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8185968 |
Magnetic head inspection method and magnetic head manufacturing method
A magnetic head inspection method is provided with the step that an area smaller than a half of a scanning and measurement area of a magnetic probe in a cantilever unit of the MFM is set as a...
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8181267 |
Scanning-type probe microscope
To provide a scanning probe microscope wherein the scanning means is not damaged by fluids, the scanning probe microscope 30 comprises a cantilever support part 2 for supporting a cantilever 1;...
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8161805 |
Method and apparatus for obtaining quantitative measurements using a probe based instrument
A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in...
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8156568 |
Hybrid contact mode scanning cantilever system
This invention addresses a contact mode hybrid scanning system (HSS), which can be used for measuring topography. The system consists of a cantilever or a cantilever array, a scanning stage, a...
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8109135 |
Cantilever assembly
A cantilever assembly (1) comprises a cantilever (10) having a cantilever tip (11). The cantilever is mounted to a rigid support (12,120,121) and is provided on its back side with an area (110) of...
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RE43117 |
Method of and apparatus for studying fast dynamical mechanical response of soft materials
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much...
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8028567 |
AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a...
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8028343 |
Scanning probe microscope with independent force control and displacement measurements
A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the...
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7997123 |
Nanotipped device and method
A dispensing device has a cantilever comprising a plurality of thin films arranged relative to one another to define a microchannel in the cantilever and to define at least portions of a dispensing...
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7926328 |
Sample manipulating apparatus
There is provided a sample manipulating apparatus which is an apparatus for manipulating a sample mounted on a substrate surface, in which at least position data and shape data are acquired by...
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7900506 |
Multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification
The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free...
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7849516 |
Probe for scanning over a substrate and a data storage device
A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a...
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7793356 |
Signal coupling system for scanning microwave microscope
A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal...
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7784107 |
High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer
An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an...
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7772552 |
Methods and devices for atom probe mass resolution enhancement
In an atom probe or other mass spectrometer wherein a specimen is subjected to ionizing pulses (voltage pulses, thermal pulses, etc.) which induce field evaporation of ions from the specimen, the...
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7761255 |
Method of and apparatus for studying fast dynamical mechanical response of soft materials
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much...
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7735358 |
Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first...
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7718962 |
Defect imaging device and method
The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the...
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7721347 |
Scanning nanotube probe device and associated method
A method and device are provided for determining, without contact, the physical and electrical properties of nanotube materials. The device includes a scanning probe configured to generate a signal...
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7663102 |
High current density particle beam system
The present invention relates to charged particle beam devices. The devices comprise an emitter for emitting charged particles; an aperture arrangement with at least two apertures for separating...
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7655923 |
Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are...
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7657947 |
Method and device for the contactless excitation of torsional vibrations in a one-sidedly clamped-in spring cantilever of an atomic force microscope
A method for exciting free torsional vibrations a spring cantilever, which is clamped in on one side and has a longitudinal extension, of an atomic force microscope (AFM) is disclosed. The...
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7644447 |
Scanning probe microscope capable of measuring samples having overhang structure
Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a...
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7605368 |
Vibration-type cantilever holder and scanning probe microscope
A vibration-type cantilever holder holds a cantilever opposed to a sample. The holder supports a main body part of the cantilever at only its base end so that a probe at the free end of the...
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7588605 |
Scanning type probe microscope
To be able to measure a value with regard to a dissipation, or a value in proportion to a dissipation energy without making a premise by being brought into a steady state. Exciting means 12 for...
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6950296 |
Nanoscale grasping device, method for fabricating the same, and method for operating the same
A nanoscale grasping device comprising at least three electrostatically actuated grasping elements. The use of at least three elements, which together define a plane, allows an object to be grasped...
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6928863 |
Apparatus and method for isolating and measuring movement in a metrology apparatus
A metrology apparatus includes an actuator with a first actuator stage to controllably move in first and second orthogonal directions, and a second actuator stage adjacent to the first actuator...
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6926927 |
Method of preparing ultra fine particle of metal chalcogenide
A chalcogen film is applied to an acute tip of a glass fiber and the acute tip is held in physical contact with a metal layer so as to induce diffusional reaction for generation of a metal...
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6925860 |
Leveling a measured height profile
The height profile of a sample that includes at least one film on a substrate is leveled based on the measured thickness of the overlying film. An apparatus that levels the height profile includes...
