve the effective collected energy, the array of concentrator elements is placed on a moving or tiltable flat slab (or dish, substrate, plane, plate, holder, tablet, or similar flat or non-flat surface) that tracks the sun. An alternative method uses an array of target elements or linear elements and a second array of concentrator elements in harmony such that the suns energy is efficiently redistributed by the reflective or refractive array on to the energy converting array as the sun's position in the sky (elevation and azimuth) changes. The elements of the reflective or refractive array are tilted by novel actuation mechanisms describe herein.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[System and process for extracting and collecting substances from a molecular combination]]></title>
            <link>http://www.freepatentsonline.com/8110175.html</link>
            <description><![CDATA[A system and process are provided for extracting a substance from a molecular combination. The process comprises heating the molecular combination to dissociate the molecular combination into cations and anions, moving the cations and anions through a magnetic field to separate cations and anions, and isolating cations from anions with a barrier. The system comprises a non-conductive conduit for guiding an ionized particle stream, a magnetic field source for creating a magnetic field through which the ionized particle stream moves, and a barrier located in the conduit. The ionized particle stream has a velocity relative to the conduit, and the magnetic field source is oriented relative to the velocity of the ionized particle stream so that cations are separated from anions as the ionized particle stream moves through the magnetic field. The barrier is oriented in the conduit so that cations are isolated from anions after separation.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
        <item>
            <title><![CDATA[System for treating liquids with wave energy from an electrical arc]]></title>
            <link>http://www.freepatentsonline.com/8110100.html</link>
            <description><![CDATA[The system has a storage tank and two or more arc whirl devices disposed in a top of the storage tank. Each arc whirl device includes: (a) a pump volute or hydrocyclone, (b) a throat connected to the pump volute or hydrocyclone head, (c) a parabolic reflector having a vertex, a focus and an opening at the vertex, wherein the opening is connected to the throat such that the vertex and focus are axially aligned with the central axis and the focus is not located within the throat, and (d) a wave energy source that irradiates the liquid using a first electrode within the pump volute or hydrocyclone head that extends into the throat along the central axis of the throat, and a second electrode extending into the parabolic reflector proximate to the focus wherein the second electrode is spaced apart and axially aligned with first electrode.]]></description>
            <pubDate>Tue, 07 Feb 2012 08:00:00 EST</pubDate>
        </item>
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