Probe pin
United States Patent D792793

Teranishi, Hirotada (Osaka, JP)
Sakai, Takahiro (Moriyama, JP)
Kondo, Makoto (Moriyama, JP)
Application Number:
Publication Date:
Filing Date:
OMRON Corporation (Kyoto-shi, Kyoto, JP)
Primary Class:
International Classes:
(IPC1-7): 1004
Field of Search:
D10/78, D10/80
View Patent Images:

Other References:
U.S. Appl. No. 29/563,351, filed May 4, 2016, Teranishi et al.
U.S. Appl. No. 29/563,354, filed May 4, 2016, Teranishi et al.
Primary Examiner:
Davis, Antoine D.
Attorney, Agent or Firm:
Sterne, Kessler, Goldstein & Fox P.L.L.C.

1. The ornamental design for a probe pin, as shown and described.


FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.