Matches 1 - 21 out of 21
Match Document Document Title
7391707 Devices and methods of detecting movement between media and probe tip in a probe data storage system  
A memory apparatus comprises a media, a tip adapted to write information to and read information from said media, a media movement mechanism attached to said media and configured to move said media...
7367119 Method for forming a reinforced tip for a probe storage device  
Systems and methods in accordance with the present invention can include a tip contactable with a media. In an embodiment, the tip comprises a substantially hollow structure formed of a metal. The...
7336524 Atomic probes and media for high density data storage  
A device in accordance with embodiments of the present invention comprises a contact probe for high density data storage reading, writing, erasing, or rewriting. In one embodiment, the contact...
7309630 Method for forming patterned media for a high density data storage device  
Systems in accordance with the present invention can include a tip contactable with a media, the media including a substrate and a plurality of cells disposed over the substrate, one or more of the...
7260051 Molecular memory medium and molecular memory integrated circuit  
A molecular memory media having a media surface and a platform with read/write heads. The platform and media are moved to allow one of addition, removal, and repositioning of atoms, electrons, and...
7233517 Atomic probes and media for high density data storage  
A device in accordance with embodiments of the present invention comprises an atomic probe for high density data storage reading, writing, erasing, or rewriting. In one embodiment, the atomic probe...
7168163 Full wafer silicon probe card for burn-in and testing and test system including same  
A full-wafer probe card is disclosed along with related methods and systems. The probe card includes test probes comprising cantilever elements configured and arranged with probe tips in a pattern...
7106684 Device for writing and reading data by using cantilever  
Device for writing and reading a data including a floated cantilever part connected to a support, a resistively heated tip at an end of the cantilever part, and a piezoelectric sensor formed on the...
6992474 Movement actuator/sensor systems  
A feedback control system, comprising a flexible rod that may have an anchored end and a free end, the rod free end movable upon the application of electric potential to the rod, a current source...
6912778 Methods of fabricating full-wafer silicon probe cards for burn-in and testing of semiconductor devices  
A full-wafer probe card, a method for making the probe card and a full-wafer testing system are provided. The probe card includes test probes comprising cantilever elements configured and arranged...
6831889 Head support mechanism and thin film piezoelectric actuator  
A head support mechanism includes a slider for carrying a head at least for performing reproduction of data from a disk, and a holding portion for holding the slider. The holding portion includes:...
5717132 Cantilever and process for fabricating it  
A probe formed in a flexible portion of a cantilever is protected by a protection frame. This protection frame is separated from a support portion at a border of a groove between the protection...
5689063 Atomic force microscope using cantilever attached to optical microscope  
Without necessitating complicated operations, an image of a low to medium magnification and an image of a high magnification are efficiently observed by an optical microscope and by an atomic force...
5679889 Method for extracting electrode and cantilever for AFM using said method for extracting electrode  
A method for extracting electrodes, comprises the steps of forming an electrode of a dielectric thin film on a first substrate member, forming a small projection on a second substrate member,...
5648300 Method of manufacturing cantilever drive mechanism and probe drive mechanism  
A method of manufacturing a cantilever drive mechanism arranged in such a manner that a cantilever portion, in which a piezoelectric layer is disposed between electrode layers, and a circuit...
5631463 Displacement element, probe employing the element, and apparatus employing the probe  
A cantilever type displacement element includes a piezoelectric film and an electrode provided on each face of the film to displace the film by convence piezoelectric effect. The electrodes are...
5537863 Scanning probe microscope having a cantilever used therein  
A scanning probe microscope according to present invention comprises a cantilever for interaction with a surface, the cantilever having a self vibrator therein for vibrating the cantilever, the...
5475318 Microprobe  
A microprobe comprises a base, a microcantilever extending in a plane from the base, and a probe tip projecting from the microcantilever out of the plane. The microcantilever is a bimorph structure...
5469733 Cantilever for atomic force microscope and method of manufacturing the cantilever  
A cantilever for an atomic force microscope includes a probe and a cantilever body supporting the probe, the probe deflecting in response to an atomic force between said probe and a sample, at...
5398229 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same  
A method of manufacturing a cantilever drive mechanism arranged in such a manner that a cantilever portion, in which a piezoelectric layer is disposed between electrode layers, and a circuit...
5338932 Method and apparatus for measuring the topography of a semiconductor device  
The topography of a surface is measured by utilizing a probe (10, 20) having a variable flexibility and a conductive tip (14, 16). Using the conductive tip (14, 16), a first tunneling current is...
Matches 1 - 21 out of 21