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7553611 Masking of repeated overlay and alignment marks to allow reuse of photomasks in a vertical structure  
In formation of monolithic three dimensional memory arrays, a photomask may be used more than once. Reuse of a photomask creates second, third or more instances of reference marks used by the...
7552816 Break-away positioning conveyor mount for accommodating conveyor belt bends  
A break-away mounting system for a continuous-motion, high-speed position conveyor system is disclosed. A support cradle may be suspended from a conveyor belt such that the support cradle...
7552269 Synchronizing a plurality of processors  
In a first aspect, a first method of synchronizing a plurality of processors of a system is provided. The first method includes the steps of (1) modifying a peripheral component interconnect...
7548542 Methods and apparatus for transferring data  
In a first aspect, a method is provided for transferring data. The method includes the steps of (1) receiving information about a location and type of a data source and a location and type of a...
7547644 Methods and apparatus for forming barrier layers in high aspect ratio vias  
In a first aspect, a method is provided that includes (1) forming a first barrier layer over the sidewalls and bottom of a via using atomic layer deposition within an atomic layer deposition (ALD)...
D593317 Health management supply organizer  
7540371 Break-away positioning conveyor mount for accommodating conveyor belt bends  
A break-away mounting system for a continuous-motion, high-speed position conveyor system is disclosed. A support cradle may be suspended from a conveyor belt such that the support cradle...
7537108 Methods and apparatus for transporting substrate carriers  
According to a first aspect, a first conveyor system is provided that is adapted to deliver substrate carriers within a semiconductor device manufacturing facility. The first conveyor system...
D592601 Inkjet printer cable  
7532952 Methods and apparatus for pressure control in electronic device manufacturing systems  
In one aspect, improved methods and apparatus for pressure control in an electronic device manufacturing system are provided. The method includes acquiring information related to a current state...
7531423 Reduced-resistance finFETs by sidewall silicidation and methods of manufacturing the same  
In a first aspect, a first method of manufacturing a finFET is provided. The first method includes the steps of (1) providing a substrate; and (2) forming at least one source/drain diffusion...
7527141 System for transporting substrate carriers  
In a semiconductor fabrication facility, a conveyor transports substrate carriers. The substrate carriers are unloaded from the conveyor and loaded onto the conveyor without stopping the conveyor....
7525121 Coplanar silicon-on-insulator (SOI) regions of different crystal orientations and methods of making the same  
In a first aspect, a first method is provided for semiconductor device manufacturing. The first method includes the steps of (1) providing a substrate; and (2) forming a first silicon-on-insulator...
7522974 Interface for operating and monitoring abatement systems  
Method and systems are provided for monitoring and controlling one or more abatement systems. One or more abatement systems may be represented on a display alone with one or more effluent flows...
7522969 Methods and apparatus for material control system interface  
Methods and apparatus are provided for managing movement of small lots between processing tools within an electronic device manufacturing facility. In some embodiments, a number of priority lots...
7521353 Method for reducing dielectric overetch when making contact to conductive features  
In a first preferred embodiment of the present invention, conductive features are formed on a first dielectric etch stop layer, and a second dielectric material is deposited over and between the...
7519752 Apparatus for using information and a count in reissuing commands requiring access to a bus and methods of using the same  
In a first aspect, a first method of reissuing a command involving bus access is provided. The first method includes the steps of (1) storing information associated with commands that are to be...
7518466 Methods and apparatus for symmetrical and/or concentric radio frequency matching networks  
Apparatus and methods are provided that are adapted to match the impedance of an electrical load to an impedance of an electrical signal generator. The invention includes providing a plurality of...
7517796 Method for patterning submicron pillars  
The present invention provides for a method to pattern and etch very small dimension pillars, for example in a memory array. When dimensions of pillars become very small, the photoresist pillars...
7513062 Single wafer dryer and drying methods  
In a first aspect, a first method of drying a substrate is provided. The first method includes the steps of (1) lifting a substrate through an air/fluid interface at a first rate; (2) directing a...
7507296 Methods and apparatus for determining scrubber brush pressure  
In a scrubber adapted to clean a semiconductor wafer, the torque of a brush rotation motor is monitored while a scrubber brush is in contact with the wafer and is being rotated by the motor. The...
7506752 Methods and apparatus for transporting substrate carriers  
According to a first aspect, a first conveyor system is provided that is adapted to deliver substrate carriers within a semiconductor device manufacturing facility. The first conveyor system...
7506747 Break-away positioning conveyor mount for accommodating conveyor belt bends  
A break-away mounting system for a continuous-motion, high-speed position conveyor system is disclosed. A support cradle may be suspended from a conveyor belt such that the support cradle...
7506746 System for transporting substrate carriers  
In a semiconductor fabrication facility, a conveyor transports substrate carriers. The substrate carriers are unloaded from the conveyor and loaded onto the conveyor without stopping the conveyor....
7506282 Apparatus and methods for predicting and/or calibrating memory yields  
An apparatus and methods for predicting and/or for calibrating memory yields due to process defects and/or device variations, including determining a model of a memory cell, identifying a subset...
