Title:
Connector for a microchip probe
United States Patent D602885


Inventors:
Nielsen, Peter F. (Farum, DK)
Application Number:
29/325789
Publication Date:
10/27/2009
Filing Date:
10/06/2008
Assignee:
Capres A/S (Lyngby, DK)
Primary Class:
International Classes:
(IPC1-7): 1303
Field of Search:
361/760, 361/720, D13/182, 174/250, 174/752, 174/255, 439/68, D14/436, 174/253, 29/829, D14/437, 174/748
View Patent Images:
US Patent References:
7520054Process of manufacturing high frequency device packagesApril, 2009Pasternak et al.29/852
20090011621Reversibe universal serial bus connection interface for USB connectors and universal serial bus portsJanuary, 2009Trenne439/68
20070205017CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAMESeptember, 2007Takakusaki et al.174/260
7253363Circuit boardAugust, 2007Iwasaki et al.174/255
D548199Flip chip on glass (FCOG) image sensorAugust, 2007ChenD10/106
6418030Multi-chip moduleJuly, 2002Yamaguchi et al.361/760
D457146Substrate for a semiconductor elementMay, 2002Yamamoto et al.D13/182
D358142Connecting terminal for chip cardsMay, 1995GlotonD14/437
4871317Surface mounted component adaptor for interconnecting of surface mounted circuit componentsOctober, 1989Jones439/68
D289036Ornamental design for a frame of edge connectors utilized to replace damaged connectors on printed circuit boardsMarch, 1987WallgrenD13/182
D255351Circuit boardJune, 1980PettijohnD13/182



Primary Examiner:
Sikder, Selina
Attorney, Agent or Firm:
Klein, O'Neill & Singh, LLP
Claims:
CLAIM

1. The ornamental design for a connector for a microchip probe, as shown.

Description:

FIG. 1 is a front elevation view of a connector for a microchip probe, in accordance with a first embodiment of my new design;

FIG. 2 is a rear elevation view of the connector of FIG. 1;

FIG. 3 is a left side elevational view of the connector of FIG. 1;

FIG. 4 is a right side elevational view of the connector of FIG. 1;

FIG. 5 is a top plan view of the connector of FIG. 1;

FIG. 6 is a bottom plan view of the connector of FIG. 1;

FIG. 7 is a front elevation view of a connector for a microchip probe, in accordance with a second embodiment of my new design;

FIG. 8 is a rear elevation view of the connector of FIG. 7;

FIG. 9 is a left side elevational view of the connector of FIG. 7;

FIG. 10 is a right side elevational view of the connector of FIG. 7;

FIG. 11 is a top plan view of the connector of FIG. 7; and,

FIG. 12 is a bottom plan view of the connector of FIG. 7.