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6921896 |
Automatic backscatter gauge
In an embodiment of the present invention, the same provides an edge sensor capable of locating an edge under a substrate. The edge sensor comprises a radiation source, a scanner, a microprocessor,...
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6920088 |
Assembly for writing and/or erasing high density data on a media
The invention discloses an assembly capable of writing/erasing high-density data, preferably on a phase-change recording media. A preferred embodiment of the invention features a novel thermal...
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6912193 |
Record condition extraction system and method of dielectric recording medium, and information recording apparatus
The record condition extraction system (1) of a dielectric recording medium is intended to obtain an applied voltage and an applied time length to be recorded when recording information in the...
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6892432 |
Nanotube cartridge and a method for manufacturing the same
A method for manufacturing a nanotube cartridge including the steps of: adhering numerous nanotubes to a surface of a holder, disposing a knife edge at an inclination to the surface of the holder...
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6882745 |
Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data
Systems and methods are described for translating detected wafer defect coordinates to reticle coordinates using CAD data. A wafer inspection image is provided and coordinates of potential defects...
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6875274 |
Carbon nanotube-nanocrystal heterostructures and methods of making the same
The present invention provides a heterostructure which includes a carbon nanotube covalently linked to at least one nanocrystal. Methods for making such heterostructures, and methods for modifying...
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6873747 |
Method for measurement of pitch in metrology and imaging systems
In accordance with an embodiment of the invention, a method for measuring pitch in data obtained from metrology and imaging systems is provided. A data set from a metrology or imaging instrument is...
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6869480 |
Method for the production of nanometer scale step height reference specimens
Methods are disclosed that provide for structures and techniques for the fabrication of ordered arrangements of crystallographically determined nanometer scale steps on single crystal substrates,...
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6847907 |
Defect detection and repair of micro-electro-mechanical systems (MEMS) devices
A method of defect detection and repair of micro-electro-mechanical systems (MEMS) devices comprising the steps of (A) detecting at least one defect in the MEMS device, wherein each defect is an...
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6834158 |
Pinhole defect repair by resist flow
According to one aspect of the present invention, pinhole defects in resist coatings are repaired by heating the resist briefly to induce the resist to flow and fill pinholes. The resist is brought...
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6819588 |
Memory element, method for structuring a surface, and storage device
The invention is essentially characterized in that in a first step a substrate is provided, which is coated with defined pattern of protrusions of a coating layer of a different material, so that...
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6772620 |
Method of generating calibration data for relative height measurement
A metrology process, in accordance with the present invention, measures the dishing of a first feature made of a first material by determining the relative height of the first feature with respect...
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6724552 |
Magnetic disk apparatus with lower probability of occurrence of read errors due to scratch or the like on magnetic disk surface
A magnetic disk apparatus is capable of reading normal data following a read error of a reference signal that has occurred due to a scratch or the like on a disk surface. In the magnetic disk...
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6715318 |
Glass substrate for information recording media and manufacturing method thereof
There are provided a glass substrate for information recording media in which the undulations on the glass substrate surface are optimized, thus contributing to reduction of the flying height, and...
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6700852 |
Information recording medium with recording film with cobalt oxide crystalline particles, and information recording device including the same
An information recording medium capable of high-density recording and accurate reproduction and also capable of repeated recording and reproduction, an information recording device that employs the...
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6685639 |
High intensity focused ultrasound system for scanning and curing tumor
A high intensity focused ultrasound system for scanning and treating tumor, having a combined probe, a power source, a B-mode ultrasound scanner, a multi-dimensional digit-controlled motional...
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6630666 |
Positron trap beam source for positron microbeam production
A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud...
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6627885 |
Method of focused ion beam pattern transfer using a smart dynamic template
The present invention provides a method of forming a dynamic template with a focused beam. The method includes forming a desired template that represents a desired image, forming an actual template...
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6627908 |
Radiation source assembly and connector press used in producing such assemblies
A radiation source assembly and a connector press used in producing such assemblies. In the radiation source assembly, each of the cap connector and the female connector is provided with internal...
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6617599 |
Apparatus and method for automated indexing of a nuclear gauge
The invention provides a method and apparatus for facilitating calibration of a nuclear gauge by automating the movement of a source rod between a plurality of source rod positions. The apparatus...
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6583412 |
Scanning tunneling charge transfer microscope
The present invention develops a new type of SPM, a scanning tunneling charge transfer microscope (STCTM). The STCTM is capable of first, detecting the transfer of an ultrasmall amount of charge...
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