Title:
Probe pin
United States Patent D792253
Inventors:
Teranishi, Hirotada (Osaka, JP)
Sakai, Takahiro (Moriyama, JP)
Kondo, Makoto (Moriyama, JP)
Application Number:
29/563343
Publication Date:
07/18/2017
Filing Date:
05/04/2016
Assignee:
OMRON Corporation (Kyoto-shi, Kyoto, JP)
Primary Class:
International Classes:
(IPC1-7): 1004
Field of Search:
D10/78, D10/80
View Patent Images:
US Patent References:
7190179Contact probeMarch, 2007Haga324/755.05
6784680Contact probe with guide unit and fabrication method thereofAugust, 2004Haga324/750.25
Other References:
U.S. Appl. No. 29/563,345, filed May 4, 2016; Teranishi et al.
U.S. Appl. No. 29/563,347, filed May 4, 2016; Teranishi et al.
Primary Examiner:
Davis, Antoine D.
Attorney, Agent or Firm:
Sterne, Kessler, Goldstein & Fox P.L.L.C.
Claims:
CLAIM

1. The ornamental design for a probe pin, as shown and described.

Description:

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof, a rear elevational view being a mirror image thereof;

FIG. 3 is a left side view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a top plan view thereof; and,

FIG. 6 is a bottom plan view thereof.