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7391707 Devices and methods of detecting movement between media and probe tip in a probe data storage system  
A memory apparatus comprises a media, a tip adapted to write information to and read information from said media, a media movement mechanism attached to said media and configured to move said media...
7367119 Method for forming a reinforced tip for a probe storage device  
Systems and methods in accordance with the present invention can include a tip contactable with a media. In an embodiment, the tip comprises a substantially hollow structure formed of a metal. The...
7336524 Atomic probes and media for high density data storage  
A device in accordance with embodiments of the present invention comprises a contact probe for high density data storage reading, writing, erasing, or rewriting. In one embodiment, the contact...
7309630 Method for forming patterned media for a high density data storage device  
Systems in accordance with the present invention can include a tip contactable with a media, the media including a substrate and a plurality of cells disposed over the substrate, one or more of the...
7260051 Molecular memory medium and molecular memory integrated circuit  
A molecular memory media having a media surface and a platform with read/write heads. The platform and media are moved to allow one of addition, removal, and repositioning of atoms, electrons, and...
7247248 Method of forming atomic force microscope tips  
The invention relates to a method for forming silicon atomic force microscope tips. The method includes the steps of depositing a masking layer onto a first layer of doped silicon so that some...
7119332 Method of fabricating probe for scanning probe microscope  
A probe is provided for an SPM (Scanning Probe Microscope), and a method is provided for fabricating the probe in which a double side alignment process is not required to simplify the fabricating....
6982898 Molecular memory integrated circuit utilizing non-vibrating cantilevers  
Memory devices in accordance with the present invention can comprise a molecular memory integrated circuit including a set of actuators capable of moving one or more platforms. In one embodiment...
6862921 Method and apparatus for manipulating a sample  
A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second...
6767696 Scanning tip and process for its production and use, particularly for a scanning probe microscope  
The invention relates to so-called scanning tips of probes necessary for scanning a measured object, in particular in scanning force microscopes and other scanning microscopes, so-called scanning...
6417673 Scanning depletion microscopy for carrier profiling  
In an imaging system for carrier profiling of a device structure, a doped semiconductor tip is utilized as an active dynamic sensing element for successively probing spaced-apart portions of the...
6059982 Micro probe assembly and method of fabrication  
A probe assembly including an integral fine probe tip, conductive line with terminal connection for testing semiconductor devices and a method of construction of the probe assembly is described....
6011261 Probe formed of mono-crystalline SI, the manufacturing method thereof, and an information processing device using the probe  
A probe for detecting minute physical behavior comprises a lever member, particularly in the form of a cantilever, formed of a monocrystalline silicon layer and a tip in the form of...
5856672 Single-crystal silicon cantilever with integral in-plane tip for use in atomic force microscope system  
A cantilever for use in an atomic force microscope system is formed of single-crystal silicon and has an integral tip. The tip is formed by the convergence of three planes, one of which is one of...
5811017 Cantilever for use in a scanning probe microscope and method of manufacturing the same  
A composite silicon-on-insulator substrate comprises first and second substrates and an oxide film interposed between them. The second substrate is partially removed, such that a lever-base section...
5729026 Atomic force microscope system with angled cantilever having integral in-plane tip  
An atomic force microscope system incorporates a single-crystal silicon cantilever with an integral tip. The cantilever is supported in the AFM system so that it makes an acute angle with the...
5595942 Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector  
A microminiature cantilever structure is provided having a cantilever arm with a piezoresistive resistor embedded in at least the fixed end of the cantilever arm. Deflection of the free end of the...
5591903 Reconstructing the shape of an atomic force microscope probe  
A method of reconstructing the shape of an atomic force microscope. The shape of the probe, which is represented by a tip function, is derived from an image taken of a colloidal gold ball by the...
5580827 Casting sharpened microminiature tips  
Sharpened microminiature tips are produced by casting in a silicon/silicon dioxide mold. The silicon dioxide layer is formed by exposing cavities in a single crystal substrate to an oxidizing...
EP0726480A2 Probe for an optical near-field microscope  
The sensor (1) consists of a one piece semiconductor (3) with a tapered porous end (4) through which can be excited by an electro-magnetic beam or an electric field to emit an electro-magnetic...
5497624 Method of and apparatus for producing power using steam  
A power plant operating on steam for producing electric power including a plurality of integrated power plant unit modules each having a steam turbine responsive to the steam and producing heat...
5474951 Method for making a charge storage electrode for a semiconductor device  
A method for making of a charge storage electrode in a semiconductor device is disclosed. The method comprises the steps of forming a first silicon film into a second protruded silicon film which...
5461907 Imaging, cutting, and collecting instrument and method  
Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move...
5455419 Micromechanical sensor and sensor fabrication process  
A method for producing micromechanical sensors for the AFM/STM/MFM profilometry is described in which a multiple step mask of cantilever beam and tip is transferred step by step into the wafer...
5449903 Methods of fabricating integrated, aligned tunneling tip pairs  
Self-aligned, opposed, nanometer dimension tips are fabricated in pairs, one of each pair being located on a movable, single crystal beam, with the beam being movable in three dimensions with...
5387316 Wafer etch protection method  
A method of etching a semiconductor wafer includes providing a wafer having a portion thereof to be etched. A highly doped region is formed in the periphery of the wafer which is subsequently...
5375087 Tunneling-stabilized magnetic reading and recording  
This invention relates principally to methods and apparatus for recording data on and reading data from a magnetizable medium using a scanning tunneling technique. Conventional rigid probes used in...
