Title:
Probe pin
United States Patent D769749


Inventors:
Teranishi, Hirotada (Osaka, JP)
Sakai, Takahiro (Moriyama, JP)
Application Number:
29/530394
Publication Date:
10/25/2016
Filing Date:
06/16/2015
Assignee:
OMRON Corporation (Kyoto-shi, Kyoto, JP)
Primary Class:
International Classes:
(IPC1-7): 1004
Field of Search:
D10/78, D10/80, D13/133, D13/154
View Patent Images:
US Patent References:
9322846ContactorApril, 2016Sakai
D750987Interactive test probe for battery testerMarch, 2016HuangD10/80
D749968Electrical test leadFebruary, 2016HuangD10/77
9130290Bellows body contactor having a fixed touch pieceSeptember, 2015Sakai
8808038Spring contact and a socket embedded with spring contactsAugust, 2014Hwang439/66
8669774Probe pin and an IC socket with the sameMarch, 2014Kato324/755.01
8460010Contact and electrical connecting apparatusJune, 2013Kimura439/66
8366496Composite contact assembly having lower contact with contact engaging points offset from each otherFebruary, 2013Hsu439/66
D665744Optical fiber connectorAugust, 2012YamauchiD13/133
D665745Optical fiber connectorAugust, 2012YamauchiD13/133
D662895Electric contactJuly, 2012KimuraD13/154
D507197Measure tapeJuly, 2005SunD10/72
D229184N/ANovember, 1973BrownD10/103



Foreign References:
JP2011232181November, 2011CONTACT FOR PROBE PIN, PROBE PIN AND CONNECTING JIG FOR ELECTRONIC DEVICE
TWD157152November, 2013
Other References:
Taiwanese Office Action issued in TW Appl. No. 104303166 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303167 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303168 on Oct. 27, 2015.
Taiwanese Office Action issued in TW Appl. No. 104303169 on Oct. 27, 2015.
U.S. Appl. No. 29/530,260, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,261, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,263, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,264, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,265, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,266, filed Jun. 15, 2015.
U.S. Appl. No. 29/530,396, filed Jun. 16, 2015.
Primary Examiner:
Davis, Antoine D.
Attorney, Agent or Firm:
Sterne, Kessler, Goldstein & Fox P.L.L.C.
Claims:
CLAIM

1. The ornamental design for a probe pin, as shown and described.

Description:

FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevation view thereof

FIG. 3 is a rear elevation view thereof

FIG. 4 is a left side view thereof

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.