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7433751 Sorting a group of integrated circuit devices for those devices requiring special testing  
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing...
7401728 Feed-forward control in event-based manufacturing systems  
Communication between machines in an event-based manufacturing system. In an event-based manufacturing system, material-specific data obtained for a material produced during a first manufacturing...
7376479 Process monitoring device for sample processing apparatus and control method of sample processing apparatus  
A plasma processing method for processing a sample by using plasma on a lot unit basis, including: detecting plural kinds of information as monitor data relating to a processing state of the...
7368678 Method for sorting integrated circuit devices  
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of...
7361862 Laser marking system for dice carried in trays and method of operation  
A laser marking system for IC packages including a tray input shuttle assembly and a tray transport borne by a transport actuator for moving a tray carrier carrying a tray of unmarked packaged ICs...
7356177 Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus  
According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image...
7352890 Method for analyzing circuit pattern defects and a system thereof  
A system for analyzing defects in electronic circuit patterns, including: comparing position information of structural defects with position information of electrical faults and extracting...
7345753 Apparatus and methods for analyzing defects on a sample  
Disclosed are methods and apparatus for facilitating procedures implemented on an analysis tool are provided herein. In one embodiment, an apparatus includes an analyzer module arranged for...
7310438 Systems for detecting defects in printed solder paste  
A method of inspecting a stencil having apertures through which a substance is deposited onto an electronic substrate includes depositing the substance through the stencil and onto the substrate,...
7276672 Method for sorting integrated circuit devices  
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of...
7269280 Method and its apparatus for inspecting a pattern  
In a pattern inspecting apparatus, images of places which can be expected to be the same pattern are compared with one another. However, a comparison of images obtained by different stage scans and...
7242467 Method and apparatus for high-resolution defect location and classification  
In the manufacture of integrated circuits on a wafer, it is necessary to monitor the manufacturing process by inspecting the ICs as to whether errors or defects have occurred during production. It...
7236847 Systems and methods for closed loop defect reduction  
Systems and methods for repairing defects on a specimen are provided. A method may include processing a specimen, detecting defects on the specimen, and repairing one or more of the defects. An...
7158848 Process monitoring device for sample processing apparatus and control method of sample processing apparatus  
A plasma processing apparatus for processing a sample within a vacuum vessel, including: a plurality of sensors for detecting plural kinds of information relating to a processing state of the...
7155300 Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs  
An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be...
7149344 Systems and methods for detecting defects in printed solder paste  
A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of...
7124050 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture  
A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating ICs on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic...
7120513 Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICS will undergo, such as additional repairs  
An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be...
7120287 Non-lot based method for assembling integrated circuit devices  
An inventive method tracks IC devices through the assembly steps in a manufacturing process. Prior to die attach, a laser scribe marks the lead frame of each of the devices with a coded hole matrix...
7117063 Sorting a group of integrated circuit devices for those devices requiring special testing  
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing...
7117062 Determining transmission of error effects for improving parametric performance  
A method and an apparatus for characterizing an uncertainty factor relating to processing workpieces. A first processing step is performed upon a workpiece. A first uncertainty factor associated...
7113628 Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus  
According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image...
7107117 Sorting a group of integrated circuit devices for those devices requiring special testing  
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing...
7072786 Inspection system setup techniques  
Techniques for efficiently setting up inspection, metrology, and review systems for operating upon semiconductor wafers are described. Specifically, this involves setting up recipes that allows...
7072503 Systems and methods for detecting defects in printed solder paste  
A method of inspecting a stencil having apertures through which a substance is deposited onto an electronic substrate includes depositing the substance through the stencil and onto the substrate,...
7068834 Inspecting method, inspecting system, and method for manufacturing electronic devices  
The present invention has an analyzing unit including an image detection device for producing a plurality of images of a workpiece, a storage for storing detected images produced by the image...
7062081 Method and system for analyzing circuit pattern defects  
In order to allow critical flaws in an inspected item to be determined early during a production process, the present invention includes the following steps: a step of detecting defects in a...
