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8166568 Contact probe pin for semiconductor test apparatus  
It is an object to provide a contact probe pin for a semiconductor test apparatus, including an amorphous carbon type conductive film formed on the probe pin base material surface. The conductive...
8104332 Probe and cantilever  
To provide a probe 1 for use in a cantilever 2 of an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full use of the properties of...
8099793 Scanning probe microscope with automatic probe replacement function  
An automatic probe exchange system for a scanning probe microscope (SPM) exchanges probes between a probe mount on the SPM and a probe mount on a probe tray based on differential magnetic force....
8099792 Methods and apparatus for spatially resolved photocurrent mapping of operating photovoltaic devices using atomic force photovoltaic microscopy  
Atomic force photovoltaic microscopy apparatus and related methodologies, as can be used to quantitatively measure spatial performance variations in functioning photovoltaic devices.
8091143 Atomic force microscopy probe  
A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in...
8079093 Dual tip atomic force microscopy probe and method for producing such a probe  
One inventive aspect is related to an atomic force microscopy probe. The probe comprises a tip configuration with two probe tips on one cantilever arm. The probe tips are electrically isolated from...
8074293 Defective product inspection apparatus, probe positioning method and probe moving method  
For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table...
8046843 Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material  
An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample...
8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscope  
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a...
7997123 Nanotipped device and method  
A dispensing device has a cantilever comprising a plurality of thin films arranged relative to one another to define a microchannel in the cantilever and to define at least portions of a dispensing...
7966867 Scanning probe microscope  
The invention provides a scanning probe microscope capable of performing highly accurate three-dimensional profile measurement in a state in which no sliding of the probe or deformation of the...
7971266 Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope  
The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe...
7958566 AFM probe with variable stiffness  
Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having a...
7954166 Independently-addressable, self-correcting inking for cantilever arrays  
An improved method of loading tips and other surfaces with patterning compositions or inks for use in deposition. A method of patterning is described, the method comprising: (i) providing at least...
7945964 Apparatus structure and scanning probe microscope including apparatus structure  
Provided are a structure of an apparatus for analysis, inspection, and measurement in which a support structure supporting a detection unit is resistant to disturbance, suppresses a reduction in...
7926328 Sample manipulating apparatus  
There is provided a sample manipulating apparatus which is an apparatus for manipulating a sample mounted on a substrate surface, in which at least position data and shape data are acquired by...
7921465 Nanotip repair and characterization using field ion microscopy  
A system (100) for characterizing surfaces can include a nanotip microscope (104) in a first pressure envelope (102) at a first pressure with an electrically conductive nanotip (110) mounted...
7913544 Scanning probe devices and methods for fabricating same  
The present invention is directed to scanning probes in which a cantilever contacts a stylus via an integrated stylus base pad, and methods for fabricating such probes. The probe offer many...
7900506 Multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification  
The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free...
7884323 Atom probes, atom probe specimens, and associated methods  
The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen...
7861315 Method for microfabricating a probe with integrated handle, cantilever, tip and circuit  
A simple method for integrating a circuit onto a probe with a handle, a cantilever and a tip is provided. By fabricating a probe whose surface has recessed patterns of the desirable profile, a...
7854015 Method for measuring the force of interaction in a scanning probe microscope  
A scanning probe microscope and method for operating the same are disclosed. The microscope includes a probe mount for attaching a probe, an electro-mechanical actuator, a probe position signal...
7814565 Nanostructure on a probe tip  
Techniques for forming a nanostructure on a probe tip are provided.
7775087 Microchannel forming method and nanotipped dispensing device having a microchannel  
A method of forming a microchannel as well as a thin film structure including same is made by forming a first thin film on a side of a substrate, forming a fugitive second thin film on the first...
7735358 Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly  
The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first...
7637960 Short and thin silicon cantilever with tip and fabrication thereof  
Thin and short cantilevers possess both a low force constant and a high resonance frequency, thus are highly desirable for atomic force microscope (AFM) imaging and force measurement. According to...
7635392 Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method  
The present invention provides a scanning probe microscope cantilever comprising a support portion, a lever portion extended from the support portion, and a needle projecting out of a first surface...
7631548 Scanning probe microscope  
With a scanning probe microscope, if a plurality of sample properties are measured using a scanning scheme of allowing a probe to approach and withdraw from a sample, the sample properties need to...
7610797 Carbon nanotube detection system  
A carbon nanotube detection system is disclosed. The detection system is suitable to detect carbon nanotube vibrations. Types of detection systems include but are not limited to: magnetic coupling...