7503448 Break-away positioning conveyor mount for accommodating conveyor belt bends  
A break-away mounting system for a continuous-motion, high-speed position conveyor system is disclosed. A support cradle may be suspended from a conveyor belt such that the support cradle...
7501161 Methods and apparatus for reducing arcing during plasma processing  
In a first aspect, a method is provided for use during plasma processing. The first method includes the steps of (1) placing a substrate on a substrate holder of a plasma chamber; (2) positioning...
7499767 Methods and apparatus for positioning a substrate relative to a support stage  
In a first aspect, a substrate positioning system includes a plurality of pushers arranged in a spaced relation about a stage adapted to support a substrate. Each pusher is adapted to assume a...
7494765 Method for patterning photoresist pillars using a photomask having a plurality of chromeless nonprinting phase shifting windows  
A method for patterning a photoresist using a photomask to form an integrated circuit, the photomask including a first area transmitting light in a first phase surrounded by a second area, the...
7488625 Vertically stacked, field programmable, nonvolatile memory and method of fabrication  
A three-dimensional, field-programmable, non-volatile memory includes multiple layers of first and second crossing conductors. Pillars are self-aligned at the intersection of adjacent first and...
7484030 Storage controller and methods for using the same  
In a first aspect, a first method is provided for processing a request. The first method includes the steps of (1) receiving a request in first logic of a controller from a device master; (2)...
7480877 Methods and apparatus for Boolean equivalency checking in the presence of voting logic  
In a first aspect, a first method of designing a circuit is provided. The first method includes the steps of (1) providing a model of an original circuit design including a latch; (2) providing a...
7477956 Methods and apparatus for enhancing electronic device manufacturing throughput  
In some aspects, a method is provided for enhancing electronic device manufacturing throughput within an electronic device manufacturing tool. The method includes the steps of (1) for the...
7475159 High-speed scheduler  
In a first aspect, a method is provided for scheduling connections for a network processor. The method includes the steps of, in a cache, scheduling a plurality of connections to be serviced based...
7474934 Methods and apparatus for enhancing electronic device manufacturing throughput  
Methods, systems, and apparatus are provided that include determining a number of storage locations corresponding to busy chambers of an electronic device manufacturing tool; based on the number...
7474000 High density contact to relaxed geometry layers  
The present invention provides for a via and staggered routing level structure. Vertically overlapping vias connect to two or more routing levels formed at different heights. The routing levels...
7472227 Invalidating multiple address cache entries  
In a first aspect, a first method is provided for removing entries from an address cache. The first method includes the steps of (1) writing data to a register; and (2) removing a plurality of...
7469265 Methods and apparatus for performing multi-value range checks  
In a first aspect, a method is provided for determining in which of n intervals a sum of two or more numbers resides. The method includes determining the two or more numbers, and providing fewer...
7467919 Automatic door opener  
A wafer carrier opener is provided. The wafer carrier opener may eliminate the use of two separate actuators by using a four-bar linkage mechanism. The wafer carrier opener includes a wafer...
7459056 Pad conditioning head for CMP process  
In a first aspect, a first apparatus is provided for a chemical mechanical polishing (CMP) process. The first apparatus includes (1) a rotatable member; (2) an end effector adapted to receive and...
7455172 Break-away positioning conveyor mount for accommodating conveyor belt bends  
A break-away mounting system for a continuous-motion, high-speed position conveyor system is disclosed. A support cradle may be suspended from a conveyor belt such that the support cradle...
7453755 Memory cell with high-K antifuse for reverse bias programming  
An integrated circuit and associated method of programming are provided. Such integrated circuit includes a memory cell with a diode and an antifuse in communication with the diode. The antifuse...
7452475 Cleaning process and apparatus for silicate materials  
A method for treating a surface of a quartz substrate includes preparing a substrate to provide a working surface having an initial roughness; and then ultrasonically acid-etching the working...
7446588 Highly scalable methods and apparatus for multiplexing signals  
In a first aspect, a first method is provided that includes providing a plurality of select signals and a plurality of input signals for input by a multiplexer. Each select signal is adapted to...
7439108 Coplanar silicon-on-insulator (SOI) regions of different crystal orientations and methods of making the same  
In a first aspect, a first method is provided for semiconductor device manufacturing. The first method includes the steps of (1) providing a substrate; and (2) forming a first silicon-on-insulator...
7434676 Methods and apparatus for transferring a substrate carrier within an electronic device manufacturing facility  
In a first aspect, a first method is provided for electronic device manufacturing. The first method includes the steps of (1) receiving a request to transfer a carrier from a first substrate...
7434130 Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection  
In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified....
7433756 Calibration of high speed loader to substrate transport system  
In a first aspect, a first method of calibrating a substrate carrier loader to a moving conveyor is provided. The first method includes the steps of (1) providing a substrate carrier loader...
7433356 Methods and apparatus for creating addresses  
In a first aspect, a first method is provided for creating a media access control (MAC) address for a device. The first method includes the steps of (1) obtaining one or more identifiers; (2)...
7423304 Optimization of critical dimensions and pitch of patterned features in and above a substrate  
A die is formed with different and optimized critical dimensions in different device levels and areas of those device levels using photolithography and etch techniques. One aspect of the invention...


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