7058467 Process monitoring device for sample processing apparatus and control method of sample processing apparatus  
A monitor data acquisition section acquires a plurality of monitor data relating to a processing state of one sample in a processing apparatus, via sensors. A data selection section selects monitor...
7035877 Quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing  
Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and...
7032816 Communication between machines and feed-forward control in event-based product manufacturing  
Providing communication between machines and feed-forward control in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for...
6987873 Automatic defect classification with invariant core classes  
A method and apparatus is provided for automatically classifying a defect on the surface of a semiconductor wafer into one of, e.g., seven core classes: a missing pattern on the surface, an extra...
6982556 System and method for classifying defects in and identifying process problems for an electrical circuit  
A method for performing circuit defect analysis and process problem identification includes applying a test signal to a circuit, obtaining a signal generated in response to the test signal,...
6959251 Inspection system setup techniques  
Techniques for efficiently setting up inspection, metrology, and review systems for operating upon semiconductor wafers are described. Specifically, this involves setting up recipes that allows...
6947803 Dispatch and/or disposition of material based upon an expected parameter result  
A method and an apparatus for affecting dispatch and/or disposition of a workpiece. A process step upon a workpiece is performed based upon a predetermined routing plan. An end-of-line parameter is...
6944567 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufacture  
A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating ICs on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic...
6941009 Method for evaluating pattern defects on a water surface  
The invention concerns a method for evaluating pattern defects on a wafer surface, comprising the following steps: acquiring the surface data of a plurality of individual image fields ( 4 ) of a...
6937296 Flat panel display unit and method of repairing defects in its line pattern  
Shorting defects between the scan lines and signal lines are repaired during the manufacture of a TFT or other flat panel display unit without causing liquid crystal orientation defects and...
6934920 Specimen analyzing method  
In a sample analysis method, positional coordinates of reference points on a surface of the sample are measured using a first device. Positional coordinates of an object on the surface of the...
6903821 Inspection method, apparatus and system for circuit pattern  
Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by...
6891967 Systems and methods for detecting defects in printed solder paste  
A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of...
6879867 Process monitoring device for sample processing apparatus and control method of sample processing apparatus  
A monitor data acquisition section acquires a plurality of monitor data relating to a processing state of one sample in a processing apparatus, via sensors. A data selection section selects monitor...
6871114 Updating process controller based upon fault detection analysis  
A method and an apparatus for adjusting a process controller based upon a fault detection analysis. A process step upon a workpiece is performed using a processing tool. Manufacturing data relating...
6834213 Process control based upon a metrology delay  
A method and an apparatus for performing process control based upon a metrology delay. A process step is performed upon a first workpiece. Metrology data related to the first workpiece is acquired....
6826735 Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device  
Inspection data output from an inspection apparatus is read, the inspection data containing at least one information piece of coordinate value information and size information of a particle or a...
6807454 Method for automatically controlling defect -specification in a semiconductor manufacturing process  
A method for automatically controlling defect-specification in a semiconductor manufacturing process is provided. The method provides a module to detect a position, number, size, and intensity...
6801824 Substrate selector  
Substrate-selecting equipment selects substrates used for objective products from among a group of substrates with photosensitive material layers used for the production of photomask. The...
6763130 Real time defect source identification  
A method and apparatus for inspecting a semiconductor wafer provides real-time information identifying tools visited by wafers under inspection and the process parameters used at those tools, and...
6759655 Inspection method, apparatus and system for circuit pattern  
Inspection method, apparatus, and system for a circuit pattern, in which when various conditions which are necessary in case of inspecting a fine circuit pattern by using an image formed by...
6741941 Method and apparatus for analyzing defect information  
To efficiently extract identification of apparatuses causing problems in a thin-film device manufacturing process, candidates for the problem-generating manufacturing apparatus are extracted by...
6741940 Computer-implemented method of defect analysis  
In the step (S 11 ), chip classification data in which a plurality of chips are classified into four sorts on the basis of presence/absence of (new) defects and pass/fail (of integrated circuits)...
Matches 1 - 50 out of 96 1 2 >