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8181267 |
Scanning-type probe microscope
To provide a scanning probe microscope wherein the scanning means is not damaged by fluids, the scanning probe microscope 30 comprises a cantilever support part 2 for supporting a cantilever 1;...
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8166567 |
Fast-scanning SPM scanner and method of operating same
A high-bandwidth SPM tip scanner is provided that additionally includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam....
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8160848 |
Apparatus for generating coarse-grained simulation image of sample to be measured with a probe of a scanning probe microscope
A sample atomic configuration creation part in a control section creates the atomic arrangement data of a sample, and a sample surface height calculation part calculates a sample surface height for...
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8156568 |
Hybrid contact mode scanning cantilever system
This invention addresses a contact mode hybrid scanning system (HSS), which can be used for measuring topography. The system consists of a cantilever or a cantilever array, a scanning stage, a...
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8141168 |
Scanning probe microscope and a method to measure relative-position between probes
A main object of the present claimed invention is to provide a scanning probe microscope that can recognize a relative position between multiple probes accurately. The scanning probe microscope...
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8108942 |
Probe microscope
A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting...
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8099792 |
Methods and apparatus for spatially resolved photocurrent mapping of operating photovoltaic devices using atomic force photovoltaic microscopy
Atomic force photovoltaic microscopy apparatus and related methodologies, as can be used to quantitatively measure spatial performance variations in functioning photovoltaic devices.
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8091143 |
Atomic force microscopy probe
A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in...
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8089053 |
Dynamically tilting specimen holder for stereo and tomographic imaging in a transmission electron microscope using a combination of micro electro mechanical systems (MEMS) and piezoelectric transducers (PZTs)
The present invention relates to double-tilt specimen holders of the side-entry type for transmission electron microscopy (TEM). The invention uses Micro Electro Mechanical Systems (MEMS) and...
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8074293 |
Defective product inspection apparatus, probe positioning method and probe moving method
For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table...
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8074291 |
Harmonic correcting controller for a scanning probe microscope
A scanning probe microscope and method for operating the same to correct for errors introduced by a repetitive scanning motion are disclosed. The microscope includes an actuator that moves the...
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8069493 |
Atomic force microscope apparatus
An object of the present invention is to provide an atomic force microscope apparatus allowing tracking errors to be made as close to zero as possible to reduce images obtained through high-speed...
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8063383 |
Inertial positioner and an optical instrument for precise positioning
We disclose a precision positioner based on an inertial actuator, an optical instrument for accurate positional readout and control, and an electrostatically clamped assembly for holding any...
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8037736 |
Non-linearity determination of positioning scanner of measurement tool
Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning...
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8028343 |
Scanning probe microscope with independent force control and displacement measurements
A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the...
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8024963 |
Material property measurements using multiple frequency atomic force microscopy
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
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8024816 |
Approach method for probe and sample in scanning probe microscope
In detecting a displacement of a cantilever (2) by a displacement detecting mechanism (5) and allowing a probe (1) and a sample (8) to approach each other by at least one of a coarse-movement...
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8006315 |
Photon-emission scanning tunneling microscopy
The present invention relates to an indirect-gap semiconductor substrate, the gap being greater than that of silicon and preferably greater than 1.5 eV, to its use for imaging a specimen by...
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8001831 |
Positioning apparatus and scanning probe microscope employing the same
There is provided a scanning probe microscope employing a positioning apparatus M1 including a unit to be driven in XY direction having a substantially square form in plane geometry at the center...
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7975314 |
Scanning probe microscope and active damping drive control device
There is provided a scanning probe microscope that allows active damping to be advantageously carried out. A Z scan control section functions as a driving control section to control a Z scanner...
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7971266 |
Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe...
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7962966 |
Scanning probe microscope having improved optical access
A scanning probe microscope and method for using the same are disclosed. The Scanning probe microscope includes a probe mount for connecting a cantilever arm and a probe signal generator. The probe...
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7958566 |
AFM probe with variable stiffness
Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having a...
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7958563 |
Method for using an atomic force microscope
The present invention relates to a method of using an atomic force microscope comprising exciting natural lower and higher vibration modes of a microlever (M) placed on a sample, and analyzing the...
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7945962 |
Information memory apparatus using probe
In a two-dimensional probe array, an interval between the leading ends of probes adjacent to each other in an X direction is made shorter than that between the leading ends of probes adjacent to...