7605368 Vibration-type cantilever holder and scanning probe microscope  
A vibration-type cantilever holder holds a cantilever opposed to a sample. The holder supports a main body part of the cantilever at only its base end so that a probe at the free end of the...
6951129 Scanning probe microscope with improved probe head mount  
A mounting mechanism for the probe head of a Scanning Probe Microscope (SPM) includes two dovetail and two right and left threaded pushdown screws, for convenient mounting and clamping of the probe...
6871527 Measurement head for atomic force microscopy and other applications  
An improvement for atomic force microscopes, more generally for light beam detecting systems, but also in part applicable to scanning probe microscopes, providing significant novel features and...
6755075 Ultra micro indentation testing apparatus  
An ultra micro indentation testing apparatus comprises: a lever stand provided with a center lever having a silicon probe and a diamond indenter disposed therein; a moving mechanism for moving the...
6734451 Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same  
On a silicon substrate is formed a silicon dioxide film and then hemispherical grains made of silicon, each having an extremely small diameter, are deposited thereon by LPCVD. After annealing the...
6690008 Probe and method of manufacturing mounted AFM probes  
An atomic force microscopy (AFM) probe and a method of manufacturing mounted probes for AFM applications. The method implements an optimized soldering procedure for mounting a probe to a holder...
6552339 Micro goniometer for scanning probe microscopy  
A goniometer for performing scanning probe microscopy on a substrate surface is disclosed. The goniometer has a cantilever, having a cantilevered end and a supported end and a tip disposed at the...
6233206 High density magnetic thermal recording and reproducing assembly  
The assembly of the present invention preferably writes by way of thermal near-field coupling between a thermal heater and a media. The thermal heater may comprise an atomic force microscope probe...
6032518 Scanning stylus atomic force microscope with cantilever tracking and optical access  
A scanned-stylus atomic force microscope (AFM) employing the optical lever technique, and method of operating the same. The AFM of the invention includes a light source and a scanned optical...
5936243 Conductive micro-probe and memory device  
A micro-probe that has little deformation and wear while maintaining a desired conductivity is composed of a cylindrical wear resistant material and a conductive material. The wear resistant...
5874668 Atomic force microscope for biological specimens  
An atomic force microscope for quantitative imaging and identification, at the molecular or submolecular level, biomolecules or subunits of biomolecules in a physiologic environment, through use of...
5825020 Atomic force microscope for generating a small incident beam spot  
An atomic force microscope utilizing an optical system having a numerical aperture sufficient with the wavelength of light of an incident beam to form a spot on the cantilever having a size of 8...
5811017 Cantilever for use in a scanning probe microscope and method of manufacturing the same  
A composite silicon-on-insulator substrate comprises first and second substrates and an oxide film interposed between them. The second substrate is partially removed, such that a lever-base section...
5751685 Probe for memory device having movable media  
A buffered probing device includes a cantilever-shaped probe having a micro-needle at its tip, and an electric circuit that applies electrical signals between the micro-needle and a probe target to...
5591903 Reconstructing the shape of an atomic force microscope probe  
A method of reconstructing the shape of an atomic force microscope. The shape of the probe, which is represented by a tip function, is derived from an image taken of a colloidal gold ball by the...
5553487 Methods of operating atomic force microscopes to measure friction  
A method of operating an atomic force microscope having a probe tip attached to a free end of a lever which is fixed at its other, wherein the probe tip is scanned in forward and reverse directions...
5469733 Cantilever for atomic force microscope and method of manufacturing the cantilever  
A cantilever for an atomic force microscope includes a probe and a cantilever body supporting the probe, the probe deflecting in response to an atomic force between said probe and a sample, at...
5408094 Atomic force microscope with light beam emission at predetermined angle  
A cantilever has a probe on one surface of the free end and a reflection surface on the opposite surface thereof. A laser diode is located so as to emit a laser beam to the reflection surface at a...
5394741 Atomic probe microscope  
A cantilever has a probe on one side of the end portion and a mirror on the opposite side. The cantilever is fixed to a support member via a piezoelectric element. A semiconductor laser situated...
5394500 Fiber probe device having multiple diameters  
A fiber probe device includes a fiber segment that has at least three sections. An uppermost section has the largest diameter; an intermediate section has an intermediate diameter, and a lowest...
5381101 System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies  
A potentiometry apparatus for measuring a periodic electrical waveform existing proximate the surface of a sample such as a semiconductor wafer is disclosed herein. The potentiometry apparatus...
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