Matches 1 - 2 out of 2
Match Document Document Title
6836139 Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer  
A charge carrier lifetime of a semiconductor wafer is measured by contacting an electrically conductive measurement probe to a surface of a semiconductor wafer to form a capacitor. A DC voltage...
6448409 Method for the synthesis of chiral allylic alcohols utilizing selone based chiral derivatizing agents  
Molecules containing a chiral 1,2-diol unit are synthesized from reactions between aldehydes and N-acyl selones. A chilled N-acyl selone is reacted with a Lewis acid such as TiCl 4 and mixed with...
Matches 1 - 2 out of 2