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7940972 |
System and method of extended field of view image acquisition of an imaged subject
A system and method of imaging an imaged subject is provided. The system comprises a controller, and an imaging system including an imaging probe in communication with the controller. The imaging...
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7937991 |
Fully digitally controller for cantilever-based instruments
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The...
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7921466 |
Method of using an atomic force microscope and microscope
The invention relates to a method of using an atomic force microscope and to a microscope. The inventive method comprises the following steps consisting in at least performing bimodal excitation of...
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7904966 |
Scanning probe microscope apparatus
There is provided a scanning probe microscope apparatus which has a high sensitivity for the interaction between the cantilever and the sample and comprises a cantilever that can oscillate stably...
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7891015 |
High-bandwidth actuator drive for scanning probe microscopy
An actuator subsystem for use in a scanning probe microscope (SPM) system having a probe for measuring a sample comprises and actuator and an actuator driving circuit. The actuator operates in the...
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7891016 |
Automatic landing method and apparatus for scanning probe microscope using the same
Disclosed herein are an automatic landing method for a scanning probe microscope and an automatic landing apparatus using the same. The method comprises irradiating light to a cantilever using a...
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7874202 |
Probe apparatus for measuring an electron state on a sample surface
In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to...
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7874016 |
Scanning probe microscope and scanning method
To realize to adapt to a shape of a surface, shorten a measurement time period and promote a measurement accuracy by setting a sampling interval in accordance with a slope of the shape of the...
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7854015 |
Method for measuring the force of interaction in a scanning probe microscope
A scanning probe microscope and method for operating the same are disclosed. The microscope includes a probe mount for attaching a probe, an electro-mechanical actuator, a probe position signal...
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7849516 |
Probe for scanning over a substrate and a data storage device
A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a...
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7818816 |
Substrate patterning by electron emission-induced displacement
Disclosed are methods and devices for patterning micro- and/or nano-sized pattern elements on a substrate using field emitted electrons from an element. Disclosed methods and devices can also be...
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7810382 |
Method and device for determining material properties
The invention relates to a method of determining material properties of a contact formed between a measurement tip of a microscopic probe and a sample surface of a sample material. According to the...
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7810166 |
Device and method for scanning probe microscopy
The invention relates to a device for scanning probe microscopy, said device comprising a scanning microscopy measuring device provided with a measuring probe for scanning microscopy measurements...
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7793356 |
Signal coupling system for scanning microwave microscope
A signal coupling system interposed between a scanning probe and a measurement instrument provides signal communication between the scanning probe and the measurement instrument. The signal...
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7784107 |
High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer
An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an...
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7770231 |
Fast-scanning SPM and method of operating same
A method and apparatus are provided that have the capability of rapidly scanning a large sample of arbitrary characteristics under force control feedback so has to obtain a high resolution image....
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7765606 |
Scanning probe apparatus
A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the...
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7748052 |
Scanning probe microscope and method of operating the same
A scanning probe microscope capable of preventing contact between the probe and a sample and a method of operating this microscope. The scanning probe microscope measures the topography of a...
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7735358 |
Self-sensing tweezer devices and associated methods for micro and nano-scale manipulation and assembly
The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first...
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7712354 |
Method and apparatus for controlling Z-position of probe
Method and apparatus of easily controlling the Z-position of the probe used in a microprobe analyzer. The apparatus has: (A) a holder, (B) a reference body having a reference surface that is at the...
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7709791 |
Scanning probe microscope with automatic probe replacement function
Provided is a scanning probe microscope (SPM), a probe of which can be automatically replaced and the replacement probe can be attached onto an exact position. The SPM includes a first scanner that...
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7694347 |
Measuring device with daisy type cantilever wheel
A measuring device with a daisy type cantilever wheel enabling easier setting of a measuring head and modification head by rotating the daisy type cantilever wheel, enabling modification, adhesion...
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7690047 |
Scanning probe apparatus
A scanning probe apparatus for obtaining information of a sample, recording information in the sample, or processing the sample with relative movement between the sample and the apparatus, the...
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7659509 |
System for scanning probe microscope input device
In accordance with the invention, a computer pointing device is interfaced with an SPM system to provide real time control of the SPM and improve the ease of use.
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7644447 |
Scanning probe microscope capable of measuring samples having overhang structure
Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a...
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