5367165 Cantilever chip for scanning probe microscope  
A cantilever chip has a holding substrate, and a cantilever having the shape of a hollow triangle extends from the holding substrate. A probe is arranged at the distal end portion of the...
EP0468071B1 Method of producing micromechanical sensors for the AFM/STM/MFM profilometry and micromechanical AFM/STM/MFM sensor head  
Abstract of EP0468071 A method for producing micromechanical sensors for the AFM/STM/MFM profilometry is described in which a multiple step mask of cantilever beam and tip is transferred step by...
5345816 Integrated tip strain sensor for use in combination with a single axis atomic force microscope  
An integrated tip strain sensor is combination with a single axis atomic force microscope (AFM) for determining the profile of a surface in three dimensions. A cantilever beam carries an integrated...
5336369 Method of making a cantilever stylus for an atomic force microscope  
A method of making a cantilever stylus for an atomic force microscope comprises forming a film on a surface of a substrate, the film comprising a stylus material that is different from the material...
5293516 Multiprobe apparatus  
A multiprobe apparatus for probing a device having a plurality of contacts includes a holder for holding the device in a fixed position; a plurality of electrically conducting elongated probes,...
5282924 Micromechanical sensor fabrication process  
A method for producing micromechanical sensors for the AFM/STM/MFM profilometry is described in which a multiple step mask of cantilever beam and tip is transferred step by step into the wafer...
5272913 Cantilever for a scanning probe microscope and a method of manufacturing the same  
A cantilever for a scanning probe microscope comprises a lever section and a probe section disposed near the free end thereof. The probe section includes a conical distal end portion having a...
5267471 Double cantilever sensor for atomic force microscope  
An atomic force microscope that performs both atomic force and surface potential measurements on a sample comprises a conductive probe beam that includes two segments, a first segment exhibiting a...
5260824 Atomic force microscope  
An atomic force microscope comprises a probe having a sharply-pointed tip end. The probe is supported on the free end portion of a cantilever and is close to the surface of a specimen. When an...
5253515 Atomic probe microscope and cantilever unit for use in the microscope  
An atomic probe microscope comprises a cantilever which includes a lever section provided with a probe, a lever attaching section for supporting the lever section, and a positioning striking...
5245187 Microtip, process for preparation thereof, surface-observing apparatus and information-treating apparatus employing the same  
A microtip has a tip portion formed by gathering of three crystal faces of a single crystal, at least one of the crystal faces being an etched face at and around the tip portion. The microtip is...
5235187 Methods of fabricating integrated, aligned tunneling tip pairs  
Self-aligned, opposed, nanometer dimension tips are fabricated in pairs, one of each pair being located on a movable, single crystal beam, with the beam being movable in three dimensions with...
5198755 Probe apparatus  
A probe apparatus has a quartz probe formed of a quartz probe body and a metallic pattern layer formed thereon, the quartz probe body including a plurality of probe portions having a large number...
5193385 Cantilever for use in atomic force microscope and manufacturing method therefor  
A cantilever for an atomic force microscope includes a diamond stylus for opposing a sample for detecting an atomic force, a stylus holding element, at least a portion of which is made of a...
5186789 Method of making a cantilever stylus for use in an atomic force microscope  
A cantilever stylus suited for use in an atomic force microscope is made in the following processes: forming a first film on a substrate; forming a second film of metallic material on an external...
5171992 Nanometer scale probe for an atomic force microscope, and method for making same  
Methods are described for producing a needle probe tip having prescribed magnetic properties for a scanning magnetic force microscope (MFM) on a substrate positioned in an evacuated environment. A...
5152168 Quantitative assessment of the geometrical distortion suffered by the profile of a semiconductor wafer  
A method for the quantitative assessment of the degree of geometrical deformation undergone by a surface profile of a wafer following the formation of a conformal surface layer employs a simple...
5150392 X-ray mask containing a cantilevered tip for gap control and alignment  
An X-ray mask membrane 12 is discussed wherein a cantilever and tip portion such as used on an atomic force or scanning tunneling microscope are fabricated directly as part of the mask. The mask is...
5116462 Method of producing micromechanical sensors for the AFM/STM profilometry  
A micromechanical sensor is described for the AFM/STM profilometry, incorporating a cantilever beam with at least one tip at its end and a mounting block at the opposite end. A method is described...
EP0468071A1 Method of producing micromechanical sensors for the AFM/STM/MFM profilometry and micromechanical AFM/STM/MFM sensor head.  
A method for producing micromechanical sensors for the AFM/STM/MFM profilometry is described in which a multiple step mask of cantilever beam and tip is transferred step by step into the wafer...
5066358 Nitride cantilevers with single crystal silicon tips  
A nitride cantilever is formed with an integral conical silicon tip at the free end thereof. A top layer of silicon dioxide is patterned into a tip mask on a doped or epitaxial silicon layer in a...
5051379 Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head  
A method and apparatus is described for a micromechanical sensor for the AFM/STM profilometry, which consist of a cantilever beam with a tip at its end and a mounting block at the opposite end. The...
5021364 Microcantilever with integral self-aligned sharp tetrahedral tip  
Apparatus and method for forming a microfabricated cantilever with a single crystal, integral silicon tip on a nitride cantilever. A nitride-silicon-nitride sandwich structure is patterned and...
Matches 1 - 50 out of 50