Title:
Substrate for spectroscopic analysis
United States Patent D750799


Inventors:
Ito, Masashi (Hamamatsu, JP)
Shibayama, Katsumi (Hamamatsu, JP)
Ofuji, Kazuto (Hamamatsu, JP)
Oyama, Hiroki (Hamamatsu, JP)
Maruyama, Yoshihiro (Hamamatsu, JP)
Application Number:
29/528795
Publication Date:
03/01/2016
Filing Date:
06/01/2015
Assignee:
HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Primary Class:
International Classes:
(IPC1-7): 2402
Field of Search:
D24/216, D24/222-226, D24/231, D24/232, D24/169, D10/80, D10/81, 422/500-504, 422/68.1, 422/69, 422/560-566, 435/288.1, 435/288.3, 435/289.1, 435/283.1, 436/174, 436/180
View Patent Images:
US Patent References:
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Other References:
U.S. Appl. No. 29/477,936, Hamamatsu Photonics K.K.
U.S. Appl. No. 29/477,940, Hamamatsu Photonics K.K.
U.S. Appl. No. 29/477,946, Hamamatsu Photonics K.K.
U.S. Appl. No. 29/477,937, Hamamatsu Photonics K.K.
U.S. Appl. No. 29/477,957, Hamamatsu Photonics K.K.
Leaflet “rSERS™ Raman Enhancing Media,” Raman Systems, A Wholly Owned Subsidiary of Agiltron, Inc., www.ramansystems.com.
Primary Examiner:
Nelson, Chase T.
Assistant Examiner:
Cavanna, Mark
Attorney, Agent or Firm:
Drinker Biddle & Reath LLP
Claims:
CLAIM

1. The ornamental design for a substrate for spectroscopic analysis, as shown and described.

Description:

FIG. 1 is a front view of a substrate for spectroscopic analysis of our new design.

FIG. 2 is a rear view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 3 is a top plan view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 4 is a bottom view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 5 is a right side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 6 is a left side view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 7 is a perspective of the substrate for spectroscopic analysis of FIG. 1.

FIG. 8 is a top plan view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 9 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

FIG. 10 is a sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3.

FIG. 11 is a sectional view taken along the line 11-11 of the substrate for spectroscopic analysis of FIG. 1.

FIG. 12 is a sectional view taken along the line 12-12 of the substrate for spectroscopic analysis of FIG. 8.

FIG. 13 is an enlarged sectional view taken along the line 13-13 of the substrate for spectroscopic analysis of FIG. 10, and,

FIG. 14 is a reference sectional view taken along the line 10-10 of the substrate for spectroscopic analysis of FIG. 3 in use, wherein the element is inserted in the concave part for element and the glass plate is set above the cover part.

The features shown in dotted lines depict environmental subject matter only and form no part of the claimed design.

The broken lines having alternating long and short segments define bounds of the claimed design and form no part thereof.